874 results about "Equipment under test" patented technology

The invention provides a consistency test method and device for single-to-wire communication, and the method comprises the steps: receiving a communication signal transmitted by a tested device, extracting a time domain feature, a frequency domain feature and a modulation feature of the communication signal, generating a protocol feature value, carrying out the dimension reduction processing, and generating a protocol feature vector; performing matching degree analysis on the protocol feature vector and a predefined mapping dictionary, and determining a target communication protocol type with the highest matching degree; based on the determined communication protocol, dynamically generating a consistency test flow through a pre-trained neural network model; configuring a signal generator to inject an excitation signal according to the test flow, and synchronously acquiring various parameters of the tested equipment; based on the real-time feedback data, dynamically adjusting the signal amplitude, frequency and judgment threshold through a pre-trained neural network model; and summarizing feedback data of multiple rounds of tests, and generating a test report of the consistency index. According to the method, the protocol of the tested equipment can be automatically identified, the test flow is generated for the protocol, and the test efficiency is effectively improved.

Embodiments of the present disclosure provide a fuzz testing method, an electronic device, and a computer readable storage medium. The fuzz testing method comprises: acquiring a data packet; generating a protocol rule tree model on the basis of the data packet; generating a test case on the basis of the protocol rule tree model; sending the test case to a device under test; and determining a test result on the basis of response information of the device under test.

The invention discloses a ship mobile energy storage system CAN communication protocol automatic test system and method, and the system comprises a protocol modeling and test configuration module, a simulation node behavior simulation module, a CAN bus interaction and power closed loop module, and a test analysis and result evaluation module. A CAN communication protocol specification of the ship mobile energy storage system and parameters of tested equipment can be obtained, a protocol analysis model and a test configuration file are constructed for format verification and logic consistency verification, meanwhile, a corresponding test case sequence is automatically generated, and the message sending time is controlled to generate a time sequence simulation message flow; and sending the time sequence simulation message flow to the tested equipment, simulating energy interaction behavior acquisition to generate a power feedback data set, testing to obtain a signal consistency deviation and a power execution error to construct a protocol conformity evaluation matrix, and generating a visual test report. According to the invention, the high coverage rate and automatic closed-loop test of the CAN communication protocol can be realized.

Disclosed is a robotic system and method designed for the verification and validation of smart connected Human-Machine Interface (HMI) devices. The robotic system integrates a multi-finger modular robotic module, a haptic module, a finger actuator, vision cameras, vision lights, a finger rotary module, a Cartesian robotic arm, an onboard user interface, and an L-shaped door. The method involves replicating human finger interactions, simulating touch sensations on a device under test (DUT), ensuring continuous and reliable operation, utilizing vision cameras for navigation and verification, optimizing vision with controlled lighting, positioning cameras strategically, executing various tasks with a robotic arm, and facilitating user interaction through an onboard interface.

A probe card mounted in an of electronic device testing apparatus is described, having a probe head housing a plurality of contact probes, each having a first end portion which abuts onto contact pads of a device under test, a main board and a connected intermediate board which provides a distance spatial transformation between contact pads made on opposite faces thereof. The intermediate board is a space transformer which includes a plurality of modules that are plate-shaped and coplanar, and structurally and functionally independent from each other. Each module has a first face facing towards the probe head and a first plurality of contact pads whereonto respective second end portions of the contact probes abut and an opposite second face facing towards the main board. The second face has a second plurality of contact pads connected to the first plurality of contact pads.

A measurement system includes a signal analysis circuit, a signal generator circuit, a control circuit, and a DUT connector. The DUT connector is connectable to a device under test for receiving a measurement signal outputted by the DUT. The signal analysis circuit is connected to the DUT connector for receiving the measurement signal. The signal generator circuit is configured to generate a radio frequency (RF) test signal that is transmitted to the DUT. The signal analysis circuit is configured to digitize the measurement signal, thereby obtaining a digitized measurement signal. The control circuit is configured to control the signal generator circuit to generate the RF test signal based on the digitized measurement signal, based on known error parameters of an error model of the measurement system, and based on a desired reflection coefficient at a reference plane associated with the DUT.

