608 results about "Transmission electron microscopy" patented technology

The invention relates to the technical field of computer science, in particular to a stamping prediction method based on a multi-machine learning model and an automatic compensation device.The stamping prediction method comprises the steps that firstly, a sheet microstructure and material characteristics are obtained through a transmission electron microscope and an atomic probe tomography technology, and then finite element simulation sampling is conducted; a data set is expanded by using an adaptive algorithm, multiple models are constructed and trained to obtain a final springback prediction model, an automatic compensation device is embedded to realize automatic compensation, and the automatic compensation device covers visual parameter input, embedded springback prediction, springback compensation calculation and an automatic control module. Parameters can be visually input, springback can be accurately predicted, a compensation value can be calculated, and the process can be adjusted. The method aims at solving the problems that in the high-strength plate stamping process, due to springback, the size and shape of a part deviate from the design requirement, and a traditional prediction and compensation technology is insufficient in precision and efficiency.

To provide: a transistor with favorable electrical characteristics; a transistor with a high on-state current; a transistor with low parasitic capacitance; or a transistor, a semiconductor device, or a memory device which can be miniaturized or highly integrated.SOLUTION: There is provided a transistor including an oxide semiconductor layer, a semiconductor device, or a memory device. The oxide semiconductor layer includes a first region, a second region over the first region, and a third region over the second region. The first region is located in a range from a surface on which the oxide semiconductor layer is to be formed to greater than or equal to 0 nm to less than or equal to 3 nm in a direction substantially perpendicular to the surface. In cross-sectional observation of the oxide semiconductor layer using a transmission electron microscope, bright spots arranged in a layered manner in a direction parallel to the surface on which the oxide semiconductor layer is to be formed are observed in each of the first region, the second region, and the third region.SELECTED DRAWING: Figure 1

The present invention relates to a catalyst for ortho-parahydrogen conversion suitable for a wide range of low-temperature conditions and a preparation method thereof. The catalyst is a fiber magnetic catalyst FeMnOx doped with Fe atoms in an orderly manner; the base material of the catalyst is α-MnO2, the α-MnO2 belongs to the tetragonal system, the unit cell parameter is #imgabs0#, the crystal structure is composed of 2×2 octahedral chains with shared edges, the XRD characteristic diffraction peaks are 2θ=12.8°, 18.1°, 25.7°, 37.5°, 49.8°, 56.3°, and the specific surface area measured by the BET test method is 100-150m 2 / g, and transmission electron microscopy shows that its microstructure is a fibrous structure with a diameter of 2 to 5nm and a length of 100nm to 500nm; when the catalyst is used for the ortho-parahydrogen conversion reaction, the ortho-parahydrogen conversion efficiency is more than 95%, and the catalyst life is more than 1400h; the wide range of low temperature conditions is 23K-77K. The coordination of Fe atoms with lattice oxygen in α-MnO2 can effectively avoid the deactivation of the catalyst caused by the change of the valence state of the metal component, thereby enhancing the stability and life of the catalyst, and is suitable for industrial-scale production.

Provided are a transistor with favorable electrical characteristics, a transistor with a high on-state current, a transistor with low parasitic capacitance, or a transistor, a semiconductor device, or a memory device which can be miniaturized or highly integrated. An oxide semiconductor layer included in the transistor, the semiconductor device, or the memory device includes a first region, a second region over the first region, and a third region over the second region. The first region is located in a range from a surface on which the oxide semiconductor layer is to be formed to greater than or equal to 0 nm to less than or equal to 3 nm in a direction substantially perpendicular to the surface. In cross-sectional observation of the oxide semiconductor layer using a transmission electron 10 microscope, bright spots arranged in a layered manner in a direction parallel to the surface are observed in each of the first region, the second region, and the third region.

