5 results about "Memory defects" patented technology

Intranasal neuropeptide Y (NPY) analogs having D-amino acids, such as [D26-His]-NPY are provided for early intervention to prevent or to treat, to reverse, or reduce symptoms of stress-related impairments such as PTSD, depression, substance abuse, and / or memory deficits following exposure to traumatic or surgical stress.

Systems and methods are provided for implementing improved memory defect management. Bad pages, referring to portions of memory affected by memory errors, are identified by an operating system (“OS”) of a computing system. A list of bad pages may be periodically uploaded to a cloud data storage. The OS may also send the list of bad pages to a basic input / output system (“BIOS”) for repair of some of the bad pages. A list of repaired bad pages or corresponding status information may be sent to the OS. In some examples, the list of bad pages is compared with the list of repaired bad pages and may be updated accordingly. The list of bad pages may be compared with a previously uploaded list of bad pages that has been received from the cloud data storage. One list may be updated with, or replaced by, the other list based on the comparison.

The application relates to the technical field of data storage, and discloses a method for optimizing test data collected by a memory chip based on machine learning and a system thereof, which comprises the following steps: collecting original test data from a test platform of a to-be-tested memory chip; constructing a convolutional neural network model, learning a mapping relationship between test data features and memory defects through the convolutional neural network model, training the convolutional neural network model through the collected original test data, optimizing parameters of the convolutional neural network model through a back propagation algorithm according to a training result until the performance of the convolutional neural network model tends to be stable; converting a parameter vector output by the convolutional neural network model into an executable test vector of ATE; feeding the generated test vector as a new training sample back to an original test data update data set to iteratively train and optimize the convolutional neural network model. The application realizes the intelligentization of a test process and can effectively capture implicit defects sensitive to voltage and timing.

Disclosed embodiments include systems and methods for tracking defective memory using a shared memory defect list. Embodiments include firmware that identifies a memory buffer to store a list that includes an entry identifying a portion of memory as defective. The firmware sends an identification of the memory buffer to an operating system. The operating system reads the list from the memory and identifies the portion of defective memory based on the list. The operating system further manages memory locations used based on the identified portion of defective memory and avoids using the portion of defective memory. The firmware persists the contents of the memory to a non-volatile storage prior to shutting down the computer system.