45 results about "Boundary scan" patented technology

The invention relates to a region-limited virtual touch interaction method and related equipment, and the method comprises the following steps: carrying out the boundary scanning of a region-limited projection plane, and obtaining a projection region contour coordinate set; performing region division on a projection plane based on the projection region contour coordinate set to obtain interaction region grid data; performing three-dimensional feature point collection on the hand of the user through a depth camera to obtain a hand key point space coordinate sequence; when the hand key point space coordinate sequence is within a depth interaction threshold range of interaction area grid data, collision detection is carried out on the hand key point space coordinate sequence based on the interaction area grid data, and a touch event judgment result is obtained; and performing visual feedback rendering on the interaction area grid data based on the touch event judgment result to obtain interaction state display data, thereby solving the technical problem of low interaction precision caused by difficulty in accurately positioning a gesture of a user in an open and irregular space in an existing solution.

The invention discloses a universal detection system and method for providing different types of connection interfaces, and the method comprises the steps: simulating a boundary scanning element through an FPGA chip of a universal test card, and cooperating with an RC circuit and a differential signal mode conversion element; therefore, different types of to-be-tested interfaces can be provided, the same general test card can be used for pin detection of an input and output pin, a grounding pin, a differential signal pin, a power supply pin and a differential clock signal pin, and the technical effect of universal detection of different types of connection interfaces can be achieved.

The invention discloses a chip layout image generation method based on a boundary tracking scanning line algorithm. A sub-graph-polygon data structure is designed, a maximum matrix of adjacent polygons of a sub-graph is established, the boundary scanning line algorithm is improved through the method, a complete chip layout is rapidly cut into a sub-graph, and a corresponding binary image is generated. According to the algorithm, a sub-graph circumscribed frame-polygon circumscribed frame data structure is designed, and polygons which are likely to intersect with the sub-graphs are quickly positioned. The data are stored to construct the maximum bounding box of all polygons contained in the current sub-graph, so that the algorithm does not need to calculate the intersection points of the polygons and the sub-graphs, and the time consumption for calculating the intersection points by the algorithm is reduced; in addition, a boundary tracking mode is designed, a scanning line algorithm is improved, intersection points of scanning lines and polygon boundaries do not need to be calculated when a certain line is scanned by storing all points in the boundaries, and algorithm complexity is further reduced.

The invention discloses a virtual power plant time-of-use electricity price dynamic optimization method and system, and the method comprises the steps: recognizing a power fluctuation component through obtaining distributed resource power time sequence data and a user response record, generating a price sensitivity coefficient, and constructing an elastic response space reflecting the user response potential; performing boundary scanning on the elastic response space to generate a schedulable capacity envelope, setting a trigger threshold along the envelope, and reversely deriving an energy storage intervention opportunity to form a time-sharing scheduling strategy; projecting the power grid dispatching price to an elastic space, cutting off based on a power balance requirement, and determining a price floating range; searching a user response path in the range, identifying a response intensity change inflection point, evaluating stability, and generating a price anchor point; performing time interval analysis on the anchor points to obtain a price ramp rate and a change speed, and extracting a synchronization rate index of group response behaviors; and comparing the synchronization rate with a target value to generate an optimized price sequence, thereby realizing dynamic adaptive adjustment of the time-of-use electricity price.

This invention discloses a chip layout image generation method based on a boundary tracking scan line algorithm. By designing a sub-image-polygon data structure and establishing a maximum matrix of adjacent polygons in the sub-image, this method improves the boundary scan line algorithm to quickly segment the complete chip layout into sub-images and generate corresponding binary images. The algorithm designs a sub-image bounding box-polygon bounding box data structure to quickly locate which polygons are most likely to intersect with the sub-image. Saving this data constructs the maximum bounding box of all polygons contained in the current sub-image, eliminating the need for the algorithm to calculate the intersection points of polygons with the sub-image, thus reducing the time consumption for intersection point calculation. Furthermore, a boundary tracking method is designed to improve the scan line algorithm. By saving each point in the boundary, when scanning a row, it is not necessary to calculate the intersection points of the scan line and the polygon boundary, further reducing the algorithm complexity.

A method performed by automated test equipment (ATE) includes power cycling a solid state drive (SSD) device under test by the ATE, wherein the SSD device includes a memory controller integrated circuit (IC) attached to a printed circuit board (PCB) having a PCB interface; communicating one or more signals between the ATE and the memory controller IC using the PCB interface in a normal system mode; sending a command to cause the memory controller IC to place the PCB interface in a boundary scan mode; remapping a portion of pins of the PCB interface to a boundary scan interface; and communicating one or more boundary scan signals between the ATE and the memory controller IC using the remapped portion of pins of the PCB interface in the boundary scan mode.

