165 results about "Bright field image" patented technology

Systems and methods for multi-dimensional metrology and inspection of a specimen such as a bumped wafer are provided. One method includes scanning the specimen with partial oblique illumination to form an image of the structure, either through the normal collection angle or through an oblique collection angle. The method also includes integrating an intensity of the image and determining a height of the structure from the integrated intensity. The integrated intensity may be approximately proportional or inversely proportional to the height of the structure. In addition, the method may include scanning the specimen with bright field illumination to form a bright field image of the specimen. The method may also include determining a lateral dimension of the structure from the bright field image. Furthermore, the method may include detecting defects on the specimen from the bright field image or the obliquely-illuminated image.

A system and method for simultaneously obtaining a plurality of images of an object or pattern from a plurality of different viewpoints is provided. In an exemplary embodiment, proper image contrast is obtained by replacing the light sources of earlier systems with equivalent light sensitive devices and replacing the cameras of earlier systems with equivalent light sources. With such a system, bright-field images and dark-field images may be simultaneously obtained. In one aspect of the invention, a light source is positioned to illuminate at least a portion of an object. A plurality of light guides having input ends are positioned to simultaneously receive light reflected from the object and transmit the received light to a plurality of photodetectors. The light guides are arranged such that their respective input ends are spaced substantially equally along at least a portion of a surface of an imaginary hemisphere surrounding the object. The signals generated by the photodetectors (as a result of light detection) are processed and a plurality of images of the object are formed. Another aspect of the invention provides a method for generating composite images from simultaneously obtained images. Equivalent regions of each image (corresponding to geographically identical subpictures) are compared. The subpicture having the highest entropy is selected and stored. This process continues until all subpictures have been considered. A new composite picture is generated by pasting together the selected subpictures. In another aspect of the invention, the vector of relative light values gathered for each pixel or region of an object illuminated or scanned (i.e., one value for each photodetector) is used to determine reflectance properties of points or regions illuminated on the object or pattern. The reflectance properties may be stored in a matrix and the matrix used to read, for example, a Bar Code of a data matrix symbol.

A method for generating a brightfield type image, which resembles a brightfield staining protocol of a biological sample, using fluorescent images is provided. The steps comprise acquiring two or more fluorescent images of a fixed area on a biological sample, mapping said fluorescent image into a brightfield color space, and generating a bright field image. Also provided is an image analysis system for generating a brightfield type image of a biological sample using fluorescent images.

Methods and apparatus for imaging a sample using a microwell array are provided. The methods and apparatus allow side view imaging of a sample to acquire fluorescence or bright field images.

The present invention provides a method and a system for inspecting a wafer. The system comprises an optical detection head, a wafer operation table, a wafer stack, a XY operation table and a vibration separator. The optical detection head comprises some lighters, an image collector, an objective lens and other optical componets. The system and the method can collect bright field image, dark field image, 3D image and redetection image. The collected image is converted to an image signal and is transmitted to a programmable controller for processing. The detection is performed in the wafer moving process. The collected image is compared with a reference picture for finding the defect on the wafer. The invention provides a process method used for generating an optimized reference image and an optimized process method for detecting the picture. The generation process of the reference picture is performed automatically.

An aluminum alloy sheet of specific Al-Mg-Si composition, which, owing to preliminary aging treatment under adequate conditions, has a specific metallographic structure in which there are a large number of clusters of specific size (each being an aggregate of atoms) expressed in terms of number density, which, when observed under a transmission electron microscope of 1,000,000 magnifications, appear as dark contrast in the bright field image. It is superior in paint baking hardenability and is invulnerable to room temperature aging during storage for a comparatively long period of 1 to 4 months.

A method and a particle analyzer are provided for determining a particle size distribution of a liquid sample including particles of a lower size range, particles of an intermediate size range, and particles of an upper size range. A dark-field image frame is captured in which the particles of the lower size range and the particles of the intermediate size range are resolved, and a bright-field image frame is captured in which the particles of the intermediate size range and the particles of the upper size range are resolved. Absolute sizes of the particles of the intermediate size range and the particles of the upper size range are determined from the bright-field image frame. Calibrated sizes of the particles of the lower size range are determined from the dark-field image frame by using the particles of the intermediate size range as internal calibration standards.

The invention relates to the technical field of CT and provides an X-ray CT image enhancement method based on double energy spectrums. In order to realize image fusion and enhancement of two images and compensate defects of a single image, the invention adopts the technical scheme as follows: the X-ray CT image enhancement method based on double energy spectrums comprises the following steps: scanning to obtain multiple sets of dark field images and calculating the average value of dark fields; moving a sample out of a view field, and respectively obtaining N sets of bright field images under high voltage and low voltage; calculating projected images under the high voltage and low voltage; unifying projection data under the high voltage and low voltage to a dimension according the gray level unifying principle; performing wavelet decomposition on N sets of corrected high and low energy projected images at the same position, and performing image fusion through the wavelet transform method; performing CT reconstruction through the utilization of fused projected images. The X-ray CT image enhancement method is mainly used for CT equipment design and manufacturing.

