5results about How to "Small spot size" patented technology

The present application provides a semiconductor device, which is provided with a semiconductor element on an upper side of an adhesive layer, the adhesive layer is provided with a tapered portion, a semiconductor unit included in the semiconductor element is provided on an upper side of the adhesive layer, and a first cross-sectional area of the semiconductor unit is greater than a second cross-sectional area of the tapered portion. When the semiconductor device is transferred, the laser only needs to irradiate the tapered portion, so that the area of the required laser spot is reduced, thereby stabilizing the transfer of the semiconductor device and avoiding damage to the semiconductor device.

This utility model discloses a laser triangulation ranging device and system; relating to the field of laser ranging technology; including a laser for emitting laser light towards the object being measured; a light-receiving lens assembly for receiving the reflected laser light from the object being measured and correcting and focusing the reflected laser light spot; the light-receiving lens assembly includes a focusing lens and multiple correction elements; the light spot of the reflected laser light from each correction element is corrected in different properties and falls onto the light-receiving element; this solution improves the structure of the traditional laser triangulation ranging optical path by correcting the light spot of the reflected laser light spot in different properties through the light-receiving lens assembly, ensuring measurement accuracy, reducing costs, and effectively accelerating assembly efficiency; by increasing the light spot size in the laser transmission direction at the position of the light-receiving element through the light-receiving lens assembly, the center of the light spot does not need to be aligned with the center of the light-receiving element to be detected, reducing the structural accuracy of the laser triangulation ranging device and improving assembly efficiency.

The invention relates to a micropore internal illumination and imaging system, which comprises an optical illumination part and an optical imaging part, and is characterized in that the optical illumination part comprises an electrodeless laser driving point light source, a collimating lens, a semi-transparent and semi-reflective lens and a coupling system; the electrodeless laser driving point light source is used for generating an illumination light source; the collimating lens is used for collimating the illumination light source to form a collimated light beam; the semi-transparent and semi-reflective lens is arranged on a light path of the collimated light beam and is used for reflecting the collimated light beam to form a reflected light beam; the coupling system is arranged on a light path of the reflected light beam and is used for focusing the reflected light beam to form a focused light beam coupled into the micropore; and the optical imaging part is arranged on a light path of a transmission light beam of the semi-transmitting and semi-reflecting lens and is used for carrying out optical imaging on optical information in the micropore transmitted by the coupling system and the semi-transmitting and semi-reflecting lens. According to the system, a point light source can be coupled into the interior of the micropore, the interior of the micropore is illuminated, and optical information in the micropore is comprehensively presented.

The present invention discloses a coherent population trapped cold atomic clock device and a control method thereof. The device comprises: a Raman light generation and control module, which is used to generate a Raman laser with adjustable frequency difference and controllable switch; a spatial beam separation and control module, which is used to split the Raman laser into a detection laser and a preparation laser in the vertical direction, and combine the Raman laser beam into a Raman laser beam group to input into a differential detection module; a differential detection module, which is used to split the Raman laser beam group into a signal laser and a reference laser, and perform differential detection and processing on the reference laser and the signal laser to output a Ramsey signal. The present invention obtains the preparation laser and the detection laser by separating the laser beams of the preparation pulse and the detection pulse, and detects the obtained signal laser and reference laser, which can be free to evolve for a longer time, and at the same time, the laser spot size can be made smaller, reducing the background noise caused by the laser, thereby improving the accuracy of the atomic clock.

The present invention discloses a method for realizing compact nanoscale displacement measurement based on super-oscillating light field, including: irradiating incident radially polarized light to a super-oscillating lens to generate a super-oscillating nanoscale light field; the super-oscillating nanoscale light field interacts with a silicon scatterer to generate scattered light; the scatterer is displaced in different directions along the nanoscale, and each time it moves, a CCD camera collects a forward scattered light field; and the displacement of the nanoscale scatterer is detected using the scattering signal of the super-oscillating nanoscale light field. The device of the present invention does not rely on a large-sized objective lens, and the super-oscillating lens has a micron-level thin thickness, and can generate a light spot that exceeds the diffraction limit, and has better integration capability and detection accuracy; the directional index parameter is introduced I DX and I DY The actual nanoscale displacement of the scatterer is parametrically modeled, so that the displacement of the scatterer can be reconstructed, which has important application value in industrial production to test whether nano-micro devices deviate from the predetermined installation position.