The present disclosure relates to a method of debugging a printed circuit board having at least one boundary-scan compliant device, the method using an electronic processing unit and comprising the steps of: retrieving boundary-scan properties of the at least one boundary-scan compliant device, the boundary-scan compliant device comprising a list of boundary-scan compliant circuit terminals of the at least one boundary-scan compliant device; selecting and displaying a circuit diagram of at least a portion of the device mounted on the printed circuit board, the circuit diagram comprising at least one device of a plurality of devices mounted on the printed circuit board and at least one other device of the plurality of devices, the other device comprising circuit terminals that are interconnected with circuit terminals of the device for visualizing at least the device, the other device and the interconnections. The present disclosure also relates to a corresponding debugging apparatus and to a corresponding computer program product.

A boundary-scan standard pin test system is disclosed. In the system, to-be-tested slots are electrically connected to form different to-be-tested series chains, or riser cards which are inserted into the to-be-tested slots are electrically connected to each other through first boundary-scan input interfaces and first boundary-scan output interfaces thereof or through second boundary-scan input interfaces and second boundary-scan output interfaces thereof, to form different riser-card series chains; a TAP controller provides a boundary-scan format test signal to a to-be-tested series chain or a riser-card series chain to make a test card perform a boundary-scan standard pin test, so as to achieve the technical effect of efficiency of providing the boundary-scan standard pin test for the to-be-tested slots on different to-be-tested boards by a testing machine.

A system, a device, and a method for determining test result based on output voltages of USB interface are disclosed. In the system, a USB specification-compliant pull-up component is disposed in a test fixture, the test fixture is controlled whether to output a voltage signal to a USB interface of a device under test, or not output voltage signal, and then an output voltage corresponding to the USB interface is read, and a test result is generated based on the read output voltage, so that a USB interfaces of computing apparatus which does not support boundary scan can be tested without booting an operating system of the computing apparatus, and the effect of increasing testing efficiency can be achieved.

This invention relates to a aging and screening device for antifuse-type FPGA devices, comprising a data stream generation module, an aging driver board, and an aging station board. The data stream generation module is implemented using Matlab software and generates an excitation JTAG data stream file through program design and algorithm iteration. The data stream generation module communicates with the aging driver board via a digital channel; the aging driver board and the aging station board are connected via a dedicated interface. This invention configures the serial data stream through a JTAG boundary scan port and is equipped with a large-capacity test code storage space and multiple programmable analog channels, providing and real-time monitoring of the device's operating voltage and current, as well as the device's operating status. It can meet the hardware resource and bit stream capacity requirements of antifuse-type FPGA devices of different types and sizes in aging and screening, and has wide applicability.

Integrated circuit devices, methods, and circuitry for configuring input / output (IO) circuitry for boundary scan chain testing is provided. An integrated circuit device may include a configuration register and IO configuration selector circuitry. The configuration register may define a voltage level of the IO circuitry based on a code stored in the configuration register. The IO configuration selector circuitry may determine the code based on a power-on-reset (POR) instruction.

An embodiment of an integrated circuit may comprise first circuitry to provide a boundary scan of a signal of the integrated circuit, wherein the first circuit includes an input test data signal and an output test data signal, and second circuitry coupled to the first circuitry to selectively output one of the input test data signal and the output test data signal. Other embodiments are disclosed and claimed.

The invention relates to a system for realizing DDR particle fault detection based on boundary scanning, which comprises a printed circuit board and a JTAG connecting line, the printed circuit board comprises an FPGA module and a socket, the JTAG connecting line is connected with a fault detection system and tested equipment, the FPGA module is arranged on the printed circuit board, the socket is in butt joint with the connecting line, and the socket is connected with the FPGA module. The invention also relates to a method for realizing DDR particle fault detection based on boundary scanning. According to the system and the method for realizing DDR particle fault detection based on boundary scanning, testing can be carried out without dismounting a BGA device, so that the dismounting time and the dismounting cost are saved. The system has two test modes and can meet different test requirements. The single-board mode can be selected when large-scale fault removal is needed, and the USB mode can be selected when accurate positioning and problem analysis are needed; and the DDR of different configurations can be tested, and the application range is wide. The test is automatically completed by the FPGA, the test speed is fast, and the operation is simple.

