278 results about "Transmission electron microscopy" patented technology

The invention relates to a transmission electron microscope low-temperature sample rod using a flexible structure to transfer heat. The transmission electron microscope low-temperature sample rod comprises a liquid nitrogen Dewar tank; the sample rod comprises a sample rod body with a front-back through hollow cavity, a heat conduction rod and a flexible heat transfer rope, one end of the heat conduction rod extends into the liquid nitrogen Dewar tank, the other end of the heat conduction rod extends into the sample rod body, one end of the flexible heat transfer rope is wound and fixed on the heat conduction rod, and the other end of the flexible heat transfer rope is wound and fixed on the sample rod body. The other end of the sample rod extends to the outer end of the sample rod body; the sample rod head comprises a sample rod fixing outer frame and a sample rod temperature control part, the sample rod fixing outer frame is connected with the outer end of the sample rod body, the sample rod temperature control part is arranged on the sample rod fixing outer frame, the sample rod temperature control part is connected with the flexible heat transfer rope, and a heating element capable of heating a sample to be tested is further arranged on the sample rod temperature control part. Compared with the prior art, efficient heat conduction can be achieved, meanwhile, the thermal stress influence is reduced, and the temperature stability and the sample position stability are improved.

The invention discloses an in-situ TEM (Transmission Electron Microscope) device sample preparation method based on a suspended thinning and parallel carrying technology, which can be used for preparing in-situ TEM samples of semiconductor two-end devices and three-end devices, and mainly solves the problems of unstable ohm contact, nonuniform thinning, low success rate and high time cost in the prior art. According to the invention, an FIB sample preparation technology is adopted, and stable and reliable ohmic contact between a sample electrode and an MEMS chip electrode is ensured through specific-angle sample extraction, suspended thinning, parallel carrying, circuit breaking treatment and an accurate electrode welding process. According to the sample prepared by the invention, the failure state of a device can be observed in real time under a transmission electron microscope, the sample has the advantages of high sample preparation success rate, good repeatability, stable electrical parameters and wide applicable chip variety, and the reliability and repeatability of in-situ TEM test data are remarkably improved.

The invention relates to a mechanical property simulation method for researching the service life of an aluminum alloy material for a reactor. The simulation method for the life period mechanical property of the aluminum alloy material comprises the following steps: S1, preparing initial, middle and last stage aluminum alloy samples according to a < 27 > Al-< 28 > Si transmutation path of the aluminum alloy material; s2, representing the sample by using a transmission electron microscope, obtaining precipitated particle parameters, calculating a volume fraction f, fitting f and operation time t, and constructing a precipitation evolution model f (t); s3, performing high-energy ion irradiation on the sample, and performing nanoindentation experiment and load-depth curve fitting to obtain nano hardness H; s4, based on the f (t), establishing a relation model of the nano hardness H and the irradiation damage D; and S5, calculating the change quantity of the nano hardness H, converting the change quantity into the change quantity of the yield strength, associating the irradiation damage D with the service time T, and establishing a life period yield strength prediction model. According to the method, the mechanical property of the aluminum alloy in the full service cycle of the research reactor can be accurately evaluated.

The invention discloses a preparation method of a transmission electron microscope sample of a sintered neodymium-iron-boron block material, which comprises the following steps of block sample cutting, mechanical grinding, sample punching, ring sticking, pre-thinning and final thinning, so that the transmission electron microscope sample to be observed is obtained. In addition, the method is simple, feasible, economical and practical, and the sample preparation success rate can be remarkably increased.