The invention relates to a transmission electron microscope low-temperature sample rod using a flexible structure to transfer heat. The transmission electron microscope low-temperature sample rod comprises a liquid nitrogen Dewar tank; the sample rod comprises a sample rod body with a front-back through hollow cavity, a heat conduction rod and a flexible heat transfer rope, one end of the heat conduction rod extends into the liquid nitrogen Dewar tank, the other end of the heat conduction rod extends into the sample rod body, one end of the flexible heat transfer rope is wound and fixed on the heat conduction rod, and the other end of the flexible heat transfer rope is wound and fixed on the sample rod body. The other end of the sample rod extends to the outer end of the sample rod body; the sample rod head comprises a sample rod fixing outer frame and a sample rod temperature control part, the sample rod fixing outer frame is connected with the outer end of the sample rod body, the sample rod temperature control part is arranged on the sample rod fixing outer frame, the sample rod temperature control part is connected with the flexible heat transfer rope, and a heating element capable of heating a sample to be tested is further arranged on the sample rod temperature control part. Compared with the prior art, efficient heat conduction can be achieved, meanwhile, the thermal stress influence is reduced, and the temperature stability and the sample position stability are improved.

The magnetic tape includes a non-magnetic support, and a magnetic layer containing a ferromagnetic powder. The ferromagnetic powder is a hexagonal ferrite powder, tilt cos θ of the hexagonal ferrite powder with respect to a surface of the magnetic layer, which is acquired by cross-sectional observation performed using a scanning transmission electron microscope, is 0.85 or more and 1.00 or less, and standard deviation σ of the cos θ in a width direction of the surface of the magnetic layer is 0.03 or less.

To provide an oxide semiconductor layer that can be used for a semiconductor device with favorable electrical characteristics.SOLUTION: There is provided an oxide semiconductor layer which is formed over a substrate and includes indium. The oxide semiconductor layer is formed in parallel or substantially in parallel with a surface of the substrate. The oxide semiconductor layer includes a first region, a second region over the first region, and a third region over the second region. The first region is located in a range from a surface on which the oxide semiconductor layer is to be formed to greater than or equal to 0 nm to less than or equal to 3 nm in a direction substantially perpendicular to the surface. In cross-sectional observation of the oxide semiconductor layer using a transmission electron microscope, bright spots arranged in a layered manner in a direction parallel to the surface on which the oxide semiconductor layer is to be formed are observed in each of the first region, the second region, and the third region.SELECTED DRAWING: Figure 2

The invention provides a position correction method for rapid acquisition of a transmission electron microscope, which is used for acquiring images of the transmission electron microscope at multiple angles. Through mathematical fitting of the relation between the image position (x, y) and the sample rod tilting angle (angle) and the relation between the focusing value (focus) and the sample rod tilting angle (angle), the position error and the focusing change caused by tilting are effectively corrected, so that the alignment precision and the imaging quality of the image are improved; according to the method, correction efficiency and automation can be greatly improved by substituting accurate numerical values into a fitting function, and the method has remarkable technical progress and application value in the aspect of improving multi-angle imaging and three-dimensional reconstruction of the transmission electron microscope.

The invention discloses an in-situ TEM (Transmission Electron Microscope) device sample preparation method based on a suspended thinning and parallel carrying technology, which can be used for preparing in-situ TEM samples of semiconductor two-end devices and three-end devices, and mainly solves the problems of unstable ohm contact, nonuniform thinning, low success rate and high time cost in the prior art. According to the invention, an FIB sample preparation technology is adopted, and stable and reliable ohmic contact between a sample electrode and an MEMS chip electrode is ensured through specific-angle sample extraction, suspended thinning, parallel carrying, circuit breaking treatment and an accurate electrode welding process. According to the sample prepared by the invention, the failure state of a device can be observed in real time under a transmission electron microscope, the sample has the advantages of high sample preparation success rate, good repeatability, stable electrical parameters and wide applicable chip variety, and the reliability and repeatability of in-situ TEM test data are remarkably improved.

The invention discloses a preparation method of an Mg / Al laminated material interface irradiation damage behavior analysis sample, which comprises the following steps: respectively calculating the incidence depths of Mg < + > with different energies in an Mg / Al laminated material by adopting SRI < M > software, and calculating the irradiation damage layer depth of incident ions with specific energy; performing ion beam cutting on the ion irradiation sample according to the SRI M calculation result; sequentially selecting ion beams with different beam sizes to thin the cut interface sample; by adjusting parameters such as the electrolytic polishing solution ratio, the polishing temperature, the polishing time and the polishing voltage, the optimal rapid polishing process parameters of the Mg / Al laminated material interface sample are explored; according to the method, by means of combination of SRI M software simulation, ion beam micro-nano scale processing, a differential thinning process, rapid polishing treatment and the like, preparation of the Mg / Al interface transmission electron microscope sample in the Mg / Al laminated material after ion irradiation can be effectively completed, and Mg / Al interface irradiation damage behavior analysis and rapid screening of the high-performance Mg / A laminated material are achieved.