The invention discloses an electrical equipment partial discharge ultrahigh frequency signal intelligent detection device, and relates to the technical field of electrical equipment insulation state monitoring, the electrical equipment partial discharge ultrahigh frequency signal intelligent detection device comprises a flat plate, one side of the flat plate is provided with a sealing suction cup, the sealing suction cup is internally provided with a damping base, the damping base is internally provided with a three-axis displacement mechanism, and the three-axis displacement mechanism is provided with a three-axis displacement sensor. A sensor array is arranged on one side of the three-axis displacement mechanism, a control layer is arranged on one side of the sensor array, horizontal detection sensors are arranged on the two sides of the damping base correspondingly, air suction holes are formed in the two sides of the horizontal detection sensors correspondingly, and telescopic supporting legs are arranged on one sides of the air suction holes. The number of the telescopic supporting legs is three, the three telescopic supporting legs are evenly distributed with the damping base as the circle center at the included angle of 120 degrees, the sealing suction cups are matched with the four sets of circumferentially-distributed air suction holes and air suction pumps, vacuum can be rapidly pumped to form negative pressure adsorption, the flat plate is tightly attached to the surface of tested equipment, and the fixing stability of the device is remarkably improved.

A probe card for a circuit probe test system and methods of fabrication thereof. The probe card includes a substrate portion, and a probe head including a guide plate located below the substrate portion and having a plurality of openings through the guide plate, and a conductive trace on the guide plate that extends between a pair of the openings. A plurality of probe pins extend through the openings through the guide plate, where a pair of probe pins are electrically connected by the conductive trace to form a loopback signal path. Accordingly, the loopback signals may be routed through the conductive trace located on and / or within the guide plate rather than through the substrate portion of the probe card. This may significantly reduce the total length of the loopback signal path, which may thereby improve the signal integrity (SI) during loopback testing of a device-under-test.

A calibration unit comprises a first port which is arranged for being connected to a measurement device; a calibration module comprising at least three different calibration standards for calibrating the measurement device; and a switching module configured to connect the first port with one of the at least three different calibration standards of the calibration module. A daisy chain port is arranged for being connected to a further calibration unit, to an external power meter, or to a device-under-test, DUT. The first port is connectable to the daisy chain port. An internal power meter is arranged within a housing of the calibration unit. The first port is connectable to the internal power meter; or an internal impedance tuner. The first port is connectable to the internal impedance tuner.

A system comprises a signal generator circuit configured to generate a modulated radio frequency (RF) signal based on a predefined waveform. An output signal path is connected to the signal generator circuit and is connectable to a device under test. A first signal path is connected to the signal generator circuit so as to receive a reference signal corresponding to the modulated RF signal. A second signal path is connectable to the device under test so as to receive a measurement signal from the device under test. A analysis signal path is connected to the first and second signal paths for merging the reference signal and the measurement signal into an analysis signal. A signal analysis circuit is configured to separate the reference signal from the measurement signal for analyzing the analysis signal based on the predefined waveform.

A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connected to an oven, control the selected DUT switch to connect each DUT in the oven to a channel of the test and measurement instrument, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails, repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested, and repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.

The invention relates to the technical field of electromagnetic compatibility testing, and provides a current-based magnetic field radiation emission limit value cutting method and device and electronic equipment. Comprising the steps of obtaining working current parameters of tested equipment; determining a basic limit value of magnetic field radiation emission, obtaining a working current of the tested equipment when the magnetic field radiation is the basic limit value, and taking the working current as a reference current threshold value; when the working current parameter is greater than the reference current threshold value, calculating the clipping amount of the magnetic field radiation emission limit value based on the ratio of the working current parameter to the reference current threshold value; and cutting the basic limit value according to the cutting amount to obtain the magnetic field radiation emission limit value of the tested equipment. The limit value is compatible with the existing electromagnetic compatibility national military standard magnetic field radiation emission limit value, so that the electromagnetic compatibility test assessment of the large-current equipment can be evaluated more reasonably and accurately, and the method has high engineering application value.

A measurement system includes a common port, the common port being connectable to a signal output of the device under test. The measurement system further includes a signal line being connected to the common port, wherein the signal line includes a first directional coupler portion and a second directional coupler portion. The measurement system further includes a signal processing circuit, wherein the signal processing circuit includes an IQ analysis circuit and an IQ synthesizer circuit. The IQ analysis circuit is connected with the common port via the first directional coupler portion so as to receive a forward-travelling signal from the common port. Further, a testing method of testing a device under test is described.

A method for determining timing accuracy of one or more radio data packets includes: generating stimulus data, wherein the stimulus data includes the radio data packets and a reference time for transmission of the radio data packets over the air; storing the stimulus data on a test device; and replaying the stimulus data, by the test device, in order to determine the timing accuracy of the transmission of the one or more radio data packets by a device under test.

The invention relates to the technical field of circuits, and discloses an electro-optical signal conversion method and equipment. The equipment comprises an input module which is connected with at least two paths of signal output interfaces of tested equipment and is used for transmitting at least two paths of signals of the tested equipment to a signal processing module; the signal processing module is used for combining and encoding the at least two paths of signals to generate an electric signal, and transmitting the electric signal to the electro-optical conversion module; the electro-optical conversion module is used for converting the electric signal into an optical signal; and the main control chip is used for controlling the working mode of at least one of the input module, the signal processing module, the main control chip and the electro-optical conversion module according to the current signal transmission state. The electric signal is converted into the optical signal, so that the influence of electromagnetic coupling is avoided.

