376 results about "Equipment under test" patented technology

The invention relates to the field of wireless product testing, and provides a multi-device cooperative closed-loop testing method based on state machine driving, and the method comprises the steps: monitoring the data output of a universal asynchronous receiver / transmitter (UART) interface of a tested device in real time; analyzing the data output by the UART interface of the tested equipment to identify the current running state of the tested equipment; dynamically generating at least one control instruction according to a preset state transition rule set and the identified current operation state; distributing the at least one control instruction to corresponding external test equipment to drive the external test equipment to execute corresponding test operation on the tested equipment; and repeatedly executing the steps of monitoring, analyzing, generating the control instruction and distributing, and automatically and continuously propelling the test process based on the response state of the tested equipment until all test items are completed. According to the technical scheme, multi-device closed-loop testing is driven through the state machine, and the testing automation degree and the process continuity are remarkably improved.

According to the verification method based on Ethernet end-to-end communication, the storage medium and the electronic equipment disclosed by the invention, the initial configuration operation is firstly executed, the communication connection between the test end and the tested equipment is established, then the verification request message is sent to the tested equipment, and the test report is generated based on the response message returned by the tested equipment. The end-to-end communication verification method and system can achieve systematic verification of end-to-end communication, can simulate an actual operation scene, automatically detect and record communication abnormity, counter logic errors, boundary values and CRC verification errors and generate a test report in a high-load, high-concurrency and multi-service-flow parallel complex network environment, improves the automation degree and efficiency of the test, and improves the test efficiency. Dependence on artificial experience is reduced, and stability and reliability of an end-to-end communication mechanism under extreme working conditions can be quantified.

A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.

A signal driver system can include one or more force amplifiers configured to provide drive signals to an output node, such as a device under test (DUT) node. The system can include a first switch circuit coupled between a first force amplifier and the output node, and the first switch circuit can include multiple parallel instances of switch circuits with respective different resistance characteristics. The system can include a second switch circuit coupled between a second force amplifier and the output node. The system can include a control circuit configured to control the switch circuit instances of the first switch circuit to mitigate glitch at the output node, for example, when switching between the first and second drive signals.

Disclosed is a robotic system and method designed for the verification and validation of smart connected Human-Machine Interface (HMI) devices. The robotic system integrates a multi-finger modular robotic module, a haptic module, a finger actuator, vision cameras, vision lights, a finger rotary module, a Cartesian robotic arm, an onboard user interface, and an L-shaped door. The method involves replicating human finger interactions, simulating touch sensations on a device under test (DUT), ensuring continuous and reliable operation, utilizing vision cameras for navigation and verification, optimizing vision with controlled lighting, positioning cameras strategically, executing various tasks with a robotic arm, and facilitating user interaction through an onboard interface.

The application discloses a kind of metering acquisition full scene automation simulation detection method and system, this method includes: selecting detection target for the equipment to be measured and associating district topology template, impedance parameter and load strategy;Utilize the technology of multiple bypass wiring to switch physical line connection automatically through network relay, reconstruct target district topology structure;Through compensation algorithm adjustment adjustable impedance equipment output, make the line impedance of the equipment to be measured consistent with target impedance value;Controllable load device is automatically controlled and generates load timing;Issue instruction to the equipment to be measured and collect response data;Response data is stored in association with target district topology structure, line impedance and load timing, and the matching degree of topological recognition result and district topology template and impedance deviation is calculated based on graph isomorphism algorithm, and detection report is generated.The application has the advantages that full scene automation of metering acquisition equipment detection is realized, and detection efficiency, accuracy and repeatability are improved.

A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.

An example test system includes a probe card configured to contact a device under test (DUT); a module including a first optical connector configured to contact a second optical connector on the DUT, with the first optical connector being for a fiber optic cable; and a motion system configured to move into, and out of, contact with the module. When the motion system is in contact with the module, the motion system is configured to move the module relative to the DUT in order to align the first optical connector to the second optical connector.

Test interconnect systems and methods are described. In one example, a test interconnect includes. A device under test (DUT) interface for connecting to a DUT; a load board interface for connecting to a load board; a circuitized component including an integrated loopback for self-test or self-communication of the DUT; and one or more conductive paths for connecting the DUT to the load board.

