650 results about "Equipment under test" patented technology

The invention discloses a ship mobile energy storage system CAN communication protocol automatic test system and method, and the system comprises a protocol modeling and test configuration module, a simulation node behavior simulation module, a CAN bus interaction and power closed loop module, and a test analysis and result evaluation module. A CAN communication protocol specification of the ship mobile energy storage system and parameters of tested equipment can be obtained, a protocol analysis model and a test configuration file are constructed for format verification and logic consistency verification, meanwhile, a corresponding test case sequence is automatically generated, and the message sending time is controlled to generate a time sequence simulation message flow; and sending the time sequence simulation message flow to the tested equipment, simulating energy interaction behavior acquisition to generate a power feedback data set, testing to obtain a signal consistency deviation and a power execution error to construct a protocol conformity evaluation matrix, and generating a visual test report. According to the invention, the high coverage rate and automatic closed-loop test of the CAN communication protocol can be realized.

Disclosed is a robotic system and method designed for the verification and validation of smart connected Human-Machine Interface (HMI) devices. The robotic system integrates a multi-finger modular robotic module, a haptic module, a finger actuator, vision cameras, vision lights, a finger rotary module, a Cartesian robotic arm, an onboard user interface, and an L-shaped door. The method involves replicating human finger interactions, simulating touch sensations on a device under test (DUT), ensuring continuous and reliable operation, utilizing vision cameras for navigation and verification, optimizing vision with controlled lighting, positioning cameras strategically, executing various tasks with a robotic arm, and facilitating user interaction through an onboard interface.

A probe card mounted in an of electronic device testing apparatus is described, having a probe head housing a plurality of contact probes, each having a first end portion which abuts onto contact pads of a device under test, a main board and a connected intermediate board which provides a distance spatial transformation between contact pads made on opposite faces thereof. The intermediate board is a space transformer which includes a plurality of modules that are plate-shaped and coplanar, and structurally and functionally independent from each other. Each module has a first face facing towards the probe head and a first plurality of contact pads whereonto respective second end portions of the contact probes abut and an opposite second face facing towards the main board. The second face has a second plurality of contact pads connected to the first plurality of contact pads.

A calibration unit comprises a first port which is arranged for being connected to a measurement device; a calibration module comprising at least three different calibration standards for calibrating the measurement device; and a switching module configured to connect the first port with one of the at least three different calibration standards of the calibration module. A daisy chain port is arranged for being connected to a further calibration unit, to an external power meter, or to a device-under-test, DUT. The first port is connectable to the daisy chain port. An internal power meter is arranged within a housing of the calibration unit. The first port is connectable to the internal power meter; or an internal impedance tuner. The first port is connectable to the internal impedance tuner.

A system comprises a signal generator circuit configured to generate a modulated radio frequency (RF) signal based on a predefined waveform. An output signal path is connected to the signal generator circuit and is connectable to a device under test. A first signal path is connected to the signal generator circuit so as to receive a reference signal corresponding to the modulated RF signal. A second signal path is connectable to the device under test so as to receive a measurement signal from the device under test. A analysis signal path is connected to the first and second signal paths for merging the reference signal and the measurement signal into an analysis signal. A signal analysis circuit is configured to separate the reference signal from the measurement signal for analyzing the analysis signal based on the predefined waveform.

A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connected to an oven, control the selected DUT switch to connect each DUT in the oven to a channel of the test and measurement instrument, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails, repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested, and repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.

A measurement system includes a common port, the common port being connectable to a signal output of the device under test. The measurement system further includes a signal line being connected to the common port, wherein the signal line includes a first directional coupler portion and a second directional coupler portion. The measurement system further includes a signal processing circuit, wherein the signal processing circuit includes an IQ analysis circuit and an IQ synthesizer circuit. The IQ analysis circuit is connected with the common port via the first directional coupler portion so as to receive a forward-travelling signal from the common port. Further, a testing method of testing a device under test is described.

A method for determining timing accuracy of one or more radio data packets includes: generating stimulus data, wherein the stimulus data includes the radio data packets and a reference time for transmission of the radio data packets over the air; storing the stimulus data on a test device; and replaying the stimulus data, by the test device, in order to determine the timing accuracy of the transmission of the one or more radio data packets by a device under test.

