38 results about "Transmission electron microscopy" patented technology

This invention provides a rapid preparation method for steel samples for transmission electron microscopy (TEM), relating to the field of physical analysis of steel materials. It is applied to the preparation of various steel samples, including heat-sensitive steels, using a composite binder of cellulose acetate, acetone, silica, and alumina. The binder is used to adhere one side of a wire-cut steel sample sheet to the sheet fixing surface of a grinding aid. A grinding aid area, parallel to the bottom surface of the sheet fixing surface, is provided on the grinding aid device. The grinding aid area is pressed, and sandpaper with progressively increasing grit is used to grind one side until a first preset thickness is reached. Then, the other side is switched, and sandpaper with progressively increasing grit is used to grind the second side until a second preset thickness is reached. The ground sheet is removed, thinned, punched, and electropolished to obtain the target steel sample. This invention can rapidly prepare steel sample sheets with a thickness of 30-50 µm, and the method is simple and has a high success rate.

A method for analyzing a sample using an electron microscope includes: generating ions, molecules, or other particles, such as droplets, from a target sample; introducing the ions, molecules, or other particles into a vacuum cavity of a transmission electron microscope (TEM) in a direction intersecting the path of a pulsed electron beam; recording an electron diffraction pattern associated with the ions through which the pulse passes at each pulse of the electron beam; and calculating the three-dimensional (3D) structure of the ion species based on the recorded electron diffraction pattern.

To provide a scanning transmission electron microscope in which the position of an aperture can be easily adjusted.SOLUTION: A scanning transmission electron microscope according to the present invention includes an electron source that generates an electron beam, an optical system having a focusing lens, an aperture, and an objective lens that focuses the electron beam generated by the electron source to form an electron probe, and a control unit that controls the electron source and the optical system, and the optical system is in a state in which an image does not move at the center of a Ronchigram even when an acceleration voltage for accelerating the electron beam is varied, and the control unit performs the following processes: inserting the aperture into the path of the electron beam; acquiring a first STEM image with the acceleration voltage set to a first voltage value while the aperture is inserted; acquiring a second STEM image with the acceleration voltage set to a second voltage value different from the first voltage value while the aperture is inserted; and moving the aperture based on the positional deviation between the first STEM image and the second STEM image.SELECTED DRAWING: Figure 4

The invention discloses a large-view-field and high-temporal-spatial-resolution transmission electron microscope in-situ imaging method for a microcosmic electrochemical process, which comprises the following steps: step 1, loading an electrode material particle sample to be detected on a carrying table, inserting the sample into a transmission electron microscope vacuum lens cone along with a sample rod, identifying a target sample under low magnification, and carrying out basic adjustment on an electron microscope; 2, adjusting magnification times to ensure that an observation area is completely incorporated into an imaging view field, selecting an imaging mode, eliminating astigmatism, and adjusting the focal length of an objective lens until a sample particle image interface is clear; and step 3, selecting a CCD camera, setting an acquisition frame rate, and performing ultrafast acquisition of images or videos. The transmission electron microscope in-situ imaging technology giving consideration to both the large view field and the high space-time resolution has practical application value in research of the electrochemical reaction kinetics process of the granular material.

The present application belongs to the technical field of gallium oxide doping regulation, and particularly relates to a gallium oxide micro-defect electrical property regulation method and system, which comprises: collecting a transmission electron microscope (TEM) bright field whole image of gallium oxide material; determining a plurality of defect sensitive areas, and performing stable cluster purification and regional clustering to form defect sensitive area clusters and de-cluster abnormal points; determining a representative area for each defect sensitive area cluster, collecting dark field images and high resolution images of the representative area and identifying defect types, and independently identifying the de-cluster abnormal points; pre-flowing according to the unrepairable leading area based on the representative area identification result; calculating a repair coefficient and recommending a doping parameter for the un-flowed area; the system is used to implement the above method, and the present application can reduce the subsequent image collection quantity and area-by-area identification burden, and improve the gallium oxide micro-defect detection and electrical property regulation efficiency.

The present application relates to the field of transmission electron microscopy characterization of two-dimensional material structure, and particularly to a method for efficiently obtaining cross-section characteristic crystal orientation of two-dimensional material, which is suitable for two-dimensional van der Waals layered material and two-dimensional non-layered material. A focused ion beam microscope (FIB) is used to sample in the direction perpendicular to (or parallel to) the long straight edge of the two-dimensional material edge, and the two-dimensional material sampling direction is parallel to the half-moon-shaped carrier net string length direction for welding, so as to prepare a cross-section sample capable of reflecting atomic layer stacking sequence; the half-moon-shaped carrier net string length direction is placed perpendicular to the TEM sample rod axial direction, and then small-angle tilting is performed to quickly realize sample crystallographic orientation. The present application lays a foundation for efficiently analyzing crystallographic information such as crystal structure, stacking defects and surface reconstruction of the material by observing the cross-section sample of the two-dimensional material.

