The invention discloses a multi-dimensional
test case generation method and device, and relates to the technical field of
test case generation, and the method comprises the steps: building a unified causal diagram model through analyzing a
schematic circuit diagram, designing a constraint document, simulating data and other multi-source inputs according to the
verification demands of a complex electronic
system, and automatically generating a multi-dimensional
test case, the technical problems that in related technologies, model type dependency is high,
natural language constraint analysis operation is lacked,
schematic diagrams, design specifications,
signal integrity
simulation and other data generated in the
design stage exist in an isolated mode, overrun scenes are ignored, and the scene coverage local limit is high are solved, and the purpose that multi-source
design data are fused, so that the design efficiency is improved is achieved. The unified causal
graph model is constructed, and the complete expression of the design intention and the dominance of the
implicit knowledge are realized, so that the technical effects of remarkably improving the coverage range of the
test scene and the utilization efficiency of the test resources are achieved.