10 results about "Design testing" patented technology

This invention relates to a multi-objective trade-off optimization and decision-making method and system for electric drive controllers, including: constructing a requirements analysis model; constructing a top-level performance target analysis model; constructing a top-level system architecture design model, constructing test models for subsystems, sub-functions, and sub-modules, and designing test cases; constructing design modules, implementation path models, and corresponding simulation models for subsystems, sub-functions, and sub-modules; multi-objective trade-off optimization; prototyping and verification; building a digital twin system; and knowledge base construction and iteration. This invention enables early quantitative evaluation and automatic optimization of design schemes.

The utility model belongs to the field of capacitor current tester, specifically is a kind of based on constant current sweep technology distribution network capacitor current tester, including box body, the surface fixedly connected with soft block of box body, the middle part of soft block top is equipped with the slot, the surface of the slot is overlapped with tester body, the edge of box body top is fixedly connected with wire arrangement assembly, the bottom of tester body is sleeved with buffer assembly, through the structural design of wire arrangement assembly, test personnel when using this capacitor current tester, pull apart clamping plate while limit spring elongation, increase the distance between clamping plate and limit plate, then test personnel will test line pass through the arc-shaped gap of limit plate and connect the joint with the interface on tester body, when test personnel complete connection, stop pulling clamping plate, limit spring rebound, and drive clamping plate to move to the direction close to limit plate, test line is fixed by soft clamp block and limit plate, improve test efficiency.

This disclosure provides a signal testing method, system, device, storage medium, and program product for chips, relating to the field of semiconductor technology. It addresses the technical problem of low chip testing efficiency. The chip has multiple input signals. The signal testing method includes: acquiring all input signals of the device chip; obtaining the time parameters of each device input signal; and generating a result table of the time parameters of all device input signals. By acquiring all input signals of the chip and obtaining the time parameters of each input signal, and obtaining a result table of the time parameters of all input signals, batch testing of the chip's input signals is achieved, improving the design efficiency of circuit designers, facilitating the design of test circuits, and increasing testing efficiency.

The application discloses a kind of automatic car driving mode conversion test method, simulation simulation device, it is related to railway shunting operation technical field.The application provides scheme: after locomotive shunting mode registration, for by manual driving mode conversion to automatic shunting driving mode, construct test scene, test scene is according to the task legality of operation order, the path feasibility of shunting route, the operation safety of parking state as constraint condition to construct scene, each test scene is according to corresponding with corresponding expected result corresponding configuration, according to each test scene, test scene corresponding expected result, automatic shunting driving mode conversion is tested.The application uses "receives effective operation order", "there is correct shunting route", "is in parking state" constraint condition design test scene, from "task legality", "path feasibility" and "operation safety" three aspects construct solution that is both simple and covers comprehensive to "mode conversion" test.

A memory is provided with a read data latch that latches a read data signal during a read operation to the memory responsive to a first binary value of a bypass signal. During a design-for-test bypass mode for the memory, a write data latch latches a data in signal from a scan chain to provide a write data signal. The read data latch responds to a second binary value of the bypass signal by latching the write data signal.

This invention proposes a method for testing the dynamic on-resistance of GaN HEMTs, including the design of the test circuit, the connection method of the test device, the method of applying the test pulse signal, and the calculation method of the dynamic on-resistance. The proposed method for testing the dynamic on-resistance of GaN HEMTs can quickly and accurately measure the dynamic on-resistance of GaN HEMTs, providing a basis for reliability evaluation and degradation assessment of GaN HEMTs. The steps are as follows: Step 1: Configure the test circuit topology and fabricate the test circuit board for the dynamic on-resistance of GaN HEMTs; Step 2: Connect the test device, which includes a high-voltage power supply, an oscilloscope, a power supply unit, a signal generator, and the test circuit board; Step 3: Apply a pulse signal and simultaneously acquire feedback data. A predefined pulse signal is applied to the gate of the GaN HEMT under test through the signal generator, and the waveform data of the device under test is captured using the oscilloscope; Step 4: Calculate the dynamic on-resistance of the device under test based on the acquired waveform data.

This invention relates to the field of bending performance testing technology, and discloses a PVC pipe bending performance testing device and method, including a bending performance testing instrument and an installed pressure-pull system. The invention incorporates a positioning mechanism and an anti-rebound design. Initially, the clamping plates are manually pressed to achieve preliminary positioning and prevent lateral displacement. During testing, as the pressure block moves downward, the guide plate presses against the top rod, causing the synchronous plate to rub against the swing arm. The linkage between the swing arm and the clamping plates locks the clamping plate position, reducing vibrations that could cause the PVC pipe to shift and ensuring the PVC pipe remains in the preset testing position throughout the test. Simultaneously, the anti-rebound structure requires no additional power. During initial positioning, the clamping plates move the pressure plate upward with a pre-determined travel. When the pressure block is about to contact the PVC pipe, the top rod resets through a through-slot, separating the clamping plates and causing the pressure plate to move downward and press firmly against the PVC pipe. This effectively suppresses elastic rebound during and after the test, avoiding data deviation and ensuring the authenticity and accuracy of the test data.

This invention discloses a device for testing the crack resistance of basalt fiber modified concrete, belonging to the field of concrete crack resistance testing technology. It includes a testing seat and an inner ring. The inner ring is disposed on the surface of the testing seat, and a plastic sleeve is disposed on the surface of the inner ring. A rotating handle is installed on the top of the inner ring, and an adjustment component is disposed at the bottom of the rotating handle. A second rotating disk is rotatably mounted inside the testing seat, and a clamping component is disposed on the side wall of the second rotating disk. This invention, through the designed testing seat, inner ring, plastic sleeve, rotating handle, and adjustment component, achieves adjustment of the inner ring diameter, flexibly adapting to the constraint stiffness requirements of different engineering scenarios and avoiding the limitations of fixed stiffness. The clamping component provides multi-directional synchronous all-round balanced clamping of the outer ring, avoiding eccentric deviations caused by manual installation, ensuring the coaxiality of the inner and outer rings, avoiding uneven ring width problems, and improving the accuracy and reliability of the test data.

Improved hardware design testing techniques qualify a current design by integrating select tests completed on prior design iterations. A product design may be divided into design unit subcomponents, and multiple test benches may individually be configured to test different groups of subcomponents. The test benches may be run on a series of iterations of an evolving product design. Qualification of a most recent current iteration of the product design can be simplified by incorporating some test results from tests performed on prior iteration checkpoints of the design into the qualification of the current design by first combining test results across time for each test bench, and then combining test results across the set of test benches.

Improved hardware design testing techniques qualify a current design by integrating select tests completed on prior design iterations. A product design may be divided into design unit subcomponents, and multiple test benches may individually be configured to test different groups of subcomponents. The test benches may be run on a series of iterations of an evolving product design. Qualification of a most recent current iteration of the product design can be simplified by incorporating some test results from tests performed on prior iteration checkpoints of the design into the qualification of the current design by first combining test results across time for each test bench, and then combining test results across the set of test benches.