The present invention relates to the technical field of diabetes, and in particular to a controlled-release diabetic wound healing promoting treatment method, comprising the following treatment experimental steps: step S1: preparation of Hst1@PNPs; step S2: Coomassie brilliant blue staining; step S3: scanning and transmission electron microscopy detection; in the present invention, a slow-release Hst1 treatment method is constructed by encapsulating Hst1 into platelet membrane vesicles derived from autologous blood. On the one hand, the PNPs encapsulate the linear Hst1 peptide structure to prevent it from being rapidly degraded by high proteases in diabetic wound exudate, thereby improving bioavailability. On the other hand, the PNPs can adsorb excess LPS in the wound exudate, and cooperate with Hst1 to achieve anti-inflammatory and anti-oxidative stress effects. Subsequent cell and animal experiments further confirmed that Hst1@PNPs have the effects of anti-inflammatory, scavenging ROS, promoting re-epithelialization, collagen deposition and angiogenesis, thereby promoting diabetic wound healing.

The invention provides a ZSM-12 molecular sieve with a hollow structure and a preparation method thereof, the crystal form is a ZSM-12 molecular sieve structure, the ZSM-12 molecular sieve structure is characterized as a single crystal particle crystal with a hollow structure through a transmission electron microscope, the center part of the crystal is hollow, and the hollow structure is presented. The preparation method comprises the following steps: firstly, contacting a ZSM-12 molecular sieve with water vapor for treatment, then washing, separating and drying to obtain a material, uniformly mixing the material with inorganic alkali, an aluminum source, a silicon source and water for reaction, and finally washing, separating, drying and roasting to obtain the ZSM-12 molecular sieve. The invention provides a brand-new method for synthesizing the ZSM-12 molecular sieve with the hollow structure, the problem that the ZSM-12 molecular sieve with the hollow structure cannot be obtained by an existing method for synthesizing and preparing hollow zeolite in the field is solved, and the preparation method provided by the invention is simple in process route and suitable for large-scale industrial production.

The invention discloses a method for evaluating the growth performance of mangrove forest seedlings in an estuary high-salinity environment, and the method comprises the steps: constructing an analysis framework in which a dynamic salinity stress system and a multi-dimensional monitoring technology are coupled, and achieving the precise evaluation of the environmental adaptability of the mangrove forest seedlings; the method comprises the following steps: firstly, carrying out sterile germination and matrix domestication on a target estuary provenance, then establishing a three-dimensional stress model containing basic salinity maintenance, sudden salinity impact and tidal cycle fluctuation, and strictly controlling the sudden salinity impact amplitude within 20% of the historical extreme value of the estuary; synchronously acquiring canopy volume and root architecture parameters of the seedlings by adopting a three-dimensional laser scanning technology, and constructing a morphological database in combination with leaf apparent characteristic records; subcellular structure indexes such as cell wall thickening, chloroplast envelope integrity and mitochondrial ridge density are observed and analyzed through a transmission electron microscope, the molecular mechanism of osmotic regulation and energy metabolism is disclosed, and the concentration of suspended solids in the water body, the oxidation-reduction potential of sediments and the functional diversity of microorganisms are synchronously monitored.

A grid for sampling a liquid specimen. The grid includes a mesh and a foil. The mesh includes a plurality of grid bars defining a plurality of openings. The plurality of grid bars forms an outer perimeter of each opening. The foil is coupled to the mesh and the foil includes a plurality of holes. A subset of the plurality of holes is aligned with each of the plurality of openings. Each hole of the subset is spaced from the outer perimeter of the corresponding opening defined by the plurality of grid bars.

