70results about How to "Detection of defect" patented technology

The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and / or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention includes a transmission unit (2) for transmitting electromagnetic (radio) wave signal by way of an antenna (1) to a circuit board (3) to be tested, a detecting unit (3) for detecting signal received by a conductor path (4) of the circuit board (3) by using the conductor path (4) as a receiving antenna, and compare unit (8) for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path (4) by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.

The present invention discloses only required personal information in an emergency. A personal information display screen displays a face image display area 141, a passenger position display area 142, an interior image display area 143, a front image display area 144, a rear image display area 145, a personal information display area 146, and a display end button 147. For example, when an accident occurs and a rescue team arrives at the scene of the accident, a display section of an on-vehicle apparatus displays not only passengers' face images but also required information such as their names, addresses, and blood types which is permitted to be disclosed. This enables emergencies to be dealt with both promptly and correctly even if such a serious accident as causes all the passengers to lose consciousness occurs. The present invention is applicable to the on-vehicle apparatus.

An inspection method for detecting a defect in a test object. A particulate is generated, then the generated particulate is introduced into a test object. Subsequently, light having high directivity is emitted such that the light passes in the vicinity of the test object to irradiate the particulate discharged from the test object, thereby making the particulate visible. An inspection apparatus for detecting a defect in a test object, including a particulate generating means for generating a particulate, a particulate introducing means for introducing the particulate into a test object, and a light emitting means for emitting light with high directivity that passes in the vicinity of the test object and irradiates the particulate discharged from the test object thereby to visualize the particulate. The inspection method and apparatus detect a defect of a test object with high sensitivity, permit easier identification and recording of the location of a defect, and shorten an inspection time and the time required for the pre-treatment and post-treatment before and after an inspection, or obviate the need for the pre-treatment and post-treatment.

An image processing apparatus for correcting an image of a subject, includes: a first illuminated image acquisition unit for acquiring the first reference member image that is an image a reference member having a plurality of normal directions taken under the first illumination condition; the second illuminated image acquisition unit for acquiring the second reference member image and a subject image that are an image of the reference member and an image of the subject, respectively, taken under the second illumination condition; a shape acquisition unit for acquiring three-dimensional shapes of the reference member and the subject; a normal direction determination unit for determining a normal direction of each region of the first reference member image, the second reference member image and the subject image based on the three-dimensional shapes of the reference member and the subject; a difference calculation unit for calculating a color difference in each region between the first and second reference member images for every normal direction; and a subject image correction unit for correcting a color of each region of the subject image with the color difference for every normal direction.

An image processing device for defect inspection that processes image data taken continually in time from a moving molded sheet with an area camera, having a data extraction unit extracting line data at an identical position from each different image data, for a plurality of different positions on the image data; a data storage unit arranging the plurality of line data in time series for each of the positions on the image data to generate a plurality of line-composited image data; a change amount calculation unit performing a differential operator operation on the plurality of line-composited image data to generate a plurality of emphasized image data; an identical position judgment / extraction unit extracting data indicating an identical position of the molded sheet from the plurality of emphasized image data; and an integration unit accumulating, at respective pixels, brightness values of the extracted emphasized image data to generate defect inspection image data.

Provided is a pattern inspection device for accurately simulating an electron beam image of a circuit pattern on a wafer from design data, and implementing high-precision defect detection based on the comparison between the simulated electron beam image and a real image. A pattern inspection device comprises: an image capturing unit for capturing an electron beam image of a pattern formed on a substrate; a simulated electron beam image generation unit for generating a simulated electron beam image using a parameter indicating the characteristics of the electron beam image on the basis of design data; and an inspection unit for comparing the electron beam image of the pattern, which is the image captured by the image capturing unit, and the simulated electron beam image generated by the simulated electron beam image generation unit, and inspecting the pattern on the substrate.