This invention discloses a method for preparing amorphous Cu-MOFs and their applications, relating to the field of metal-organic framework materials technology. The key technical points are: CuCl2 is used as the copper source and 4,4′-bipyridine as the ligand, and Cu-MOFs are synthesized via a solvothermal method. Transmission electron microscopy shows that the obtained material exhibits a typical micron-scale sheet-like morphology. After etching with ammonia, the sample morphology transforms into rough-surfaced nanospheres with a significantly increased pore size, indicating a local rearrangement of its framework structure. X-ray diffraction analysis shows that the original Cu-MOF has high crystallinity, while the diffraction peaks of the etched aCu-MOF essentially disappear, exhibiting amorphous characteristics. As a signal conversion element in a colorimetric sensor, aCu-MOF can achieve reliable detection of ampicillin under neutral conditions. Using thiram as a cofactor, a highly selective thiram colorimetric sensing system can be constructed.

The application discloses a kind of gas-liquid two-phase in-situ observation sample rod for transmission electron microscope and observation cleaning method, belong to transmission electron microscope in-situ experimental technical field.The sample rod includes front end sample table area, stem and hand grip connected in sequence;The front end sample table area forms rod head vacuum cavity, and there are gas phase and liquid phase observation chip in cavity along sample rod axis direction in series.The internal sample rod is provided with independent vacuum pipeline and fluid transmission pipeline, wherein fluid transmission pipeline is used to transport gas or liquid sample into chip, and vacuum pipeline is used to maintain the vacuum degree of rod head vacuum cavity throughout the process to protect the observation area of chip;At the same time, by injecting inert gas and cleaning agent in fluid transmission pipeline in turn, the observation area is cleaned.The application does not need to repeatedly plug and pull sample rod, has the advantages of fast fluid control response, cleaning without dead angle, preventing cross contamination and high vacuum safety.

A separator for alkaline hydrolysis comprising a porous layer, the porous layer comprising inorganic particles, characterized in that the inorganic particles have a fraction of primary particles having a diameter above 100 nm of lower than 3% by number, as measured by Transmission Electron Microscopy (TEM).

The invention relates to a sample holder tip for use in a charged particle microscope, such as a transmission electron microscope; a sample holder comprising said sample holder tip and methods of using said sample holder tip and sample holder.

This invention provides an in-situ heating and electrical testing apparatus and method for scanning electron microscopy (SEM). The apparatus includes a T-shaped sample stage, an in-situ heating and electrical testing chip, a probe card, wires, a vacuum flange with a BNC interface, a signal source meter, pins, and fixing studs. The in-situ heating and electrical testing chip is placed on the T-shaped sample. The probe card presses into contact with the heating and testing electrodes on the in-situ heating and electrical testing chip and leads out wires, simultaneously fixing the chip. The fixing studs secure the probe card to the T-shaped sample stage. The vacuum flange with the BNC interface connects the probe card and the signal source meter via wires. This invention provides in-situ heating, electrical testing, and microstructure observation functions for SEM, offering advantages such as rapid heating and cooling, low thermal drift, and low electromagnetic interference. It provides a platform for testing the performance of micro and nanomaterials and an experimental platform for preliminary screening of transmission electron microscopy (TEM) samples.

The application discloses a method for quantifying and analyzing the amorphization rate of precipitates in steel materials, and belongs to the technical field of material irradiation damage analysis. The method is based on obtaining corresponding transmission electron microscope dark field images of steel material samples under multiple different irradiation doses, identifying the ROI of the two-dimensional projection area of the precipitates, extracting the amorphous area, calculating the relative amorphization fraction, fitting the evolution relationship of the relative amorphization fraction with the dose D, and extracting the characteristic dose corresponding to the preset relative amorphization fraction as the amorphization rate index. The quantitative comparison of the amorphization behavior of the precipitates under different variables such as temperature, size and irradiation conditions can be realized, and the method is suitable for the research on irradiation damage and structural stability.

