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1550results about "Electric/magnetic position measurements" patented technology

Magnetic field permeable barrier for magnetic position measurement system

A magnetic field position and orientation measurement system contains, confines and re-directs the magnetic field from one or more transmitters such that the fields are attenuated in areas outside of the operating volume in areas where metallic objects are commonly found. A thin barrier made of a highly permeable material such as ferrite or mumetal is placed on top of a conductive plate. The thickness of the permeable layer is from 0.01 inches to 0.25 inches while the conductive plate, preferably made of an aluminum alloy, may preferably be from {fraction (3/16)} of an inch to ¼ inch in thickness. On top of the permeable barrier, a rhombic three axis transmitter is placed. In the preferred embodiment, the transmitter consists of a PC board carrying the transmitter. PC boards having thicknesses varying from 0.03125-0.125 inches may be employed. Thus, the entire "stack" including the transmitter, the permeable barrier and the conductive plate may only be from ½ inch to ⅝ of an inch in thickness. The permeable barrier may have a flat, planar configuration. Alternatively, it may be made to resemble, in cross-section, a cake pan having a flat central region with uplifted peripheral edges. Alternatively, the permeable barrier may have a generally flat configuration with peripheral edges that taper outwardly from the top surface thereof to the bottom surface thereof with the taper making an angle with the bottom surface in the range of, preferably, 30° to 85°.
Owner:ASCENSION TECH

System for creating microscopic digital montage images

An imaging apparatus is disclosed. The imaging apparatus includes a motorized stage, a camera focussed relative to the stage, and a processor coupled to the camera. The processor contains instructions which, when executed by the processor, cause the processor to capture an image incident on the camera, convert the image into a plurality of pixels having a characteristic such as intensity, establish the characteristic for each pixel; and determine which pixels contain a target image based on the characteristic of the pixels. Another imaging apparatus includes a motorized stage, a camera having a lens directed toward the motorized stage, and a processor coupled to the camera. The processor contains instructions which, when executed by the processor, cause the processor to select at least three regions of a sample adjacent the motorized stage, develop a focus surface based on a normalized distribution of the at least three selected regions, position the camera on a region of the sample, focus the camera on the surface, and capture an image of the region. In addition, an imaging apparatus having a motorized stage, a camera focussed relative to the motorized stage, a stage position sensor adjacent the motorized stage, and a pulsed light directed toward the motorized stage and coupled to the stage position sensor such that the pulsed light illuminates in response to the stage position sensor is disclosed.
Owner:CARL ZEISS MICROSCOPY GMBH

Apparatus and method for detecting the displacement

An apparatus for detecting the displacement of a magnet is to be provided. The errors on the detected value due to the variation of temperature or that with time are hardly caused in the apparatus. The apparatus can detect the displacement in high resolution and precision. The apparatus is simple in its structure, and it can be expected that the apparatus can be manufactured in low cost. The apparatus is not limited in its application by the range of the displacement of the magnet. Further, a method for detecting the displacement of a magnet will be provided. An apparatus for detecting the displacement of a magnet M, the apparatus being characterized in that it further comprises a plurality of hall devices H0-H7 disposed in a predetermined spacing DP along a displacing path of the magnet in parallel thereto, wherein each of said hall devices includes a magnetically sensitive surface HS through which a magnetic flux from said magnet M permeate to generate an output the polarity and the voltage of which are depend on the direction and the density of the magnetic flux, and said magnetically sensitive surface HS of each hall device is disposed in a predetermined distance from the displacing path of the magnet M in parallel with the direction defined by the magnetic poles, and wherein two adjacent hall devices inverted in the polarity of their output voltages are detected to determine the general position of the magnet, and the precise position of the magnet between these two hall devices is determined on the basis of the output voltages.
Owner:TOKYO KEISO

Method and apparatus for detecting displacement of a magnet moved in response to variation of a physical characteristic of a fluid

An apparatus for detecting the displacement of a magnet is to be provided. The errors on the detected value due to the variation of temperature or that with time are hardly caused in the apparatus. The apparatus can detect the displacement in high resolution and precision. The apparatus is simple in its structure, and it can be expected that the apparatus can be manufactured in low cost. The apparatus is not limited in its application by the range of the displacement of the magnet. Further, a method for detecting the displacement of a magnet will be provided. An apparatus for detecting the displacement of a magnet M, the apparatus being characterized in that it further comprises a plurality of hall devices H0-H7 disposed in a predetermined spacing DP along a displacing path of the magnet in parallel thereto, wherein each of said hall devices includes a magnetically sensitive surface HS through which a magnetic flux from said magnet M permeate to generate an output the polarity and the voltage of which are depend on the direction and the density of the magnetic flux, and said magnetically sensitive surface HS of each hall device is disposed in a predetermined distance from the displacing path of the magnet M in parallel with the direction defined by the magnetic poles, and whereintwo adjacent hall devices inverted in the polarity of their output voltages are detected to determine the general position of the magnet, and the precise position of the magnet between these two hall devices is determined on the basis of the output voltages.
Owner:TOKYO KEISO
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