A device is described for indicating the locking state of a fifth wheel coupling and an arrangement of a first and a second sensor. According to the prior art, the first sensor is arranged on the underside of the locking latch and monitors the position of the kingpin in relation to the locking latch. A second sensor that is used is an inductive proximity switch that monitors a safety mechanism against loosening. In practice, this type of positioning of the first sensor has led to damage of the locking latch and the first sensor, while the signals of the second sensor were often false signals. Thus, the object of the invention is to provide a device for indicating the locking state, which maximizes operational availability and minimizes false signals. A further object of the invention is to optimize the arrangement of the first and the second sensor. These objects are attained by arranging the first sensor detecting the kingpin in the area of the locating hole and configuring the second sensor as a magnetically sensitive sensor that interacts with a magnet mounted on the operating lever. The two sensors are based on different mechanisms of action.

A display device includes a substrate includes a display area having a plurality of pixels, a pad area including a plurality of input pads, and a circuit area positioned between the pad area and the display area; a crack sensor having a first end and a second end, the first end being connected to a first input pad of the plurality of input pads; a first shorting element extending through the pad area, the first shorting element being connected to the second end and extending to an edge of the substrate; a plurality of data lines connected to the plurality of pixels; and a crack sensing circuit including a first switching element having an input terminal connected to the first end and an output terminal connected to a first data line of the plurality of data lines, and a second switching element having an input terminal connected to the second end and an output terminal connected to a second data line of the plurality of data lines.

A system and method for detecting a defect in a solar cell and repairing and characterizing a solar cell includes applying a test signal to the solar cell, monitoring the response of solar cell, detecting a defect associated with its location during the monitoring step, removing or isolating the defect from a solar cell and characterizing solar cell performance. The defect may be a short between the emitter and the base of solar cell. The system and method also detect a precise location of the defect based on the use of light valve panel (LVP), which can control the input beam to or output beam from the solar cell in terms of size, position, gray level, and wavelength of the transmitted light. The LVP may be realized in any one of a variety of ways. For example, the active matrix liquid crystal display (AMLCD) such as Thin Film Transistor driven LCD (TFT-LCD) may be used as the LVP.

The disclosed apparatus, systems and methods relate to a vision system which improves the performance of depth cameras in communication with vision cameras and their ability to image and analyze surroundings.

Modern high-end technology products such as aircraft consist of a number of individual systems that are controlled by independent electronic control units and increasingly interconnected. According to one exemplary embodiment of the present invention, a test system assembly for testing several such systems for an aircraft in parallel is disclosed, wherein a master network is provided in order to exchange data between the individual test systems and a control unit, and wherein original electrical wiring is provided between the test systems in order to directly interconnect the tested systems. The flexibility of system tests for aircraft may be increased in this fashion.

The pattern defect inspection apparatus and its method of the present invention comprises: a recipe setting unit for setting an inspection recipe and / or a review recipe; an illumination optical system including: a laser light source for emitting ultraviolet laser light; a quantity-of-light adjusting unit for adjusting a quantity of the ultraviolet laser light emitted from the laser light source; and an illumination range forming unit for forming on a sample an illumination range of the ultraviolet laser light; a coherence reducing system; and a detection optical system including: a condensing optical system; a diffracted-light control optical system; and a detecting unit.

Low-pass filtering is applied only to the borders of an original mage to reduce the noise in the borders of image, thereby preventing errors in extrapolation. Then, an extended region is provided around the image by extrapolation, thereby eliminating the need for border processing in the borders of the image when performing the final low-pass filtering. Finally, low-pass filtering is applied to the regions where the original image exists. Thus, a filtering effect can be obtained in which the regions nearer to the center of the image and the border regions of the image have the same characteristics.

One object is to provide a method for measuring current by which minute current can be measured. A value of current flowing through an electrical element is not directly measured but is calculated from change in a potential observed in a predetermined period. The method for measuring current includes the steps of: applying a predetermined potential to a first terminal of an electrical element having the first terminal and a second terminal; measuring an amount of change in a potential of a node connected to the second terminal; and calculating, from the amount of change in the potential, a value of current flowing between the first terminal and the second terminal of the electrical element. Thus, the value of minute current can be measured.

The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and / or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention comprises a transmission unit (2) for transmitting electromagnetic (radio) wave signal by way of an antenna (1) to a circuit board (3) to be tested, a detecting unit (3) for detecting signal received by a conductor path (4) of the circuit board (3) by using the conductor path (4) as a receiving antenna, and compare unit (8) for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path (4) by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.