The application discloses a kind of transmission electron microscope (TEM) image measurement method and related device, wherein the method comprises: obtaining the TEM image of semiconductor device, TEM image is classified by measurement component, the category of the measurement component of TEM image is obtained, then the target measurement area of TEM image is determined based on the category of measurement component, wherein the target measurement area is the area where the measurement component is located in TEM image.Electronic device measures target measurement point in target measurement area, and obtains the measurement result of TEM image.The embodiments of the present application are beneficial to improve the measurement and analysis efficiency of the TEM image of semiconductor device.

Provided is an adhesive film formed from a first layer including a first main surface and a second layer provided on the first main surface. The first layer is a crosslinked layer chiefly comprising polypropylene. The first layer has a heat collapse residual ratio of 60% or more. The second layer is an acid-modified polyolefin layer. After staining a cross section of the adhesive film with ruthenium tetroxide, the area percentage of the stained portion in a first image obtained by observing the first layer within the cross section at 10000x magnification using a transmission electron microscope is between 20% and 50%, inclusive.

The present disclosure relates to a method for manufacturing a transmission electron microscope grid oxide sample and a structure thereof. The method comprises the following steps: providing a sample; selecting a detection area on the sample; exposing an active area; and exposing a single row of active areas. The present disclosure removes the peripheral part of the initial protective layer of the sample along the length direction of the detection area, removes part of the sample along the arrangement direction of the active area on the sample, and exposes the active area on the sample. By adjusting the angle of the sample relative to the electron beam emitted by the transmission electron microscope, for example, rotating the machine table of the transmission electron microscope to the same angle as the angle between the length direction of the detection area and the length direction of the wire on the sample, the electron beam can be perpendicular to the length direction of the wire on the sample or perpendicular to the arrangement direction of the active area on the sample. The purpose of having a cross section along the arrangement direction of the active area and a cross section along the length direction of the wire on the same sample is achieved, and different angle detection is realized by single sample preparation.

The application provides a kind of nanoparticle thickness measurement method based on transmission electron microscopy high-angle annular dark-field image, belongs to the technical field of nanoparticle material.This method includes: the absolute brightness intensity value and thickness value data of standard nanoparticle with same composition and different particle size of the nanoparticle to be measured are collected to construct data set;The standard nanoparticle is regular shape nanoparticle;The relationship function of the absolute brightness intensity value and thickness value of the nanoparticle is established based on the data set;The absolute brightness intensity value of the nanoparticle to be measured is collected by transmission electron microscopy, and the thickness of the nanoparticle to be measured is obtained by the relationship function of the absolute brightness intensity value and thickness value of the nanoparticle.The method effectively avoids the interference of different crystal orientations on the brightness intensity in ordinary transmission mode imaging, and can obtain accurate nanoparticle thickness information.

Provided is a catalyst for electrode that has excellent catalytic activity and that is capable of contributing toward lower PEFC costs. This catalyst for electrode includes: a hollow carbon support having nanopores with a pore diameter of 1 to 20 nm; and a plurality of catalyst particles supported on the support. The catalyst particles are supported both inside and outside the nanopores of the support, are composed of (zerovalent) Pt, and when analysis of the particle size distribution of the catalyst particles is performed using three-dimensional, reconstructed images obtained through STEM-based electron tomography measurement, the percentage of catalyst particles supported inside the nanopores is 50% or more.

The present application relates to the technical field of mineral material microcharacterization, and in particular to a method for dispersing clay mineral monolayer suitable for transmission electron microscope observation. The method for dispersing clay mineral monolayer based on stage alcohol intercalation and exfoliation comprises the following steps: dispersing clay mineral in deionized water to obtain a clay mineral suspension system by stirring; adding small molecule alcohol to the suspension system first and then adding macromolecular alcohol, and stirring to obtain a dilute dispersion system; performing ultrasonic treatment to make the clay mineral form a dispersion system mainly in monolayer or few-layer structure; dropping onto a carrier film for transmission electron microscope to make the lamella spread on the surface of the carrier film; and observing by using a transmission electron microscope. The present application is conducive to obtaining clay mineral monolayer samples with good dispersion and complete structure, and is suitable for morphology and structure characterization under transmission electron microscope.

A vibration-damping rubber laminate with excellent damping characteristics is provided. The vibration-damping rubber laminate has a rubber layer formed from a vulcanizate of a rubber composition for vibration-damping rubber laminate containing components (A) and (B), wherein the number of aggregates consisting of three or more calcium carbonate particles linked together in any 1μm × 1μm square region of a scanning transmission electron microscope image obtained by photographing the rubber layer at 150,000x magnification is in the range of 5 to 15, wherein (A) isoprene rubber and at least one butadiene rubber, and (B) calcium carbonate.