The embodiment of the invention provides a performance bottleneck determination method and device. When the method is executed, firstly, real-time resource consumption data and real-time performance index data of tested equipment are obtained; determining whether the performance of the tested equipment is abnormal or not according to the real-time performance index data; if the performance is abnormal, determining candidate bottleneck resources according to the real-time resource consumption data; determining resource performance influence factors of the candidate bottleneck resources; wherein the resource performance impact factor of the candidate bottleneck resource indicates the contribution degree to the performance abnormality; and determining a performance bottleneck according to the resource performance impact factor of the candidate bottleneck resource, the performance bottleneck being a resource of which the resource performance factor accords with a preset condition in the candidate bottleneck resource. Therefore, the performance index data, the resource consumption data and other data which comprehensively reflect the real state of the tested equipment are utilized, the problem that the identification and positioning precision is insufficient due to the fact that a single index is utilized for identifying and positioning the performance bottleneck is solved, and the precision of identifying and positioning the performance bottleneck is improved.

A test and measurement device has an input port to receive a signal from a device under test (DUT), the signal having a symbol rate, one or more analog-to-digital converters (ADC) to convert the signal to waveform samples at a sampling rate, and one or more processors, when aliasing is present: up-sample a portion of the signal having aliased samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the aliased samples to produce a non-aliased waveform.

A measurement system for determining a noise figure of a device under test is described. The measurement system determines a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power includes systematic errors originating in the device under test and in the measurement system. The measurement system determines a second total error power based on the output signal by a different, second noise canceling technique. The second total error power includes systematic errors originating in the measurement system. The second total error power further includes noise originating in the device under test and in the measurement system outside of the measurement instrument. The measurement system is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

Disclosed are a system and a method for a high-speed performance measurement. The system includes: a fixing part; a positioner for controlling the rotation of the equipment by controlling the fixing part; a measurement probe; a curved reflective plate for reflecting, in the direction of the measurement probe, an electromagnetic wave radiated by the equipment and transforming the spherical wave of the measurement probe into a plane wave at the position where the equipment is provided; an arc structure including an arc arranged to be adjacent to the fixing part; a probe set including near-filed probes arranged to be spaced predetermined intervals apart from each other on the inner side of the arc; and a control unit, which receives, through a signal analyzer, signal data corresponding to an input signal from some of near-filed probes and the measurement probe.

The invention relates to the field of wireless product testing, and provides a multi-device cooperative closed-loop testing method based on state machine driving, and the method comprises the steps: monitoring the data output of a universal asynchronous receiver / transmitter (UART) interface of a tested device in real time; analyzing the data output by the UART interface of the tested equipment to identify the current running state of the tested equipment; dynamically generating at least one control instruction according to a preset state transition rule set and the identified current operation state; distributing the at least one control instruction to corresponding external test equipment to drive the external test equipment to execute corresponding test operation on the tested equipment; and repeatedly executing the steps of monitoring, analyzing, generating the control instruction and distributing, and automatically and continuously propelling the test process based on the response state of the tested equipment until all test items are completed. According to the technical scheme, multi-device closed-loop testing is driven through the state machine, and the testing automation degree and the process continuity are remarkably improved.

According to the verification method based on Ethernet end-to-end communication, the storage medium and the electronic equipment disclosed by the invention, the initial configuration operation is firstly executed, the communication connection between the test end and the tested equipment is established, then the verification request message is sent to the tested equipment, and the test report is generated based on the response message returned by the tested equipment. The end-to-end communication verification method and system can achieve systematic verification of end-to-end communication, can simulate an actual operation scene, automatically detect and record communication abnormity, counter logic errors, boundary values and CRC verification errors and generate a test report in a high-load, high-concurrency and multi-service-flow parallel complex network environment, improves the automation degree and efficiency of the test, and improves the test efficiency. Dependence on artificial experience is reduced, and stability and reliability of an end-to-end communication mechanism under extreme working conditions can be quantified.

