510 results about "Test line" patented technology

A test device and method for determining the presence or absence of an analyte in a fluid sample, the test device including a support bearing a mark thereon, and a matrix defining an axial flow path. In operation, an observation area in the test device becomes transparent, thereby allowing the user to view a mark that is present on a support that is disposed beneath the observation area. Typically, the mark on the underlying support is configured as a minus (−) sign. In the absence of analyte in the sample, the test device presents a negative result as a minus (−) signal. In the presence of analyte in the sample, however, the mark operates in concert with a perpendicular test line on the observation area to present a positive result as a plus (+) signal that is visible to the user.

A test strip reader is provided with an optical mouse integrated circuit sensor that reads the test line, reference line and control line of a lateral flow assay strip by light absorption and determines the position of the test strip beneath the image on the integrated circuit board using digital signal processing algorithms. The digital signal processing algorithms process the imaged surface at a very high rate (e.g., 1500 frames per second) to determine the direction and speed of movement of the lateral strip with respect to the reader optics and image capture components. The sensor outputs this position information in a quadrature pattern format. A microcontroller uses the known position of the strip with respect to the reader to calculate the optical absorption of each colored reagent line, and the diagnostic significance (i.e., either qualitative or quantitative) of the test strip.

The invention relates to a thin film transistor liquid crystal display (TFT-LCD) array substrate as well as a manufacturing method and a test method thereof. TheTFT-LCD array substrate comprises a display area and a peripheral area, wherein the peripheral area is internally provided with at least one first testing line and/or at least one second testing line; the first testing lines are parallel to data lines; gate lines and/or pixel electrodes are overlapped with the at least one first testing line; the second testing lines are parallel to the gate lines; and the data lines are overlapped with the at least one second testing line. The invention effectively overcomes the technical defect that a signal inside a liquid crystal display panel can not be tested in the prior art by installing the test lines in the peripheral area.

An array substrate including a signal line, a test line to inspect the open of the signal line and fault of the pixels, and a fuse electrically connecting the signal line with the test line. The fuse is opened when a current higher than a reference current is applied thereto. Accordingly, a laser trimming process to insulate the signal line from the test line is not needed after the signal line and pixels have been tested, so that the processing time may be shortened.

A panel for a display device includes a display area and a peripheral area. The display area comprises a plurality of pixels each comprising a switching element and gate lines and data lines connected to the pixels. The peripheral area comprises a plurality of gate driving integrated circuit regions, a plurality of data driving integrated circuit regions, a plurality of repair lines disposed along the edge of the panel, connecting pads connected to both ends of the repair lines, a test line connected to at least one connecting pad, and a test pad connected to the test line. A test method for detecting disconnection of the data lines is also provided.

The invention is suitable for the field of motor train unit train test run and provides a test line train control system and a test run method. The system comprises a first end track section, a first service braking section, a split-phase section, a second service braking section and a second end track section, all of which are sequentially connected. A CTCS level switching section is further arranged between the split-phase section and the second service braking section. Test line train control center equipment is arranged in a test run control room beside a test line track. Test line outdoor equipment comprises an active/passive transponder set, an interval parking signboard, a mileage position calibration mark, split-phase section outage marks, a temporary speed restriction mark, service braking marks, emergency braking marks and track circuit outdoor equipment. Motor train unit ATP train-mounted equipment communicates with an RBC through a GSM-R. By the adoption of the embodiment, the purpose that the performance of train control train-mounted equipment can be comprehensively tested simply by one time of back-and-forth operation of a motor train unit on a test line.

The invention relates to a TFT-LCD array substrate and methods for manufacturing and testing the same. The TFT-LCD array substrate comprises a display area and a peripheral area, wherein the display area is internally provided with a grid line and a data line, and the peripheral area is internally provided with a test line and a binding point for connecting the test line with the grid line and/or connecting the test line with the data line. The method for testing the TFT-LCD array substrate comprises the following steps: connecting a signal line to be tested with the test line at the binding point in a laser welding way, and testing the signal line to be tested through the test line. Because the test line and the binding point are formed in the peripheral area, and the signal line to be tested is connected with the test line at the binding point in a laser welding way in the TFT-LCD array substrate testing process, a signal on the signal line can be tested, the test and analysis way of the liquid crystal panel can be strengthened and the comprehensive analysis ability of a TFT-LCD is improved.

For testing for stress-migration failure of interconnect, an interconnect test structure is formed with a first feeder line coupled to a test line by a first no-flux structure, and with a second feeder line coupled to the test line by a second no-flux structure. A respective width of ea ch of the first and second feeder lines is greater than a width of the test line. A resistance meter and a timer measure a stress-migration life-time of the interconnect test structure with a current being continuously conducted through the interconnect test structure that is continuously heated to a predetermined temperature.