The invention discloses a transmission electron microscope sample preparation method for a lunar soil space weathered surface and application, and the method comprises the following steps: pasting target lunar soil particles on a carbon conductive adhesive tape, and enabling the target flat surfaces of the target lunar soil particles to be placed back to the carbon conductive adhesive tape; plating a layer of carbon film on the surface of the target lunar soil particle to obtain a scanning electron microscope sample of the target lunar soil particle; screening out a plurality of target research areas on the carbon film corresponding to the target flat surface; uniformly plating a layer of gold film on the carbon film corresponding to the target lunar soil particle scanning electron microscope sample; deposition operation of a research area protection layer is carried out on the gold film corresponding to the target research area through an electron beam and an ion beam in sequence; and performing slicing operation perpendicular to the target flat surface on the target lunar soil particle scanning electron microscope sample to obtain the target lunar soil particle transmission electron microscope sample. According to the method, lunar soil space weathering characteristics can be truly reserved, and an accurate and reliable sample is provided for lunar soil space weathering research.

The invention discloses an ion thinning instrument control method based on a self-adaptive gradient energy reduction algorithm, and belongs to the technical field of transmission electron microscope (TEM) sample preparation. The problem that a traditional ion thinning technology has many limitations is solved, dynamic optimization of parameters such as ion beam energy, beam current density and sample temperature is achieved through the self-adaptive gradient energy reduction algorithm, and the sample preparation efficiency is remarkably improved; by combining multi-modal data acquisition and dynamic gradient optimization, the thinning process can be accurately controlled, and the sample quality is improved; sample damage is effectively avoided by combining a damage constraint mechanism and self-adaptive step length control, and the stability of the preparation process is improved; the method is suitable for various materials through a pre-stored optimization path library, and has wide applicability; therefore, the energy of the ion beam is optimized, the incident angle and the beam density are dynamically adjusted, and the thinning instrument is controlled.

To provide an aluminum alloy sheet excellent in rollability.SOLUTION: 0.05% by mass or more and 0.35% by mass or less of Si, 0.05% by mass or more and 0.50% by mass or less of Fe, 0.01% by mass or more and 0.35% by mass or less of Cu, 0.10% by mass or more and 0.80% by mass or less of Mn, 2.0% by mass or more and 6.0% by mass or less of Mg, 0.01% by mass or more and 0.15% by mass or less of Cr, and a balance of Al and inevitable impurities, in a cross section in a sheet thickness direction, a ratio of an area occupied by central grains is 1.15% or less, and in a sheet thickness Mg2Si region, a number-density ratio obtained by dividing a number-density of precipitates observed with a transmission-type electron microscope by a number-density in a reference aluminum alloy sheet, a Si-amount ratio obtained by dividing a Si content by a reference Si content, and a Mg-amount ratio obtained by dividing a Mg content by a reference Mg content satisfy the following formulas: Number density ratio ≥ 10.929 * Si amount ratio - 15.814 + 2.043 * (Mg amount ratio - 1) SELECTED DRAWING: Figure 5

The invention discloses a toughening forming method of a high-performance PEI plate for a high-heat-resistance structural part, and particularly relates to the technical field of high-performance composite material forming. Pre-embedding a PEI toughening layer between thermosetting prepreg layers, and controlling the temperature, the pressure, the pressure maintaining time and the heating rate in the hot pressing process; carrying out infrared spectrum or solid nuclear magnetic resonance testing on the interface area sample subjected to hot press molding, and calculating the chain segment residual rate Rp; determining the interface penetration depth Di through a transmission electron microscope in combination with energy spectrum analysis; inputting the Rp and the Di into an interface coupling model, and outputting an interface combination quality factor Q by the model in a form of combining weighted linearity and logarithmic functions; the interface bonding grade is judged according to the Q value, and when the Q value is lower than a threshold value, hot-pressing process parameters are backtracked for optimization; according to the method, quantitative evaluation of the interface performance and process closed-loop optimization are realized, and the interface bonding strength and service reliability of the composite material can be effectively improved.

