Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

590 results about "Clock skew" patented technology

Clock skew (sometimes called timing skew) is a phenomenon in synchronous digital circuit systems (such as computer systems) in which the same sourced clock signal arrives at different components at different times. The instantaneous difference between the readings of any two clocks is called their skew.

Method and apparatus for at-speed testing of digital circuits

A scheme for multi-frequency at-speed logic Built-In Self Test (BIST) is provided. This scheme allows at-speed testing of very high frequency integrated circuits controlled by a clock signal generated externally or on-chip. The scheme is also applicable to testing of circuits with multiple clock domains which can be either the same frequency or different frequency. Scanable memory elements of the digital circuit are connected to define plurality of scan chains. The loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. The BIST controller, Pseudo-Random Pattern Generator (PRPG) and Multi-input Signature Register (MISR) work at slower frequency than the fastest clock domain. After loading of a new test pattern, a clock suppression circuit allows a scan enable signal to propagate for more that one clock cycle before multiple capture clock is applied. This feature relaxes the speed and skew constraints on scan enable signal design. Only the capture cycle is performed at the corresponding system timing. A programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative impact of clock skew between clock domains.
Owner:MENTOR GRAPHICS CORP

Wireless time reference system and method

Instead of normalizing time reference of independent spatially-located clocks using a reference tag transmission from known location, the present invention uses an interarrival time interval between a pulse pair of UWB pulses as a timing metric. Thus, a method of synchronizing spatially-located clock or normalizing time indications thereof comprises transmitting a UWB pulse pair, determining at first and second monitoring stations a respective count value indicative of a locally measured time interval between received pulse pairs, determining a ratio between clock counts of first and second monitoring stations, and utilizing the ratio to determine clock skew, e.g., a timing correction to be applied to respective local clocks of the monitoring stations. A corresponding system comprises a reference tag transmitter that transmits a pulse pair of UWB pulses to define a time reference interval, a first independent receiver that receives the pulse pair to generate a first count value indicative an interarrival interval between the pulse pair, a second independent receiver that receives the pulse pair to similarly generate a second count value, and a processor hub responsive to the count values to determine a ratio corresponding to the ratio of respective clock frequencies of the first and second receiver clocks. Once the correction is applied, time-of-arrival information from object tag transmissions may be used to determine object location with sub-foot position accuracies.
Owner:ZEBRA TECH CORP

Method and apparatus for at-speed testing of digital circuits

A scheme for multi-frequency at-speed logic Built-In Self Test (BIST) is provided. This scheme allows at-speed testing of very high frequency integrated circuits controlled by a clock signal generated externally or on-chip. The scheme is also applicable to testing of circuits with multiple clock domains which can be either the same frequency or different frequency. Scanable memory elements of the digital circuit are connected to define plurality of scan chains. The loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. The BIST controller, Pseudo-Random Pattern Generator (PRPG) and Multi-Input Signature Register (MISR) work at slower frequency than the fastest clock domain. After loading of a new test pattern, a clock suppression circuit allows a scan enable signal to propagate for more that one clock cycle before multiple capture clock is applied. This feature relaxes the speed and skew constraints on scan enable signal design. Only the capture cycle is performed at the corresponding system timing. A programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative impact of clock skew between clock domains.
Owner:MENTOR GRAPHICS CORP

Data recovery apparatus and method for minimizing errors due to clock skew

A data recovery apparatus for minimizing errors due to clock skew and a data recovery apparatus therefor are provided. The data recovery apparatus comprises a phase locked loop (PLL), an oversampler, a level transition detector, a transition accumulator, a state selector, and a data selector. The PLL generates a plurality of phase clock signals having different delay times, which signals are synchronized with an input clock signal. The oversampler 110 M (>1) times oversamples data serially input from the outside in response to the plurality of phase clock signals and outputs the oversampled result as a plurality of bit data items. The level transition detector receives the plurality of bit data output from the oversampler, detects the point of time at which the level transitions between adjacent bits and outputs the detection result as first through Mth transition signals. The transition accumulator accumulates the number of generations of the first through Mth transition signals output from the level transition detector and outputs a signal whose generation frequency is high as first through Mth transition accumulation signals. The state selector generates a state signal for selecting bit data items of corresponding positions among the plurality oversampling data items in response to the first through Mth transition accumulation signal. The data selector receives the oversampled plurality of bit data, selects bit data items of the sampling positions corresponding to the state signal, and outputs the selected bit data items in parallel. It is possible to minimize errors due to clock skew, which can be generated during the reproduction of data.
Owner:SAMSUNG ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products