This invention discloses a sample preparation method and storage medium for ion irradiation transmission electron microscopy, comprising: cutting a metal sheet to obtain a blanking sheet; acquiring surface images and / or thickness distribution information of the blanking sheet, identifying candidate blanking regions, and determining the effective ion irradiation region; determining the target blanking position and target blanking posture, so that the target observation area of ​​the blanked sample covers the effective ion irradiation region; inputting candidate die parameters and image features and thickness features corresponding to the target blanking position and target blanking posture into a trained optimization model to determine the target die parameters; using a punch and die corresponding to the target die parameters to blank at the target blanking position and target blanking posture, and simultaneously forming a directional positioning notch, a repositioning reference mark, and a liquid exchange auxiliary structure; and performing a forming quality re-inspection on the blanked sample for subsequent precision thinning, corrosion immersion, and transmission electron microscopy observation.

The application discloses a method for synchronously preparing and observing small-size tin nanoparticles based on a transmission electron microscope and application thereof, and belongs to the field of solder particles and preparation thereof. The application aims to provide a method for synchronously preparing and observing small-size tin nanoparticles based on a transmission electron microscope and application thereof. The method comprises the following steps: dropping anhydrous ethanol suspension liquid of large-size tin nanoparticles on an in-situ heating chip of a transmission electron microscope; placing the transmission electron microscope in a high-vacuum environment after the anhydrous ethanol is evaporated; and raising and maintaining the temperature to obtain a liquid tin droplet; and converging an electron beam on the edge of the tin droplet, so that the tin droplet explodes and splashes to obtain small-size tin nanoparticles. The method can simplify the preparation process, reduce the operation difficulty, realize the observation of nanoscale liquid-solid phase transition while preparing the tin nanoparticles, and can obtain tin nanoparticles with various sizes. In addition, the reusability of a single in-situ heating chip is improved.

In this work, a new method for synthesizing lead iodide (PbI₂) thin films was developed using the chemical bath deposition (CBD) method, which consisted of two stages. In the first stage, tin oxide films were synthesized to act as a seed layer, allowing for better adhesion of the film to be deposited. The second stage consisted of synthesizing the lead iodide films. Finally, heat treatments (100, 150°C, 200°C, 250°C, 270°C) were performed to promote polytype transitions in the material and to study the effect of these structures on the optical, chemical, and structural properties of the material. The direct influence of the heat treatment on the induction of polytypes was determined, and these polytypes clearly influence the structure and chemical composition of the resulting films.The results showed that the formulation sequence is crucial for generating a heterogeneous mechanism, which leads to the formation of lead iodide films. The samples obtained exhibited a characteristic yellow color of lead iodide films. Structural and compositional characterization using X-ray diffraction and transmission electron microscopy established that the films, both with and without heat treatment, exhibit a 2H and 4H polytypical structure. Furthermore, an increase in the contribution of the 4H structure and crystallinity was observed with increasing heat treatment temperature, a result consistent with the hypothesis and objectives of the project.Using Raman microscopy, we were able to identify the vibrational modes of the films with and without heat treatment, which correspond to the vibrational modes of 2H and 4H polytypical structures. Finally, their optical properties were measured using UV-Vis optical microscopy, establishing that temperature does not have a significant effect on the onset of fundamental absorption of the material. Applying the Kubelka-Munk method, we were able to determine the band gap for the lead iodide films, Eg 2.4 eV.

This invention relates to the field of transmission electron microscope accessories, and in particular to a sample rod capable of loading multiple samples. The sample rod includes a rod body and a rod core, with the rod core passing through the rod body. A rod head is located at the front end of the rod core, and the rod head has multiple sample mesh mounting positions arranged along the axial direction of the sample rod. A first limiting portion is located on the side of the rod core. A limiting member is located between the rod body and the rod core, with a portion of the limiting member protruding from the rod body. Multiple second limiting portions are located inside the limiting member. The limiting member can rotate around the axial direction of the sample rod, allowing the first limiting portion to engage with different second limiting portions. Under the constraint of different second limiting portions, the rod core can move along the axial direction of the sample rod to different positions. The number of second limiting portions corresponds to the number of sample mesh mounting positions. By providing second limiting portions for different sample mesh mounting positions, different sample mesh mounting positions correspond to different rod core positions. When adjusting the rod core position, it can be adjusted to the correct position in one step, making the adjustment process more convenient and faster.

