591 results about "Solid-state drive" patented technology

The invention provides a solid state disk testing method and device, equipment and a medium, and relates to the technical field of hard disk detection. The test method comprises the following steps: in a process of writing data into physical areas of a to-be-tested solid state disk according to a physical address in sequence, randomly selecting at least part of areas from the physical areas written with the data at a preset time interval to perform reset operation until the physical areas reach a target area state, the target area state comprises a target filling state and a target fragmentation state; executing a read-write test on the physical region in the target region state to obtain test data; and generating a test report based on the test data.

The invention relates to the technical field of solid state disk security protection, in particular to a security protection detection method and system for a solid state disk, and the method comprises the following steps: obtaining a historical security monitoring log of the solid state disk, carrying out normalized fluctuation rule mining and reference behavior evolution, and constructing a normalized reference behavior model; identifying real-time access behavior data of the solid state disk; analyzing access modes of behavior storage units one by one according to the real-time access behavior data, and identifying real-time access behavior characteristics to generate real-time access behavior characteristics; and performing reference access deviation detection on the real-time access behavior characteristics according to the normalized reference behavior model, tracing an access position, and positioning a malicious access storage unit. Through a multi-layer and all-around intelligent protection system, the overall safety and stability of the solid state disk are improved.

The invention relates to the technical field of storage, and discloses a threshold voltage processing method of a solid state disk, a data reading method and related equipment. The threshold voltage processing method comprises the following steps: selecting a crystal grain in a frequent rereading state in a solid state disk as a target crystal grain; obtaining the optimal threshold voltage of the target crystal grain; and setting the optimal threshold voltage as the threshold voltage of all the blocks in the closed state in the target crystal grain. According to the method, the threshold voltage deviation problem of the solid state disk can be compensated, the read-write performance of the solid state disk under the scenes of data retention, read interference, cross temperature and the like is effectively stabilized, performance reduction and stability fluctuation caused by repeated rereading are reduced, the data reading efficiency is remarkably improved, the maintenance cost is reduced, and the service life of the solid state disk is prolonged. Reliability of the solid state disk is further improved, and service life of the disk is prolonged.

A data writing method and apparatus, a solid state drive, an electronic device, and a non-transitory readable storage medium are provided. The method includes: receiving a data writing request sent by a target object to acquire data to be written; preprocessing original data blocks in the data to be written to obtain a plurality of preprocessed data blocks of the data to be written; mirroring the plurality of preprocessed data blocks to a first partition of a target solid state drive; sending, according to a mirroring result, response information corresponding to the data to be written to the target object, where the response information includes writing state information; and writing the plurality of preprocessed data blocks to a second partition of the target solid state drive from the first partition.

The invention discloses a preheating system of a solid state disk, and relates to the technical field of storage, and the system comprises the solid state disk which is used for sending a first instruction to a power supply device when it is detected that the initial temperature value of each target area in at least one target area is smaller than or equal to the corresponding minimum working temperature value. And the power supply device is used for heating each target area according to a full-power heating mode. The solid state disk is also used for predicting a target temperature value of each target area after a preset time period; and when the difference between the target temperature value of each target area and the corresponding minimum working temperature value is smaller than the preset temperature difference value, a second instruction is sent to the power supply device. And the power supply device is used for heating each target area according to a pulse heating mode and stopping heating until the real-time temperature value of each target area is greater than the corresponding minimum working temperature value. The problems of high power consumption, high time delay, slow response and low working efficiency of the solid state disk caused by the low-temperature problem can be solved.

To allow attachment of electrolytic capacitors and other relatively large electrical circuit devices to a PCB while meeting size limitations, The PCB can include a full-through opening within which the device can be located. Along one edge of the opening, the PCB includes half-through cuts with a conductive lining extending from the opening, where the pins of the capacitor or other device can rest and form electrical connections. In addition to pins extending radially from one end of the capacitor or other device, the device includes a notch extending from the opposing end. Along the edge of the PCB opening opposing the half-through cuts for the pins, the PCB includes a half-though cut for the device's notch to rest, thereby providing mounting stability.

A module identifier and a request address associated with an access request are received at a host memory buffer (HMB) access module in a solid-state drive (SSD) system. A translated address is determined based at least in part on the module identifier and the request address, including by accessing at least one translation table that stores address mappings between (1) a plurality of processors in the SSD system and (2) a host memory buffer; each processor in the plurality of processors has a non-overlapping memory space in the host memory buffer. The access request is performed at a host interface, including by accessing the host memory buffer using the translated address, wherein the host memory buffer is located in host memory that is external to the SSD system.

