379 results about "Automatic test equipment" patented technology

The invention discloses a fault analysis method for vehicle-mounted automatic test equipment, and relates to the technical field of vehicle-mounted electronic equipment testing, and the method comprises the steps: collecting vehicle-mounted test data of the vehicle-mounted automatic test equipment, and storing the vehicle-mounted test data in a test database according to a time sequence; performing feature extraction on the test database through a deep learning model to generate a fault feature vector; inputting the fault feature vector into a fault diagnosis model, and generating a fault type judgment result and a fault probability value; and according to the fault type determination result and the fault probability values, screening corresponding fault recovery schemes from a preset fault recovery strategy library, and sorting the fault recovery schemes according to the fault probability values from high to low to form a fault processing report. According to the method, the fault processing report is generated based on the layered fault recovery strategy library and the priority grading mechanism, the technical problems that a traditional fault diagnosis method is insufficient in feature extraction and low in diagnosis precision are solved, and the accuracy and recovery efficiency of fault diagnosis are improved.

The invention, which relates to the technical field of equipment simulation testing, discloses a simulation evaluation method for automatic testing equipment of an in-vehicle infotainment system, and the method comprises the steps: collecting operation test data, carrying out the recognition processing through a deep convolutional neural network model, obtaining test task data, constructing a test action sequence, mapping the test action sequence into a control instruction, and carrying out the simulation evaluation of the in-vehicle infotainment system. The control instruction is optimized and adjusted according to a preset action rule base; driving the in-vehicle automatic test equipment to execute the control instruction to complete the test operation, recording the operation response time and interface state change data in the test process, calculating a movement track deviation value, calculating a test accuracy score, and when the test accuracy score is smaller than a preset threshold value, starting the in-vehicle automatic test equipment; and if not, supplementing the optimization parameters to the preset action rule base and triggering a new test. According to the invention, accurate control of the test equipment is realized by adopting the TCP / IP communication protocol, and the test strategy is continuously optimized by dynamically updating the preset action rule base, so that the automatic test efficiency of the vehicle machine is improved.

The invention discloses a calibration method and system of ATE test equipment. The calibration method comprises the steps of obtaining calibration data, performing self-compensation and measuring and calibrating a tested single board through a calibration device. The step of obtaining the calibration data comprises the steps of selecting one FPGA from the to-be-tested single boards as a calibration source, calibrating and calibrating the calibration source, calibrating the to-be-tested single board where the calibration source is located as a calibration device through the calibration source, and taking time delay data between a calibration device signal and a calibration source signal as the calibration data. The self-compensation comprises the following steps: compensating the signal delay of the calibration device according to the calibration data, and ensuring that the calibration device provides a reference synchronization signal for the tested single board. The FPGA is adopted as a calibration source, calibration of the test equipment can be completed without an external TDC calibration board, the limitation of the number of channels of a traditional TDC calibration board is broken through, and the accuracy and reliability of a calibration result are also improved.

Example automatic test equipment (ATE) includes a transmitter to output a waveform to a transmission line; circuitry to detect data for the waveform on the transmission line, with the circuitry being configured to scan the waveform across a range of times and across a range of voltages to obtain the data for the waveform; and memory to store the data detected by the circuitry.

The embodiment of the utility model discloses full-automatic testing equipment, the full-automatic testing equipment comprises a first conveying unit and a testing device, the testing device comprises a first transfer unit, a testing unit, a testing instrument and an upper computer, the first conveying unit is arranged on one side of the first transfer unit, and the testing unit is arranged on the other side of the first transfer unit. The conveying unit is used for conveying a to-be-tested plate to the first transfer unit; the first transfer unit is arranged on one side of the test unit and is used for conveying the to-be-tested plate to the test unit; the upper computer is connected with the test instrument, and the test instrument is connected with the to-be-tested plate through the test unit. By applying the full-automatic test equipment provided by the embodiment of the utility model, the test process can be fully automatically realized, manual participation is reduced, and compared with a semi-automatic mode in the prior art, the test efficiency of the full-automatic test equipment is greatly improved.

