The invention provides an ultra-
wideband low-absorption low-stress high-reflection thin film based on a gradual change
chirp structure, and belongs to the technical field of optical thin films. Different from a mode of mutually combining and superposing high and low
refractive index materials of a traditional structured film
system to control the reflection bandwidth, the invention provides a logarithmic function gradient
chirp structure, the
reflectivity index is adjusted by adjusting the total number of film
layers, and the reflection bandwidth is adjusted by adjusting head and
tail optical thickness coefficients. The problem that the
reflectivity is suddenly reduced in a multi-reflection-band superposition reflection gap area when the
broadband high-reflection
dielectric film is designed is effectively avoided, and the problem of surface
distortion caused by thin film stress is reduced by adjusting the film thickness ratio of the
stress regulation and
control layer to the gradual change main reflection layer. From the perspective of membrane
system design, the thickness of the
membrane layer is reduced, the preparation period and difficulty are reduced, problems and risks caused by stress are reduced,
membrane layer absorption is effectively reduced, and the absorption and stress can be controlled within a proper range in combination with a post-treatment means to effectively support safe and stable operation of the
system.