Image processing apparatus 1 includes a hardware processor that acquires a bright-field image of a cell and a fluorescence image in which fluorescent spots of a fluorescent reagent applied dropwise to a region including the cell are imaged, and that uses a convolutional neural network to extract respective image features of the bright-field image and the fluorescence image and to output classification information concerning the cell.

The invention relates to a real-time three-dimensional laser fluorescence microscopic imaging device. The real-time three-dimensional laser fluorescence microscopic imaging device is compatible with a traditional bright field illumination microscopic imaging working mode. The real-time three-dimensional laser fluorescence microscopic imaging device is divided into a laser excitation module, a bright field imaging illumination module, a digital detection module, an eyepiece observation module and a control module according to functions. A spatial light modulator is adopted to load a pyramid phase, so that a Gaussian-Bessel illumination light field can be generated at the backfield of a focusing objective lens. In a detection optical path, a twisted Dammann grating is additionally adopted so as to realize simultaneous imaging of a multi-surface object, fluorescence collected from the objective lens simultaneously images a plurality of axial planes to an electron-enhanced CCD detection surface through a multi-surface imaging technology, and therefore, real-time three-dimensional fluorescence imaging can be realized. The real-time three-dimensional fluorescence imaging technique has an important practical value in biological living tissue and living cell microscopic imaging.

Illustrative embodiments of a method are disclosed, which comprise applying a texture filter to a bright field image of a wound healing assay, generating a wound mask image in response to an output of the texture filter, and determining a wound area of the wound healing assay by counting a number of pixels in the wound mask image corresponding to the wound area. Illustrative embodiments of apparatus are also disclosed.

The invention provides a method, a system and equipment for tomography of the mammary gland and an image acquisition and processing method. The method for tomography of the mammary gland includes: acquiring at least two dark field images and at least two bright field images corresponding to each X ray source, wherein the at least two dark field images are acquired under the conditions that no article is scanned and no X ray source is started, and the at least two bright field images corresponding to each X ray source are acquired under the conditions that no article is scanned and a plurality of X ray sources arrayed at intervals on the same plane are started sequentially one by one; obtaining an average dark field image and an average bright field image corresponding to each X ray source by means of summating and averaging; correcting projection images, corresponding to the plurality of X ray sources, of a scanned article to obtain corrected projection images according to the average dark field image and the average bright field image corresponding to each X ray source; subjecting the corrected projection images to iterative reconstruction to obtain a reconstructed chromatographic image on the basis of a chromatographic image iterative reconstruction method. Accurate three-dimensional mammary gland structural information can be provided to effectively avoid the problem of image overlapping in traditional X-ray mammary gland imaging.

The present invention provides an X-ray image sensor and a method for eliminating image blur. According to the method, each pixel is connected with two thin film transistor (TFT) switches, a single scan line is between pixel rows, and two read lines are between pixel columns, so that one row of pixel is independently controlled by scan lines of upper and lower sides; and an upper read circuit is used for reading a bright field image, and a lower release circuit is used for clearing residual information in a dark field. Read and release at the upper and lower sides are performed synchronously, but the difference between read and release is one row of spatial physical position, so that after one frame of bright field image is collected, residual image information in the dark field is also cleared one time. When a current bright field image is collected, lag information of the current frame image is cleared. A single clear operation and extra clearing time are not increased. The method can be used in a static collection condition or a dynamic collection condition, and effectively improves the image collection frequency and image quality.

A method for generating a brightfield type image, which resembles a brightfield staining protocol of a biological sample, using fluorescent images is provided. The steps comprise acquiring two or more fluorescent images of a fixed area on a biological sample, mapping said fluorescent image into a brightfield color space, and generating a bright field image. Also provided is an image analysis system for generating a brightfield type image of a biological sample using fluorescent images.

The invention provides a flat panel detector and a method for eliminating image persistence of vision of the flat panel detector. The method comprises that 1) the flat panel detector is used for exposure, a frame of original bright-field image and a frame of original dark-field image are collected, and a collection time point t1 of the original bright-field image is recorded; 2) the flat panel detector is used to continue exposure, another frame of original bright-field image and another frame of original dark-field image are collected, and a collection time point t2 of the original bright-field image is recorded; 3) according to a natural attenuation rule of the image persistence of vision as well as a time interval between t1 and t2, a weighting coefficient is obtained; and 4) the weighting coefficient obtained in the step 3) is used to compensate the original dark-field image collected in the step 1), and then implement persistence of vision correction on the original bright-field image collected in the step 2) by difference operation. The method of the invention is simple in process and simplified in algorithms, is highly practically and is high in the system integrated level.