To provide a group of polyorganosiloxane-containing polymer particles that yield molded articles with excellent impact strength. [Solution] A polyorganosiloxane-containing polymer particle group according to one aspect of the present invention comprises a polymer (A) containing a polyorganosiloxane (A1) and a first vinyl polymer (A2), and a second vinyl polymer (B). When the cross-section of a resin piece obtained by dispersing the polyorganosiloxane-containing polymer particle group in a resin is observed with a transmission electron microscope, the ratio of the number of particles satisfying the following formula (1) is less than 60%, where L is the diameter of each particle in the polyorganosiloxane-containing polymer particle group and M is the maximum domain length of the polyorganosiloxane (A1). M / L>0.1 ···(1)

The application discloses a device and method for bending and deforming micro-nano samples in-situ in an electron microscope, and belongs to the field of scanning / transmission electron microscope accessories and micro-nano material mechanical property measurement research. The device comprises four parts, namely a supporting part, a driving part, a bending loading part and a sample stage part. One end of the nano material is fixed to a suspended part at the front end of the sample stage, and the other end is a free end. The free end of the nano material is pushed by the bending loading part driven by the heating and bending bimetallic strip, so that the nano material achieves the bending and deformation effect. The application separates and fixes the bimetallic strip and the sample, solves the problems of poor mechanical stability and easy movement of the sample in the deformation process of the in-situ bending nano material, improves the stability of the fixed sample and in-situ imaging, realizes the bending and deformation of the sample, and simultaneously observes the structural evolution of the material in the deformation process. While realizing the bending and deformation of single / multiple nano wire shafts, the structural evolution of the material in the deformation process is observed in-situ.

This invention relates to a method for locating characteristic defects in cadmium zinc telluride (CZT) samples and a method for preparing CZT samples. The location method includes the following steps: determining the positions of internal feature points on the sample under an infrared transmission microscope; establishing marking features on the sample surface using FIB-SEM; and determining the relative position of the internal feature points projected onto the sample surface by establishing a geometric relationship between the virtual position of the internal feature points projected onto the sample surface and the marking features. The preparation method uses these relative positions to prepare CZT samples. The location method of this invention can simply and effectively establish the positional relationship between internal feature points and surface features, accurately locating internal defect features in CZT samples. This allows for convenient and rapid determination of the specific location for preparing transmission electron microscopy (TEM) samples, thus improving the quality of TEM samples.

This invention provides a rapid preparation method for steel samples for transmission electron microscopy (TEM), relating to the field of physical analysis of steel materials. It is applied to the preparation of various steel samples, including heat-sensitive steels, using a composite binder of cellulose acetate, acetone, silica, and alumina. The binder is used to adhere one side of a wire-cut steel sample sheet to the sheet fixing surface of a grinding aid. A grinding aid area, parallel to the bottom surface of the sheet fixing surface, is provided on the grinding aid device. The grinding aid area is pressed, and sandpaper with progressively increasing grit is used to grind one side until a first preset thickness is reached. Then, the other side is switched, and sandpaper with progressively increasing grit is used to grind the second side until a second preset thickness is reached. The ground sheet is removed, thinned, punched, and electropolished to obtain the target steel sample. This invention can rapidly prepare steel sample sheets with a thickness of 30-50 µm, and the method is simple and has a high success rate.

A method for analyzing a sample using an electron microscope includes: generating ions, molecules, or other particles, such as droplets, from a target sample; introducing the ions, molecules, or other particles into a vacuum cavity of a transmission electron microscope (TEM) in a direction intersecting the path of a pulsed electron beam; recording an electron diffraction pattern associated with the ions through which the pulse passes at each pulse of the electron beam; and calculating the three-dimensional (3D) structure of the ion species based on the recorded electron diffraction pattern.

The invention relates to the technical field of in-situ detection of electron microscopes, in particular to a one-stop four-dimensional transmission scanning focused ion beam double-beam electron microscope, which comprises a vacuum cavity provided with a vacuum cavity cover; a sample table is arranged on the inner side of the vacuum cavity cover; the electron beam, the ion beam, the manipulator, the sample holder and the gas injection system are mounted on the vacuum cavity through the multifunctional in-situ sealing flange; the system further comprises a 4D STEM detector. According to the invention, electron beam observation, ion beam processing, four-dimensional scanning transmission electron microscope imaging information acquisition and in-situ electric, optical, thermal, force and other external field loading functions are integrated, and scanning electron microscope imaging, transmission electron microscope sample preparation and in-situ 4D STEM diffraction information acquisition under multi-field combined application can be carried out on a sample in one device. One-stop full-scale multi-field combined application detection is realized, the test result is prevented from being influenced by contact with air, water and other external environments in the sample transfer process, and meanwhile, the test efficiency is remarkably improved.