The present invention relates to a substrate-transporting device, including a base, a substrate carrier unit and a shaft unit mounted between the base and the substrate carrier unit. The shaft unit has a supporting shaft and a shaft base to support and control rotation of the substrate carrier unit. The substrate carrier unit includes a bottom carrier seat connected to the supporting shaft, a plurality of first supporting components mounted on a surface of the bottom carrier seat, a top carrier seat having a plurality of vacuum suction nozzles and a plurality of second supporting components, and at least a retractable component sandwiched between the top carrier seat and the bottom carrier seat. The top carrier seat is used to affix and detect the substrate. The retractable component is capable of adjusting the distance between the top carrier seat and the bottom carrier seat.

The present invention relates to a magnetic resonance examination system (10) comprising a superconducting main magnet (20) surrounding an examination region (18) and generating a main magnetic field in the examination region (18), and further comprising a magnetic field gradient system (30) selectively causing alternating gradient magnetic fields in the examination region (18), said magnetic field gradient system (30) being disposed outside of the main magnet (20). In order to provide a technique to ensure stable operation of the superconducting main magnet (20) of a magnetic resonance examination system (10) with such a magnetic field gradient system (30), it is suggested to provide the magnetic resonance examination system (10) with a predicting device (91) and a preventing device (92), the predicting device (91) being adapted to predict the behavior of the main magnet (20) due to the gradient magnetic fields (eg by calculating the expected heat load of the main magnet caused by an imaging protocol) and the preventing device (92) being adapted to prevent, based on the predicted behavior of the main magnet (20), the main magnet (20) from quenching.

An image processing apparatus for correcting an image of a subject, includes: a first illuminated image acquisition unit for acquiring the first reference member image that is an image a reference member having a plurality of normal directions taken under the first illumination condition; the second illuminated image acquisition unit for acquiring the second reference member image and a subject image that are an image of the reference member and an image of the subject, respectively, taken under the second illumination condition; a shape acquisition unit for acquiring three-dimensional shapes of the reference member and the subject; a normal direction determination unit for determining a normal direction of each region of the first reference member image, the second reference member image and the subject image based on the three-dimensional shapes of the reference member and the subject; a difference calculation unit for calculating a color difference in each region between the first and second reference member images for every normal direction; and a subject image correction unit for correcting a color of each region of the subject image with the color difference for every normal direction.

A magnetic resonance examination system (10) includes a superconducting main magnet (20) surrounding an examination region (18) and generating a main magnetic field in the examination region (18) A magnetic field gradient system (30) selectively causes alternating gradient magnetic fields in the examination region (18). The magnetic field gradient system (30) is disposed outside of the main magnet (20). In order to provide stable operation of the superconducting main magnet (20) of a magnetic resonance examination system (10) with such a magnetic field gradient system (30), the magnetic resonance examination system (10) is provided with a predicting device (91) and a preventing device (92) The predicting device (91) predicts the behavior of the main magnet (20) due to the gradient magnetic fields (e.g., by calculating the expected heat load of the main magnet caused by an imaging protocol) and the preventing device (92) prevents, based on the predicted behavior of the main magnet (20), the main magnet (20) from quenching.

A method and system of fault patterns oriented defect diagnosis for memories can analyze and recognize fault patterns and failure patterns after Memory Error Catches and Analyses (MECA) are done. The existent fault patterns are compared with a pre-simulated and grouped defect dictionary that defines possible defects of different fault patterns, and the defects of memories caused from their manufacturing process or circuit layout can be detected.

The invention pertains to a method for examining a series of objects that are symmetrical in reference to a rotational axis, e.g., circular disks, during or after the manufacturing process of the disks. In particular, the invention pertains to the optical examination of circular data carriers, e.g., CD, DVDs, CD-Rs or the like. The invention proposes that each object contains at least one marking or is provided with at least one marking. The marking makes it possible to unequivocally determine the angular position of each object about the rotational axis in reference to the marking for objects manufactured in the same manufacturing process. At least one section of the objects is scanned by at least one scanning element, and the marking is detected during the examination process. The scanning result and / or examination result of geometric regions with corresponding positions on the objects in reference to the marking is determined and / or evaluated and / or displayed on a display element in the same angular position in reference to the marking. A defect that always occurs at the same position will always have the same geometric data independent of the rotation of the object to be examined during its transport to the examination point and can be treated with other criteria.

