35 results about "Automatic test equipment" patented technology

The present application relates to discrete device testing technology field, especially to a kind of discrete device full automation test equipment with intelligent temperature control and buffer scheduling, setting tool handling unit, visual identification manipulator, at least one tool positioning area, multiple positioning material placing mechanisms, multiple aging test machines and at least one cooling buffer warehouse, multiple positioning material placing mechanisms include at least one to be tested positioning material placing mechanism, at least one tested positioning material placing mechanism, at least one defective positioning material placing mechanism and at least one buffer positioning material placing mechanism;Each positioning material placing mechanism is configured with material placing container, and the material placing container is configured to store multiple discrete devices;It can improve test efficiency and equipment utilization, through full-process unmanned collaborative work, multiple aging test machines synchronous test, non-stop buffer replacement and seamless connection of temperature control and equipment scheduling, avoid time-consuming and equipment emptying, plugging problem of artificial operation, significantly improve test pace and equipment utilization.

The present application relates to a kind of porous ceramic material size automatic test equipment and method, belong to image measurement technical field.Test method includes: step S1, multiple sample numbers and in order are placed into each sample compartment of material taking frame, and blank material receiving frame is placed in material taking frame side;Step S2, according to the size specification of sample, the size of material taking frame and material receiving frame, sample quantity, set the sampling program and sample receiving program of mechanical arm;Step S3, according to the size specification of sample, set the measurement program of image measuring instrument measurement sample size;Step S4, according to sampling program, control mechanical arm from material taking frame sampling and place in image measuring instrument;According to measurement program, control image measuring instrument to sample size measurement;According to sample receiving program, control mechanical arm and sample receiving to material receiving frame in, until complete the measurement of all samples.The present application can realize the accurate test of large batch sample size, improve test efficiency and accuracy.

This disclosure provides a test circuit, calibration method, and test equipment, wherein the test circuit includes a main control chip and an internal calibration circuit; the internal calibration circuit includes a resistor with a preset resistance value, a relay array, and a correction ADC; the main control chip is used to control the relay array to activate the measurement link in the internal calibration circuit corresponding to the control signal according to the received control signal; the internal calibration circuit is used to receive the test electrical signal, output it to the corresponding correction ADC through the measurement link, and acquire the value of the output electrical signal through the correction ADC. The test circuit provided by this disclosure allows the acquisition of the electrical signal output by the test chip within an ATE (Automatic Test Equipment) device, and the calibration of the test chip based on these electrical signals, integrating the test chip calibration function within the ATE device, thereby improving the integration level of the ATE device.

This invention relates to an automatic testing device and control method for a handheld terminal, comprising a frame composed of several supports and cover plates. The internal space of the frame is divided into a testing area and an electronic control area by partitions and supports. An electronic control module is located inside the electronic control area. A first control module is mounted on the side wall of the partition in the testing area, and a second control module is mounted on the first control module. The first control module is used to enable lateral movement of the second control module on the first control module. A third control module for changing the position of the handheld terminal is located at the bottom of the frame. The first control module includes a first synchronization belt. The advantages of this structure are that it solves the problems of low testing efficiency, large errors, complex structure, and testing of handheld terminals using only one or two control axes in existing handheld terminal testing methods.

The application discloses a kind of FPGA-based timing generator resolution and linearity promotion method and system, belong to automatic test equipment technical field.For the problem that existing FPGA timing generator is difficult to consider high resolution, large dynamic range and high linearity, the application adopts multi-phase clock and carry chain coarse, fine delay line to form three-stage time interpolation architecture, to realize picosecond-level interpolation of large dynamic range with very few logic resources;At the same time, the actual physical delay is obtained by constructing a time measurement channel in the chip, and is transmitted to the host computer to execute the selection algorithm, and the target delay code with the smallest integral nonlinear error is selected to update the delay code table.The application effectively overcomes the nonlinear deviation caused by the underlying hardware wiring, significantly improves the accuracy of timing edge placement and the system test rate, and is mainly used for generating high-precision timing signals in digital integrated circuit automatic test equipment.

The utility model belongs to the mainboard test technical field especially relates to a kind of automatic test equipment of wired PCBA mainboard.It includes rack, and the two sides of rack are equipped with inlet and discharge port;Assembly line component is installed in the rack, and assembly line component is connected from inlet to discharge port, for transporting PCBA mainboard to be measured;Jig box is equipped in the below of assembly line component, and jig box is equipped with lower mould component;First driving mechanism is connected with assembly line component, for driving assembly line component to move downwards to make PCBA mainboard to be measured and lower mould component be connected;Upper mould component and second driving mechanism are equipped in the above of assembly line component, for driving upper mould component to move downwards to carry out the test of the lower pressure connection to PCBA mainboard to be measured.The utility model can be not interrupted, not separate main production assembly line without interruption, quickly, automatically, reliably complete test, realize the seamless embedding of PCBA mainboard test link, optimize production process, reduce manpower cost, improve test efficiency and product quality.

