308 results about "Automatic test equipment" patented technology

The invention, which relates to the technical field of equipment simulation testing, discloses a simulation evaluation method for automatic testing equipment of an in-vehicle infotainment system, and the method comprises the steps: collecting operation test data, carrying out the recognition processing through a deep convolutional neural network model, obtaining test task data, constructing a test action sequence, mapping the test action sequence into a control instruction, and carrying out the simulation evaluation of the in-vehicle infotainment system. The control instruction is optimized and adjusted according to a preset action rule base; driving the in-vehicle automatic test equipment to execute the control instruction to complete the test operation, recording the operation response time and interface state change data in the test process, calculating a movement track deviation value, calculating a test accuracy score, and when the test accuracy score is smaller than a preset threshold value, starting the in-vehicle automatic test equipment; and if not, supplementing the optimization parameters to the preset action rule base and triggering a new test. According to the invention, accurate control of the test equipment is realized by adopting the TCP / IP communication protocol, and the test strategy is continuously optimized by dynamically updating the preset action rule base, so that the automatic test efficiency of the vehicle machine is improved.

The invention discloses a calibration method and system of ATE test equipment. The calibration method comprises the steps of obtaining calibration data, performing self-compensation and measuring and calibrating a tested single board through a calibration device. The step of obtaining the calibration data comprises the steps of selecting one FPGA from the to-be-tested single boards as a calibration source, calibrating and calibrating the calibration source, calibrating the to-be-tested single board where the calibration source is located as a calibration device through the calibration source, and taking time delay data between a calibration device signal and a calibration source signal as the calibration data. The self-compensation comprises the following steps: compensating the signal delay of the calibration device according to the calibration data, and ensuring that the calibration device provides a reference synchronization signal for the tested single board. The FPGA is adopted as a calibration source, calibration of the test equipment can be completed without an external TDC calibration board, the limitation of the number of channels of a traditional TDC calibration board is broken through, and the accuracy and reliability of a calibration result are also improved.

Disclosed is a test aid unit that is installed between automatic test equipment (ATE) and a device under test (DUT), generates a test data signal according to a data processing and transmission / reception rate of the DUT in response to a control signal transmitted from the ATE, transmits the test data signal to the DUT, self-tests a test result signal transmitted from the DUT, and transmits the test result to the ATE. The test aid unit includes a clock signal divider, an integrated digital logic unit, a transmitter, and a receiver.

The invention relates to an antenna device comprising a quad-ridged waveguide, an open end of which is configured to act as a radiating aperture, and an orthomode transducer, OMT, configured to couple the quad-ridged waveguide to two feed structures.

The invention discloses a method and a system for displaying a test waveform of ATE (automatic test equipment), and belongs to the technical field of automatic test, and the method comprises the following steps: receiving a waveform display request sent by an upper computer, the waveform display request comprising a trigger condition for triggering a logic controller to store waveform digital information; triggering conditions in the waveform conversion request are set to a register address corresponding to the logic controller, a pattern program is executed, test data are sent to a tested device, and return data of the tested device are received; after the pattern program is executed, the waveform digital information is obtained from a register address corresponding to the logic controller, and the waveform digital information is all test data and return data which are started to be stored by the logic controller after a trigger condition is met; and analyzing and converting the waveform digital information, and forwarding the waveform digital information to an upper computer for waveform analog signal display. According to the application, a section of waveform at any time node is captured in real time, the time sequence problem of a pattern program is quickly positioned by comparing the captured waveform signal with the pattern time sequence, the debugging period is shortened, and the development difficulty is reduced.

The invention relates to the technical field of circuit board detection equipment, in particular to a PCB voltage detection device which comprises a detection mechanism, the detection mechanism comprises a detection table, a bottom plate is arranged on the detection table, a square cover is arranged above the bottom plate, ATE automatic test equipment is arranged in the middle of the square cover, telescopic curtain cloth is arranged at the lower end of the square cover, and a sealing strip is arranged below the telescopic curtain cloth. And the ATE is fixed on the side plate of the detection table through a first electric telescopic rod. The detection environment is filled with nitrogen, moisture and oxygen in the air are prevented from interfering the voltage detection accuracy, and meanwhile the size of the cover formed by the square cover, the telescopic curtain cloth and the sealing strip can adaptively change along with the height of the PCB. The amount of nitrogen filled into the cover formed by the square cover, the telescopic curtain cloth and the sealing strip also changes along with the volume of the cover formed by the square cover, the telescopic curtain cloth and the sealing strip, and the square cover and the telescopic curtain cloth are matched with each other, so that waste caused by insufficient or excessive nitrogen filling amount is prevented, and meanwhile, PCBs of various models can be detected.