The invention provides an intelligent accelerated data reading method and system for a solid state disk, and the method comprises the steps: reading basic information of each data block in the solid state disk when a data reading request is received, and constructing an information fingerprint of each data block based on the basic information; constructing an information fingerprint of request data based on the data reading request, and eliminating unmatched data blocks by adopting a Bloom filter; performing similarity calculation on the information fingerprints of the request data and the information fingerprints of the excluded data blocks by using a locality sensitive hash algorithm, and positioning the data block most similar to the request data; and reading the request data from the solid state disk according to a positioning result. According to the method and the device, unmatched data blocks are eliminated by adopting a Bloom filter; similarity calculation is carried out on the information fingerprints of the request data and the information fingerprints of the excluded data blocks, the data block most similar to the request data is positioned, and the defects of long time consumption and system resource waste during current data reading are overcome.

A solid state drive determines address mapping information based on a first flash translation layer (FTL) algorithm during a time period. The address mapping information indicates a correspondence between a logical address and a physical address of the solid state drive when processing a read / write task during the time period. Afterward, the solid state drive determines a second FTL algorithm from a plurality of FTL algorithms, and enables the target address mapping information that is determined based on the second FTL algorithm. The read / write task processed by the solid state drive during the time period are generally of a same type, and the performance of processing the read / write task during the time period based on the second FTL algorithm is higher than the performance of processing the read / write task during the time period based on the first FTL algorithm, thereby enhancing read / write performance of the solid state drive.

The utility model relates to the field of solid state disk production testing equipment, and discloses solid state disk testing equipment, which comprises a solid state disk testing machine provided with a plurality of testing ports, a testing substrate, a solid state disk limiting mechanism, a plugging driving mechanism and a plurality of testing plugging heads, the test substrate is used for fixing the solid state disk limiting mechanism and the plug-in driving mechanism, and the solid state disk limiting mechanism is located on one side of the plug-in driving mechanism and can limit a plurality of stacked solid state disks so that sockets of the solid state disks can correspond to the plug-in driving mechanism. The plurality of test plugs are horizontally and fixedly arranged on the plug driving mechanism in an independently detachable manner and are respectively connected with a plurality of test ports on the solid state disk test machine, and the plurality of test plugs are correspondingly arranged up and down and are driven by the plug driving mechanism to perform plug operation with the solid state disk limited in the solid state disk limiting mechanism. A plurality of solid state disks can be subjected to loading test or unloading at one time, the operation is simple and rapid, the efficiency is high, and the test stability is high.

The invention relates to the technical field of data storage, and discloses a method for verifying average fault-free time of a solid state disk, which comprises the following steps of: initializing a test environment of the solid state disk; a dynamic comprehensive stress model is constructed, acceleration factors are calculated based on self-adaptive parameters of reliability, in the testing process, the acceleration factors are added, different read-write load combinations are circularly switched according to set time slices, and testing of the solid state disk is accelerated; judging whether the test reaches a preset duration or a trigger fault condition; if yes, analyzing solid state disk fault diagnosis and data analysis, and if not, returning to continue accelerated testing of the solid state disk. According to the method, the dynamic comprehensive stress model is constructed, and the temperature stress, the voltage stress, the read-write load stress and other multi-dimensional stress are combined, so that the limitation that only single static high-temperature stress is applied in a traditional test method is broken through, comprehensive stress test on the solid state disk is realized, and the test comprehensiveness and accuracy are improved.

A solid state drive (SSD) includes an NAND memory and an SSD controller. The SSD controller includes an interface coupled to a host machine, a nonvolatile memory controller coupled to the interface, and a processor coupled to the nonvolatile memory controller. The SSD controller is configured to: receive, via the interface, a write command from the host machine; process, by the nonvolatile memory controller, the write command; transmit, from the nonvolatile memory controller to the processor, a system message; process, by the processor according to Zoned Namespaces (ZNS) protocol, the system message; obtain, by the nonvolatile memory controller via the interface, host data for storage from the host machine; and write the host data to the NAND memory based on a result of processing the system message. Processing the system message by the processor and obtaining the host data by the nonvolatile memory controller are executed in parallel.

The invention provides a data storage reliability testing method and system based on a solid state disk. The method comprises the following steps: executing a data storage reliability test on a target solid state disk, and extracting reliability index data; processing according to the reliability index data to obtain a reliability standard degree coefficient; acquiring environment characteristic data of the test region, and processing to obtain an environment interference coefficient; processing according to the reliability standard degree coefficient in combination with an environment interference coefficient to obtain a corrected reliability standard degree coefficient, and judging whether the data storage reliability reaches the standard or not; and if the data storage reliability of the target solid state disk does not reach the standard, executing an optimization measure on the target solid state disk, thereby realizing a data storage reliability test technology based on the solid state disk.