The application discloses a kind of multi-station automatic QT test equipment, belong to test equipment technical field, including base frame, assembly line, test piece conveying line, qualified piece conveying line, carrier disc backflow conveying line, defective product conveying line and lifting positioning transfer line assembly, the left end and right end of assembly line are respectively equipped with discharge mechanism and feeding mechanism, by above-mentioned mode, in the present application, feeding mechanism, discharge mechanism, test piece conveying line, qualified piece conveying line, carrier disc backflow conveying line and lifting positioning transfer line assembly constitute the circulation of carrier disc conveying, realize the automatic QT test of test piece, and multiple lifting positioning transfer line assembly and multiple multi-station test mechanism cooperate simultaneously to test piece conveying line on test piece take and place and test, and each multi-station test mechanism simultaneously tests multiple test pieces, reduces test time, significantly improves test efficiency, simultaneously, unqualified piece is placed on defective product conveying line and temporarily stored, waits subsequent processing.

This invention discloses an automatic testing device for air conditioners and an air conditioner. The former includes a communication module and a control processing module. The control processing module can communicate with the air conditioner through the communication module. Multiple first communication messages are preset, each including a data flag and data. The parsing capability of the data flag is determined by setting the bit value corresponding to the data. Each first communication message can control the air conditioner to operate in different modes or functions. The control processing module is configured to send each first communication message to the air conditioner in a test sequence. The air conditioner parses or discards the corresponding data based on the bit value of the data flag. This invention automates air conditioner testing by sequentially setting multiple first communication messages and controls data parsing and discarding by setting data flags in each first communication message with the same protocol format, thereby reducing testing difficulty and improving testing efficiency.

The utility model discloses a socket gauge test equipment, it includes control circuit, motor module, gauge movement module, gauge tray and socket movement module, motor module with control circuit electricity is connected, socket movement module is used for fixing the socket of waiting for testing, gauge tray is used for placing the gauge of waiting for testing socket corresponding, control circuit controls motor module drive gauge movement module and socket movement module, control circuit is used for controlling the gauge of gauge movement module snatchs clamp in gauge tray and clamps the target gauge, and control target gauge carries out gauge test to the socket of waiting for testing, the utility model technical scheme can gather the plurality of test of traditional plurality of artificial operation to one automatic test equipment, has realized the automatic gauge test of socket, has improved the detection efficiency of laboratory to socket, has reduced a large number of manual operation, has guaranteed the accuracy of test data, reaches the effect of reducing cost and increasing efficiency.

The application discloses a display panel, a display master and a display device. The first type of pads and the light emitting elements are located on the same side of the substrate in the display panel. The first type of traces includes a first end portion, the first end portion is located on the same side of the substrate as the first type of pads, the first type of pads and the first end portion are arranged along a first direction, and along the first direction, the first end portion and the first type of pads at least partially overlap; wherein, the size of the first end portion along the first direction is W1, the size of the first type of pads along the first direction is W2, the size of the first end portion along a second direction is L1, the size of the first type of pads along the second direction is L2, and W1 / L1>W2 / L2. In this way, the first end portion and the light emitting elements are located on the same side of the substrate, that is, the test position is located on the front surface of the display panel during automatic testing, and the reliability of the test can be improved. In addition, the width-length ratio of the first end portion is large, which facilitates the automatic detection requirement of the automatic test equipment, thereby improving the detection efficiency of the automatic detection and the reliability of the display panel.

The utility model relates to vehicle control ware test technical field, concretely is a kind of vehicle control ware FCT automation test device, contain automation test platform and multifunctional test system, automation test platform is realized controller automatic feeding and discharging by linear slide module group drive pneumatic fixture, adjustable test needle bed is compatible with different size controller interface, multifunctional test system integrates programmable power array analog storage battery fluctuation, high-precision acquisition module synchronous acquisition multichannel signal, multi-protocol communication unit resolves CAN FD / SENT data, load simulation and fault injection unit test driving ability and abnormal working condition. Host system executes test sequence by industrial computer, and scanning code gun is associated serial number and test data, realizes whole-process automation test. The equipment supports dynamic power test, signal synergy analysis and communication reliability verification, single-piece test time is not more than forty-five seconds, significantly improves test efficiency and quality consistency.