The invention provides an automatic test system and method for a third-party high-power repeater, and relates to the technical field of automatic test equipment, and the system comprises an integrated reconfigurable passive link box, a control host, a vector signal generator and a vector signal analyzer. The integrated reconfigurable passive link box comprises a box body, a radio frequency switch matrix network, an embedded function network, a control port, an input port, an output port, an uplink interface and a downlink interface. The radio frequency switch matrix network and the embedded function network are arranged in the box body. The input port, the output port, the uplink interface and the downlink interface are arranged on the surface of the box body. The vector signal generator is connected with the input port, the vector signal analyzer is connected with the output port, and a third-party high-power repeater to be tested is arranged between the uplink interface and the downlink interface. According to the invention, the radio frequency switch matrix network and the embedded function network are packaged in the integrated reconfigurable passive link box, and the control host is utilized to carry out automatic testing on the third-party high-power repeater according to the preset process, so that frequent operation processes are avoided, and damage to instruments is reduced.

The invention belongs to the field of visual inspection, and particularly relates to a chip packaging multi-dimensional defect intelligent detection system which comprises a plurality of modules and a subsystem. Wherein the electric-thermal linkage detection module consists of ATE (automatic test equipment) and a thermal infrared imager, and is used for acquiring an electric parameter matrix and a thermal imaging matrix of a chip; the multi-dimensional vision detection module comprises an X-ray tomography unit, a 3D structured light imaging unit and a plane vision unit; the reconstruction module is used for reconstructing an internal structure of the chip, acquiring 3D surface topography and extracting plane defect features; the multi-modal feature fusion module is based on a cross-modal attention mechanism and a multi-task joint learning model to fuse electric-thermal data, X-ray voxel features and 3D morphology features; the hierarchical defect decision-making subsystem locates a defect area through FastR-CNN, classifies defect types through a graph convolutional network, and outputs a final defect judgment result based on Bayesian reasoning network by integrating multi-modal evidence; through multi-modal data linkage, joint detection of cavities, heat dissipation and appearance defects can be realized.

The invention relates to the technical field of optical communication, and provides COB automatic test equipment, which comprises an aging strip trolley, a bonding strip stock bin, a material taking device and a test mechanism, and is characterized in that the aging strip trolley is used for storing aging strips, the bonding strip stock bin is used for storing bonding strips with COB, and the material taking device is used for testing the bonding strips with COB. The transfer mechanism is used for transferring the COB between the bonding strip and the aging strip, and the testing mechanism is used for testing the COB before aging and testing the COB after aging. The invention also provides a COB automatic test method. According to the invention, automatic COB testing can be realized, the problem of poor wire collapse caused by manual handheld COB plugging and unplugging is avoided, manpower is reduced, the efficiency and the product are improved, and the cost is greatly saved.

The present invention relates to the technical field of capacitor aging testing, and discloses a fully automatic testing device for capacitor aging testing, including a testing table, a conveyor, a first alignment mechanism, a second alignment mechanism and a material transfer mechanism; a capacitor testing circuit board is embedded on one side of the top of the testing table, a capacitor waveform monitoring display is arranged beside the testing table, and the capacitor waveform monitoring display is electrically connected to the capacitor testing circuit board through a wire; the conveyor is arranged on the other side of the top of the testing table, and the conveyor is used for conveying capacitors; the first alignment mechanism and the second alignment mechanism are sequentially arranged upstream of the conveyor and along the conveying direction of the conveyor; the first alignment mechanism is used to adjust the positive and negative pins of each capacitor on the conveyor to the same horizontal plane; the second alignment mechanism is used to adjust the azimuth of the positive pins or the azimuth of the negative pins of each capacitor on the conveyor to the same side of the capacitor; the improvement of the testing efficiency and the improvement of the degree of testing automation are realized.