A multilayer ceramic capacitor includes dielectric ceramic layers and inner electrode layers. The dielectric ceramic layers include crystal grains including a perovskite oxide including at least one A-site element and at least one B-site element. When a cross-section of the dielectric ceramic layers is observed using a scanning transmission electron microscope, the dielectric ceramic layers include grains, on which a plane of a perovskite structure is observed, as crystal grains. The grains, when subjected to compositional analysis by energy dispersive x-ray spectroscopy, have an atom-distributed region in which a concentration of the A-site element or B-site element (c) subtracted from a maximum concentration of the element (cmax) (Δc=cmax−c) is about 2 atm % or less, at one or more atomic sites in the grains, and an area of the atom-distributed region (SΔc≤2%) is about 0.050 nm2 or less.

This invention discloses a measurement technique for the width of magnetic domain walls based on a transmission Lorentz electron microscope, comprising the following steps: (1) observing the sample in a transmission electron microscope and obtaining a series of defocus images corresponding to the magnetic domain walls; (2) replacing the sample with a standard sample, obtaining a series of defocus images, and calculating the correction coefficients for magnifications corresponding to different defocus amounts under the current Lorentz imaging mode; (3) selecting a portion of the magnetic domain walls perpendicular to a certain area in a series of defocus images, performing Gaussian linear fitting on the intensity distribution of this area and correcting it to obtain the transverse width of the magnetic domain walls, and then performing linear fitting based on the relationship between the transverse width of the magnetic domain walls and the defocus amount to extrapolate the intrinsic width of the magnetic domain walls; (4) constructing the magnetization distribution of the magnetic domain walls based on the intrinsic width of the magnetic domain walls, simulating a series of Fresnel defocus images of the magnetic domain walls, calculating the correspondence between the width of the magnetic domain walls and the defocus amount, and extrapolating to obtain the width of the simulated magnetic domain walls under positive focus conditions. Using the method of this invention, quantitative measurement of the width of magnetic domain walls in magnetic materials can be achieved.

A negative electrode active substance layer of a negative electrode for nonaqueous electrolyte secondary battery herein disclosed includes at least a first negative electrode active substance and a second negative electrode active substance. The first negative electrode active substance is configured with an aggregated body of a scaly graphite whose surface of at least one part is covered with a low crystalline carbon. A graphite interlayer distance of the low crystalline carbon is equal to or more than 3.8 Å and not more than 5.0 Å. The second negative electrode active substance is a natural graphite or an artificial graphite whose graphite interlayer distance based on electron diffraction images by the transmission electron microscope is equal to or more than 3.35 Å and not more than 3.4 Å. Here, a mass ratio of the first negative electrode active substance and the second negative electrode active substance is 50:50 to 90:10.

To provide a scanning transmission electron microscope in which the position of an aperture can be easily adjusted.SOLUTION: A scanning transmission electron microscope according to the present invention includes an electron source that generates an electron beam, an optical system having a focusing lens, an aperture, and an objective lens that focuses the electron beam generated by the electron source to form an electron probe, and a control unit that controls the electron source and the optical system, and the optical system is in a state in which an image does not move at the center of a Ronchigram even when an acceleration voltage for accelerating the electron beam is varied, and the control unit performs the following processes: inserting the aperture into the path of the electron beam; acquiring a first STEM image with the acceleration voltage set to a first voltage value while the aperture is inserted; acquiring a second STEM image with the acceleration voltage set to a second voltage value different from the first voltage value while the aperture is inserted; and moving the aperture based on the positional deviation between the first STEM image and the second STEM image.SELECTED DRAWING: Figure 4

