Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

4results about How to "Solve one-sidedness" patented technology

An intelligent power distribution cabinet with fault detection function and a detection method

The present application relates to the technical field of smart grid, especially to a kind of intelligent power distribution cabinet with fault detection function and detection method.The present application can accurately obtain state data and analyze state data by obtaining unit and data analysis unit;Multiple AI analysis models in edge computing unit can accurately analyze equipment state results, and can improve the efficiency of power distribution cabinet fault detection;Through the decision unit, multiple equipment state results are fused using the preset rules to obtain accurate fault information, and the execution module in the control unit is driven based on the accurate fault information to act;Finally, the analysis unit determines the fault detection state based on the fault suppression success rate within the preset period, and adjusts the corresponding parameters based on the fault detection state, so as to more accurately analyze the fault.The present application improves the fault detection efficiency of power distribution cabinet.
Owner:SHANXI TONGXINDA ELECTRICAL ENG CO LTD

Animal immune evaluation method based on cat flea infection model

The application provides an animal immune evaluation method based on a Lutzomyia longipalpis infection model, and comprises the following steps: S1, experimental animal preparation and screening; S2, Lutzomyia longipalpis preparation and quality verification; S3, Lutzomyia longipalpis infection of experimental animals; S4, immune related index detection; S5, animal immune function evaluation; and S6, repeatability verification and data summarization. The application realizes systematic and objective evaluation of the effect of immune candidate drugs.
Owner:BEIJING GRAND SPARK PHARM TECH CO LTD

A key node identification method and device, electronic equipment and storage medium

This invention provides a method, apparatus, electronic device, and storage medium for identifying critical nodes. The method includes: determining multiple indicator values ​​for any node based on multiple indicators, whereby the multiple indicators are used to evaluate the importance of the node; determining the comprehensive weight corresponding to any indicator using the analytic hierarchy process (AHP) and entropy weight method; determining the node's importance ranking value based on the multiple indicator values ​​and the comprehensive weights corresponding to the multiple indicators for any node; and identifying critical nodes based on the node importance ranking values ​​of all nodes. This invention solves the problem of the one-sidedness of existing critical node identification methods in related technologies.
Owner:STATE GRID JIANGSU ELECTRIC POWER CO LTD +2

Chip visual data inference capability testing method and electronic device

ActiveCN121524024BSolve one-sidednessaddress limitationsHardware monitoringBiological modelsVisual testData set
The application discloses a chip visual data reasoning capability test method and electronic equipment, and relates to the technical field of chip testing. The method comprises the following steps: processing visual original data sets based on a data arrangement mechanism to obtain visual test data sets, solving the one-sidedness and limitations of single data types and single data formats on the calibration chip capability, and helping to scientifically and comprehensively evaluate the to-be-tested chip; testing the to-be-tested chip according to a preset test model set to obtain an output result set, solving the one-sidedness and limitations of a single test model on the calibration chip capability, and helping to scientifically and comprehensively evaluate the to-be-tested chip; and judging the effectiveness of the output result set according to a monitoring result set, thereby improving the accuracy of the visual test result, and enabling the visual test result to accurately represent the visual data reasoning capability of the to-be-tested chip.
Owner:INSPUR SUZHOU INTELLIGENT TECH CO LTD