The invention discloses automatic test equipment, a chip test method, a chip test device and a medium, which are used for implementing pre-test by adopting a preset rule before a chip mass production test so as to detect whether a chip mass production test environment is normal or not, thereby improving the working efficiency and the accuracy of the mass production test. In one embodiment, an apparatus includes: a memory to store program instructions; the processor calls a program instruction stored in the memory, and executes according to an obtained program: when a preset triggering condition for executing a chip test is met, the sorting machine is notified to execute a preset action, so that the to-be-tested chip is put into the test seat of the test area; and when a preset test starting signal fed back by the sorting machine is received, the local automatic test equipment is switched to a preset test mode, the current to-be-tested chip on the test seat is tested, and a test result is fed back to the sorting machine, so that the sorting machine performs automatic test on the current to-be-tested chip according to the received test result. And executing a preset action corresponding to the test result.

The present invention belongs to the field of visual inspection, in particular to an intelligent multi-dimensional defect detection system for chip packaging, including multiple modules and a subsystem; among them, the electro-thermal linkage detection module is composed of an ATE automatic test equipment and an infrared thermal imager, which collects the electrical parameter matrix and thermal imaging matrix of the chip; the multi-dimensional visual detection module includes an X-ray tomography imaging unit, a 3D structured light imaging unit and a planar vision unit; it is used to reconstruct the internal structure of the chip, obtain the 3D surface topography and extract the planar defect features; the multi-modal feature fusion module is based on the cross-modal attention mechanism and multi-task joint learning model to fuse the electro-thermal data, X-ray voxel features and 3D topography features; the hierarchical defect decision subsystem locates the defect area through FastR-CNN, classifies the defect types through the graph convolutional network, and outputs the final defect determination result based on the Bayesian inference network by integrating multi-modal evidence; through the multi-modal data linkage, the joint detection of voids, heat dissipation and appearance defects can be realized.

The invention relates to the technical field of data storage, and discloses a method and system for optimizing test data collected by a memory chip based on machine learning, and the method comprises the steps: collecting original test data from a test platform of a to-be-tested memory chip; constructing a convolutional neural network model, learning a mapping relationship between test data features and memory defects through the convolutional neural network model, training the convolutional neural network model through the collected original test data, optimizing parameters of the convolutional neural network model according to a training result through a back propagation algorithm, and obtaining memory defects through the optimized parameters. The performance of the convolutional neural network model tends to be stable; converting a parameter vector output by the convolutional neural network model into a test vector executable by ATE; and taking the generated test vector as a new training sample, feeding back the new training sample to an original test data updating data set, and iteratively training and optimizing the convolutional neural network model. According to the invention, intelligentization of the test process is realized, and hidden defects sensitive to voltage and time sequence can be effectively captured.

55 Power Supply Filter Circuit, Power Supply Arrangement, Automated Test Equipment and Method for Actively Filtering a Supply Voltage Abstract 5 A power supply filter circuit (100), comprises a transistor (120), a control capacitor (130) and a stabilization capacitor (140). A load path of the transistor is coupled between an input (110) of the power supply filter circuit and an output (112) of the power supply filter circuit. The control capacitor is coupled between a control terminal of the transistor and a reference potential conductor (GND). The stabilization capacitor is coupled between a source terminal 10 of the transistor and the reference potential conductor. The power supply filter circuit is configured to regulate a voltage across the load path of the transistor or a voltage between an input of the power supply filter circuit and an output of the power supply filter circuit. A Power Supply Arrangement, an Automated Test Equipment and Method for Actively Filtering a Supply Voltage are also described. 15 Figure 1

An automated test equipment (ATE) for testing semiconductor devices, the test equipment comprises a test handler, a spare part, or a contactor socket, and a semiconductor devices tester, The spare part comprises an electronic component for storing and / or processing data regarding the spare part or a portion thereof, The test equipment comprises an operator terminal comprising a display or GUI and a data exchange interface which is connected or connectable to the electronic component within the spare part, for at least displaying data stored therein. The ATE further comprises a data buffer unit for buffering the data, a maintenance planning and control unit for planning and controlling maintenance actions of the test equipment, and a dedicated database residing in a control computer.