Disclosed is a test aid unit that is installed between automatic test equipment (ATE) and a device under test (DUT), generates a test data signal according to a data processing and transmission / reception rate of the DUT in response to a control signal transmitted from the ATE, transmits the test data signal to the DUT, self-tests a test result signal transmitted from the DUT, and transmits the test result to the ATE. The test aid unit includes a clock signal divider, an integrated digital logic unit, a transmitter, and a receiver.

The utility model discloses an ICT automatic test device comprising a cabinet, a rotating disc and an ICT test mechanism, the rotating disc is rotatably arranged in the middle of the cabinet, and the rotating disc is provided with a test station; the ICT testing mechanism is arranged on the machine case and located on one side of the testing station, the ICT testing mechanism comprises a testing support, a lifting module and an ICT tester, the testing support is fixedly arranged on the machine case, the lifting module is fixedly arranged on the testing support, the ICT tester is fixedly arranged on the lifting module, the lifting module drives the ICT tester to move up and down, and the ICT tester is fixedly arranged on the lifting module. A detection probe is arranged at the bottom of the ICT tester, and the ICT tester and the detection probe are located above the test station. And when the microphone circuit board rotates to the test station through the turntable, the lifting module drives the ICT tester to descend, so that the detection probe is in contact with the microphone circuit board, and the ICT test of the microphone circuit board is realized.

The invention relates to an antenna device comprising a quad-ridged waveguide, an open end of which is configured to act as a radiating aperture, and an orthomode transducer, OMT, configured to couple the quad-ridged waveguide to two feed structures.

An automated test equipment, ATE, for testing a device under test, DUT, is configured to obtain a testing profile indicating an evolution of a DUT temperature during an execution of a given test flow. The automated test equipment is configured to analyze the testing profile, in order determine an information describing a plurality of temperature peaks using a fitting approach. The automated test equipment is configured to obtain a plurality of temperature control instructions for an execution of a test flow on the basis of the information describing the plurality of temperature peaks.

The invention discloses a method and a system for displaying a test waveform of ATE (automatic test equipment), and belongs to the technical field of automatic test, and the method comprises the following steps: receiving a waveform display request sent by an upper computer, the waveform display request comprising a trigger condition for triggering a logic controller to store waveform digital information; triggering conditions in the waveform conversion request are set to a register address corresponding to the logic controller, a pattern program is executed, test data are sent to a tested device, and return data of the tested device are received; after the pattern program is executed, the waveform digital information is obtained from a register address corresponding to the logic controller, and the waveform digital information is all test data and return data which are started to be stored by the logic controller after a trigger condition is met; and analyzing and converting the waveform digital information, and forwarding the waveform digital information to an upper computer for waveform analog signal display. According to the application, a section of waveform at any time node is captured in real time, the time sequence problem of a pattern program is quickly positioned by comparing the captured waveform signal with the pattern time sequence, the debugging period is shortened, and the development difficulty is reduced.

The invention relates to the technical field of circuit board detection equipment, in particular to a PCB voltage detection device which comprises a detection mechanism, the detection mechanism comprises a detection table, a bottom plate is arranged on the detection table, a square cover is arranged above the bottom plate, ATE automatic test equipment is arranged in the middle of the square cover, telescopic curtain cloth is arranged at the lower end of the square cover, and a sealing strip is arranged below the telescopic curtain cloth. And the ATE is fixed on the side plate of the detection table through a first electric telescopic rod. The detection environment is filled with nitrogen, moisture and oxygen in the air are prevented from interfering the voltage detection accuracy, and meanwhile the size of the cover formed by the square cover, the telescopic curtain cloth and the sealing strip can adaptively change along with the height of the PCB. The amount of nitrogen filled into the cover formed by the square cover, the telescopic curtain cloth and the sealing strip also changes along with the volume of the cover formed by the square cover, the telescopic curtain cloth and the sealing strip, and the square cover and the telescopic curtain cloth are matched with each other, so that waste caused by insufficient or excessive nitrogen filling amount is prevented, and meanwhile, PCBs of various models can be detected.