To provide a laminate which stably exhibits high barrier properties.SOLUTION: A barrier film includes a layer A on a base material film, wherein the layer A contains Mg and Si, when 10 points are collected at an interval of 1 m in a longitudinal direction of the film from a central part in a width direction, and are measured by a transmission electron microscope, standard deviation in the longitudinal direction of the thickness of the layer A is 30 nm or less, and when 10 points are collected at an interval of 1 m in the longitudinal direction of the film from the central part in the width direction, atomic concentrations (atom%) of a Mg atom and an Si atom of the layer A analyzed by X-ray photoelectron spectroscopy are represented by YMg and YSi, where standard deviation in the longitudinal direction of YMg / (YMg+YSi) is 0.055 or less.SELECTED DRAWING: None

The utility model discloses a maintenance device for water quality and flue gas on-line monitoring equipment, and belongs to the technical field of maintenance devices. The water quality and flue gas on-line monitoring equipment maintenance device comprises a base assembly, a leak detection assembly, a damage detection mechanism and a blowing mechanism, the leak detection assembly is used for carrying out leak detection on a gas path system of the flue gas on-line monitoring equipment, and the damage detection mechanism is used for carrying out surface and internal damage detection on an optical probe of the water quality on-line monitoring equipment. The air blowing mechanism is used for conducting blow-drying maintenance and air blowing cleaning on sampling probes of the water quality online monitoring equipment and the smoke online monitoring equipment respectively, the leak detection assembly and the air blowing mechanism are installed on the two sides of the top face of the base assembly respectively, the damage detection mechanism is arranged on the top face of the leak detection assembly, and the leak detection assembly comprises an installation box. A pair of leak detector bodies is installed in the installation box body, the damage detection mechanism comprises a pair of connecting plates and a connecting frame, and a scanning electron microscope and a transmission electron microscope are installed on the two sides of the bottom end of the connecting frame respectively.

The present application provides a kind of negative electrode for reducing the initial resistance of non-aqueous electrolyte secondary battery and achieving the improvement of durability.The negative electrode for non-aqueous electrolyte secondary battery disclosed herein has a negative electrode current collector and a negative electrode active material layer formed on the negative electrode current collector, and the negative electrode active material layer at least contains a first negative electrode active material and a second negative electrode active material.The first negative electrode active material is composed of agglomerates of flaky graphite coated with low-crystallinity carbon on at least part of the surface, and the interlayer distance of graphite of the low-crystallinity carbon based on the electron diffraction image obtained by transmission electron microscopy is 0.3375 nm.The second negative electrode active material is natural graphite or artificial graphite with an interlayer distance of graphite based on the electron diffraction image obtained by transmission electron microscopy of 0.3375 nm.Here, the mass ratio of the first negative electrode active material to the second negative electrode active material is 50:50 to 90:10.

The present invention includes a positive electrode active material for a secondary battery, comprising a composite metal hydroxide precursor represented by Chemical Formula (1) below: wherein the precursor includes a secondary particle composed of a plurality of primary particles; wherein each primary particle is formed as a bundle of micro primary particles; wherein, when observed via a transmission electron microscope, the major axis direction of the micro primary particles coincides with the major axis direction of the primary particles; and wherein each micro primary particle has a thickness of about 1 nm to about 50 nm.

The invention discloses a large-view-field and high-temporal-spatial-resolution transmission electron microscope in-situ imaging method for a microcosmic electrochemical process, which comprises the following steps: step 1, loading an electrode material particle sample to be detected on a carrying table, inserting the sample into a transmission electron microscope vacuum lens cone along with a sample rod, identifying a target sample under low magnification, and carrying out basic adjustment on an electron microscope; 2, adjusting magnification times to ensure that an observation area is completely incorporated into an imaging view field, selecting an imaging mode, eliminating astigmatism, and adjusting the focal length of an objective lens until a sample particle image interface is clear; and step 3, selecting a CCD camera, setting an acquisition frame rate, and performing ultrafast acquisition of images or videos. The transmission electron microscope in-situ imaging technology giving consideration to both the large view field and the high space-time resolution has practical application value in research of the electrochemical reaction kinetics process of the granular material.

