Defect detection method and system for cross-architecture firmware heap memory

A defect detection and cross-architecture technology, which is applied in the field of defect detection of cross-architecture firmware heap memory, can solve problems such as low efficiency, insufficient processor architecture support, and difficult implementation, to solve limited storage space, overcome unrealistic needs, The effect of improving efficiency

Active Publication Date: 2020-08-28
TSINGHUA UNIV +1
View PDF4 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Embodiments of the present invention provide a defect detection method and system for cross-architecture firmware heap memory, which are used to solve the problems of insufficient processor architecture support, difficult implementation, and low efficiency after implementation in the cross-architecture firmware memory defect detection method in the prior art.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defect detection method and system for cross-architecture firmware heap memory
  • Defect detection method and system for cross-architecture firmware heap memory
  • Defect detection method and system for cross-architecture firmware heap memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0043] Aiming at the problems existing in the existing technology, a method and system for emulating memory defect detection of cross-architecture firmware is provided, which utilizes computing power-rich server resources to realize heap memory defect detection of cross-architecture firmware in a fixed and single operating environment.

[0044...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The embodiment of the invention provides a defect detection method and system for a cross-architecture firmware heap memory. The method comprises the steps: acquiring an application program in a simulator and firmware, and analyzing the application program in the simulator based on a binary translation technology, so as to enable the application program to be matched with a preset test environmentsystem architecture; and performing mapping to generate a shadow memory by traversing and executing the registered heap memory read-write hook function and the heap memory allocation hook function, and executing a preset memory defect detection algorithm based on the shadow memory to obtain a heap memory defect detection result. According to the embodiment of the invention, the cross-platform characteristic of the execution module is simulated; a detection tool does not need to be deployed into equipment where firmware is located, the unpractical requirement that a traditional memory detection tool needs to be deployed in the device is greatly overcome, the firmware test efficiency is improved, the problem that the storage space of the IoT device is limited is solved, and meanwhile, the memory defect detection module also provides an effective solution for detecting various heap memory defects in a cross-architecture firmware scene.

Description

technical field [0001] The invention relates to the technical field of defect detection, in particular to a defect detection method and system for a cross-architecture firmware heap memory. Background technique [0002] With the rapid growth of the number of IoT devices, the number of IoT devices is expected to reach 9.9 billion by the end of 2020. Today, the technical threshold for attacking is getting lower and lower, and IoT terminal devices have become new attack targets. Routers, cameras, refrigerators, sweeping robots, water meters, and smart street lights will all become potential attack targets. Kaspersky IoT Security Report "New trends in the world of IoT threats" pointed out that the number of IoT malicious samples captured has exploded in recent years. According to Gartner's forecast, by the end of 2020, more than 25% of cyber attacks detected by enterprises will involve IoT devices. [0003] Memory security flaws such as buffer overflows have always been the lo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F11/22G06F11/26
CPCG06F11/3688G06F11/2205G06F11/2273G06F11/261
Inventor 高健许怡文姜宇罗冰何跃鹰张晓明张嘉玮孙中豪曹可建李建强何清林王庆邢燕祯
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products