The invention provides an automatic test system and method for a third-party high-power repeater, and relates to the technical field of automatic test equipment, and the system comprises an integrated reconfigurable passive link box, a control host, a vector signal generator and a vector signal analyzer. The integrated reconfigurable passive link box comprises a box body, a radio frequency switch matrix network, an embedded function network, a control port, an input port, an output port, an uplink interface and a downlink interface. The radio frequency switch matrix network and the embedded function network are arranged in the box body. The input port, the output port, the uplink interface and the downlink interface are arranged on the surface of the box body. The vector signal generator is connected with the input port, the vector signal analyzer is connected with the output port, and a third-party high-power repeater to be tested is arranged between the uplink interface and the downlink interface. According to the invention, the radio frequency switch matrix network and the embedded function network are packaged in the integrated reconfigurable passive link box, and the control host is utilized to carry out automatic testing on the third-party high-power repeater according to the preset process, so that frequent operation processes are avoided, and damage to instruments is reduced.

The invention belongs to the field of visual inspection, and particularly relates to a chip packaging multi-dimensional defect intelligent detection system which comprises a plurality of modules and a subsystem. Wherein the electric-thermal linkage detection module consists of ATE (automatic test equipment) and a thermal infrared imager, and is used for acquiring an electric parameter matrix and a thermal imaging matrix of a chip; the multi-dimensional vision detection module comprises an X-ray tomography unit, a 3D structured light imaging unit and a plane vision unit; the reconstruction module is used for reconstructing an internal structure of the chip, acquiring 3D surface topography and extracting plane defect features; the multi-modal feature fusion module is based on a cross-modal attention mechanism and a multi-task joint learning model to fuse electric-thermal data, X-ray voxel features and 3D morphology features; the hierarchical defect decision-making subsystem locates a defect area through FastR-CNN, classifies defect types through a graph convolutional network, and outputs a final defect judgment result based on Bayesian reasoning network by integrating multi-modal evidence; through multi-modal data linkage, joint detection of cavities, heat dissipation and appearance defects can be realized.

The invention relates to the technical field of optical communication, and provides COB automatic test equipment, which comprises an aging strip trolley, a bonding strip stock bin, a material taking device and a test mechanism, and is characterized in that the aging strip trolley is used for storing aging strips, the bonding strip stock bin is used for storing bonding strips with COB, and the material taking device is used for testing the bonding strips with COB. The transfer mechanism is used for transferring the COB between the bonding strip and the aging strip, and the testing mechanism is used for testing the COB before aging and testing the COB after aging. The invention also provides a COB automatic test method. According to the invention, automatic COB testing can be realized, the problem of poor wire collapse caused by manual handheld COB plugging and unplugging is avoided, manpower is reduced, the efficiency and the product are improved, and the cost is greatly saved.

The present invention relates to the technical field of capacitor aging testing, and discloses a fully automatic testing device for capacitor aging testing, including a testing table, a conveyor, a first alignment mechanism, a second alignment mechanism and a material transfer mechanism; a capacitor testing circuit board is embedded on one side of the top of the testing table, a capacitor waveform monitoring display is arranged beside the testing table, and the capacitor waveform monitoring display is electrically connected to the capacitor testing circuit board through a wire; the conveyor is arranged on the other side of the top of the testing table, and the conveyor is used for conveying capacitors; the first alignment mechanism and the second alignment mechanism are sequentially arranged upstream of the conveyor and along the conveying direction of the conveyor; the first alignment mechanism is used to adjust the positive and negative pins of each capacitor on the conveyor to the same horizontal plane; the second alignment mechanism is used to adjust the azimuth of the positive pins or the azimuth of the negative pins of each capacitor on the conveyor to the same side of the capacitor; the improvement of the testing efficiency and the improvement of the degree of testing automation are realized.

The invention provides an automatic test device and method for a rigid bearing plate method on-site rock mass in-situ deformation test. The device comprises a loading unit, a displacement acquisition unit, a portable in-situ test terminal and a multifunctional data collection and pressure control integrated device. The loading unit and the displacement acquisition unit are connected with the multifunctional data collection and pressure control integrated device; and the multifunctional data collection and pressure control integrated device is in communication connection with the portable in-situ test terminal. According to the rigid bearing plate method on-site rock mass in-situ deformation test automatic test equipment and method, deformation / displacement and pressure are measured in a non-manual reading mode, data are sent to an acquisition instrument in a wireless transmission mode, meanwhile, an electric pressure control device is adopted to accurately control loading and unloading of pressure, and the test efficiency is improved. And a portable in-situ test terminal is adopted to control and monitor the whole test process, so that in-situ rock mass mechanical parameters are accurately obtained, and the test efficiency and the reliability and accuracy of test data are improved.

