Automatic testing and sorting machine for integrated circuit IC chip

An automatic testing and sorting machine technology, applied in sorting and other directions, can solve problems such as low efficiency, unsatisfactory, and error-prone

Active Publication Date: 2012-10-03
深圳格芯集成电路装备有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Initially, after people tested the chips, they were placed by manual classification, which was not only inefficient, but also prone to errors
At present, there are automatic test and sorting machines, but there are single types of test and sorting varieties and single types of classification and placement, that is,

Method used

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  • Automatic testing and sorting machine for integrated circuit IC chip
  • Automatic testing and sorting machine for integrated circuit IC chip
  • Automatic testing and sorting machine for integrated circuit IC chip

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Experimental program
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Embodiment Construction

[0031] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0032] The structural composition of IC chip automatic testing machine of the present invention is as figure 1 As shown, it is mainly composed of a material-loading pallet separation input device 1, a heating platform device 2, a material-feeding gripper platform device 3, a material ship module device 4, a test gripper combination module device 5, and a material-feeding sorting gripper platform Device 6, defective product classification and collection module 7, empty pallet sorting device 8, qualified product classification and collection module 9, operation keyboard 10, unloading empty pallet separation input device 11, loading empty pallet output stacking device 12 , electronic control system 13, testing machine (view not shown) and other components.

[0033] Tray separation input device 1 of the present invention is as figure 2 As sho...

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PUM

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Abstract

The invention discloses an automatic testing and sorting machine for an integrated circuit IC chip. The machine comprises a charging tray separating and inputting device, a material boat module device, a qualified product sorting and collecting module and an inferior-quality product sorting and collecting module, wherein the charging tray separating and inputting device can separate stacked material trays one by one; the material boat module device comprises a left material boat for holding chips to be tested and a right material boat for holding the tested chips, and the left material boat and the right material boat are controlled by a servo motor to swing left and right; the qualified product sorting and collecting module is used for holding the chips tested to be qualified in the right material boat; and the inferior-quality product sorting and collecting module is used for holding the chips tested to be unqualified. A tray full of chips to be tested and sorted is automatically input to the right position by the tray separating and inputting device, then, the chips are transferred to the boats by a charging gripper platform device one by one; and the chips to be tested in the left material boat are precisely absorbed and moved to a testing position to be tested by a testing gripper combined module device, then, are placed back to the right material boat to be further conveyed to a sorting position, and finally, are sorted and placed in a corresponding finished product tray or inferior-quality product tray by a discharging and sorting gripper platform device according to the test result, and conveyed out of the machine in order after fully filled in the tray.

Description

technical field [0001] The invention relates to a new equipment for automatic testing and sorting of IC chips. Background technique [0002] After the IC chips complete the processing and manufacturing process, they need to be tested and classified one by one. The classified storage of chips is conducive to the rational use of chips. Initially, after people tested the chips, they were placed by manual classification, which was not only inefficient, but also prone to errors. At present, there are automatic test and sorting machines, but there are single types of test and sorting varieties and single types of classification and placement, that is, one machine can only test one or two types of chips, and can only be divided into qualified products and unqualified products for placement. This cannot meet the comprehensive requirements of today's chips with many varieties and specifications, detailed classification requirements, and full use of the value of each chip. Contents...

Claims

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Application Information

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IPC IPC(8): B07C5/36
Inventor 林宜龙付义超唐召来刘飞王能翔母华程
Owner 深圳格芯集成电路装备有限公司
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