The invention relates to a mechanical property simulation method for researching the service life of an aluminum alloy material for a reactor. The simulation method for the life period mechanical property of the aluminum alloy material comprises the following steps: S1, preparing initial, middle and last stage aluminum alloy samples according to a < 27 > Al-< 28 > Si transmutation path of the aluminum alloy material; s2, representing the sample by using a transmission electron microscope, obtaining precipitated particle parameters, calculating a volume fraction f, fitting f and operation time t, and constructing a precipitation evolution model f (t); s3, performing high-energy ion irradiation on the sample, and performing nanoindentation experiment and load-depth curve fitting to obtain nano hardness H; s4, based on the f (t), establishing a relation model of the nano hardness H and the irradiation damage D; and S5, calculating the change quantity of the nano hardness H, converting the change quantity into the change quantity of the yield strength, associating the irradiation damage D with the service time T, and establishing a life period yield strength prediction model. According to the method, the mechanical property of the aluminum alloy in the full service cycle of the research reactor can be accurately evaluated.

The invention discloses a preparation method of a transmission electron microscope sample of a sintered neodymium-iron-boron block material, which comprises the following steps of block sample cutting, mechanical grinding, sample punching, ring sticking, pre-thinning and final thinning, so that the transmission electron microscope sample to be observed is obtained. In addition, the method is simple, feasible, economical and practical, and the sample preparation success rate can be remarkably increased.

The invention discloses a transmission electron microscope sample preparation method for a lunar soil space weathered surface and application, and the method comprises the following steps: pasting target lunar soil particles on a carbon conductive adhesive tape, and enabling the target flat surfaces of the target lunar soil particles to be placed back to the carbon conductive adhesive tape; plating a layer of carbon film on the surface of the target lunar soil particle to obtain a scanning electron microscope sample of the target lunar soil particle; screening out a plurality of target research areas on the carbon film corresponding to the target flat surface; uniformly plating a layer of gold film on the carbon film corresponding to the target lunar soil particle scanning electron microscope sample; deposition operation of a research area protection layer is carried out on the gold film corresponding to the target research area through an electron beam and an ion beam in sequence; and performing slicing operation perpendicular to the target flat surface on the target lunar soil particle scanning electron microscope sample to obtain the target lunar soil particle transmission electron microscope sample. According to the method, lunar soil space weathering characteristics can be truly reserved, and an accurate and reliable sample is provided for lunar soil space weathering research.

The invention discloses a novel nano-drug as well as a preparation method and application thereof, and co-delivery of siRNA and 3BP is realized on an exosome nano-platform, so that a novel nano-drug Exo (at) siRNA / 3BP-CTX (ERBC) engineering exosome is generated. The surface-modified cetuximab (CTX) is targeted to tumors, and shows high targeting and low toxicity in imaging analysis. CCK-8, western blot and immunofluorescence detection are used for detecting the tumor killing effect and the synergistic effect. The ERBC finds that the occurrence of death-promoting autophagy in KRAS mutation tumors is promoted on the transmission electron microscope (TEM) and molecular level.

A toner comprising a toner particle comprising a binder resin and a release agent, wherein the binder resin comprises a first resin and a second resin; the first resin is a crystalline resin having a melting point Tp of 50° C. to 90° C.; the second resin is an amorphous resin; in a cross section of the toner particle observed by a transmission electron microscope, the cross section of the toner particle has a matrix-domain structure composed of a matrix comprising the first resin and domains comprising the second resin; an area ratio of the matrix comprising the first resin in a total area of the cross section of the toner particle is 35 to 70 area %; and where a longest direction of each of the domains is taken as a longitudinal direction, a standard deviation of an angle of the longitudinal direction of the domains is 25° or less.

An optical system of a Transmission Electron Microscope (TEM) is configured to use a square-shaped electron beam. Preferably, the square-shaped electron beam is produced by using an aperture with a square hole positioned in an aperture plane of TEM's beam shaping aperture (typically, the C2 lens). The square beam enables exhaustive tiling and data collection, enabling the complete imaging of large biological objects. In single particle analysis, a square beam also speeds up data collection rates. These improvements come with no significant loss in imaging quality compared to the standard round beam method of imaging.