The embodiment of the invention provides a performance bottleneck determination method and device. When the method is executed, firstly, real-time resource consumption data and real-time performance index data of tested equipment are obtained; determining whether the performance of the tested equipment is abnormal or not according to the real-time performance index data; if the performance is abnormal, determining candidate bottleneck resources according to the real-time resource consumption data; determining resource performance influence factors of the candidate bottleneck resources; wherein the resource performance impact factor of the candidate bottleneck resource indicates the contribution degree to the performance abnormality; and determining a performance bottleneck according to the resource performance impact factor of the candidate bottleneck resource, the performance bottleneck being a resource of which the resource performance factor accords with a preset condition in the candidate bottleneck resource. Therefore, the performance index data, the resource consumption data and other data which comprehensively reflect the real state of the tested equipment are utilized, the problem that the identification and positioning precision is insufficient due to the fact that a single index is utilized for identifying and positioning the performance bottleneck is solved, and the precision of identifying and positioning the performance bottleneck is improved.

A test and measurement device has an input port to receive a signal from a device under test (DUT), the signal having a symbol rate, one or more analog-to-digital converters (ADC) to convert the signal to waveform samples at a sampling rate, and one or more processors, when aliasing is present: up-sample a portion of the signal having aliased samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the aliased samples to produce a non-aliased waveform.

A measurement system for determining a noise figure of a device under test is described. The measurement system determines a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power includes systematic errors originating in the device under test and in the measurement system. The measurement system determines a second total error power based on the output signal by a different, second noise canceling technique. The second total error power includes systematic errors originating in the measurement system. The second total error power further includes noise originating in the device under test and in the measurement system outside of the measurement instrument. The measurement system is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

Disclosed are a system and a method for a high-speed performance measurement. The system includes: a fixing part; a positioner for controlling the rotation of the equipment by controlling the fixing part; a measurement probe; a curved reflective plate for reflecting, in the direction of the measurement probe, an electromagnetic wave radiated by the equipment and transforming the spherical wave of the measurement probe into a plane wave at the position where the equipment is provided; an arc structure including an arc arranged to be adjacent to the fixing part; a probe set including near-filed probes arranged to be spaced predetermined intervals apart from each other on the inner side of the arc; and a control unit, which receives, through a signal analyzer, signal data corresponding to an input signal from some of near-filed probes and the measurement probe.

The invention relates to the field of wireless product testing, and provides a multi-device cooperative closed-loop testing method based on state machine driving, and the method comprises the steps: monitoring the data output of a universal asynchronous receiver / transmitter (UART) interface of a tested device in real time; analyzing the data output by the UART interface of the tested equipment to identify the current running state of the tested equipment; dynamically generating at least one control instruction according to a preset state transition rule set and the identified current operation state; distributing the at least one control instruction to corresponding external test equipment to drive the external test equipment to execute corresponding test operation on the tested equipment; and repeatedly executing the steps of monitoring, analyzing, generating the control instruction and distributing, and automatically and continuously propelling the test process based on the response state of the tested equipment until all test items are completed. According to the technical scheme, multi-device closed-loop testing is driven through the state machine, and the testing automation degree and the process continuity are remarkably improved.

According to the verification method based on Ethernet end-to-end communication, the storage medium and the electronic equipment disclosed by the invention, the initial configuration operation is firstly executed, the communication connection between the test end and the tested equipment is established, then the verification request message is sent to the tested equipment, and the test report is generated based on the response message returned by the tested equipment. The end-to-end communication verification method and system can achieve systematic verification of end-to-end communication, can simulate an actual operation scene, automatically detect and record communication abnormity, counter logic errors, boundary values and CRC verification errors and generate a test report in a high-load, high-concurrency and multi-service-flow parallel complex network environment, improves the automation degree and efficiency of the test, and improves the test efficiency. Dependence on artificial experience is reduced, and stability and reliability of an end-to-end communication mechanism under extreme working conditions can be quantified.

The invention discloses a hardware-in-the-loop automatic test method and system, and the method comprises the steps: receiving a technical specification document and a historical failure case library of a tested device, analyzing a technical specification through a natural language processing model to extract key test parameters, carrying out the correlation analysis of the key test parameters and a fault mode in the historical failure case library, and obtaining a fault mode of the tested device; generating a structured test demand table, wherein the structured test demand table comprises test target priorities, constraint conditions and boundary value definitions; based on the structured test demand table and equipment working condition data acquired in real time, generating a plurality of test cases covering boundary conditions and extreme working conditions by using a genetic algorithm; the test cases covering the boundary conditions and the extreme working conditions are screened out from the multiple test cases to obtain a test case sequence, and each case in the test case sequence comprises a fault injection parameter, an expected response threshold value and an execution priority label. According to the method and system, the test coverage rate and efficiency are improved, and manual intervention is reduced.