A fluorescent image, and either a bright-field image or a phase difference image of a plurality of cells are acquired by a microscope. A position of each cell is specified in the fluorescent image, and then a cell region of each cell is specified using the bright-field image or the phase difference image. A fluorescent part other than the cell region is thereby excluded. A class of each cell is determined, that is, the cells are classified. Thereafter, based on these results, a report is created.

The invention relates to a CT system beam hardening elimination method based on a sonogram. The method comprises the following steps of obtaining CT projection image data; removing a scan object from a check platform of a CT machine for scanning to obtain CT bright field image data and calculating average bright field image data of the CT bright field image data; scanning to obtain CT dark field image data and calculating average dark field image data of the CT dark field image data; performing preprocessing and coordination transformation on the CT projection image data to obtain a projection data sonogram and performing filtering processing and correction on the sonogram; rebuilding a CT image based on the corrected projection data sonogram. According to the CT system beam hardening elimination method and a CT system beam hardening elimination system based on the sonogram, a series of processing is performed on the CT projection image data before rebuilding the CT image, so that the goodness of fit between the CT projection image data and the actual image data is improved, therefore the beam hardening can be precisely eliminated.

There is disclosed a charged particle beam device which judges whether or not an image based on a dark-field signal has an appropriate atomic number contrast. Input reference information, a bright-field image or a back-scattered electron image is compared with a dark-field image, and it is judged whether or not a correlation value between them or the dark-field image has a predetermined contrast. According to such a constitution, it is possible to obtain information by which it is judged whether or not the dark-field image has an appropriate atomic number contrast.

The invention provides a TiAl based alloy metallographic specimen corroding method. The method comprises the following steps: kibbling and polishing a TiAl based alloy specimen on silicon carbide paper, and then carrying out electrolytic corrosion, wherein the metallographic specimen to be observed is utilized as an anode, a stainless steel sheet is utilized as a cathode, an electrolytic corrosion solution is utilized as a conducting medium, the electrolytic corrosion voltage is 15-18V, and the electrolytic corrosion time is 30-240s; then washing clean and blow-drying; and observing a clear TiAl based alloy microscopic structure under an ordinary light microscope bright field image condition. The method provided by the invention has the advantages of solving the problem of difficulty in display of the TiAl based alloy metallurgical structure, enabling the to-be-observed surface of the specimen to form megascopic color, integrally and clearly displaying TiAl based alloy structures in different states, obtaining clear and beautiful images by virtue of observation under an ordinary optical metalloscope, enabling grain boundaries in the alloy to be clear and visible and integrally displaying the internal structure characteristics of grains. The method is simple and convenient to implement and does not need special equipment. Compared with other chemical metallographical corroding methods, the method provided by the invention has the advantages of easily controlled conditions, simplicity in operation and good experiment repeatability.

The invention discloses a method for identifying dust and pocking marks on a surface of a big-caliber optical element. The method comprises the following steps of: utilizing an image acquisition device to acquire surface damage images of the big-caliber optical element under the condition of a light field to serve as sample images, and marking the damage type corresponding to each sample image; extracting characteristic vectors of the acquired sample images; performing pre-treatment on the obtained characteristic vectors; regarding the characteristic vectors after the pre-treatment as input variables of a mode identification classifier, and regarding corresponding damage type labels as output variables of a mode identification classifier so as to obtain a mapping relationship between the input variables and the output variables; identifying the damage types of the tested samples based on the mapping relationship, and outputting the identification result. The mode identification method is adopted to start from the texture characteristics of images in the light field, so that the automatic judgment problem of the dust and the pocking marks on the surface of the big-caliber optical element is solved.

The invention provides a multichannel fluorescent microscopy composite microscopic system, and belongs to the technical field of microscopes. The multichannel fluorescent microscopy composite microscopic system comprises a microscope body, an imaging module and a composite lighting module. A mechanical rotating mirror is controlled to change the light path of the composite lighting module through a control system, and light matched with the imaging module and modulated through different modes is selected to enter the microscope body by the mechanical rotating mirror to perform lighting on a sample. The device has four functions including a two-color fluorescent localization microscopic function, a structured light lighting microscopic function, a function of fluorescent recovery after photobleaching and a bright field imaging function respectively. The appropriate method can be selected to perform high spatial resolution or high time resolution imaging on the sample in a bioexperiment according to the characteristics of the sample and the imaging requirements, and different modes of imaging can be performed on the same position of the same sample so that the problem of one-sidedness of the imaging result of the single microscopic method can be solved.