The invention discloses preparation of an aqueous zinc ion battery positive electrode material and a detection method of charge reaction of the aqueous zinc ion battery positive electrode material in a metal ion battery, and belongs to the technical field of batteries. The invention provides the preparation method of the vanadium-based positive electrode material, which is simple in process and low in cost. The preparation method of the positive electrode material comprises the following steps: grinding vanadium pentoxide powder; performing ultrasonic treatment with deionized water, adding inorganic salt, sealing, performing water bath heating reaction, and performing centrifugal washing; and then drying or freeze-drying to finally obtain the batched and high-performance positive electrode material. In 8000 times of charging and discharging, the positive electrode material provided by the invention has excellent cycling stability, and the capacity retention rate is as high as 93%. In addition, an in-situ alternating-current impedance technology is used for rapidly detecting the charge transfer process in the battery, and complex and expensive in-situ X-ray diffraction and transmission electron microscope technologies are avoided. The vanadium pentoxide activation process is accurately controlled through the water bath, the process is simple, the cost is low, and the method has good batch production potential and application prospects.

The invention discloses a hollow silicon dioxide particle. The ratio of the hollow area of the hollow silicon dioxide particle to the total area of the particle in a transmission electron microscope photo is 10-96%; the average maximum diameter of the hollow silica particles is 100 nm to 10 [mu] m; a shell layer of the hollow silicon dioxide particle is formed by stacking nano particles, the average diameter of nano convex particles in the shell layer is 4-100 nm, and the ratio of the average diameter of the nano convex particles to the average maximum diameter of the hollow silicon dioxide particle is 1 / 2500-1 / 5. The ratio of the average diameter of the nanometer protruding particles on the surfaces of the hollow silicon dioxide particles to the average maximum diameter of the hollow silicon dioxide particles ranges from 1 / 2500 to 1 / 5, so that the bonding force between the hollow silicon dioxide particles serving as filler and resin is high, the fluidity is good when the hollow silicon dioxide particles are added into the resin, and the hollow silicon dioxide particles are suitable for serving as packaging filler of semiconductor devices.

The resin composition includes more than 50 mass% and 80 mass% or less of propylene units; and 20 mass% or more of ethylene units or 7 mass% or more of butene units with respect to 100 mass% of a total content of monomer units in a resin component, the resin composition having a co-continuous structure including a first continuous phase in which the propylene units are relatively more and a second continuous phase in which the propylene units are relatively less, or a sea-island structure including a sea phase in which the propylene units are relatively more, and an island phase in which the propylene units are relatively less and a maximum length in a cross-sectional image observed with a transmission electron microscope is 600 nm or less.

The invention discloses an ion thinning instrument control method based on a self-adaptive gradient energy reduction algorithm, and belongs to the technical field of transmission electron microscope (TEM) sample preparation. The problem that a traditional ion thinning technology has many limitations is solved, dynamic optimization of parameters such as ion beam energy, beam current density and sample temperature is achieved through the self-adaptive gradient energy reduction algorithm, and the sample preparation efficiency is remarkably improved; by combining multi-modal data acquisition and dynamic gradient optimization, the thinning process can be accurately controlled, and the sample quality is improved; sample damage is effectively avoided by combining a damage constraint mechanism and self-adaptive step length control, and the stability of the preparation process is improved; the method is suitable for various materials through a pre-stored optimization path library, and has wide applicability; therefore, the energy of the ion beam is optimized, the incident angle and the beam density are dynamically adjusted, and the thinning instrument is controlled.

Methods for preparing imaging samples by applying a liquid or semiliquid substance to a substrate surface in order to mitigate the deleterious effects of vacuum and other conditions used for sample preparation, thereby preserving the structure of at least a portion of deposited samples. These methods are useful for MS-based electron microscopy (EM) sample preparation at room temperature, but are also applicable to other imaging methods. These methods also enable transmission electron microscopy (TEM) structural confirmation of ions passing through a mass spectrometer. Additionally, only entry-level negative staining techniques for TEM are required, making this technique much more widely available than cryogenic electron microscopy (cryo-EM).

The invention provides a preparation method of an exosome antibody microsphere conjugate, which belongs to the technical field of exosomes, and comprises the following steps: preparing a carboxyl polystyrene microsphere suspension with the particle size of 50 nanometers, and ensuring that the size of the microsphere is stabilized in a range of 50 + / -5 nanometers by optimizing centrifugation and cross-linking conditions. And then coupling the exosome marker antibody with the microspheres, and closing unreacted active groups. A mathematical model is adopted to optimize purification process parameters for purification. A dynamic light scattering and transmission electron microscope is utilized to characterize coupling physics properties, and a conjugate meeting requirements is screened. And finally, obtaining fluffy porous exosome antibody microsphere conjugate freeze-dried powder under the protection of a sucrose solution by adopting a vacuum freeze-drying method. The method solves the technical problems that in an existing exosome microsphere conjugate preparation process, centrifugation and purification parameters are often set according to artificial experience, optimization is difficult to obtain, and the quality of the exosome microsphere conjugate is affected.

