Estimation method and system of clock tree delay time in specified integrated circuit

An integrated circuit and delay time technology, which is applied in the field of estimation of time tree delay time and clock signal arrival time, can solve the problems of prolonging the design cycle, time-consuming clock tree insertion, long product design cycle, etc., so as to reduce design time and improve The effect of design efficiency

Active Publication Date: 2011-08-31
GLOBALFOUNDRIES INC
View PDF4 Cites 33 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Typically, clock tree insertion itself is time-consuming, and such an iterative process greatly extends the design cycle
[0006] On the other hand, as the scale of ASICs becomes larger, the work of clock tree insertion itself becomes more and more time-consuming
For a very large-scale application-specific integrated circuit with tens of millions of gates, if the design method of flattening is adopted, the time-consuming of clock tree insertion is often calculated in days or even weeks; this situation increases the difficulty of finding and solving problems. time cost
[0007] The above two problems will cause the product design cycle to be too long, and may miss favorable market opportunities

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Estimation method and system of clock tree delay time in specified integrated circuit
  • Estimation method and system of clock tree delay time in specified integrated circuit
  • Estimation method and system of clock tree delay time in specified integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] The preferred embodiments of the present invention will be described in more detail with reference to the accompanying drawings, in which the preferred embodiments of the present invention are shown. However, the present invention can be implemented in various forms and should not be construed as being limited by the embodiments set forth herein. On the contrary, these embodiments are provided to make the present invention more thorough and complete, and to fully convey the scope of the present invention to those skilled in the art.

[0042] First clarify some basic concepts for the description of the invention later.

[0043] Netlist: A file or data structure that expresses the topological connection of a digital circuit device, and does not contain the physical information of the device (for example, the physical location and orientation of the device).

[0044] Layout: A file or data structure that expresses physical location information (such as physical location, orienta...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an estimation method and system of clock tree delay time in a specified integrated circuit, wherein the method comprises the following steps of: obtaining a netlist and a layout relative to the clock tree in the specified integrated circuit; extracting the number of load time sequence apparatuses connected with the clock tree according to the netlist relative to the clock tree; extracting a physical distribution region area of the load time sequence apparatuses connected with the clock tree according to the layout relative to the clock tree; estimating the delay time of the clock tree according to the relation among the number of the load time sequence apparatuses, the physical distribution region area of the load time sequence apparatuses and the clock tree delay time in the historical data of the same process with the specified integrated circuit. An audit flow is reduced to days from weeks by using the improved specified integrated circuit design method, a designer can rapidly find and solve the problem; and therefore, the design time is reduced, and the design efficiency is improved.

Description

Technical field [0001] The present invention generally relates to integrated circuit design, and more specifically, to a method and system for estimating the delay time of a time tree and the arrival time of a clock signal in an application specific integrated circuit. Background technique [0002] In the field of integrated circuit technology, an application specific integrated circuit (ASIC) refers to an integrated circuit designed and manufactured in response to specific user requirements and specific electronic system requirements. ASIC is characterized by the needs of specific users. Compared with general integrated circuits in mass production, it has the advantages of smaller size, lower power consumption, improved reliability, improved performance, enhanced confidentiality, and cost reduction. [0003] figure 1 The current ASIC design process is shown. In step S101, a Gate Level Netlist is generated, and in step S102, a layout (Full Placment) is performed. This step refers t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F2217/84G06F2217/62G06F17/5031G06F30/3312G06F30/396G06F2119/12G06F30/3315
Inventor 葛亮浦索明徐晨李恭琼
Owner GLOBALFOUNDRIES INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products