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44 results about "Atom probe" patented technology

The atom probe was introduced at the 14th Field Emission Symposium in 1967 by Erwin Wilhelm Müller and J. A. Panitz. It combined a field ion microscope with a mass spectrometer having a single particle detection capability and, for the first time, an instrument could “... determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”.

Stamping prediction method based on multi-machine learning model and automatic compensation device

The invention relates to the technical field of computer science, in particular to a stamping prediction method based on a multi-machine learning model and an automatic compensation device.The stamping prediction method comprises the steps that firstly, a sheet microstructure and material characteristics are obtained through a transmission electron microscope and an atomic probe tomography technology, and then finite element simulation sampling is conducted; a data set is expanded by using an adaptive algorithm, multiple models are constructed and trained to obtain a final springback prediction model, an automatic compensation device is embedded to realize automatic compensation, and the automatic compensation device covers visual parameter input, embedded springback prediction, springback compensation calculation and an automatic control module. Parameters can be visually input, springback can be accurately predicted, a compensation value can be calculated, and the process can be adjusted. The method aims at solving the problems that in the high-strength plate stamping process, due to springback, the size and shape of a part deviate from the design requirement, and a traditional prediction and compensation technology is insufficient in precision and efficiency.
Owner:GUIZHOU UNIV

Partial discharge detection system based on Rydberg atoms

The invention relates to a partial discharge detection system based on Rydberg atoms in the field of partial discharge detection of electrical equipment, the system comprises an optical path frequency stabilization module, an atom probe, a photoelectric detection module, a controller module and a power frequency synchronous trigger signal circuit, the optical path frequency stabilization module locks 852.35 nm probe light and pump light frequency less than 509.53 nm through SAS and EIT technologies, and the atomic probe is used for detecting the frequency of the probe light. Inducing transition from a cesium atom ground state to a first excited state to a Rydberg state; under the effect of partial discharge pulse, the atomic probe outputs a modulated EIT transmission spectrum signal, after photoelectric conversion and filtering, the controller module analyzes the amplitude and phase information of the pulse in combination with a power frequency synchronizing signal, the upper computer generates a PRPD diagram to analyze the discharge correlation, the detection sensitivity of the system reaches-50dBm, the frequency band of 300MHz-2GHz is covered, the dynamic range is greater than or equal to 50dB, the equivalent height is greater than or equal to 20mm, and the discharge correlation is greater than or equal to 20mm. Broadband and high-resolution detection is achieved, the problem of phase synchronization is solved, and the device is suitable for high-voltage environment on-line monitoring.
Owner:BEIJING KEWEI QUANTUM TECHNOLOGY CO LTD +1

Neutral atom beam generation device and neutral atom detector calibration device

The invention provides a neutral atom beam generation device and a neutral atom detector calibration device. The neutral atom beam generation device comprises an ion beam generation device used for emitting a mixed beam; the particle energy testing device comprises an incident end, a first emergent end, a second emergent end and an acquisition device, the incident end is used for receiving the mixed beam; the incident end is communicated with the second emergent end through an arc-shaped channel, and a deflection magnetic field is arranged at the arc-shaped channel, so that positive ions in the mixed beam flow deflect and bombard the acquisition device; the acquisition device is used for acquiring a first bombardment position of positive ions; the first emergent end is used for emitting a first ion beam; the processing device is connected with the collecting device and used for determining the deflection radius of the positive ions according to the first bombardment position and determining the energy of the positive ions and the neutral atoms according to the deflection radius; and the particle screening device is used for absorbing positive ions and negative ions in the first ion beam so as to emit a neutral atom beam.
Owner:UNIV OF SCI & TECH OF CHINA

Electrical and thermal connection cable for charged particle microscope

The systems, methods, and communication cables taught herein provide cryogenic cooling, high voltage connections, and other electrical connections to a sample on a stage within a vacuum environment while still enabling stage motion in at least five degrees of freedom with minimal stage vibration to achieve new or improved measurement applications in situ within a microscope, such as in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, in-situ microscopy, and in-situ microscopy. Such as atomic probe chromatography and testing of quantum computing components. The connection cables taught herein combine connections into a single connection cable within an outer spring suitable for use in ultra-high vacuum. These connection cables are also shaped and configured to maintain at least a minimum spacing distance from components in the surrounding environment (e.g., chamber walls and other equipment) to prevent mechanical, electrical and thermal shortcuts.
Owner:FEI CO

Sample clamping auxiliary device for three-dimensional atom probe detection

The invention discloses a sample clamping auxiliary device for three-dimensional atom probe detection. The sample clamping auxiliary device comprises a rack, and a mounting piece is arranged over the left side of the rack. The feet of the three-dimensional atom probe support are placed in the connecting disc, the main gear is driven to rotate through the output end of the transmission motor, all the clamping pieces are driven to synchronously move towards the position close to the circle center of the connecting disc, the feet of the three-dimensional atom probe support are clamped, installation is rapidly achieved, operation of workers is not needed, and the work efficiency is improved. When a sample needs to be leveled, the first movable arm, the second movable arm, the third movable arm and the fourth movable arm are all kept in a rotating state by pushing or retracting the output ends of the air cylinders, so that the movable seat moves to drive the movable rod to rotate, and the output ends of a plurality of groups of air cylinders can be respectively controlled; and the installation piece can be kept in a horizontal state, convenience and rapidness are achieved, and the requirements of workers are further met.
Owner:SHANGHAI UNIV