The invention discloses a hardware-in-the-loop automatic test method and system, and the method comprises the steps: receiving a technical specification document and a historical failure case library of a tested device, analyzing a technical specification through a natural language processing model to extract key test parameters, carrying out the correlation analysis of the key test parameters and a fault mode in the historical failure case library, and obtaining a fault mode of the tested device; generating a structured test demand table, wherein the structured test demand table comprises test target priorities, constraint conditions and boundary value definitions; based on the structured test demand table and equipment working condition data acquired in real time, generating a plurality of test cases covering boundary conditions and extreme working conditions by using a genetic algorithm; the test cases covering the boundary conditions and the extreme working conditions are screened out from the multiple test cases to obtain a test case sequence, and each case in the test case sequence comprises a fault injection parameter, an expected response threshold value and an execution priority label. According to the method and system, the test coverage rate and efficiency are improved, and manual intervention is reduced.

Various embodiments provide for a unified interface for testing a system, which can include a device under test (DUT). In particular, some embodiments described herein can be used to implement a Unified Test Framework (UTF) that comprises an architecture that provides a unified (or common) software interface to one or more test methods used during a development life cycle of a system. Example test methods can include, without limitation, modeling, verification, simulation, emulation, validation, customer support, and the like.

The invention discloses an audio signal measurement method and device, an electronic device and a storage medium, and relates to the field of audio signal measurement, and the method comprises the steps: deploying a detection microphone nearby a tested device, and arranging a reference microphone in a noise field, so as to synchronously collect a mixed signal containing a test signal and noise, and a pure ambient noise reference signal. After the noise of the two signals is subjected to correlation evaluation and the consistency of noise sources is confirmed, dynamically changing noise components are accurately stripped from the signals of the tested equipment by utilizing real-time noise data acquired by the reference microphone and through an adaptive noise cancellation algorithm, so that pure test signals are restored. Therefore, the problem of non-stationary noise pollution is solved through an active signal processing means instead of depending on imperfect physical sound insulation, and accurate and efficient measurement of the performance of the microphone in a noisy environment is realized.

The techniques and circuits, described herein, include solutions for error compensation in source measurement units (SMUs). An example SMU is capable of both sourcing current to a device under test (DUT) and measuring current through the DUT. An SMU may include a sensing resistor coupled in series with the DUT. A voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the DUT. In practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. A gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the DUT can be sourced and measured.

A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.

The invention discloses a linear acceleration environment test platform and a test method. The test platform comprises a platform body, a control system, and a guide rail assembly, an equipment assembly tool, a spring assembly, a spring stretching assembly and a detection unit which are arranged on the platform body, the equipment assembling tool is arranged on the guide rail assembly and is used for installing tested equipment; the spring assembly comprises a plurality of springs which are symmetrically distributed on the two sides of the guide rail assembly. The spring stretching assembly is used for stretching the spring assembly to a preset stretching position, the equipment assembling tool abuts against the spring stretching assembly, and the spring stretching assembly is released to drive the equipment assembling tool to do linear accelerated motion. The invention further comprises a test method of the linear acceleration environment test platform. The device is simple in structure and low in manufacturing cost, can effectively simulate the real dynamic response of the tested device under the action of the linear acceleration, carries out refined evaluation on the independence performance of the tested device, and is especially suitable for batch test requirements of inertial navigation devices, low-cost whole aircrafts and the like.

A test and measurement instrument includes an input configured to receive at least a waveform of a test signal, which includes a plurality of samples. The test and measurement instrument includes a processing circuit connected with the input. The processing circuit is configured to analyze the waveform and to select at least a subset of samples out of the plurality of samples. The subset of samples matches predefined criteria concerning at least one of bandwidth, amplitude distribution, and amplitude percentiles. The test and measurement instrument is configured to generate a modified waveform based on the selected subset of samples and / or to measure only a part of a received measurement signal from a device under test, which corresponds to the selected subset of samples. Further, a test and measurement setup and a method of measuring a device under test are described.

A method and system synchronize first and second VNAs for testing a DUT over a long distance. The method includes receiving at the second VNA an RF signal from the first VNA; mixing the RF signal and an LO signal at the second VNA to output an IF signal to an ADC; determining a reference error ratio between a first reference clock in the first VNA and a second reference clock in the second VNA; adjusting an LO frequency to a corrected LO frequency by applying the reference error to a desired LO frequency; mixing the RF signal and the adjusted LO signal to output the IF signal; and resampling the IF signal at an adjusted sample rate to output a corrected IF signal corrected for the reference error, without adjustments being made to the first or second reference clock.