The invention discloses an array substrate, a manufacturing method thereof and a liquid crystal panel, relates to the technical field of liquid crystal display, and aims to solve the problem of difficulty in performing array test on an array substrate comprising a GOA (Gate On Array) circuit in the prior art. The array substrate comprises a grid line, a grid line test line, a grid line test terminal and a GOA circuit, wherein the GOA circuit is connected with the grid line; the grid line test line is connected with the grid line test terminal; the array substrate is characterized by also comprising a grid line test control terminal, a grid line test control line and a plurality of test liquid crystal transistor TFTs (Thin Film Transistor); the grid line test control terminal is connected with the grid line test control line; and a grid electrode of each test TFT is connected with the grid line test control line, a drain electrode of each test TFT is connected with one said grid line, and a source electrode of each test TFT is connected with the grid line test line. The array substrate can be used for performing array test on the array substrate comprising the GOA circuit.

The invention discloses an array substrate, a display panel and a polarity reversal driving method. The array substrate comprises a test line area and a display area, wherein the test line area comprises at least one reference voltage line; each data line in the display area is connected with the reference voltage line through a switch; a node is formed between the switch and the data line; the node is connected with a source driving circuit. Through adoption of an existing structure of the test line area on the array substrate, the data line of each pixel is communicated with the reference voltage line before the source driving circuit outputs gray-scale voltage, so that charge sharing between the pixels is realized, the fluctuation range of driving voltage is reduced, and thus the power consumption of the circuit is reduced.

A manufacturing method of an array substrate for a liquid crystal display device includes among other features, preparing a substrate including a display area and a non-display area, forming first and second gate shorting bars in the non-display area and electrically connected to gate lines, forming first and second data shorting bars in the non-display area and electrically connected to data lines, forming n gate probe test lines in the non-display area, forming m data probe test lines in the non-display area, forming first connection patterns connecting the gate lines and the n gate probe test lines, and forming second connection patterns connecting the data lines and the m data probe test lines, wherein the gate lines include n gate groups connected to the n gate probe test lines, respectively, and wherein the data lines include m data groups connected to the m data probe test lines, respectively.

The invention discloses test paper for rapidly detecting the immunochromatography of cadmium ion colloidal gold and a preparation method and application thereof. The test paper consists of a sample pad, a colloidal gold combination pad, a nitrocellulose membrane, absorbent paper and a plastic base plate; The sample pad, the colloidal gold combination pad, the nitrocellulose membrane and the absorbent paper are sequentially stuck on the plastic base plate; an anti-cadmium ion monoclonal colloidal gold label is coated on the colloidal gold combination pad; a goat anti-rat IgG antibody and a complete antigen Cd-iEDTA-BSA of heavy metal cadmium are sequentially coated on the nitrocellulose membrane; the goat anti-rat IgG antibody is used as a quality control line; and the complete antigen Cd-iEDTA-BSA of the heavy metal cadmium is used as a test line. The test paper detects residual metal cadmium in ambient soil, a water body and an aquatic product based on the immunology theory of antigen antibody; and compared with the prior detection system, the test paper has the advantages of rapidness, cheapness, convenience, sensitivity and speciality, can give a result within five minutes and is convenient to carry along to carry out field monitoring.

The invention provides a hemoglobin, hemoglobin-haptoglobin composite and transferrin joint examination kit. The hemoglobin, hemoglobin-haptoglobin composite and transferrin joint examination kit comprises an upper shell, a lower shell, an immunostrip, test paper and the like; a gold-labeled composite containing a hemoglobin monoclonal antibody, a hemoglobin-haptoglobin composite monoclonal antibody and a transferrin monoclonal antibody is scribed on a nitrocellulose membrane; 3 test lines, a quality control line (15) and a gold-labeled composite membrane scribing line (8) are arranged on the nitrocellulose membrane in parallel. The invention further provides a preparation method and a detection method of the hemoglobin, hemoglobin-haptoglobin composite and transferrin joint examination kit. The hemoglobin, hemoglobin-haptoglobin composite and transferrin joint examination kit is convenient and simple in operation, stable in performance and accurate in result, has a relatively good reference value for early diagnosis and identification of colorectal cancer or colon cancer tumor or other tumors with lower gastrointestinal bleeding symptoms in clinic, significantly improves the positive detection rate of digestive hemorrhagic diseases, is suitable for clinical hospital examination and household self-examination, and provides measures for large-scale general examination of such diseases.

The present invention relates to a method to prepare a reagent kit to quickly diagnose mycobacterium tuberculosis antigens jointly packaged by 38KD and 16KD antigens and a test method. The blood antigen test paper of the present invention jointly packages 38 KD and 16KD of TB antigens into a lower part of a NC film to form a test line (T). Goat anti-mouse IgG is packaged into an upper part of the NC film to form a quality control line (C). In addition, anti-human IgG (mouse anti-human IgG, goat anti-human IgG or SPA) marks nanometer coloring particles (colloidal gold particles or sol particles or nanometer beads) to prepare a labeling pad. The NC film, the labeling pad, a sampling pad and a sample adsorption pad are glued and assembled onto a plastic board to form the test paper. During test, few tested sample is added onto the NC film of the test paper. And then, sample diluents are added through a sampling end. After sampling, it is necessary to observe result of immunoreaction, thus realizing quick auxiliary TB antigen diagnosis.