The invention discloses automatic test equipment, a chip test method, a chip test device and a medium, which are used for implementing pre-test by adopting a preset rule before a chip mass production test so as to detect whether a chip mass production test environment is normal or not, thereby improving the working efficiency and the accuracy of the mass production test. In one embodiment, an apparatus includes: a memory to store program instructions; the processor calls a program instruction stored in the memory, and executes according to an obtained program: when a preset triggering condition for executing a chip test is met, the sorting machine is notified to execute a preset action, so that the to-be-tested chip is put into the test seat of the test area; and when a preset test starting signal fed back by the sorting machine is received, the local automatic test equipment is switched to a preset test mode, the current to-be-tested chip on the test seat is tested, and a test result is fed back to the sorting machine, so that the sorting machine performs automatic test on the current to-be-tested chip according to the received test result. And executing a preset action corresponding to the test result.

The present invention belongs to the field of visual inspection, in particular to an intelligent multi-dimensional defect detection system for chip packaging, including multiple modules and a subsystem; among them, the electro-thermal linkage detection module is composed of an ATE automatic test equipment and an infrared thermal imager, which collects the electrical parameter matrix and thermal imaging matrix of the chip; the multi-dimensional visual detection module includes an X-ray tomography imaging unit, a 3D structured light imaging unit and a planar vision unit; it is used to reconstruct the internal structure of the chip, obtain the 3D surface topography and extract the planar defect features; the multi-modal feature fusion module is based on the cross-modal attention mechanism and multi-task joint learning model to fuse the electro-thermal data, X-ray voxel features and 3D topography features; the hierarchical defect decision subsystem locates the defect area through FastR-CNN, classifies the defect types through the graph convolutional network, and outputs the final defect determination result based on the Bayesian inference network by integrating multi-modal evidence; through the multi-modal data linkage, the joint detection of voids, heat dissipation and appearance defects can be realized.

The invention relates to the technical field of data storage, and discloses a method and system for optimizing test data collected by a memory chip based on machine learning, and the method comprises the steps: collecting original test data from a test platform of a to-be-tested memory chip; constructing a convolutional neural network model, learning a mapping relationship between test data features and memory defects through the convolutional neural network model, training the convolutional neural network model through the collected original test data, optimizing parameters of the convolutional neural network model according to a training result through a back propagation algorithm, and obtaining memory defects through the optimized parameters. The performance of the convolutional neural network model tends to be stable; converting a parameter vector output by the convolutional neural network model into a test vector executable by ATE; and taking the generated test vector as a new training sample, feeding back the new training sample to an original test data updating data set, and iteratively training and optimizing the convolutional neural network model. According to the invention, intelligentization of the test process is realized, and hidden defects sensitive to voltage and time sequence can be effectively captured.

55 Power Supply Filter Circuit, Power Supply Arrangement, Automated Test Equipment and Method for Actively Filtering a Supply Voltage Abstract 5 A power supply filter circuit (100), comprises a transistor (120), a control capacitor (130) and a stabilization capacitor (140). A load path of the transistor is coupled between an input (110) of the power supply filter circuit and an output (112) of the power supply filter circuit. The control capacitor is coupled between a control terminal of the transistor and a reference potential conductor (GND). The stabilization capacitor is coupled between a source terminal 10 of the transistor and the reference potential conductor. The power supply filter circuit is configured to regulate a voltage across the load path of the transistor or a voltage between an input of the power supply filter circuit and an output of the power supply filter circuit. A Power Supply Arrangement, an Automated Test Equipment and Method for Actively Filtering a Supply Voltage are also described. 15 Figure 1

An automated test equipment (ATE) for testing semiconductor devices, the test equipment comprises a test handler, a spare part, or a contactor socket, and a semiconductor devices tester, The spare part comprises an electronic component for storing and / or processing data regarding the spare part or a portion thereof, The test equipment comprises an operator terminal comprising a display or GUI and a data exchange interface which is connected or connectable to the electronic component within the spare part, for at least displaying data stored therein. The ATE further comprises a data buffer unit for buffering the data, a maintenance planning and control unit for planning and controlling maintenance actions of the test equipment, and a dedicated database residing in a control computer.

