68results about How to "Detection of defect" patented technology

The present invention discloses only required personal information in an emergency. A personal information display screen displays a face image display area 141, a passenger position display area 142, an interior image display area 143, a front image display area 144, a rear image display area 145, a personal information display area 146, and a display end button 147. For example, when an accident occurs and a rescue team arrives at the scene of the accident, a display section of an on-vehicle apparatus displays not only passengers' face images but also required information such as their names, addresses, and blood types which is permitted to be disclosed. This enables emergencies to be dealt with both promptly and correctly even if such a serious accident as causes all the passengers to lose consciousness occurs. The present invention is applicable to the on-vehicle apparatus.

An inspection method for detecting a defect in a test object. A particulate is generated, then the generated particulate is introduced into a test object. Subsequently, light having high directivity is emitted such that the light passes in the vicinity of the test object to irradiate the particulate discharged from the test object, thereby making the particulate visible. An inspection apparatus for detecting a defect in a test object, including a particulate generating means for generating a particulate, a particulate introducing means for introducing the particulate into a test object, and a light emitting means for emitting light with high directivity that passes in the vicinity of the test object and irradiates the particulate discharged from the test object thereby to visualize the particulate. The inspection method and apparatus detect a defect of a test object with high sensitivity, permit easier identification and recording of the location of a defect, and shorten an inspection time and the time required for the pre-treatment and post-treatment before and after an inspection, or obviate the need for the pre-treatment and post-treatment.

Provided is a pattern inspection device for accurately simulating an electron beam image of a circuit pattern on a wafer from design data, and implementing high-precision defect detection based on the comparison between the simulated electron beam image and a real image. A pattern inspection device comprises: an image capturing unit for capturing an electron beam image of a pattern formed on a substrate; a simulated electron beam image generation unit for generating a simulated electron beam image using a parameter indicating the characteristics of the electron beam image on the basis of design data; and an inspection unit for comparing the electron beam image of the pattern, which is the image captured by the image capturing unit, and the simulated electron beam image generated by the simulated electron beam image generation unit, and inspecting the pattern on the substrate.

A device is described for indicating the locking state of a fifth wheel coupling and an arrangement of a first and a second sensor. According to the prior art, the first sensor is arranged on the underside of the locking latch and monitors the position of the kingpin in relation to the locking latch. A second sensor that is used is an inductive proximity switch that monitors a safety mechanism against loosening. In practice, this type of positioning of the first sensor has led to damage of the locking latch and the first sensor, while the signals of the second sensor were often false signals. Thus, the object of the invention is to provide a device for indicating the locking state, which maximizes operational availability and minimizes false signals. A further object of the invention is to optimize the arrangement of the first and the second sensor. These objects are attained by arranging the first sensor detecting the kingpin in the area of the locating hole and configuring the second sensor as a magnetically sensitive sensor that interacts with a magnet mounted on the operating lever. The two sensors are based on different mechanisms of action.

A system and method for detecting a defect in a solar cell and repairing and characterizing a solar cell includes applying a test signal to the solar cell, monitoring the response of solar cell, detecting a defect associated with its location during the monitoring step, removing or isolating the defect from a solar cell and characterizing solar cell performance. The defect may be a short between the emitter and the base of solar cell. The system and method also detect a precise location of the defect based on the use of light valve panel (LVP), which can control the input beam to or output beam from the solar cell in terms of size, position, gray level, and wavelength of the transmitted light. The LVP may be realized in any one of a variety of ways. For example, the active matrix liquid crystal display (AMLCD) such as Thin Film Transistor driven LCD (TFT-LCD) may be used as the LVP.

The pattern defect inspection apparatus and its method of the present invention comprises: a recipe setting unit for setting an inspection recipe and/or a review recipe; an illumination optical system including: a laser light source for emitting ultraviolet laser light; a quantity-of-light adjusting unit for adjusting a quantity of the ultraviolet laser light emitted from the laser light source; and an illumination range forming unit for forming on a sample an illumination range of the ultraviolet laser light; a coherence reducing system; and a detection optical system including: a condensing optical system; a diffracted-light control optical system; and a detecting unit.

The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and/or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention comprises a transmission unit (2) for transmitting electromagnetic (radio) wave signal by way of an antenna (1) to a circuit board (3) to be tested, a detecting unit (3) for detecting signal received by a conductor path (4) of the circuit board (3) by using the conductor path (4) as a receiving antenna, and compare unit (8) for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path (4) by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.

