Memory shortage diagnostic method using failure mode as guide and its system

Abstract

The invention relates to an approach of memory defect diagnoses which uses failure mode as direction. It conducts analyzing and comparing failure mode and disable mode. Through comparing with defect database built previously, practical problems in memory making and design can be found according to possible defect in different failure modes defined in the database.

Description

technical field [0001] The invention relates to a memory defect diagnosis method and its system, in particular to a failure mode-oriented memory diagnosis method and its system. Background technique [0002] Memory is the most basic component in a digital system, and will occupy most of the area in a system-on-chip (SoC) design, so it has become an important part that determines the yield rate of a system-on-chip. As the capacity and density of embedded memory continues to increase, the testing problem becomes more difficult and complex. In order to effectively improve the manufacturing yield of the SoC, memory diagnosis (diagnostic) and failure analysis (Failure Analysis, FA) have become very important topics. [0003] Since most of the decrease in yield is caused by defects generated in the wafer manufacturing process, failure analysis can be used to check the cause of the defect that causes the decrease in yield. According to the results of the failure analysis, the des...

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Problems solved by technology

[0007] However, there are many shortcomings in both the failure mode and the failure bitmap. For example, many different causes are identified as the same failure mode, which will result in poor diagnostic accuracy.

On the other hand, although more fault models have been proposed, they are still insufficient for testing algorithms, and even fault models still have to rely on considerable manual analysis to confirm the cause of failure

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