The invention discloses a contour microscopic method and device. The device comprises a laser, a single-mode optical fiber, a first collimating lens, a first polarizer, a first polarization beam splitter, a 1/4 wave plate, a second lens, a third lens, a 1/2 wave plate, a second polarization beam splitter, a first detection optical fiber, a second detection optical fiber, a differential detector, a master computer, a nano translation table and a sample platform used for placing a sample to be detected. According to the invention, a contour image of an object is obtained by virtue of a transverse difference, and transverse resolution of a system is effectively improved. The contour microscopic device disclosed by the invention has a simple structure, the transverse resolution is obviously improved and can reach up to 200nm or below, and the contour microscopic device disclosed by the invention can be applied to the optical microscopy field and nano-scale high-accuracy detection, measurement and manufacturing fields.