485 results about "Optical test" patented technology

To identify a fault location easily if there is any fault detected in a network. If an optical path is switched from a working system to an auxiliary system due to a fault, an optical test signal originated from a network node apparatus located at an end point of the optical path is looped back by another network node apparatus on the optical path for the working system. This looped back optical signal is received by the network node apparatus of an originator, in which the signal quality of the optical test signal is measured by a determination device, thereby detecting the presence or absence of the fault on the path through which the optical test signal has been passed. A test receiver within the determination device measures a BER, an S/N ratio, an optical power, or an optical wavelength, whereby it is possible to detect not only the fault location due to disconnection of a link but also degradation in the signal quality.

A system for calibrating a plurality of optical modules includes a plurality of optical signal sources and optical signal degradation elements optically communicating with input switches. The input switches supply optical test signals to optical modules (units under test) plugged into a common shelf. Calibration switches including variable optical attenuators may be used to adjust the input signal levels and alternately supply adjusted signals to an optical power meter and the units under test. A controller is used to control the adjustment and thereby provide defined, measured signal levels to the units under test. By reading data from the units under test and using these defined signal levels, the optical modules may be calibrated or diagnosed. Output optical switches are used in a similar fashion to calibrate or diagnose the outputs of the units under test. In addition to input/output power calibration, the invention may also perform wavelength calibrations.

Method and apparatus for optically testing the quality of objects such as silicon wafers which have a circular peripheral edge, wherein light is directed onto the edge region of the object, and the light radiating from the object due to reflection, refraction and/or diffraction is detected by means of a measuring unit which produces an image from the received light. Defects on and/or in the object are identified from the produced image.

A wafer-level testing arrangement for opto-electronic devices formed in a silicon-on-insulator (SOI) wafer structure utilizes a single opto-electronic testing element to perform both optical and electrical testing. Beam steering optics may be formed on the testing element and used to facilitate the coupling between optical probe signals and optical coupling elements (e.g., prism couplers, gratings) formed on the top surface of the SOI structure. The optical test signals are thereafter directed into optical waveguides formed in the top layer of the SOI structure. The opto-electronic testing element also comprises a plurality of electrical test pins that are positioned to contact a plurality of bondpad test sites on the opto-electronic device and perform electrical testing operations. The optical test signal results may be converted into electrical representations within the SOI structure and thus returned to the testing element as electrical signals.

Optical Time-Domain Reflectometer (OTDR) troubleshooting of a passive optical network (PON) can be enhanced by deploying cascaded splitters, at least some of which have multiple inputs. That is, at least some of the splitters in the PON have not only a first input coupleable to the optical line terminator (OLT) or output of another splitter but also a second input directly coupleable to an Optical Time-Domain Reflectometer (OTDR). Optical time-delay reflectometry can be performed upon a selected portion or segment of the PON by selecting a splitter and transmitting an optical test signal from the OTDR directly to the input of the selected splitter and analyzing the reflected signal.

In a multifunctional printing method and printing system, printed material is checked, verified and tracked. For that purpose different test equipments are located in-line with a printing line. Magnetic information being printed by a printing station onto the recording carrier using magnetic ink character readable toner may be in-line tested by a magnetic test equipment, which reads information from the magnetic recording zone on the carrier. Optical information may be tested by an in-line mounted optical test equipment, respectively. Further in-line test equipment is proposed such as a leaser bar code scanner and an address reader. The printing line may have additional devices such as print preprocessing unwinders or print postprocessing stackers, folders or cutters.

A portable system and method for measuring the concentration of multiple chemical or biological substances where an onsite analysis of such substances is needed. The new and original handheld sensor system uses a disposable optical test element and a spectroscopic detector that measures the test element response to specific analytes through a change in light absorbance, luminescence, and other forms of light-based response. In this way, reflection light intensities indicative of the test element response can be used to measure the concentration of the target analytes. The sensor system is also capable of being interfaced to an information processing unit or computer so that analytical data can be manipulated or stored electronically.

A technique is disclosed for performing testing of an optical device under test (DUT). According to a specific embodiment, the DUT includes a plurality of DUT optical input ports and a plurality of DUT optical output ports. The testing may be performed by an optical switching testing system (OSTS) which includes a plurality of OSTS output ports optically connected to a plurality of DUT input ports, and a plurality of OSTS input ports optically connected to a plurality of DUT output ports. Components of the OSTS are configured in order to perform a specific test on the DUT. A first test scenario is configured at the DUT. At least one optical test signal is transmitted to at least one DUT input port. Test results may then be obtained by monitoring at least one DUT output port for the presence or absence of light. The test results are then analyzed for specific characteristics. According to a specific embodiment, the OSTS of the present invention may be adapted to automatically perform a plurality of testing operations on a selected plurality of different optical paths associated with the DUT. Such testing operations may include, for example, transmitting a plurality of optical test signals to a plurality of DUT input ports during a given test scenario, and/or monitoring a plurality of DUT output ports for test results during a given test scenario. According to a specific embodiment, the optical switch testing system of the present invention may be used to measure and verify selected characteristics associated with a device under test (DUT) or a system under test (SUT). Such characteristics may include, for example, optical cross talk, insertion loss, polarization dependent loss, path switching time, data integrity, optical path verification, optical path stability, etc.

