The invention discloses an optimization method of capturing
power consumption in a scan test. The optimization method of capturing
power consumption in the scan test comprises the following steps: generating a
netlist with a
scan chain; grouping gating control
clock units; designing a power constrain unit; combining with the generated
netlist with the
scan chain, conducting
chip layout design which comprises a floorpan, a
layout, a
clock tree sythesis and wiring; reading a gate-level
netlist with a scan structure, a process
library, a timing sequence constrain file and a
test protocol into an automatic
test vector generating tool after the
chip layout design is completed, conducting
testability design rule checking, and generating a
test vector; and conducting gate-level
simulation to the
test vector generated. By means of the optimization method of capturing the
power consumption in the scan test, the capturing power consumption in a test process can be reduced significantly, the reduction of coverage or the sharp increase of the quantity of test vectors is not generated, changing of a
test design process is needless, and realization is easy.