Various embodiments provide for a unified interface for testing a system, which can include a device under test (DUT). In particular, some embodiments described herein can be used to implement a Unified Test Framework (UTF) that comprises an architecture that provides a unified (or common) software interface to one or more test methods used during a development life cycle of a system. Example test methods can include, without limitation, modeling, verification, simulation, emulation, validation, customer support, and the like.

The invention discloses an audio signal measurement method and device, an electronic device and a storage medium, and relates to the field of audio signal measurement, and the method comprises the steps: deploying a detection microphone nearby a tested device, and arranging a reference microphone in a noise field, so as to synchronously collect a mixed signal containing a test signal and noise, and a pure ambient noise reference signal. After the noise of the two signals is subjected to correlation evaluation and the consistency of noise sources is confirmed, dynamically changing noise components are accurately stripped from the signals of the tested equipment by utilizing real-time noise data acquired by the reference microphone and through an adaptive noise cancellation algorithm, so that pure test signals are restored. Therefore, the problem of non-stationary noise pollution is solved through an active signal processing means instead of depending on imperfect physical sound insulation, and accurate and efficient measurement of the performance of the microphone in a noisy environment is realized.

The invention discloses a method and a system for displaying a test waveform of ATE (automatic test equipment), and belongs to the technical field of automatic test, and the method comprises the following steps: receiving a waveform display request sent by an upper computer, the waveform display request comprising a trigger condition for triggering a logic controller to store waveform digital information; triggering conditions in the waveform conversion request are set to a register address corresponding to the logic controller, a pattern program is executed, test data are sent to a tested device, and return data of the tested device are received; after the pattern program is executed, the waveform digital information is obtained from a register address corresponding to the logic controller, and the waveform digital information is all test data and return data which are started to be stored by the logic controller after a trigger condition is met; and analyzing and converting the waveform digital information, and forwarding the waveform digital information to an upper computer for waveform analog signal display. According to the application, a section of waveform at any time node is captured in real time, the time sequence problem of a pattern program is quickly positioned by comparing the captured waveform signal with the pattern time sequence, the debugging period is shortened, and the development difficulty is reduced.

An example test system includes a probe card configured to contact a device under test (DUT); a module including a first optical connector configured to contact a second optical connector on the DUT, with the first optical connector being for a fiber optic cable; and a motion system configured to move into, and out of, contact with the module. When the motion system is in contact with the module, the motion system is configured to move the module relative to the DUT in order to align the first optical connector to the second optical connector.

The techniques and circuits, described herein, include solutions for error compensation in source measurement units (SMUs). An example SMU is capable of both sourcing current to a device under test (DUT) and measuring current through the DUT. An SMU may include a sensing resistor coupled in series with the DUT. A voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the DUT. In practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. A gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the DUT can be sourced and measured.

A socket assembly used in an electronic component test apparatus for testing a device under test (DUT) having a first device antenna, includes a socket in which the DUT is mounted, a pressing portion, disposed between an antenna unit and the socket, that presses the DUT toward the socket, the antenna unit having a first measuring antenna opposed to the socket, and a reinforcement frame on which the pressing portion is stacked. A material in the pressing portion has a lower dielectric constant than a material in the reinforcement frame.

The invention relates to the technical field of semiconductor device testing, and discloses a dynamic on-resistance testing system and method, and the system comprises a current source module, a voltage source module, an acquisition module, a drive control module, and a main control module. The current source module is used for outputting a driving current to a tested device, the voltage source module is used for applying a bias voltage, the driving control module controls the on-off of the tested device, and the main control module coordinates the operation process of each module through a preset operation time sequence, so that the staged measurement of the dynamic on-resistance is realized. According to the system, through time sequence synchronous control and modular design, the problems of inaccurate sampling points caused by time sequence deviation, test errors caused by lead interference and insufficient power supply precision in the prior art are solved, and measurement results of initial on resistance, leakage current and steady-state on resistance of tested equipment can be accurately obtained; and reliable data support is provided for device performance evaluation.

A device may generate a link training and status state machine (LTSSM) test configuration that includes states and paths connecting the states, and may provide the LTSSM test configuration for tracing through by a device under test. The device may receive results associated with tracing through of the LTSSM test configuration by the device under test, and may modify, based on the results, one of the paths of the LTSSM test configuration to include a different one of the states and to generate a modified LTSSM test configuration. The device may provide the modified LTSSM test configuration for tracing through by the device under test.