The invention provides a power distribution network line fault risk day prediction method and system. The method comprises steps that the external environment information of the location area of a tested line on the prediction date, load prediction data of the tested line on the prediction date, an operation plan of the tested line on the prediction date and the self status information of the tested line on the prediction date are acquired; the acquired external environment information of the tested line on the prediction date, the acquired load prediction data of the tested line on the prediction date, the acquired operation plan of the tested line on the prediction date and the acquired self status information of the tested line on the prediction date are inputted to a pre-constructed line fault risk day prediction model, and a fault generation probability prediction value of the tested line on the prediction date is generated. The method is advantaged in that based on line load prediction, weather prediction, the operation plan, the line operation environment and other situations, line fault risk day prediction is carried out, so relevant fault avoidance measures are adopted, fault generation is avoided, and power supply reliability is guaranteed.

This invention relates to one 2D displacement measurement method, which comprises the following steps: according to Wheatstone bridge circuit test principle to distribute the bridge resistance wire into direct or arc shape and the direct resistance wire is to test line displacement; the arc resistance wire is to test arc length change volume and then according to the relationship between arc length and radium to get test point rotary angle; through testing points in electrode coordinate displacement change to realize 2D displacement. The 2D displacement sensor comprises the test bridge line resistance wire and arc resistance wire fixed onto one structure around axis and it also comprises data transmission line.

This invention provides one dog rabies virus antigen glue gold immune chromatography test paper and its process, which comprises the following steps: according to antigen antibody immune combination basic principle to label the sheep IgG by glue gold label covering on the glass fiber film as combination pad; covering the purification rabies virus antigen and gene engineer expressed antigen and rabit IgG covering on the NC film as test line and quality control line; when testing the antibody, forming antibody combination to expose red band.

The invention discloses a method for detecting poor contact of battery voltage testing terminals, in particular to a technology for detecting the poor contact of voltage testing terminals, which is suitable for a rechargeable battery. Two ends of a voltage sampling circuit are connected with a test circuit capable of controlling on-off, and micro current is injected into the battery through a voltage test line of the battery; and then the voltage values of both ends of the anode and cathode of a voltage test line are respectively measured under the states of current switching on-off, no change of the voltage value shows good contact of voltage terminals, and the change of the voltage value shows that the voltage test terminals and the battery have contact resistance, i.e. the voltage test terminals have poor contact. The invention has good test effect, can easily detect the contact situation of the voltage test terminals, and can calculate the value of the contact resistance; and in addition, the method has small test current and short test time, and has no influence on the normal detection of the battery; and the test circuit for the method has simple principles and is easily realized.

A portable lateral test reader apparatus includes a processing arrangement, a digital camera, a user interface. The digital camera captures at least one image of locations of at least one test line, at least one control line and at least one reference of a test structure. The processing arrangement measures an intensity associated with the at least one test line, an intensity associated with the at least control line and an intensity of the at least one reference in the at least one image, forms a test result as a function of measured intensities associated with the at least on test line, the at least control line and the at least one reference, and outputs the test result using the user interface.

A side-pocket mandrel is used for a gas lift system. The mandrel has two external ports, which can use external check valves when deployed downhole. Before installing the mandrel, operators preferably pressure test the interface of a gas lift valve in the pocket of the mandrel. Internal pressure testing is performed. The mandrel, however, is suited for external-pressure testing, which is impractical for other types of side-pocket mandrels. In the external pressure test, a pressure test line is coupled to the inlet port on the mandrel, which is already threaded in a reinforced area of the mandrel to receive a check valve. The other inlet port is closed off with a plug or with a check valve. When external pressure is applied with the test line, operators can determine if the gas lift valve is properly seated (i.e., whether the latch is properly engaged in the pocket). Operators can also determine if the seals between the gas lift valve and the pocket are capable of holding external pressure.

The invention provides a display panel and a manufacturing method thereof, and a TFT test method in order to comprehensively evaluate the display effect of electroluminescent layers and the electrical characteristics (such as short-range uniformity) of thin-film transistors in a display panel. The display panel comprises a display area and a peripheral area of the display area. The peripheral area comprises an electroluminescent layer test area, a TFT test area, and outgoing lines. The electroluminescent layer test area includes multiple thin-film transistors respectively provided with an electroluminescent layer, a first test line connected with the sources of the multiple thin-film transistors respectively provided with an electroluminescent layer, and a switch lead and a second test line which are connected with the gates of the multiple thin-film transistors respectively provided with an electroluminescent layer. The TFT test area includes multiple thin-film transistors. Each of the multiple outgoing lines is used to connect the source and drain metal layer of one thin-film transistor in the electroluminescent layer test area and the source and drain metal layer of one thin-film transistor in the TFT test area.