Rotational motions between a displacement-measuring probe and an optical test surface define a spherical or near spherical datum surface against which measurements of the probe are taken. The probe has a measurement axis that is maintained substantially normal to the optical test surface during the course of measurement.

The invention provides a correction method for luminescence parameters of liquid crystal display devices and a device thereof, which is adaptable to the liquid crystal display field. The correction device for luminescence parameters of liquid crystal display devices comprises an optical test device, a test device support, a test control unit and an image generator. During the process of producing the liquid crystal display devices, the correction device for luminescence parameters of liquid crystal display devices can be utilized to enable the optical parameters to meet standard values through correcting LED luminescence parameters in corresponding areas which do not meet the standard values , thereby resolving the problems that the existing liquid crystal display devices are low in effect and high in cost during the production process.

There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.

A method for optically testing semiconductor devices or wafers using a holographic optical interference system with light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light beam into a reference beam and an object beam, imposing the object beam on the semiconductor material to generate a reflected object beam reflected from interior structures of the semiconductor material, adjusting the angle of the reference beam relative to the object beam between a plurality of angles with the semiconductor material being a different state for each angle of the reference beam, imposing the reflected object beam and the reference beam onto a detection device to create a plurality of interference patterns, one for each of the reference beam angles, and comparing the interference patterns to one another to determine and display characteristics within the semiconductor material.

An optical die probe wafer testing circuit arrangement and associated testing methodology are described for mounting a production test die (157) and surrounding scribe grid (156) to a test head (155) which is positioned over a wafer (160) in alignment with a die under test (163) and surrounding scribe grid (161, 165), such that one or more optical deflection mirrors (152, 154) in the test head scribe grid (156) are aligned with one or more optical deflection mirrors (162, 164) in the scribe grid (161, 165) for the die under test (163) to enable optical die probe testing on the die under test (163) by directing a first optical test signal (158) from the production test die (157), through the first and second optical deflection mirrors (e.g., 152, 162) and to the first die.

A system for conducting optical tests on a plurality of optical modules includes a plurality of optical signal sources and optical signal degradation elements optically communicating with input switches. The input switches sources supply optical test signals to optical modules (units under test) plugged into a common shelf. Output optical switches supply the output signals to a range of optical test equipment. A controller utilizes a database of test recipes to supervise and control the optical signal sources, optical signal degradation elements, units under test, input switches, output switches, and test equipment to conduct a variety of optical tests on the modules. With this architecture it is possible to subject a variety of different optical modules to a variety of different optical tests.

The invention discloses an online test method for the processing of a Cassegrain two-reflector optical system, which is used for the online test of the processing of the non-perfect imaging Cassegrain two-reflector optical system. The optical test system consists of a standard self-collimating plane mirror, the tested Cassegrain optical system, a compensating lens and an aspheric processing surface form detection instrument. The compensating lens is arranged on the back light path of the non-perfect imaging Cassegrain two-reflector optical system to compensate the spherical aberration of the original optical system, thereby enabling the tested Cassegrain two-reflector optical system to form a perfect image on points on the axis, and meeting the processing requirements of the pair of primary and secondary reflectors.

This invention relates to one wide band multi-sensor device light axis test system in optical test technique, which comprises the following steps: fixing the devices with different wave lengths into guide rail and moving their focus parts onto parallel focus surface through adjusting system in cross or star holes; receiving laser spot CCD receive system parts; using parallel light tube to make cross or star point hole onto tested system each optical display to receive test system laser.

The invention relates to an optical parameter detection method of low-radiation coated glass, wherein the low-radiation coated glass is SnO2:F/SiCxOy, 0<x<1, and 1<y<4. The invention belongs to a coated glass detection field. On basis of obtaining a spectroscopic ellipsometry of SnO2:F/SiCxOy energy saving coated glass, the method introduces a five-layer film structure and an optical dispersion equation, returns an actually-measured spectroscopic ellipsometry by iteration, and finally obtains a film structure of the SnO2:F/SiCxOy coated glass and optical parameters of each layer. By the method, on-line real time monitor of optical performances of the coated glass can be implemented. The method can obtain an accurate film structure and the optical parameters only by optical test means, has advantages of no damage on a sample, small time consuming for measuring, simple measuring method, and no special requirement on a sample surface to be measured, and is very suitable for performance detection of the SnO2:F/SiCxOy energy saving coated glass.