The present application belongs to the technical field of gallium oxide doping regulation, and particularly relates to a gallium oxide micro-defect electrical property regulation method and system, which comprises: collecting a transmission electron microscope (TEM) bright field whole image of gallium oxide material; determining a plurality of defect sensitive areas, and performing stable cluster purification and regional clustering to form defect sensitive area clusters and de-cluster abnormal points; determining a representative area for each defect sensitive area cluster, collecting dark field images and high resolution images of the representative area and identifying defect types, and independently identifying the de-cluster abnormal points; pre-flowing according to the unrepairable leading area based on the representative area identification result; calculating a repair coefficient and recommending a doping parameter for the un-flowed area; the system is used to implement the above method, and the present application can reduce the subsequent image collection quantity and area-by-area identification burden, and improve the gallium oxide micro-defect detection and electrical property regulation efficiency.

The invention discloses a construction method of a COL4A5-K229X point mutation X-linked Alport syndrome mouse model. The construction method comprises the following steps: aiming at c.685Agt of a No.12 exon of a mouse COL4A5 gene; carrying out T point mutation, and designing and preparing Cas9 mRNA, gRNA and a donor vector; the components are mixed and then microinjected into fertilized eggs of a C57BL / 6J mouse to obtain an F0-generation mouse; identifying the genotype through PCR (Polymerase Chain Reaction) amplification and Sanger sequencing, and screening positive mice; mating the positive F0-generation mice with the wild-type mice, and breeding F1-generation and subsequent generations; the phenotype of the model is further verified through qPCR, biochemical analysis, light microscopic examination, transmission electron microscope and immunofluorescence. The model constructed by the invention shows hematuria, proteinuria, azemia, podocyte loss and irregular thickening and layering of glomerular basement membrane, is consistent with phenotypes of human XLAS patients, and provides an animal model tool for analyzing pathogenesis and developing treatment strategies.

The invention provides a powder particle transmission electron microscope sample and a preparation method thereof, and the method comprises the steps: adding a powder sample into a curable resin matrix, mixing to form a pasty or pasty uniform mixture, pre-burying a transmission electron microscope grid in the mixture under the cooperation of a flat substrate and a separation material, the resin and powder solidified body and the grid form an integral structure by pressurizing the upper substrate and the lower substrate and standing and solidifying the upper substrate and the lower substrate; removing the substrate and the separation material after curing, and exposing and separating the edge of the grid through mechanical grinding and polishing to obtain the grid of which the grid openings are filled with the curing mixture; and carrying out ion thinning on the grid and plating a carbon film, and forming through holes and large-area thin areas around the through holes in the plurality of grids. The method is simple in process and universal in equipment, can be used for simultaneously preparing a large amount of powder cross section thin areas, is suitable for various nano-scale, submicron-scale and micron-scale powder, and remarkably improves the preparation efficiency and observable information amount of the powder TEM sample.

