2 results about "Memory defects" patented technology

The application relates to a memory defect detection method, a memory defect detection device and a computer readable storage medium. The memory defect detection method comprises the following steps: writing first data to a target memory cell array; opening a word line of the target memory cell when a bit line voltage of the target memory cell is at a target voltage after being pulled up or pulled down, so as to store data opposite to the first data in the target memory cell, and the storage time of the target memory cell is a preset time; closing the word line of the target memory cell; reading second data stored in the target memory cell; judging whether the first data and the second data are consistent; and when the first data and the second data are consistent, determining that the target memory cell has a defect causing storage failure within the preset time. The embodiment of the application can effectively improve the defect detection capability.