The present invention relates to a substrate-transporting device, including a base, a substrate carrier unit and a shaft unit mounted between the base and the substrate carrier unit. The shaft unit has a supporting shaft and a shaft base to support and control rotation of the substrate carrier unit. The substrate carrier unit includes a bottom carrier seat connected to the supporting shaft, a plurality of first supporting components mounted on a surface of the bottom carrier seat, a top carrier seat having a plurality of vacuum suction nozzles and a plurality of second supporting components, and at least a retractable component sandwiched between the top carrier seat and the bottom carrier seat. The top carrier seat is used to affix and detect the substrate. The retractable component is capable of adjusting the distance between the top carrier seat and the bottom carrier seat.

A method and system of fault patterns oriented defect diagnosis for memories can analyze and recognize fault patterns and failure patterns after Memory Error Catches and Analyses (MECA) are done. The existent fault patterns are compared with a pre-simulated and grouped defect dictionary that defines possible defects of different fault patterns, and the defects of memories caused from their manufacturing process or circuit layout can be detected.

The invention pertains to a method for examining a series of objects that are symmetrical in reference to a rotational axis, e.g., circular disks, during or after the manufacturing process of the disks. In particular, the invention pertains to the optical examination of circular data carriers, e.g., CD, DVDs, CD-Rs or the like. The invention proposes that each object contains at least one marking or is provided with at least one marking. The marking makes it possible to unequivocally determine the angular position of each object about the rotational axis in reference to the marking for objects manufactured in the same manufacturing process. At least one section of the objects is scanned by at least one scanning element, and the marking is detected during the examination process. The scanning result and/or examination result of geometric regions with corresponding positions on the objects in reference to the marking is determined and/or evaluated and/or displayed on a display element in the same angular position in reference to the marking. A defect that always occurs at the same position will always have the same geometric data independent of the rotation of the object to be examined during its transport to the examination point and can be treated with other criteria.

A device for testing a solenoid valve includes: a voltage generator for applying a short pulse of voltage, which is not long enough to open the solenoid valve, to the windings of the solenoid valve; a current meter configured for measuring the current flowing through the windings of the solenoid valve; and an analysis device which is configured for analysing the current measured by the current meter for detecting a potential fault of the solenoid valve.

A device for automatic illumination and inspection of tubular probes, in particular stents, is proposed, with rotatable means for holding the probes that are to be inspected, with an electronic camera and associated lens, with a computer-based electronic imaging system, and with means for illuminating the probe that is to be inspected. The probe surfaces are illuminated by means of a combination of dark field illumination and transillumination.

Provided is an eddy current inspection device, an eddy current inspection probe and an eddy current inspection method that make it possible to detect defects existing in deeper parts of test objects. Three or more odd number of excitation coils are arranged at even intervals in a circumferential direction on a postulated circumference. Excitation currents applied to the excitation coils are controlled so that the phase difference between excitation currents applied to adjacent ones of the excitation coils arranged in the circumferential direction on the postulated circumference equals one cycle divided by the number of excitation coils. A magnetic field generated according to an eddy current occurring in the test object due to a magnetic field caused by the application of the excitation currents to the excitation coils is detected by use of a detector arranged on a postulated plane containing the postulated circumference but inside the postulated circumference.

Apparatus for an alternating current field measurement (ACFM) probe is disclosed. The apparatus comprises an arrangement for generating a magnetic field for inducing an alternating current field in a conductor; a sensor element arranged to produce a signal responsive to the alternating current field; and a compensator element arranged to compensate for an influence of the generated magnetic field in the signal responsive to the alternating current field.

A color image processing apparatus for detecting and correcting fault pixels in a color image pickup device having a plurality of pixels each with a correspondingly disposed filter device of color filter having a plurality of filter devices respectively of predetermined colors, including means for detecting fault pixels by establishing a correlation among pixel signals along an arrangement of consecutive ones of identical color, and means for correcting pixel signals corresponding to the fault pixels detected at the fault pixel detecting means. By thus establishing a correlation among pixel signals along an arrangement of consecutive ones of identical color to detect and correct fault pixels, the fault pixels are efficiently detected in a small range and correction of the fault pixels is performed in real time.