This invention belongs to the field of metallic material sample preparation, and particularly relates to a method for rapidly thinning 1500MPa grade martensitic steel metal thin film samples for transmission electron microscopy. The sample is first wire-cut into thin sheets, cleaned with sandpaper, and then thinned to 120–150 μm on both sides using a chemical etching reagent. Next, it is manually thinned to 50–60 μm on both sides using sandpaper. Finally, the sample is electrolytically thinned using a double-jet electrolytic thinning instrument until a central perforation is achieved, followed by washing with anhydrous ethanol. The advantages are: stable internal sample structure, strict control of reaction conditions, avoidance of surface hardening layer formation, and shortened sample preparation time.

This utility model relates to a sample pretreatment device for magnetic thin films used in transmission electron microscopy, belonging to the field of electron microscope sample technology. It includes a base, on which a rotating body is movably mounted. A top plate and a bottom plate, arranged vertically opposite each other, are fixedly connected to both ends of the rotating body. An upper magnet is located on the bottom surface of the top plate, and a lower magnet is located on the top surface of the bottom plate. The upper and lower magnets are arranged opposite each other to form a magnetic field. A sample placement hole is opened on the rotating body, and a sample rod containing the sample is securely fastened within the hole, placing the sample between the upper and lower magnets. A toggle hole is opened on the top plate, and a toggle rod is inserted into the toggle hole. Rotating the toggle rod causes the top plate, rotating body, and bottom plate to rotate synchronously, allowing the magnetic field to adsorb sample debris from various locations on the sample surface. This application improves sample adhesion and can simulate a magnetic field to pre-remove sample debris around the sample on the sample rod.

The application belongs to the field of catalyst hydrolysis hydrogen production reaction, discloses a preparation method and application of Pt-Fe / tourmaline catalyst composite material, and applies it to sodium borohydride (NaBH4) hydrolysis hydrogen production; the catalyst forms metal-support interaction with the carrier tourmaline based on the synergistic mechanism between the bimetallic and makes NaBH4 produce hydrogen efficiently; the preparation method comprises the following steps: (1) preparing Pt / tourmaline catalyst solution by using in-situ reduction method; (2) adding metal iron precursor into the solution to prepare Pt-Fe / tourmaline composite catalyst suspension. The obtained suspension is filtered, washed and dried to obtain Pt-Fe / tourmaline catalyst. The application uses simple in-situ reduction method to prepare Pt-Fe / tourmaline catalyst composite material, and uses transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS) and other means to characterize the preparation completion and catalytic sodium borohydride hydrolysis performance, and obtains a kind of process simple, low energy consumption, pollution-free, efficient hydrogen production and low cost characteristics; the prepared Pt and Fe nanoparticles have small particle size and good dispersion uniformity, and have good application prospect.

This invention relates to the field of transmission electron microscopy (TEM) sample pretreatment tools, specifically to a batch staining device for ultrathin TEM sections, comprising a tray, a tray cover, a copper mesh box, a handle, and a wax tray. The copper mesh box includes a base and a lid. The base has multiple placement slots, and both the placement slots in the base and the lid have small holes with a diameter of less than 3 mm, with the holes on the base and lid corresponding one-to-one. The handle is fixedly connected to the lid of the copper mesh box. The wax tray has a groove adapted to the shape of the copper mesh box. By providing a tray, tray cover, copper mesh box, handle, and wax tray, this invention eliminates the need for repeated handling of the mesh with tweezers, effectively preventing mesh deformation and damage to the ultrathin sections.

The present application provides a high skin permeation effect truffle vesicle-nicotinamide composition, which uses natural nanovesicles extracted from truffles as carriers, and encapsulates hydrophobic drug nicotinamide by ultrasonic method to form truffle vesicle-nicotinamide composition. The preparation method comprises the steps of extraction and purification of truffle vesicles, ultrasonic drug loading with nicotinamide, and ultrafiltration purification. The composition is characterized by transmission electron microscopy, and the particle size is uniform, about 30-200 nm, and the encapsulation efficiency can reach more than 75%. In vitro Franz diffusion cell experiment shows that the composition can significantly enhance the skin permeability of nicotinamide, and can promote the accumulation of drugs in the epidermis and dermis. The composition has the natural biological activity of truffle and the pharmacological efficacy of nicotinamide, and can be used for preparing transdermal preparations with the effects of whitening, anti-aging, repair, etc., and has a wide application prospect in the field of cosmetics and skin local administration.

1. Name of the product in this design: Electron Microscope (TOTEM). 2. Intended use of this design: for use in cryogenic transmission electron microscopes. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.