The invention relates to the technical field of roller testing, and discloses roller jumping and deflection automatic testing equipment which comprises a testing table, a testing seat and a control display are arranged on the outer wall of the top of the testing table, a six-axis robot is arranged on one side of the testing table, a first mechanical claw is arranged on the six-axis robot, and a second mechanical claw is arranged on the other side of the testing table. A lifting plate is arranged right above the testing seat, a driving mechanism is arranged on the lifting plate, a pair of first mounting plates is fixedly connected to the outer walls of the two sides of the bottom of the lifting plate, a first rotating roller is rotationally connected between each pair of first mounting plates, and a rotating mechanism is arranged at one end of one first rotating roller. By arranging the six-axis robot and the first mechanical claw, the rolling wheel needing to be tested can be automatically taken, the error caused by manual placement is replaced, when the rolling wheel is tested, the rolling wheel can be irregularly pressed, the situation that a person uses the rolling wheel is simulated, and the testing accuracy is greatly improved.

The invention belongs to the technical field of power-assisted steering lock testing, and particularly relates to automatic testing equipment for an automobile power-assisted steering lock, which comprises a testing workbench and a power-assisted steering lock main body, and is characterized in that a positioning base is fixedly mounted at the center of the bottom of a layout groove, and a rotating seat is slidably mounted at the top of the positioning base; a rotating inserting column is rotationally installed at the top of the rotating base, and a torque sensor is installed at the lower end of the rotating inserting column. According to the invention, when the servo motor drives the linear bidirectional screw rod to rotate, the moving plate support can move synchronously with the supporting moving block on the left side, when the active sliding table is just in contact with the passive sliding block, the moving plate support drives the linkage moving plate to move, and the test plug is just aligned to and close to the inlet of the wiring port; when the support moving block continues to drive the active sliding table to move, the test plug is completely inserted into the wiring port on the power-assisted steering lock main body, so that the synchronism of two actions of automatic plugging and automatic positioning is realized, and the operation steps are reduced.

Automatic test equipment (ATE) configured to test devices under test (DUTs) can include a host device tester, one or more load boards, and one or more host bus adapters (HBAs). The host device tester does not support odd sector sizes and / or non-standard sector sizes. The one or more load boards can be communicatively coupled to the host device. The one or more HBAs can be communicatively coupled between respective load boards and one or more respective devices under test (DUTs). The one or more load boards can be configured to communicate with respective HBAs using one or more first communication protocol interfaces. The one or more HBAs can be configured to communicate with the respective DUTs using one or more second communication protocol interfaces. The HBAs can be configured to translate commands and data between the host device tester and the one or more DUTs that support odd sector size or non-standard sector size.

The present application relates to discrete device testing technology field, especially to a kind of discrete device full automation test equipment with intelligent temperature control and buffer scheduling, setting tool handling unit, visual identification manipulator, at least one tool positioning area, multiple positioning material placing mechanisms, multiple aging test machines and at least one cooling buffer warehouse, multiple positioning material placing mechanisms include at least one to be tested positioning material placing mechanism, at least one tested positioning material placing mechanism, at least one defective positioning material placing mechanism and at least one buffer positioning material placing mechanism;Each positioning material placing mechanism is configured with material placing container, and the material placing container is configured to store multiple discrete devices;It can improve test efficiency and equipment utilization, through full-process unmanned collaborative work, multiple aging test machines synchronous test, non-stop buffer replacement and seamless connection of temperature control and equipment scheduling, avoid time-consuming and equipment emptying, plugging problem of artificial operation, significantly improve test pace and equipment utilization.