A device for testing a solenoid valve includes: a voltage generator for applying a short pulse of voltage, which is not long enough to open the solenoid valve, to the windings of the solenoid valve; a current meter configured for measuring the current flowing through the windings of the solenoid valve; and an analysis device which is configured for analysing the current measured by the current meter for detecting a potential fault of the solenoid valve.

A device for automatic illumination and inspection of tubular probes, in particular stents, is proposed, with rotatable means for holding the probes that are to be inspected, with an electronic camera and associated lens, with a computer-based electronic imaging system, and with means for illuminating the probe that is to be inspected. The probe surfaces are illuminated by means of a combination of dark field illumination and transillumination.

Provided is an eddy current inspection device, an eddy current inspection probe and an eddy current inspection method that make it possible to detect defects existing in deeper parts of test objects. Three or more odd number of excitation coils are arranged at even intervals in a circumferential direction on a postulated circumference. Excitation currents applied to the excitation coils are controlled so that the phase difference between excitation currents applied to adjacent ones of the excitation coils arranged in the circumferential direction on the postulated circumference equals one cycle divided by the number of excitation coils. A magnetic field generated according to an eddy current occurring in the test object due to a magnetic field caused by the application of the excitation currents to the excitation coils is detected by use of a detector arranged on a postulated plane containing the postulated circumference but inside the postulated circumference.

The present invention inspects a defect of a photo sensor element or a photo sensor line. A display device includes a substrate, a plurality of pixels formed on a display region of the substrate, and a plurality of video lines for applying a video voltage to the plurality of pixels. The substrate includes at least one photo sensor element which is formed on a region outside the display region, a photo sensor line which is connected with at least one photo sensor element, and at least one first switching element which connects at least one photo sensor element and at least one video line out of the plurality of video lines. At the time of inspecting the photo sensor element, the first switching element is turned on and, at the same time, a predetermined inspection voltage is applied to at least one photo sensor element via the photo sensor line thus applying a signal to the pixel via the first switching element and the video line, and in response to a turn-on state of the pixel at the time of applying the signal to the pixel, a defect of at least one of at least one photo sensor element and the photo sensor line can be detected.

Apparatus for an alternating current field measurement (ACFM) probe is disclosed. The apparatus comprises an arrangement for generating a magnetic field for inducing an alternating current field in a conductor; a sensor element arranged to produce a signal responsive to the alternating current field; and a compensator element arranged to compensate for an influence of the generated magnetic field in the signal responsive to the alternating current field.

A color image processing apparatus for detecting and correcting fault pixels in a color image pickup device having a plurality of pixels each with a correspondingly disposed filter device of color filter having a plurality of filter devices respectively of predetermined colors, including means for detecting fault pixels by establishing a correlation among pixel signals along an arrangement of consecutive ones of identical color, and means for correcting pixel signals corresponding to the fault pixels detected at the fault pixel detecting means. By thus establishing a correlation among pixel signals along an arrangement of consecutive ones of identical color to detect and correct fault pixels, the fault pixels are efficiently detected in a small range and correction of the fault pixels is performed in real time.

One object is to provide a method for measuring current by which minute current can be measured. A value of current flowing through an electrical element is not directly measured but is calculated from change in a potential observed in a predetermined period. The method for measuring current includes the steps of: applying a predetermined potential to a first terminal of an electrical element having the first terminal and a second terminal; measuring an amount of change in a potential of a node connected to the second terminal; and calculating, from the amount of change in the potential, a value of current flowing between the first terminal and the second terminal of the electrical element. Thus, the value of minute current can be measured.

A display device includes a substrate includes a display area having a plurality of pixels, a pad area including a plurality of input pads, and a circuit area positioned between the pad area and the display area; a crack sensor having a first end and a second end, the first end being connected to a first input pad of the plurality of input pads; a first shorting element extending through the pad area, the first shorting element being connected to the second end and extending to an edge of the substrate; a plurality of data lines connected to the plurality of pixels; and a crack sensing circuit including a first switching element having an input terminal connected to the first end and an output terminal connected to a first data line of the plurality of data lines, and a second switching element having an input terminal connected to the second end and an output terminal connected to a second data line of the plurality of data lines.