The invention belongs to the technical field of power-assisted steering lock testing, and particularly relates to automatic testing equipment for an automobile power-assisted steering lock, which comprises a testing workbench and a power-assisted steering lock main body, and is characterized in that a positioning base is fixedly mounted at the center of the bottom of a layout groove, and a rotating seat is slidably mounted at the top of the positioning base; a rotating inserting column is rotationally installed at the top of the rotating base, and a torque sensor is installed at the lower end of the rotating inserting column. According to the invention, when the servo motor drives the linear bidirectional screw rod to rotate, the moving plate support can move synchronously with the supporting moving block on the left side, when the active sliding table is just in contact with the passive sliding block, the moving plate support drives the linkage moving plate to move, and the test plug is just aligned to and close to the inlet of the wiring port; when the support moving block continues to drive the active sliding table to move, the test plug is completely inserted into the wiring port on the power-assisted steering lock main body, so that the synchronism of two actions of automatic plugging and automatic positioning is realized, and the operation steps are reduced.

Automatic test equipment (ATE) configured to test devices under test (DUTs) can include a host device tester, one or more load boards, and one or more host bus adapters (HBAs). The host device tester does not support odd sector sizes and / or non-standard sector sizes. The one or more load boards can be communicatively coupled to the host device. The one or more HBAs can be communicatively coupled between respective load boards and one or more respective devices under test (DUTs). The one or more load boards can be configured to communicate with respective HBAs using one or more first communication protocol interfaces. The one or more HBAs can be configured to communicate with the respective DUTs using one or more second communication protocol interfaces. The HBAs can be configured to translate commands and data between the host device tester and the one or more DUTs that support odd sector size or non-standard sector size.

The present application relates to discrete device testing technology field, especially to a kind of discrete device full automation test equipment with intelligent temperature control and buffer scheduling, setting tool handling unit, visual identification manipulator, at least one tool positioning area, multiple positioning material placing mechanisms, multiple aging test machines and at least one cooling buffer warehouse, multiple positioning material placing mechanisms include at least one to be tested positioning material placing mechanism, at least one tested positioning material placing mechanism, at least one defective positioning material placing mechanism and at least one buffer positioning material placing mechanism;Each positioning material placing mechanism is configured with material placing container, and the material placing container is configured to store multiple discrete devices;It can improve test efficiency and equipment utilization, through full-process unmanned collaborative work, multiple aging test machines synchronous test, non-stop buffer replacement and seamless connection of temperature control and equipment scheduling, avoid time-consuming and equipment emptying, plugging problem of artificial operation, significantly improve test pace and equipment utilization.

The utility model relates to an FPC integrated automatic test equipment, including transmission band support, loading transmission band, FPC loading plate, front side test structure, overturn structure, reverse side test structure, the loading transmission band is connected in the transmission band support, a plurality of groups of FPC loading plates are arranged on the loading transmission band at equal intervals, the overturn structure is arranged on the front side test structure, the reverse side test structure is arranged on the reverse side test structure, and the reverse side test structure is arranged on the reverse side test structure. The front testing structure is fixed on the conveying belt support, the overturning structure is fixed on the conveying belt support, and the back testing structure is fixed at the top end of the overturning structure. According to the utility model, the arrangement of the FPC detection structure is optimized, the traditional FPC detection mode is changed, the detection equipment with the overturning function is designed, and the overturning structure is simple, convenient to maintain and use and suitable for popularization and use.

The invention relates to the technical field of optical module automatic test equipment, and discloses optical module automatic test equipment, which comprises an adsorption carrying table, and the adsorption carrying table is rotationally arranged on a machine base through a rotation driving part; the product carrying mechanism comprises a product moving module and a vacuum suction nozzle connected to the output end of the product moving module; the probe card testing mechanism comprises a first moving module, a visual detection module connected to the output end of the first moving module, probe plates symmetrically arranged on the two sides of the visual detection module and a plurality of probes arranged on the probe plates; the optical fiber alignment testing mechanism comprises a second moving module, an optical fiber posture adjusting assembly connected to the output end of the second moving module and an alignment optical fiber connected to the output end of the optical fiber posture adjusting assembly, and an optical fiber tube of the alignment optical fiber faces the product and is used for collecting light emitted by the product to achieve luminous flux detection.

