Method for eliminating image persistence of vision of flat panel detector and flat panel detector

A flat-panel detector and image technology, applied in image enhancement, image data processing, instruments, etc., can solve the problem that the image afterimage of the flat-panel detector is difficult to effectively eliminate, achieve objective market application value, eliminate image afterimage, and achieve no image afterimage. Visible afterimage effect
CN106097282AActive Publication Date: 2016-11-09SHANGHAI IRAY TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI IRAY TECH
Publication Date
2016-11-09

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Abstract

The invention provides a flat panel detector and a method for eliminating image persistence of vision of the flat panel detector. The method comprises that 1) the flat panel detector is used for exposure, a frame of original bright-field image and a frame of original dark-field image are collected, and a collection time point t1 of the original bright-field image is recorded; 2) the flat panel detector is used to continue exposure, another frame of original bright-field image and another frame of original dark-field image are collected, and a collection time point t2 of the original bright-field image is recorded; 3) according to a natural attenuation rule of the image persistence of vision as well as a time interval between t1 and t2, a weighting coefficient is obtained; and 4) the weighting coefficient obtained in the step 3) is used to compensate the original dark-field image collected in the step 1), and then implement persistence of vision correction on the original bright-field image collected in the step 2) by difference operation. The method of the invention is simple in process and simplified in algorithms, is highly practically and is high in the system integrated level.
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Description

technical field

[0001] The invention belongs to the technical field of radiographic image processing, and in particular relates to a flat panel detector and a method for eliminating image residuals of the flat panel detector. Background technique

[0002] At present, due to the physical characteristics of amorphous silicon or amorphous selenium X-ray flat panel detectors, when the supersaturated dose is exposed, the charge cannot be released at one time, and the target image will have the problem of afterimage, and once image afterimage occurs The shadow cannot be eliminated from the hardware, and it takes time for natural attenuation, and the images taken after subsequent exposures will have afterimage interference.

[0003] The current amorphous silicon or amorphous selenium X-ray flat panel detectors have the phenomenon of image afterimage, which is caused by afterglow of scintillators (such as cesium iodide, gadolinium oxysulfide) and TFT sensor, photo Diode, RC itself a...

Claims

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