32 results about "Systematic variation" patented technology

An acoustic borehole logging system for parameters of a well borehole environs. Full wave acoustic response of a scanning transducer is used to measure parameters indicative of condition of a tubular lining the well borehole, the bonding of the tubular to material filling an annulus formed by the outside surface of the tubular and the wall of the borehole, the distribution of the material filling the annulus, and thickness of the tubular. A reference transducer is used to correct measured parameters for variations in acoustic impedance of fluid filling the borehole, and for systematic variations in the response of the scanning transducer. Corrections are made in real time. The downhole tool portion of the logging system is operated essentially centralized in the borehole using a centralizer that can be adjusted for operation in a wide range of borehole sizes.

A method for analyzing a layout for a semiconductor integrated circuit, which includes a plurality of physical devices, to generate physical parameter distribution enabling accurate recognition of changes in transistor characteristics caused by systematic variations. The method includes holding systematic variation tables for physical parameters dependent on the layout of the semiconductor integrated circuit among physical parameters related to characteristics of the semiconductor integrated circuit, analyzing a design layout pattern of the semiconductor integrated circuit and selecting tables corresponding to the plurality of physical devices, and generating a physical parameter distribution based on the selected tables.

A statistical on-chip variation approach to timing analysis permits the automated or semi-automated selection of design-specific margins without requiring complex statistical libraries. By separately addressing the impact of random and systematic variations on timing, a design-specific margin can be obtained and used in downstream OCV analysis. In addition, where statistical libraries are available for some portions of a design, these can be incrementally included in the timing analysis to obtain more accurate results.

Two paths (arrival and required paths) as a target of analysis are united into a single path, and an on-chip random variation component σr about a plurality of nodes of the single path is calculated. Next, an on-chip variation component σchip is calculated on the basis of the on-chip random variation component σr and an on-chip systematic variation component σs. Subsequently, a delay variation Docv is calculated on the basis of a reference delay Dbase of the entire path and the on-chip variation component σchip.

A two-dimensional capacitive touch sensor having a cover layer of varying thickness arranged on top of its electrode structure. An array of sensing nodes is formed between edge portions of the receiver electrodes and adjacent portions of the transmitter electrodes. To compensate for the varying thickness of the cover layer, the length of the edge portions per sensing node is varied to equalize node sensitivity across the sensor and thus suppress the systematic variation in node sensitivity which would otherwise arise as a result of the varying thickness of the cover layer.

One embodiment of the present invention provides a system that predicts manufacturing yield for a die within a semiconductor wafer. During operation, the system first receives a physical layout of the die. Next, the system partitions the die into an array of tiles. The system then computes systematic variations for a quality indicative value to describe a process parameter across the array of tiles based on the physical layout of the die. Next, the system applies a random variation for the quality indicative parameter to each tile in the array of tiles. Finally, the system obtains the manufacturing yield for the die based on both the systematic variations and the random variations.

An airborne ultrasonic testing system includes two sets of ultrasound transmitters and receivers, an ultrasound frequency generator, a computer analyzer, and a controller. The ultrasound transmitters and opposing receivers are fixedly mounted at oblique angles from a support. A seal-receiving slot is defined between the transmitters and receivers, and is sized to receive a sealed edge portion of a container to be tested. The ultrasound transmitters preferably emit respective ultrasound streams that encounter a top surface of a sealed edge portion of the container at an angle between approximately 0-45 degrees, and most preferably, approximately 45 degrees. The angle of ultrasound emission of the first transmitter may be inverse of the angle of emission of the second transmitter. The signal response of each pair of receivers can be processed individually or combined to produce a summary test result of the two measurements that eliminates systematic variation associated with material variation.