The invention discloses a software ecological management method of automatic test equipment and application thereof, and belongs to the technical field of integrated circuit test. The method comprises the following steps: automatically writing a version identifier containing firmware information of an upper computer and a lower computer when a test program is compiled; when the program is loaded, the system obtains the actual version of the current operating environment and compares the actual version with the version identifier; if the versions are not matched, the system interrupts program execution through consistency verification and an interlocking controller, and a version switching manager is started; and the version switching manager automatically closes the current environment according to the version identifier, searches a version information base, switches the software of the upper computer, synchronously updates the firmware of the lower computer to a target version, and restores the test after the environment verification is passed. Through binding during compiling and forced verification during loading, automatic and accurate switching of the test environment is achieved, the problems that manual switching is prone to errors and software and hardware collaboration is poor are solved, and the test risk and the maintenance cost are remarkably reduced.

The invention relates to an automatic code spraying test line for a ceramic heating sheet. The automatic code spraying test line comprises a base, a jig return line, a withstand voltage detection module, a resistance detection module, an NG blanking module, a code spraying module, a code scanning module, a blocking module and a plurality of jigs, a feeding station, a withstand voltage detection station, a resistance detection station, an NG discharging station, a code spraying station, a code scanning station and a discharging station which are arranged in sequence are formed on the jig return line; the withstand voltage detection module is arranged at the withstand voltage detection station; the resistance detection module is arranged at the resistance detection station; the NG blanking module is arranged at the NG blanking station; the code spraying module is arranged at the code spraying station; the code scanning module is arranged at the code scanning station; blocking modules are arranged at the multiple stations. And the plurality of jigs are arranged on the jig return line and circularly move on the jig return line. According to the invention, the problem that products with inaccurate code spraying information possibly flow to the market in the existing automatic testing equipment for the ceramic heating sheet is solved.

The present application relates to a kind of porous ceramic material size automatic test equipment and method, belong to image measurement technical field.Test method includes: step S1, multiple sample numbers and in order are placed into each sample compartment of material taking frame, and blank material receiving frame is placed in material taking frame side;Step S2, according to the size specification of sample, the size of material taking frame and material receiving frame, sample quantity, set the sampling program and sample receiving program of mechanical arm;Step S3, according to the size specification of sample, set the measurement program of image measuring instrument measurement sample size;Step S4, according to sampling program, control mechanical arm from material taking frame sampling and place in image measuring instrument;According to measurement program, control image measuring instrument to sample size measurement;According to sample receiving program, control mechanical arm and sample receiving to material receiving frame in, until complete the measurement of all samples.The present application can realize the accurate test of large batch sample size, improve test efficiency and accuracy.

The invention discloses an active shock absorber test system, a test method, test equipment and a storage medium. The active shock absorber test system comprises a configuration module in which a parameter search space is stored; the automatic test module is used for controlling the active shock absorber and can obtain test data; the parameter selection module is used for inputting calibration parameters into the controller; and the data processing module is used for analyzing the test data to obtain a comprehensive performance score. The active shock absorber test method comprises the following steps: defining a parameter search space; performing formal testing by using the calibration parameters; analyzing to obtain a performance comprehensive score; repeating formal testing and data analysis; and outputting calibration parameters. The automatic test device for the automobile active damper comprises a processor configured to execute the steps of the active damper test method; and a memory storing processor executable instructions. Computer program instructions are stored in the computer readable storage medium, and the steps of the active shock absorber testing method are achieved when the program instructions are executed.

A method performed by automated test equipment (ATE) includes power cycling a solid state drive (SSD) device under test by the ATE, wherein the SSD device includes a memory controller integrated circuit (IC) attached to a printed circuit board (PCB) having a PCB interface; communicating one or more signals between the ATE and the memory controller IC using the PCB interface in a normal system mode; sending a command to cause the memory controller IC to place the PCB interface in a boundary scan mode; remapping a portion of pins of the PCB interface to a boundary scan interface; and communicating one or more boundary scan signals between the ATE and the memory controller IC using the remapped portion of pins of the PCB interface in the boundary scan mode.