An example apparatus is configured to communicate with a device under test (DUT). The apparatus includes a first interface circuit to communicate with a test instrument using a first protocol and a second interface circuit to communicate with the DUT using a second protocol. The second protocol is a predefined protocol for which the DUT is configured to operate. The first protocol is for connections associated with a first frequency attenuation. The second protocol is for connections associated with a second frequency attenuation. The first frequency attenuation is greater than the second frequency attenuation. Circuitry is configured to perform one or both of the following operations: (i) converting first data received from the test instrument in the first protocol to the second protocol for output to the DUT via the second interface circuit, or (ii) converting second data received from the DUT in the second protocol to the first protocol for output to the test instrument via the first interface circuit.

The present invention relates to a method and an apparatus for detecting anomalies in an operation behavior of a device under test (DUT), in particular during electromagnetic susceptibility (EMS) measurements. The apparatus comprises a monitoring unit adapted to generate a first set of observation data of the operation behavior of a DUT while the DUT is not subjected to disturbances and adapted to generate a second set of observation data of the operation behavior of a DUT while the DUT is subjected to disturbances and comprising an AI module trained with the first set of observation data generated by the monitoring unit and adapted to process the second set of observation data to detect anomalies in the operation behavior of the DUT while being subjected to the disturbances and comprising a reporting unit adapted to reporting anomalies in the operation behavior of the DUT detected by the trained AI module.

A test and measurement system includes: a test and measurement instrument; a computing device connected to the test and measurement instrument; and one or more processors configured to execute code, the code causing the one or more processors to: collect measurement data from a full parameter scan of the first device under test, the full parameter scan comprising a total number of measurement points for each parameter combination of a number of parameters; identifying a core parameter scan from the full parameter scans, the core parameter scan comprising a total number of measurement points for fewer parameter scans than the full parameter scans; calculating an auxiliary parameter scan using the core parameter scan; determining a reduced parameter scan using the core parameter scan and the auxiliary parameter scan; and testing a subsequent device under test of the same type as the first device under test using the reduced parameter scan.

A measurement system for over-the-air testing of a device for non-terrestrial networks is described. The measurement system includes an anechoic chamber, at least one transmission antenna configured to transmit a source signal, a polarization rotator configured to rotate a polarization state of the source signal transmitted by the transmission antenna, and an electronic circuit configured to control the polarization rotator such that an ionospheric Faraday rotation is simulated. In addition, a user equipment (UE) is described. The UE is configured to measure a polarization direction of a received signal and to report the measured polarization direction by transmitting it as channel state information. Further, a method for emulating and determining a polarization mismatch in non-terrestrial communication systems is described. The method includes a step of establishing a connection between a system simulator and a device under test, wherein the system simulator indicates the used polarization to the device under test.

The application discloses a kind of based on physical function topology's substation secondary device state monitoring method and system, the substation secondary device is hierarchized according to physical composition and is decomposed into equipment, board piece, device, functional module etc.object;Different functional modules are combined into functional object again according to the time sequence of function execution;The monitoring element of different object is extracted, and the alarm information of each object is established based on the logical relationship between elements, and the device physical function topology model is formed;Operation and maintenance monitoring system reads the physical function topology model of the equipment to be measured and real-time monitoring element data, generates alarm information based on alarm logic, realizes the internal state monitoring of secondary device;Through the method, the internal state of the substation secondary device can be monitored and fault or abnormal positioning is realized, and the convenience of equipment operation and maintenance is improved.

This application relates to the field of electronic equipment technology, and discloses a device testing method, testing equipment, and storage medium. The method includes: loading and initializing a traffic classification module, a traffic isolation module, and an algorithm module at the kernel network protocol stack of the operating system of the device under test; using the traffic classification module to divert the test data of different test items to different queues based on the information of the test data of each test item in multiple test items; using the algorithm module to perform network impairment processing on the test data flowing through the traffic isolation module, so that the traffic isolation module outputs the impaired data; based on the impaired data, determining whether the network state of the device under test has been configured to a weak network state; if the network state of the device under test has been configured to a weak network state, evaluating the working state of the device under test, and determining the test result of the device under test based on the working state of the device under test. This application can test whether the device under test meets the requirements under a weak network state.