This multilayer ceramic capacitor 1 is provided with: an element body 10 including a plurality of dielectric ceramic layers 20 and a plurality of internal electrode layers 30 stacked in a thickness direction T; and external electrodes 11, 12 provided on the surface of the element body 10, the external electrodes 11, 12 being electrically connected to the internal electrode layers 30. The dielectric ceramic layer 20 contains a perovskite type oxide as a main component. The perovskite type oxide contains at least one of barium (Ba), calcium (Ca), and strontium (Sr), at least one of titanium (Ti) and zirconium (Zr), and at least one of rare earth elements (Re). For a Re / (Ti+Zr) ratio of each pixel of an element mapping image converted to atom%, obtainable by STEM-EDS analysis (scanning transmission electron microscope-energy dispersive X-ray spectroscopic analysis) of the dielectric ceramic layer 20, if the range of 0≤Re / (Ti+Zr)˂2 is divided by a section width 0.002, the number of pixels belonging to each section is enumerated, and the frequency of the number of pixels is converted to a relative frequency so that the cumulative frequency of 0≤Re / (Ti+Zr)˂2 becomes 1, then: the arithmetic mean of the Re / (Ti+Zr) ratio in the dielectric ceramic layer (hereinafter referred to as a "concentration ratio arithmetic mean") is 0.03 to 0.10 inclusive; a value obtained by dividing a starting point of a section in which the cumulative frequency exceeds 0.1 for the first time, starting from the relative frequency of a first section 0≤Re / (Ti+Zr)˂0.002, by the concentration ratio arithmetic mean (hereinafter referred to as a "10% cumulative frequency ratio to the concentration ratio arithmetic mean") is 0.50 or more; and a value obtained by dividing a starting point of a section in which the cumulative frequency exceeds 0.9 for the first time, starting from the relative frequency of the first section 0≤Re / (Ti+Zr)˂0.002, by the concentration ratio arithmetic mean (hereinafter referred to as a "90% cumulative frequency ratio to the concentration ratio arithmetic mean") is 1.30 or less.

The invention discloses preparation and application of a medium-temperature solid oxide fuel cell cathode material for improving Sm < 0.5 > Sr < 0.5 > FeO < 3-delta > oxygen reduction activity through B-site regulation and control, and belongs to the technical field of medium-temperature solid oxide fuel cells. According to the invention, the Sm < 0.5 > Sr < 0.5 > Fe < 1-x > Ni < x > O < 3-delta > series material is successfully synthesized by adopting an EDTA-citric acid sol-gel method. XRD (X-ray diffraction) results show that all samples are of cubic perovskite structures, and lattice shrinkage caused by Ni doping shows that Fe is successfully substituted to enter lattice sites. The uniformity of element distribution is further verified through HR-TEM (high-resolution transmission electron microscope) and EDS (energy spectrum element distribution) analysis.

The present application relates to the field of transmission electron microscopy characterization of two-dimensional material structure, and particularly to a method for efficiently obtaining cross-section characteristic crystal orientation of two-dimensional material, which is suitable for two-dimensional van der Waals layered material and two-dimensional non-layered material. A focused ion beam microscope (FIB) is used to sample in the direction perpendicular to (or parallel to) the long straight edge of the two-dimensional material edge, and the two-dimensional material sampling direction is parallel to the half-moon-shaped carrier net string length direction for welding, so as to prepare a cross-section sample capable of reflecting atomic layer stacking sequence; the half-moon-shaped carrier net string length direction is placed perpendicular to the TEM sample rod axial direction, and then small-angle tilting is performed to quickly realize sample crystallographic orientation. The present application lays a foundation for efficiently analyzing crystallographic information such as crystal structure, stacking defects and surface reconstruction of the material by observing the cross-section sample of the two-dimensional material.

The invention provides a coenzyme Q10 nano-liposome capable of being endocytosed by brain neurons as well as a preparation method and application of the coenzyme Q10 nano-liposome, and belongs to the technical field of biological medicines. According to the coenzyme Q10 nano-liposome and the preparation method thereof, polycarbonate filter membranes of 220 nm, 100 nm and 50 nm are adopted to sequentially extrude a solution, the coenzyme Q10 nano-liposome which has the particle size range of 30-50 nm, is not prone to melt collapse and can be endocytosed by neurons is prepared, and the preparation method is simple and efficient. According to the invention, nano-liposomes simultaneously wrapping 5nm gold and coenzyme Q10 are further prepared, distribution of the nano-liposomes can be traced through a transmission electron microscope, and whether the drug coenzyme Q10 enters extracellular gaps of brain cells and whether the drug coenzyme Q10 is endocytosed into neurons or not is verified. The coenzyme Q10 nano-liposome disclosed by the invention can penetrate through a blood brain barrier, enter extracellular gaps and are endocytosed by neurons to eliminate formaldehyde accumulated in the brain, so that a foundation is provided for research and development of drugs for brain diseases such as Alzheimer's disease.