The invention relates to the technical field of electromagnetic compatibility, and discloses a wireless radio frequency electromagnetic field immunity test method, which comprises the following steps of S1, generating a continuous wave radio frequency signal in a frequency band of 80MHz-6GHz through a programmable radio frequency signal generation device; s2, constructing an orthogonal polarization electromagnetic field in the radiation test area; s3, three-dimensional space field intensity distribution is monitored in real time based on the 16-channel digital probe array, and a space field intensity distribution cloud picture is generated; s4, synchronously monitoring performance parameters of the tested equipment through an optical coupler isolation acquisition channel; s5, using a slope type field intensity incremental method to increase the field intensity at a step length less than or equal to 1V / m; and S6, establishing a field intensity-performance incidence matrix, generating a three-dimensional electromagnetic vulnerability distribution map, and outputting an immunity grade index. A multi-system interference scene in a real complex electromagnetic environment can be simulated through a programmable radio frequency signal generating device and a time division multiplexing mechanism in combination with carrier frequency hopping and modulation depth gradual change.

Thermal heads and corresponding test systems for independently controlling one or more components when testing one or more devices under test are disclosed herein. In some embodiments, the thermal head includes a plurality of adapters, one or more heaters, and one or more thermal controllers for independent control of the temperature of the plurality of components. The thermal controller may independently control the temperature of at least some of the plurality of components such that thermal control of one component does not affect thermal control of another component. In some embodiments, thermal control is performed through one or more cold plates, and the thermal head includes one or more cold plates. Various embodiments of the present disclosure also include independent control of one or more forces using one or more force mechanisms.

A signal driver system can include one or more force amplifiers configured to provide drive signals to an output node, such as a device under test (DUT) node. The system can include a first switch circuit coupled between a first force amplifier and the output node, and the first switch circuit can include multiple parallel instances of switch circuits with respective different resistance characteristics. The system can include a second switch circuit coupled between a second force amplifier and the output node. The system can include a control circuit configured to control the switch circuit instances of the first switch circuit to mitigate glitch at the output node, for example, when switching between the first and second drive signals.

Disclosed is a robotic system and method designed for the verification and validation of smart connected Human-Machine Interface (HMI) devices. The robotic system integrates a multi-finger modular robotic module, a haptic module, a finger actuator, vision cameras, vision lights, a finger rotary module, a Cartesian robotic arm, an onboard user interface, and an L-shaped door. The method involves replicating human finger interactions, simulating touch sensations on a device under test (DUT), ensuring continuous and reliable operation, utilizing vision cameras for navigation and verification, optimizing vision with controlled lighting, positioning cameras strategically, executing various tasks with a robotic arm, and facilitating user interaction through an onboard interface.

The invention relates to the technical field of sensor measuring equipment, and discloses a sensor base fixing structure for sound vibration temperature measurement, which comprises a main body, and a base is clamped at the bottom of the main body. When sound vibration temperature is measured for a long time through the base and equipment vibrates, the two sets of elastic pieces intersect and asymmetrically wrap the threads on the bolt, so that the friction force between the threads can be increased, lateral pressure can be continuously applied to the bolt when the base is vibrated, dynamic locking is achieved, and the service life of the bolt is prolonged. Therefore, possible displacement of the base can be limited when the base is vibrated, the reliability of connection between the base and the tested equipment is ensured, and the accuracy and stability of the sensor during measurement are improved.

The application discloses a kind of metering acquisition full scene automation simulation detection method and system, this method includes: selecting detection target for the equipment to be measured and associating district topology template, impedance parameter and load strategy;Utilize the technology of multiple bypass wiring to switch physical line connection automatically through network relay, reconstruct target district topology structure;Through compensation algorithm adjustment adjustable impedance equipment output, make the line impedance of the equipment to be measured consistent with target impedance value;Controllable load device is automatically controlled and generates load timing;Issue instruction to the equipment to be measured and collect response data;Response data is stored in association with target district topology structure, line impedance and load timing, and the matching degree of topological recognition result and district topology template and impedance deviation is calculated based on graph isomorphism algorithm, and detection report is generated.The application has the advantages that full scene automation of metering acquisition equipment detection is realized, and detection efficiency, accuracy and repeatability are improved.

A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.