The invention provides a remote vehicle control test method and system, and belongs to the technical field of automobiles, and the method comprises the steps: obtaining a test case and a signal mapping file; generating a control instruction corresponding to a remote vehicle control test process based on the test case and a signal mapping file; the simulation equipment generates a test signal based on the control instruction and sends the test signal to the tested equipment; and feeding back a test result, and comparing the test result with a predicted result of the test case. A flexible and easy-to-use remote vehicle control test platform is constructed through stepwise module separation and configuration uploading by adopting a cloud deployment method, and test cases and signal mapping files can be automatically generated based on a generation tool, so that different vehicle types or hardware can be quickly replaced and adapted, and the test efficiency is improved. The overall reconstruction cost caused by equipment replacement is reduced, the manual writing workload can be omitted, and rapid iteration is supported to adapt to a new process.

A method of testing phase-based ranging includes the following. A respective first phase correction term in response to a channel sounding procedure is measured for a first carrier frequency of a carrier signal by a device under test and a test and / or measurement instrument, respectively. A first channel phase offset is calculated for the first carrier frequency based on the measured first phase correction terms. A respective second phase correction term is measured for a second carrier frequency of the carrier signal by the device under test and the test and / or measurement instrument, respectively. A second channel phase offset is calculated for the second carrier frequency based on the measured second phase correction terms. A phase is altered in order to emulate a different distance between the test and / or measurement instrument and the device under test. Further, a test and / or measurement system is described.

A test and measurement device comprises two or more channels to enable the test and measurement device to connect to a device under test (DUT), each channel comprising an analog-to-digital converter (ADC) and one or more trigger devices, each trigger device determining one or more trigger conditions, a display to enable the test and measurement device to display data from the ADC, a user interface, and one or more processors configured to execute code to cause the one or more processors to acquire data from the two or more channels at a different time than other two or more channels in response to one or more trigger conditions.A test and measuring instrument similar to the one mentioned above, except that in addition to one or more channels with ADCs, it includes at least one channel with an auxiliary input and a threshold detector instead of an ADC.

To make it possible to accurately measure a surface temperature of a device under test during testing. An inspection apparatus according to the present disclosure configured to test a device under test by contacting an electrode terminal of the device under test with a conductive contact to electrically connect between a tester and the device under test, includes: a device-under-test support unit that supports the device under test; an infrared-light receiving unit that receives infrared rays radiated from the device under test, at least the device under test being as an object to be temperature-measured; and a temperature measuring device having a temperature conversion function of converting the infrared rays from the infrared-light receiving unit into a temperature of the object to be temperature-measured, wherein the device-under-test support unit has a black body at a peripheral edge region or in a vicinity of the peripheral edge of the device-under-test support unit.

In some examples, high speed bidirectional OTDR-based testing may include transmitting data from a first end of a device under test (DUT) towards an optical time-domain reflectometer (OTDR) that is operatively connected to a second opposite end of the DUT. Further data that is transmitted by the OTDR may be received from the second opposite end of the DUT towards the first end of the DUT. Based on an amplitude of the further data, a direction of receiving of the further data may be adjusted towards a first receiver or towards a second receiver.

A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.

The invention provides an air interface wire rapid calibration method and system, and solves the problems of high execution complexity and difficulty in engineering application caused by the adoption of space violent search in the existing air interface wire calibration technology. The method comprises the following steps: synchronously starting a static calibration antenna and a reference antenna fixedly connected with a rotary table under a plurality of rotation angles of the rotary table, and acquiring measurement data from measured equipment; determining a phase difference data set and a relative amplitude data set according to the measurement data; reconstructing a plurality of air interface transmission matrixes in a digital domain based on the data set, and screening out at least one calibration antenna spatial position combination by taking a matrix condition number as an index; and air interface wire calibration is completed according to the combination. According to the invention, the calibration complexity is reduced from a combination order to a linear order, the hardware cost and the measurement time are significantly reduced, the high-efficiency and high-precision calibration of large-scale terminals such as a whole vehicle is realized, and the method has wide applicability irrelevant to frequency.