To provide a transmission electron microscope, which can analyze a sample over a wide range and with high resolution.SOLUTION: A transmission electron microscope includes: an irradiation section that can irradiate a sample with a parallel electron beam at a predetermined incident angle; a sample holding section that can hold the sample; an aperture section that is located downstream in a traveling direction of the electron beam transmitted the sample or scattered by the sample, and that has an opening; an image forming lens that is located downstream in the traveling direction of the electron beam with respect to the opening of the aperture section and that forms an image of the electron beam selected by the aperture section; an image capturing section that is located downstream in the traveling direction of the electron beam with respect to the image forming lens, that captures a bright-field image and a dark-field image formed by the image forming lens, and that has an imaging surface; and an analysis section that analyzes the sample on the basis of the bright-field image and the dark-field image.SELECTED DRAWING: Figure 1

The invention provides a medium manganese steel oxygen vacancy defect identification method and device. The method comprises the following steps: obtaining a first oxygen vacancy defect area based on a measurement result of a positron annihilation lifetime spectrum and a Doppler broadening spectrum on a target sample block; aiming at each ultra-thin sample, observing the ultra-thin sample through a high-resolution transmission electron microscope, and collecting a bright field image and a dark field image of the ultra-thin sample; obtaining a second oxygen vacancy defect area based on the bright field image, the dark field image and the first oxygen vacancy defect area; performing electron energy loss spectrum analysis on the second oxygen vacancy defect area, and determining a third oxygen vacancy defect area and corresponding oxygen vacancy defect concentration in the ultrathin sample; and determining each target oxygen vacancy defect region and oxygen vacancy defect concentration of the target medium manganese steel sample according to the third oxygen vacancy defect region and oxygen vacancy defect concentration in each ultrathin sample. According to the invention, information such as position, number, size and distribution pattern of oxygen vacancy defects can be accurately obtained.

The invention provides a preparation method of a transmission electron microscope sample, which comprises the following steps: welding a prepared cross section TEM sample on a carrying net, horizontally placing the carrying net, and forming a first protection layer on the cross section; forming a limiting mark; forming a second protective layer on the first protective layer; after the part, close to the connecting end of the same carrying net, of the cross-section TEM sample is welded together with a nano manipulator, the sample and the carrying net are cut and separated at the connecting position; the nano manipulator is moved to the hovering position, and then the nano manipulator is taken back; overturning the sample table to enable the carrying net to be vertically placed; after adjustment preparation, the other end, opposite to the end connected with the nano manipulator, of the sample is welded to the carrying net; after the sample and the nano manipulator are cut and separated, the nano manipulator is taken back; and inclining the sample table to 52 degrees, and cutting and thinning the sample according to the limiting marks to obtain the required planar TEM sample. The purpose of comprehensively knowing the plane and section structure information of the sample can be achieved.

The invention discloses a multi-field coupling transmission electron microscope in-situ sample rod and a bidirectional accurate temperature and electromagnetic field control system method thereof, and belongs to the field of transmission electron microscopes. The rod head of the sample rod comprises an objective table, a micro U-shaped electromagnet and a PCB (Printed Circuit Board) which are arranged in the objective table, a temperature conducting plate and a liquid nitrogen circulating pipe which are arranged at the rear end of the objective table, and a four-electrode MEMS (Micro Electro Mechanical System) thermoelectric chip arranged on the objective table. Dual control of heating and an electric field is realized through the MEMS thermoelectric chip, and bidirectional temperature adjustment of a sample is realized in combination with a liquid nitrogen cooling system. And meanwhile, the sample rod is also integrated with a micro U-shaped electromagnet to apply a controllable parallel magnetic field. The whole system can carry out multi-field coupling experiments under extreme conditions, such as dynamic researches of electricity, magnetism, phase change and the like.