This invention discloses a configurable parallel test circuit and method for a three-dimensional stacked packaged chip. The test circuit includes configurable boundary scan unit pairs. The three-dimensional stacked packaged chip has multiple layers of small dies. Each configurable boundary scan unit pair includes a first configurable boundary scan unit for connecting to the input port of the small die and a second configurable boundary scan unit for connecting to the output port of the small die. The first and second configurable boundary scan units are configured into different modes through different control signals. Multiple configurable boundary scan unit pairs are set on each layer of small dies, and the multiple configurable boundary scan unit pairs on each layer of small dies are connected in series according to different modes. The configurable boundary scan unit pairs on adjacent layers of small dies are cascaded. The advantages of this invention are: flexible configuration of the number of scan chains, which is beneficial to practical applications, and low manufacturing cost.

The utility model discloses a boundary scan controller which comprises an XAVIER master control module, a boundary scan module, two JTAG interface connectors JTAG1 and JTAG2, an IO interface connector and a PSU power supply configuration module. The XAVIER main control module is connected with the boundary scanning module through an FPGA, I2C communication and a common IO, the boundary scanning module is connected with a JTAG1 and a JTAG2 through four lines, the boundary scanning module is connected with the IO interface connector through the common IO, and the PSU power supply configuration module is connected with the boundary scanning module and used for supplying power to the boundary scanning module. According to the utility model, the Ethernet port is adopted for communication, so that boundary scanning has wide applicability, high-speed transmission and flexibility, meanwhile, the SD card is adopted for storage, wide compatibility, relatively low power consumption and higher transmission rate are achieved, and the two groups of JTAG interfaces are connected to provide access to IO of a scan chain, so that the boundary scanning speed is improved. And the requirement on physical test points on the circuit board can be eliminated or greatly reduced, so that the cost is remarkably saved.

Integrated circuit devices, methods, and circuitry for configuring input / output (IO) circuitry for boundary scan chain testing is provided. An integrated circuit device may include a configuration register and IO configuration selector circuitry. The configuration register may define a voltage level of the IO circuitry based on a code stored in the configuration register. The IO configuration selector circuitry may determine the code based on a power-on-reset (POR) instruction.

This invention relates to the field of internal circuit testing technology for airborne equipment, specifically a boundary scan-based testing method for 659 bus input boards. The method includes: Step 1, designing the 659 bus main control board and test resource boards, designing the timing and control logic, and the industrial computer test control program; Step 2, connecting the 659 bus main control board, test resource boards, boundary scan controller, and industrial computer, and connecting the 659 bus main control board, test resource boards, and boundary scan controller to the board under test; Step 3, performing 659 bus testing; Step 4, performing input acquisition testing, including AD conversion testing and discrete input testing; Step 5, performing self-test functionality testing. This invention enables rapid fault location of 659 bus input boards, significantly reducing waste in the production process, saving resources, and lowering costs; it also features a simple structure, reliable operation, and strong applicability; and improves the testing and maintenance capabilities of airborne products.

The invention discloses a method for constructing a curved surface heat flux density boundary by using a scanning electron beam, which comprises the following steps of: discretizing the target curved surface heat flux density boundary, performing space division by adopting a uniform grid, and positioning an electron beam scanning point at the central position of each grid unit; setting a reference surface; acquiring a surface movement track of the electron beam on the curved surface heat flux density boundary; obtaining a projection point of each scanning point on the reference surface; calculating the electron beam power of the electron beam at the curved surface heat flux density boundary scanning point; calculating the target heat flux density of each projection point; and obtaining residence time distribution of the electron beam on different scanning points. The method can be suitable for a plane and a curved surface at the same time, the curved surface heating problem is converted into the plane heating problem, the residence time distribution is solved, meanwhile, the corresponding relation between the electron beam deflection angle corresponding to each scanning point and the current in the deflection coil is obtained, and electromagnetic control parameters of electron beams can be directly given based on a target heat flux density field; and the scanning electron beam heating experiment is directly guided.

The invention provides a metasurface design method and a metasurface, and the method comprises the steps: selecting a plurality of incident angles, carrying out the Bloch boundary scanning of a superstructure unit, and obtaining a period value-nanostructure height number set corresponding to each incident angle from the Bloch boundary scanning result based on a first screening principle; selecting the intersection of the nanostructure heights in all the period value-nanostructure height number sets, and determining the optimal nanostructure height from the intersection based on a second screening principle; based on the optimal nanostructure height, determining period values corresponding to different incident angles; according to the method, the optimal nanostructure height can be determined only by screening the Bloch boundary scanning results corresponding to the multiple incident angles and screening the intersection of the period value-nanostructure height number set, so that the calculation amount of adjusting parameter variables is reduced, and the design process of the metasurface is simplified.