The embodiment of the invention relates to the technical field of semiconductor testing, and discloses testing equipment, which comprises a main control module, a signal processing module and a signal compensation circuit, and is characterized in that the signal processing module is in communication connection with the main control module and the signal compensation circuit; the main control module is configured to send a first differential signal and a second differential signal to the signal processing module, and the signal processing module is configured to perform frequency multiplication processing according to the first differential signal and the second differential signal to obtain a test signal; and the signal compensation circuit is configured to dynamically compensate the amplitude of the test signal, so that the amplitude of the compensated test signal is consistent, and the compensated test signal is provided for the tested equipment. According to the invention, the signal processing module is adopted to perform frequency multiplication processing on the two paths of differential signals, so that the requirement of high-frequency signal transmission of test equipment can be met; meanwhile, the test signal after frequency multiplication is compensated through the signal compensation circuit, so that the compensated test signal can be transmitted at a long distance.

An environmental test enclosure conditions the inlet air of a device under test (DUT) using a recirculating airflow loop that faces the DUT's intake side. Panels with insulating material form the loop, which includes an environment-conditioning device positioned upstream of the intake to add or remove heat and / or moisture. An ambient-air mixing aperture on the enclosure communicates the loop with room air to trim the inlet condition without dedicated chilling or additional heating. One or more sensors measure an inlet environmental parameter (e.g., temperature or relative humidity), and a controller maintains airflow toward the intake and coordinates the conditioning device output with the aperture setting. Exhaust air from the DUT is routed back toward the conditioning device to reuse waste heat, improving energy efficiency and test throughput.

A test and measurement instrument includes one or more test channels to connect to a memory device under test (DUT) and analyze signals generated by the DUT, and one or more processors configured to execute code to cause the DUT to generate strobe and data signals using a first clock setting of the DUT, determine whether the period of the strobe signal and data signals are within a tolerance specification, and perform at least one additional measurement of the DUT when the period of the strobe and data signals are within the tolerance specification. Methods are also described.

In some implementations, a test device may initiate a set of measurements by a set of sensors of the test device and of a device under test (DUT), wherein the DUT is a memory device. The test device may obtain the set of measurements of the DUT from the set of sensors based on initiating the set of measurements. The test device may analyze the set of measurements of the DUT, using a first model, to identify one or more defects present with the DUT. The test device may determine, using a second model, that the one or more defects present with the DUT satisfy a failure threshold. The test device may provide, based on the failure threshold being satisfied for the DUT, an output indicating that the failure threshold is satisfied for the DUT.

A test and measurement system includes a test and measurement instrument, a computing device connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to collect measurement data from a full parameter sweep of a first device under test, the full parameter sweep comprising a total number of measurement points for every parameter combination of a number of parameters, identify core parameter sweeps from the full parameter sweep, the core parameter sweeps comprising a total number of measurement points for fewer parameter sweeps than the full parameter sweep, use the core parameter sweeps to calculate auxiliary parameters sweeps. use the core parameter sweeps and the auxiliary parameter sweeps to determine a reduced parameter sweep, and use the reduced parameter sweep for testing subsequent devices under test of a same type as the first device under test.

The present disclosure relates to a measurement device for performing a vector signal analysis. The measurement device includes an input port which is arranged for being connected to a device under test (DUT). The input port is configured to receive a repetitive measurement signal from the DUT and a processor is configured to determine a reference signal based on at least one repetition of the received measurement signal. The processor is configured to iteratively adapt the determined reference signal over at least one further repetition of the measurement signal.

A test method and test system for providing a connection diagram (CDIA) and / or a connection list between a test device and a device under test wherein the test device has a plurality of connectors with different characteristics and the device under test has a plurality of antennas, wherein the connection diagram (CDIA) and / or connection list is calculated by a processor automatically on the basis of a Band-Centric DUT Connector Configuration indicating a mapping between frequency bands and a set of device under test connectors and / or antennas in transmission (TX) and reception (RX) direction.