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294 results about "Number density" patented technology

In physics, astronomy, chemistry, biology and geography, number density (symbol: n or ρN) is an intensive quantity used to describe the degree of concentration of countable objects (particles, molecules, phonons, cells, galaxies, etc.) in physical space: three-dimensional volumetric number density, two-dimensional a real number density, or one-dimensional linear number density. Population density is an example of areal number density. The term number concentration (symbol: C, to avoid confusion with amount of substance n) is sometimes used in chemistry for the same quantity, particularly when comparing with other concentrations.

Identification of reservoir geometry from microseismic event clouds

A method for characterizing fracture planes generated during a hydraulic fracturing process, comprises receiving microseismic data from the hydraulic fracturing process and processing a microseismic event cloud from the received microseismic data. This is followed by determining at least one reservoir geometry from the microseismic event cloud. The determination of geometry may consist of determining multiple candidate geometries and probability of each. In some forms of the invention the method may comprise postulating a set of candidate geometries with differing numbers of fracture planes, determining the most probable locations of the postulated fracture planes in each member of the set of candidate geometries and also determining relative probabilities of the candidate geometries in the postulated set. Determining a location of a fracture plane may comprise calculating a number density for each microseismic event, dependent on distance from some possible location of a fracture plane or fracture network. Finding the location of a plane may then be finding the location for which the number density is greatest. The determination of reservoir geometry may be followed by determination of the area of the fracture planes and/or by a prediction of production.
Owner:SCHLUMBERGER TECH CORP

Methods for tailoring the surface topography of a nanocrystalline or amorphous metal or alloy and articles formed by such methods

Electrochemical etching tailors topography of a nanocrystalline or amorphous metal or alloy, which may be produced by any method including, by electrochemical deposition. Common etching methods can be used. Topography can be controlled by varying parameters that produce the item or the etching parameters or both. The nanocrystalline article has a surface comprising at least two elements, at least one of which is metal, and one of which is more electrochemically active than the others. The active element has a definite spatial distribution in the workpiece, which bears a predecessor spatial relationship to the specified topography. Etching removes a portion of the active element preferentially, to achieve the specified topography. Control is possible regarding: roughness, color, particularly along a spectrum from silver through grey to black, reflectivity and the presence, distribution and number density of pits and channels, as well as their depth, width, size. Processing parameters that have been correlated in the Ni—W system to topography features include, for both the deposition phase and the etching phase of a nanocrystalline surface: duty cycle, current density, deposition duration, plating chemistry, polarity ratio. The relative influence of the processing parameters can be noted and correlated to establish a relationship between values for processing parameters and degree of topography feature. Control can be established over the topography features. Correlation can be made for any such system that exhibits a definite spatial distribution of an active element that bears a predecessor spatial relationship to a desired topography feature.
Owner:MASSACHUSETTS INST OF TECH

Fine-particle counter

The present invention provides a fine-particle counter with which the number density of nanometer-sized fine particles born in a gas phase, which is extremely low, can be accurately measured under wide-ranging pressure conditions from pressurized conditions to low-pressure conditions.
After contact-mixing, in a mixer 3, saturated vapor of a high-boiling-point solvent produced in a saturator 2, a component of a condensed nucleus detector 1, with nanometer-sized fine gas-born particles, condensed droplets of the saturated vapor whose nuclii are the fine particles are produced in a condenser 4 by heterogeneous nucleation. The number of the condensed droplets per unit of time is then counted with an optical detector 5 and is output as a pulse signal, and a computer 19 computes the number density of the nanometer-sized fine particles born in the aerosol from this pulse signal, the gas flow rates controlled by the flow meters 6, 12 and 10, and the other data that are transmitted to the computer 19 via an interface 18. The internal space of the mixer 3 has a narrowest passage having a circular cross section, situated in the center between the lower end of the mixer from which the carrier gas enters and the upper end of the mixer from which the carrier gas exits, a truncated-cone-shaped part whose cross section is circular and whose diameter gradually decreases so that the diameter on the lower end side is greater than the diameter on the narrowest passage side, and a reverse-truncated-cone-shaped part whose cross section is circular and whose diameter gradually increases so that the diameter on the narrowest passage side is smaller than the diameter on the upper end side. An aerosol inlet communicating with the aerosol inlet tube 8 is positioned at the narrowest passage.
Owner:RIKEN
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