A semiconductor automatic testing equipment includes a housing, a main board, a plurality of extension boards, a plurality of intermediate seats and a plurality of function boards. The main board is arranged in the housing and is divided into an extension board area and a function board area. The main board is provided with a plurality of docking interfaces. Each extension board is arranged in the extension board area, and each function board is arranged in the function board area and has a connecting seat corresponding to the docking interface. Each extension board and the function board matched therewith are in the docking interface, are accurately aligned and are electrically connected through one of the plurality of intermediate seats, thereby improving the assembly efficiency and the docking stability.

This invention discloses a connection device, system, and method for an automatic testing equipment. The automatic testing equipment's channel signal terminals are configured into multiple modules, with the same number and identical signal connection points in each module. The drive module of the connection device drives a signal transfer module to move according to drive control commands. The arrangement of the multiple contacts in the signal transfer module is the same as the arrangement of the signal connection points in the module. When the signal transfer module moves to the corresponding position in the module, the contacts of the signal transfer module are electrically connected to the corresponding signal connection points of the module. A switching module connects at least a portion of the signal connection points in the module to external instruments through corresponding contacts according to switching control commands, forming a complete channel signal. This invention reduces design complexity, allows for the simultaneous connection of multiple channel signal terminals and external instruments, improves connection efficiency, and enhances the efficiency of testing, calibration, or diagnostic operations.

The application provides an interface automatic switching device. Since there are many types of external devices at present, the interface types are diversified, the interface plugging and switching function verification of different types of external devices usually depend on manual work, the workload of interface testing is large, and errors and omissions are easy to occur. Related automatic testing equipment is usually large in size and complex in operation, and testing personnel need to spend a lot of time to be familiar with specific operation, which greatly affects the efficiency and experience of testing personnel. The application sets a plurality of relatively independent first interfaces and second interfaces on both sides of the device, and at least two interfaces of the same type are arranged on different sides, and the switching module is used to realize the on-off and switching between the interfaces on both sides. By correspondingly arranging different types of interfaces on both sides, a plurality of interfaces can be compatible for synchronous testing, and the interface testing efficiency is effectively improved. Moreover, more than two interfaces of the same type are arranged, which can simultaneously meet the interface plugging and switching requirements, and the overall structure is simple and convenient to operate.

This invention proposes a WIFI intelligent calibration method and device. It constructs a wireless communication benchmark fingerprint map containing multi-dimensional physical parameter mapping relationships in a laboratory testing environment. During testing, a multi-dimensional feature vector is constructed based on dynamic environmental parameters and input into a radio frequency behavior prediction model to generate expected compensation data. The expected compensation data includes the expected compensation gain and error uncertainty index corresponding to the test point. When the error uncertainty index is lower than the accuracy tolerance threshold, the expected compensation gain is used to adjust the parameters of the radio frequency signal chain. When the error uncertainty index is higher than the accuracy tolerance threshold, a rapid supplementary test action is triggered for the test point. The model deviation is corrected by measuring physical quantities. In the testing process, a lightweight radio frequency behavior prediction model replaces traditional full-quantity physical measurements, thereby greatly improving the throughput of automated testing equipment while maintaining high accuracy.

This invention belongs to the field of high-speed data testing technology and discloses a method and system for testing high-speed signal eye diagrams based on automated testing equipment. The method includes: dividing the high-speed signal configuration vector into a configuration segment and an action segment. The configuration segment is used for quickly configuring the test environment, and the action segment is used for controlling test actions. In the action segment, a virtual clock is constructed as a reference trigger signal, and the virtual clock is synchronized with the high-speed signal under test to the same sequence group. The synchronized high-speed signal under test is waveform captured to generate a two-dimensional array composed of sampling time and level value. The two-dimensional array is processed using a differential peak-valley segmentation method, and eye height, rise / fall time, and jitter are measured based on the processing results. Automated testing equipment enables automated control, measurement, and output of test data, facilitating data analysis and processing, improving testing efficiency, and avoiding human interference.

A power supply filter circuit (100) includes a transistor (120), a control capacitor (130), and a stabilizing capacitor (140). The load path of the transistor is coupled between the input terminal (110) and the output terminal (112) of the power supply filter circuit. The control capacitor is coupled between the control terminal of the transistor and a reference potential conductor (GND). The stabilizing capacitor is coupled between the source terminal of the transistor and the reference potential conductor. The power supply filter circuit is configured to regulate the voltage across the load path of the transistor or the voltage between the input terminal and the output terminal of the power supply filter circuit. A power supply arrangement structure, an automated test apparatus, and a method for actively filtering power supply voltages are also described.