A system, a device and a method for determining a test result according to a plurality of output voltages of a universal serial bus (USB) interface are provided, after a pull-up element conforming to a universal serial bus specification is arranged in a test fixture, whether the test fixture outputs a voltage signal to enter the USB interface of a device to be tested is controlled, and the output voltage corresponding to the USB interface is read; according to the technical means of reading the output voltage and generating the corresponding test result according to the read output voltage, the USB interface of the computing equipment which does not support boundary scanning can be tested under the condition that an operation system is not started, and the technical effect of improving the test efficiency is achieved.

The invention discloses a chip scanning test encryption circuit based on a Rossler chaotic system and a test method, and relates to the field of integrated circuit testability design safety. In order to make up for potential attackable vulnerabilities in a traditional password verification or stream encryption test scheme, a pseudo-random sequence generated by a chaotic system is introduced during encryption and decryption of test data, and high initial value sensitivity and nonlinearity of the chaotic system are utilized to effectively resist attacks aiming at classical stream passwords and improve the security of a scanning test. The scan test encryption circuit comprises a Rossler chaotic sequence generation module, a bit recombination module, an internal or boundary scan chain, a JTAG test access controller, a parallel-serial data conversion module, a perturbation unit and the like. The scanning encryption test method comprises the following steps: simulating on a computer to obtain a chaos pseudo-random sequence; performing XOR on the pseudo-random sequence and the original test data to obtain an encrypted test vector and a response thereof; the test machine injects the encrypted test vector into the to-be-tested chip, and meanwhile, the test machine obtains the response of the previous encrypted test vector; and comparing the read encrypted test response with the encrypted response stored in the test machine. The scanning test encryption circuit and the test method are compatible with an IEEE-1149 protocol interface and can continue to use existing test machine equipment.

The invention discloses a daisy chain removal processing system and method suitable for a server mainboard DDR connector boundary scan test. The system comprises at least one boundary scanning controller and an upper computer which is in real-time communication with the boundary scanning controller; the boundary scan controller is electrically connected with the mainboard CPU to be tested through at least one group of JTAG interfaces; a DDR connector on the mainboard to be tested is in butt joint with a plurality of DDR simulation test cards through golden fingers; a first control chip is arranged in the DDR simulation test card; a preset communication interface is electrically connected with an input or output pin of a to-be-tested mainboard CPU, real-time test instruction and data interaction work is achieved, a traditional JTAG daisy chain architecture is replaced with an I2C bus, various test signals are innovatively collected to a detectable pin of the CPU through a current-limiting resistance network, unified collection of test responses is achieved, and the test efficiency is improved. The problem of whole chain interruption caused by a single-point fault is solved, the reliability of a test system is improved, the jig structure is simplified, and the maintenance efficiency is improved.

The present invention belongs to the field of antenna and microwave technology, and discloses an antenna testing method and a testing control system based on a robotic arm for testing the performance of an antenna. The method of the present invention includes: presetting a scanning range and a scanning plane, and roughly scanning to determine the scanning center position; according to the amplitude and phase values recorded in the previous step, comparing with the preset scanning range conditions to estimate the scanning range; scanning one week along the boundary of the estimated scanning range, if the amplitude and phase read during this one-week scanning meet the preset scanning range conditions, a closed area is obtained; generating a rectangular scanning range that can cover the closed area as the formal scanning range; automatically generating a meandering scanning path according to the rectangular scanning range; scanning along the pre-determined meandering scanning path. By using the present invention, the position error accumulated in the antenna testing based on the robotic arm can be controlled within a certain range.

The embodiment of the application discloses a pin state control method and system of a chip, a chip and an upper computer, relates to the technical field of chips, and can effectively improve the design efficiency and integration of the chip. The method comprises the following steps: generating an enable control signal of an input-output control component corresponding to a target pin of the chip based on preset values moved into a boundary scan unit corresponding to the target pin through a JTAG interface; and controlling the input-output control component to be in an input enable state or an output enable state according to the enable control signal, so that, in the input enable state, a pin signal flows into the chip through the target pin, or in the output enable state, a pin signal flows out of the chip through the target pin. The application is suitable for being applied to the chip.