This disclosure provides for host-controller cooperation in managing NAND flash memory. The controller maintains information for each erase unit which tracks memory usage. This information assists the host in making decisions about specific operations, for example, initiating garbage collection, space reclamation, wear leveling or other operations. For example, metadata can be provided to the host identifying whether each page of an erase unit has been released, and the host can specifically then command each of consolidation and erase using direct addressing. By redefining host-controller responsibilities in this manner, much of the overhead association with FTL functions can be substantially removed from the memory controller, with the host directly specifying physical addresses. This reduces performance unpredictability and overhead, thereby facilitating integration of solid state drives (SSDs) with other forms of storage. The disclosed techniques are especially useful for direct-attached and / or network-attached storage.

Disclosed herein is a backplate assembly for mounting a component (such as a compression attached memory module (CAMM)) and a co-located component (such as a solid state drive (SSD)) to a printed circuit board (PCB). The backplate assembly includes a backplate mounted on a first face of the PCB and attached to the component on a second face of the PCB that is opposite to the first face. The backplate includes a cutout to receive the co-located component and a perimeter portion that includes a flange extending away from the backplate and the printed circuit board. The backplate assembly also includes a plate cap configured to engage with the flange to attach the plate cap to the backplate and to at least partially cover the co-located component.

An information processing apparatus includes: a solid state drive (SSD) configured with a multi-bit cell for storing multi-bit data in one memory cell and configured to include an electrically rewritable non-volatile storage unit; and a main control unit configured to execute processing based on data stored in the SSD. The SSD includes a storage control unit, which is a storage control unit configured to control access to the non-volatile storage unit, and configured to, when the multi-bit data is stored in the multi-bit cell, store the multi-bit data with a high-quality storage mode in which a variation width of a threshold voltage is narrower than in a normal storage mode when a number of rewrites executed in the multi-bit cell is equal to or greater than a threshold number of rewrites.

1. Name of the designed product: solid state disk. 2. Use of the designed product: for electronic data storage. 3. Design points of the designed product: in the shape of the product. 4. Picture or photo best indicating the design points: perspective view 1.

1. The name of this design product: Portable Solid State Drive (XY20250121C). 2. Purpose of this design product: used for storing data. 3. The key design feature of this product is its shape. 4. The picture or photo that best illustrates the key points of the design: main view.

The invention relates to a sorting machine for testing electronic components. According to the sorting machine for testing the electronic components, if a moving hand moves the electronic components to a shelving device by taking the shelving device capable of shelving the electronic components as a medium, a testing hand moves the electronic components from the shelving device to a tester side, and then the electronic components and the tester are electrically connected. To this end, the present invention is characterized in a stacker section for supplying and recovering electronic components. According to the present invention, large electronic components such as a solid state drive can be automatically and electrically connected to a tester, and particularly, electronic components of various specifications can be processed, thereby having an effect of minimizing construction costs for testing electronic components.

Systems and methods are provided for dynamically changing the operating clock frequency of a circuit. Control circuitry determines a first workload value for a circuit operating at a first clock frequency. Control circuitry then detect a second workload value for the circuit, which is less than the first workload value. When the control circuitry detects the second workload value, the control circuitry calculates a second clock frequency which is greater than the first clock frequency. The control circuitry then causes the circuit to operate at the second clock frequency.

The utility model relates to hard disk labelling technical field, and specifically is a kind of labelling device for solid state disk, including conveyer, still including labelling mechanism and cleaning mechanism, labelling mechanism is installed on the surface of conveyer, labelling mechanism includes support plate, moving rail frame, moving rail car, labelling cylinder, label suction cup and label roller, support plate is fixed on the surface side of conveyer, moving rail frame is fixed between conveyer and support plate, the whole labelling procedure is from workpiece feeding to labelling to detection to storage and forms closed loop, full automation, compared with traditional manual labelling, manual detection and manual sorting mode, greatly improve production efficiency, completely replace manual labelling link, from label pickup, paste to paper winding, full course does not need manual operation, avoid the problem such as the inconsistent labelling position, label wrinkle caused by fatigue, experience difference when manual labelling, simultaneously, reduce the manual configuration of labelling station, greatly reduce manual labor intensity.