The utility model discloses a double cam self -centering formula pressure resistance testing arrangement relates to automatic test equipment technical field. The pressure resistance testing arrangement includes the lower pressure mechanism and sets up the double cam self -centering mechanism at the bottom of lower pressure mechanism, the lower pressure mechanism includes the slide platform air cylinder, the floating plate, the upper electrode, the guide pin, the support plate that set up in proper order, and the opposite sides of support plate are equipped with the inner electrode and the outer electrode, and the slide platform air cylinder can drive the floating plate and do the reciprocating motion of vertical direction, the double cam self -centering mechanism includes cam slide slot board, drive cylinder and cam follower, and the cam slide slot board sets up at the bottom of support plate, and drive cylinder is connected at the bottom of cam slide slot board, and the linear guide is equipped on the cam slide slot board, and the cam follower is connected with cam slide slot board. The utility model provides a double cam self -centering formula pressure resistance testing arrangement, can hold the inner diameter and the outer diameter of product simultaneously, and simple operation improves the efficiency to a great extent.

This application relates to the technical field of chip testing, and in particular to an automatic testing device and method for laser chips. The automatic testing device includes a frame, a conveyor belt, a current detector, and a feeding device. The feeding device is located at the starting end of the conveyor belt and includes a feeding seat and a pushing component. A feeding slot for placing the laser chip is formed on the top surface of the feeding seat. A pushing slot and an ejection slot are formed on the side of the feeding seat, and the starting end of the conveyor belt is connected to the ejection slot. The pushing component is used to push the laser chip from the feeding slot into the ejection slot onto the conveyor belt. A limiting channel is provided on the conveyor belt, and the limiting channel is connected to the ejection slot. The technical solution provided by this application enables the laser chip to face the end of the conveyor belt, eliminating the need for circular holes in the conveyor belt and rotating disks within these holes. This helps reduce the manufacturing difficulty and cost of the conveyor belt, and the conveyor belt is less prone to sagging, ensuring stable transport.

This application provides an automated testing device for power module testing, including a control module for executing test sequences and generating corresponding control commands; a pin management module for switching the interfaces of various test resource modules, connecting the interfaces to the corresponding pins of the power module under test, and switching and activating the corresponding test resource modules to the pins of the power module under test according to the control commands; a power testing module, connected to the pin management module, for configuring and providing the operating basis of the power module under test and simulating the actual working state of the power module under test; a sampling module for sampling the current and voltage of the power module under test during operation and outputting current sampling signals and voltage sampling signals; and a data acquisition module connected to the sampling module through the pin management module for acquiring the current waveform in the current sampling signal and the voltage waveform in the voltage sampling signal. This application can accurately determine whether there are defects in the power module under test, thereby improving the quality of shipments.

The present application relates to the technical field of automatic test equipment, and discloses an energy consumption intelligent control method and system of ATE automatic test equipment, the system comprising a working condition load module, a central control module, a power supply adjustment module and a humidity control module, the method collecting the load power and the current temperature value of the test station through the working condition load module, and inputting multiple data models in combination with the test node state to output the operating condition. The partition power supply module interrupts the physical power supply circuit in the idle state or the deep standby state according to the operating condition; the power supply adjustment module reduces the output voltage of the high-power switching power supply in the light load test state, and disconnects the main output circuit in the deep standby state; and the central control module generates a pulse modulation signal according to the current temperature value to adjust the speed of the fan. The present application realizes independent power-off of the test station, dynamic voltage regulation and hibernation of the high-power switching power supply, and fan speed regulation, and reduces the overall wiring of the test equipment.

This invention relates to a static parameter INL testing method based on a bipolar DAC, belonging to the field of electronic component testing technology. It solves the problems of complex hardware structure or difficult software programming in existing bipolar DAC static parameter INL testing methods. The method includes: connecting the bipolar DAC under test to an ATE (Automatic Test Equipment); connecting the DAC's most significant digital input pin to the ATE without an inverter; performing positive and negative polarity INL tests on the DAC, including: the ATE sending a digital input ladder waveform to the non-most significant digital input pin of the bipolar DAC, and controlling the most significant digital input pin to maintain a low input level during the positive polarity test and a high input level during the negative polarity test; simultaneously, synchronously acquiring the voltage output of the DAC's analog output pin during the current polarity INL test; obtaining the measured INL value based on the synchronous acquisition results of the positive and negative polarity INL tests; if the measured INL value is within the INL criterion range, the test passes; otherwise, the test fails.

1. Name of the product in this design: Automatic Durability Testing Equipment. 2. Purpose of this design: For durability testing of in-vehicle central control screens. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.