A wafer inspection system has a bright field imaging beam path and a dark field imaging beam path to obtain bright field images and dark field images of a full 300 mm wafer. The optical system provides for telecentric imaging and has low optical aberrations. The bright field and dark field beam paths are folded such that the system can be integrated to occupy a low volume with a small foot print.

The invention provides a method and system for determining the fluorescence intensity of a fluorescence image. The method includes the steps that light field imaging and fluorescence imaging are conducted on a target sample by adopting a microscopic fluorescence imaging system to obtain the light field image and the fluorescence image, edge extraction and segmentation are conducted on a fluorescence image region of each detection target in the fluorescence image, and the fluorescence image region corresponding to each detection target in the fluorescence image is obtained; the cumulative gray value, the maximum gray value, and the average gray value of the fluorescence image region of each detection target, and the diameter value of the light field image region of each detection target are calculated, streaming clustering analyses are conducted based on the cumulative gray value, the maximum gray value, the average gray value and the light field diameter value. Analyses can be conducted by executing or inputting into a streaming clustering analysis software, and corresponding and similar results of the streaming analysis are obtained.

There is provided a confocal optical scanner capable of coping with variation of optical system magnification, a bright field image, and so forth. The confocal optical scanner comprising a pinhole disc with pinholes provided thereon, and rotation means for rotating the pinhole disc for obtaining a confocal image by rotating the pinhole disc with the use of the rotation means to thereby scan with illumination light and by causing optical feedback from the illumination light passing through the pinholes to form an image, wherein the confocal optical scanner is provided with a transfer mechanism for causing the pinhole disc to undergo reciprocating transfer between a position where the pinhole disc resides in an optical path of the illumination light, and a position where the pinhole disc is evacuated from the optical path of the illumination light.

The present invention relates to systems and methods for adaptively optimizing broadband reference spectra for a multi-spectral image or adaptively optimizing reference colors for a bright-field image. The methods and systems of the present invention involve optimization techniques that are based on structures detected in an unmixed channel of the image, and involves detecting and segmenting structures from a channel, updating a reference matrix with signals estimated from the structures, subsequently unmixing the image using the updated reference matrix, and iteratively repeating the process until an optimized reference matrix is achieved.

The invention relates to a method of correcting projection background inconsistency in CT imaging, and specifically relates to a CT projection background cross-correlation registration method based on image grayscale information. The method comprises the following steps: (1) before acquisition of a sample CT projection image, acquiring a bright field image, and determining the spot center of the bright field image; (2) calculating a compensation function of the bright field image; (3) compensating the illumination of the bright field image; (4) compensating the illumination of the projection image; (5) calculating the actual offset between the background of the projection image and the background of the bright field image; and (6) performing image translation registration. A CT projection is registered using the principle of cross-correlation based on image grayscale information. The method has the advantages of no need to know the specific deflection parameter of a detector in advance, simple operation, and high computation efficiency.

Disclosed is a scanning transmission type electron microscope provided with a scanning transmission electron microscope provided with an aberration corrector 805 for correcting the aberration of an electron-optical system that irradiates electron beams to a sample (808); a bright field image detector (813) for detecting electron beams that have transmitted through the sample; a camera (814); and an information processing apparatus (703) for processing signals detected by the detectors. The information processing apparatus divides a Ronchigram obtained by the detectors into a plurality of areas, and calculates a feature vector (W; 903), which reflects the magnitude and direction of an on-axis secondary comma aberration (B2), from the values of an off-axis defocus {C1(τ)} to be obtained for each of the plurality of areas, and the distance (τ) from the center of the Ronchigram to the center of the plurality of areas, and also calculates the correcting condition for the on-axis secondary comma aberration with the feature vector. In such a way, a scanning transmission type electron microscope that can correct he on-axis secondary comma aberration thereof in a short period of time, and efficiently, was able to be provided.

The disclosure provides a method of generating an artificial fluorescent image of cells is provided. The method includes receiving a brightfield image generated by a brightfield microscopy imaging modality of at least a portion of cells included in a specimen, applying, to the brightfield image, at least one trained model, the trained model being trained to generate the artificial fluorescent image based on the brightfield image, receiving the artificial fluorescent image from the trained model

A non-destructive composite material inspection apparatus and method thereof inspect the fiber direction and fracture toughness. The apparatus includes a light module and a stereoscopic microcamera module. The light module generates a polarized light that has a polarization orientation projecting to an inspection area on the surface layer of the composite material. The stereoscopic microcamera module captures the reflection light from the inspection area and outputs an image. When the polarization orientation and the fiber direction are parallel, the image is a bright field image. When the polarization orientation and the fiber direction are orthogonal, the image is a dark field image. The bright and dark field images show the fiber direction and toughened particle distribution and the toughness of the composite material is then predicted.