The present invention discloses a boundary scan circuit, comprising: a test access port controller, which provides data to be tested for a boundary scan chain and receives test results output by the boundary scan chain; a user-defined register, which provides selection control signals for a plurality of multiplexers; wherein the boundary scan chain has a plurality of stages connected in series, each stage includes a scan sub-chain, a scan bypass register and a multiplexer, and the multiplexer determines the output mode of input data according to the selection control signal; the output ends of the multiplexers of the previous-stage boundary scan chain are respectively connected to the input ends of the scan sub-chain and the scan bypass register of the next-stage boundary scan chain. The boundary scan circuit of the present invention can support multiple package test scenarios, improve test coverage and reduce test costs.

The application relates to the technical field of automatic driving car simulation, in particular to a kind of end-to-end big model two-way failure boundary scanning and hysteresis effect evaluation method and equipment.The method comprises the following steps: different intensity failure factors in limit failure scene factor library are generalized and combined to obtain different limit failure scenes;end-to-end intelligent driving big model is tested;hysteresis coefficient is calculated according to failure threshold and recovery threshold;the bottom strategy of end-to-end intelligent driving big model after failure is determined according to the size of hysteresis coefficient.The application calculates hysteresis coefficient to quantify system recovery capability, which helps to promote the algorithm progress of driving big model.

The application provides a RISC-V processor download debugging method and system based on an FPGA-JTAG interface, and the method comprises the following steps: based on a boundary scan register address and a bit width, modifying boundary scan configuration code related to an FPGA chip in host computer source code; based on the boundary scan register, modifying the cfg configuration code of the host computer to be configured as a boundary scan mode; constructing a data packet containing a boundary scan register address, a debugging instruction and debugging data by the host computer, and transmitting the data packet to a data parsing module through an FPGA-JTAG interface; according to the data packet format, analyzing a TDI signal, and switching a TAP state machine state through a control TMS signal to realize the debugging of the RISC-V processor. The application realizes the debugging by multiplexing the FPGA-JTAG interface, improves the debugging efficiency and reliability, simplifies the hardware design, and reduces the system cost.

A wireless device that can save and restore state information is disclosed. The wireless device stores state information in non-persistent registers during an active power state, routes the state information from the non-persistent registers to a non-volatile memory, via a boundary scan chain using one or more test signals, based on an indication that the wireless device is to enter a low-power state, and enters the low-power state after the state information is stored in the non-volatile memory. The wireless device may remove power from the processor, the non-persistent registers, the non-volatile memory, and one or more other portions of the wireless device during the low-power state. The wireless device may return to the active power state after a period of time and restore the state information to the non-persistent registers upon returning to the active power state.

The utility model discloses a test circuit, a circuit board and electronic equipment, when the test circuit runs, an output interface is connected with a tested chip, and then an upper computer controls a main control chip through a boundary scanning chip, so that the main control chip controls a digital-to-analog conversion module and adjusts analog voltage output by the digital-to-analog conversion module; then the conduction module enables the output interface and the driving output module to be conducted, so that the output interface can output current to the tested chip, in the process, the driving output module is used for enhancing the current of the output interface, and the tested chip returns data to the main control chip through the output interface; and the analog voltage is transmitted to the boundary scanning chip and the upper computer in sequence, so that the boundary scanning test can be completed, and the analog voltage output by the digital-to-analog conversion module is adjusted through the main control chip, so that the voltage of the output interface is changed, and the application scene is expanded.

The invention relates to the technical field of airborne equipment internal circuit testing, in particular to a 659 bus input board testing method based on boundary scan, which comprises the following steps: step 1, designing a 659 bus main control board and a testing resource board, and designing a time sequence and control logic and an industrial personal computer testing control program; step 2, connecting the 659 bus main control board, the test resource board and the boundary scan controller with the industrial personal computer, and respectively connecting the 659 bus main control board, the test resource board and the boundary scan controller with the tested board; step 3, performing a 659 bus test; 4, carrying out input acquisition testing, wherein the input acquisition testing comprises AD conversion testing and discrete input testing; and step 5, performing a self-checking mode function test. According to the 659 bus input board fault positioning method, rapid fault positioning of the 659 bus input board can be achieved, waste in the production process is reduced to a great extent, resources are saved, and cost is reduced; the structure is simple, the work is reliable, and the applicability is strong; and the test and maintenance capability of aviation airborne products is improved.