This disclosure provides a test circuit, calibration method, and test equipment, wherein the test circuit includes a main control chip and an internal calibration circuit; the internal calibration circuit includes a resistor with a preset resistance value, a relay array, and a correction ADC; the main control chip is used to control the relay array to activate the measurement link in the internal calibration circuit corresponding to the control signal according to the received control signal; the internal calibration circuit is used to receive the test electrical signal, output it to the corresponding correction ADC through the measurement link, and acquire the value of the output electrical signal through the correction ADC. The test circuit provided by this disclosure allows the acquisition of the electrical signal output by the test chip within an ATE (Automatic Test Equipment) device, and the calibration of the test chip based on these electrical signals, integrating the test chip calibration function within the ATE device, thereby improving the integration level of the ATE device.

The utility model provides a kind of abnormal sound test equipment for automobile combination switch, including automatic test equipment main body and be provided in the quiet room of automatic test equipment main body, main control component, automatic feeding component, automatic test component, power supply component, display component, microphone for collecting sound data is equipped in quiet room, automatic test component is set in quiet room, automatic feeding component and automatic test component are respectively set in the inside two sides of automatic test equipment main body and mutually cooperate, main control component is respectively with automatic feeding component, automatic test component, power supply component, display component, microphone control connection, automatic test component is equipped with mutually cooperating combination switch fixing device and combination switch calibration test device. The utility model has the beneficial effect that: it can simulate driving personnel to operate automobile combination switch and test whether it exists abnormal sound.

The present application relates to the field of integrated circuit automatic test equipment, and discloses an asynchronous execution method and system for ATE test machines.The asynchronous execution method comprises the following steps: an SDK module forms a plurality of executable tasks from test item interface instructions issued by an upper computer and stores the executable tasks in a task stack; the SDK module polls tasks in the task stack, judges the executability of the tasks and processing modules; if the tasks are executable, the SDK module further judges whether lower modules participate; according to the judgment result, the SDK module processes the tasks by itself or distributes the tasks to an ATOS module for processing or distributes the tasks to an FPGA module through the ATOS module for processing; the SDK module, the ATOS module and the FPGA module asynchronously process the assigned tasks at the same time; and after the tasks are completed, the processing results are returned to the task stack; after all subtasks of the current test item are completed, the SDK module loads tasks of the next test item until all test items are completed.

The invention provides a mass production test system for an analog-to-digital converter based on a JESD204B interface, and the system comprises a to-be-tested chip which is provided with the JESD204B interface; the automatic test equipment is in communication connection with the JESD204B interface of the chip to be tested; the signal generator is used for providing an analog input signal and a clock for the chip to be tested and providing a reference clock for the automatic test equipment; wherein the automatic test equipment controls the to-be-tested chip to output a fixed waveform signal, so that the automatic test equipment performs sampling edge alignment based on the fixed waveform signal so as to capture output data of the JESD204B interface for analysis, application layer data is obtained, and a test result is determined based on the application layer data. The test efficiency can be effectively improved, and the complexity of a test architecture is reduced.

The invention belongs to the technical field of high-speed data testing, and discloses a high-speed signal eye pattern testing method and system based on automatic testing equipment, and the method comprises the steps that a high-speed signal configuration vector is divided into a configuration section and an action section, the configuration section is used for rapidly configuring a testing environment, and the action section is used for controlling a testing action; in the action section, constructing a virtual clock as a reference Trigger signal, and synchronizing the virtual clock and a high-speed signal to be detected to the same sequence group; performing waveform capture on the synchronized high-speed signal to be detected, and generating a two-dimensional array formed by sampling time and level values; the two-dimensional array is processed by a difference peak-valley segmentation method, the eye height, the rising / falling time and the jitter are measured based on a processing result, automatic control, measurement and output of test data can be realized through testing of automatic test equipment, data analysis and processing are facilitated, the test efficiency is improved, and interference of human factors is avoided.