The utility model relates to an FPC integrated automatic test equipment, including transmission band support, loading transmission band, FPC loading plate, front side test structure, overturn structure, reverse side test structure, the loading transmission band is connected in the transmission band support, a plurality of groups of FPC loading plates are arranged on the loading transmission band at equal intervals, the overturn structure is arranged on the front side test structure, the reverse side test structure is arranged on the reverse side test structure, and the reverse side test structure is arranged on the reverse side test structure. The front testing structure is fixed on the conveying belt support, the overturning structure is fixed on the conveying belt support, and the back testing structure is fixed at the top end of the overturning structure. According to the utility model, the arrangement of the FPC detection structure is optimized, the traditional FPC detection mode is changed, the detection equipment with the overturning function is designed, and the overturning structure is simple, convenient to maintain and use and suitable for popularization and use.

The invention relates to the technical field of optical module automatic test equipment, and discloses optical module automatic test equipment, which comprises an adsorption carrying table, and the adsorption carrying table is rotationally arranged on a machine base through a rotation driving part; the product carrying mechanism comprises a product moving module and a vacuum suction nozzle connected to the output end of the product moving module; the probe card testing mechanism comprises a first moving module, a visual detection module connected to the output end of the first moving module, probe plates symmetrically arranged on the two sides of the visual detection module and a plurality of probes arranged on the probe plates; the optical fiber alignment testing mechanism comprises a second moving module, an optical fiber posture adjusting assembly connected to the output end of the second moving module and an alignment optical fiber connected to the output end of the optical fiber posture adjusting assembly, and an optical fiber tube of the alignment optical fiber faces the product and is used for collecting light emitted by the product to achieve luminous flux detection.

The invention discloses a software ecological management method of automatic test equipment and application thereof, and belongs to the technical field of integrated circuit test. The method comprises the following steps: automatically writing a version identifier containing firmware information of an upper computer and a lower computer when a test program is compiled; when the program is loaded, the system obtains the actual version of the current operating environment and compares the actual version with the version identifier; if the versions are not matched, the system interrupts program execution through consistency verification and an interlocking controller, and a version switching manager is started; and the version switching manager automatically closes the current environment according to the version identifier, searches a version information base, switches the software of the upper computer, synchronously updates the firmware of the lower computer to a target version, and restores the test after the environment verification is passed. Through binding during compiling and forced verification during loading, automatic and accurate switching of the test environment is achieved, the problems that manual switching is prone to errors and software and hardware collaboration is poor are solved, and the test risk and the maintenance cost are remarkably reduced.

The invention relates to an automatic code spraying test line for a ceramic heating sheet. The automatic code spraying test line comprises a base, a jig return line, a withstand voltage detection module, a resistance detection module, an NG blanking module, a code spraying module, a code scanning module, a blocking module and a plurality of jigs, a feeding station, a withstand voltage detection station, a resistance detection station, an NG discharging station, a code spraying station, a code scanning station and a discharging station which are arranged in sequence are formed on the jig return line; the withstand voltage detection module is arranged at the withstand voltage detection station; the resistance detection module is arranged at the resistance detection station; the NG blanking module is arranged at the NG blanking station; the code spraying module is arranged at the code spraying station; the code scanning module is arranged at the code scanning station; blocking modules are arranged at the multiple stations. And the plurality of jigs are arranged on the jig return line and circularly move on the jig return line. According to the invention, the problem that products with inaccurate code spraying information possibly flow to the market in the existing automatic testing equipment for the ceramic heating sheet is solved.

The invention provides a voltage calibration system of a frequency converter. A data transmission channel is established between automatic test equipment and a remote control cloud platform through a communication device; parameters of the automatic test equipment are set through the remote control cloud platform, and the automatic test equipment is controlled to collect the bus voltage of the frequency converter and the output voltage of the control port and visualize the bus voltage and the output voltage; performing parameter adjustment on the frequency converter according to the acquired bus voltage, the control port output voltage, the read bus voltage of the frequency converter and the read control port output voltage, so that the difference value between the bus voltage displayed by the frequency converter and the acquired bus voltage is smaller than a preset voltage threshold value; enabling the difference value between the control port output voltage displayed by the frequency converter and the acquired control port output voltage to be smaller than a preset voltage threshold value; the purposes of automatic acquisition, calibration and detection are achieved, production safety accidents are reduced, and personal safety guarantee is provided for production operators.