1. The name of the design product: the main body of the solid state disk storage device. 2. The use of the design product: the product as a whole and the part claimed for protection are used as solid state disk storage devices to store data. 3. The design points of the design product: the shape of the part claimed for protection. 4. The picture or photo that best indicates the design points: perspective view 1. 5. Other circumstances that need to be explained: the part depicted in solid lines in the view is the part claimed for protection by the present design.

A solid state drive (SSD) device includes a substrate, a first buffer chip disposed on the substrate, a second buffer chip disposed on the first buffer chip, a plurality of first non-volatile memory chips connected to the second buffer chip through wire bonding, a controller configured to send a control signal to the plurality of first non-volatile memory chips through a first channel, and a first redistribution layer disposed in the substrate and configured to electrically connect the first channel to the first buffer chip, wherein the first buffer chip is connected to the first redistribution layer through flip chip bonding, and the second buffer chip is connected to the first redistribution layer through first wires.

1. The name of this design product: Portable Solid State Drive. 2. Purpose of this design product: used for data transmission and storage. 3. The key point of the design of this product lies in its shape. 4. The picture or photo that best illustrates the design points: Stereoscopic drawing 1.

The present application relates to improved data reliability for extreme temperature usage conditions in data storage. Systems, methods, and apparatus are related to memory devices, such as solid-state drives. In one method, data (e.g., data to be written to an SSD) is received from a host system. The received data is encoded using a first error correction code to generate first parity data. A temperature at which a memory cell of a storage device (e.g., the SSD) will store the received data is determined. In response to determining the temperature, a first portion of the received data is identified (e.g., data in a memory storage device that is prone to errors at a predicted higher temperature determined based on output from an artificial neural network using sensor inputs). The identified first portion is encoded using a second error correction code to generate second parity data. The second error correction code has a higher error correction capability than the first error correction code. The encoded first portion, the first parity data, and the second parity data are stored in the memory cell of the storage device.

The present invention provides a memory drive device, an information processing device, and a control method that reduce data corruption due to retention characteristics and improve reliability. [Solution] The SSD (Solid State Drive) in the information processing device 100 comprises a data storage unit including a data storage area and a test storage area, and a control unit. The data storage area is composed of rewritable non-volatile memory and stores data used for information processing. The test storage area is composed of non-volatile memory and stores predetermined test data. The control unit determines that a predetermined data retention period has been reached if the date and time information obtained from the information processing device is accurate and the power outage period based on the date and time information exceeds a threshold period. If the date and time information is inaccurate, the control unit determines that a predetermined data retention period has been reached based on an index value related to storage failures in the test storage area and performs a rewrite of the already stored data to the data storage area.

The invention discloses a method for testing NAND link reliability of a solid state disk, and belongs to the technical field of solid state disks. Comprising the steps that S1, an SSD master control sends a write command sequence to an NAND particle, and verification data is written into a cache unit; s2, the SSD master control polls the minimum encapsulated physical entities and the internal logic partitions of the NAND particles, sends a read command sequence, and switches data in a cache unit to a readable state; s3, the SSD master control sends a data reading time sequence, the data in the target cache unit is compared with the original test data, and if the data are inconsistent, it is judged that the link of the minimum capsulable physical entity and the link of the internal logic partition corresponding to the target cache unit are abnormal. According to the invention, the read-write test is directly carried out on the NAND cache unit, so that the interference of the inherent data jump of the Flash Array on the test result is effectively avoided.

A data access method of a solid-state drive (SSD) device includes storing data into a volatile memory or reading the data from the volatile memory according to an instruction from a host. Next, upon receiving a shutdown command from the host or detecting a power-off signal, transferring the data stored in the volatile memory to a non-volatile memory from mapping data of the volatile memory to a physical address of the non-volatile memory to accordingly perform a data storage process. Then, upon receiving a boot command from the host, transferring the data stored in the non-volatile memory to the volatile memory from mapping data of the non-volatile memory to a physical address of the volatile memory to accordingly perform a data loading process.

The present invention discloses a solid-state drive access control circuit, a system and a solid-state drive. The hard disk access control circuit includes: a key memory, a key reading control circuit, a digest value calculation circuit, a first input control circuit, a random number generator, a second input control circuit and a comparison circuit; the key memory is connected to the key reading control circuit; the key reading control circuit, the first input control circuit and the random number generator are all connected to the digest value calculation circuit; the digest value calculation circuit and the second input control circuit are both connected to the comparison circuit. The present invention can effectively resist "replay" attacks and improve the data security of the hard disk.

1. Name of the designed product: mobile solid state disk (PS2005). 2. Use of the designed product: for storing data. 3. Design points of the designed product: in shape. 4. Picture or photo best indicating the design points: perspective view.