Automatic testing and sorting machine for integrated circuit IC chip

Abstract

The invention discloses an automatic testing and sorting machine for an integrated circuit IC chip. The machine comprises a charging tray separating and inputting device, a material boat module device, a qualified product sorting and collecting module and an inferior-quality product sorting and collecting module, wherein the charging tray separating and inputting device can separate stacked material trays one by one; the material boat module device comprises a left material boat for holding chips to be tested and a right material boat for holding the tested chips, and the left material boat and the right material boat are controlled by a servo motor to swing left and right; the qualified product sorting and collecting module is used for holding the chips tested to be qualified in the right material boat; and the inferior-quality product sorting and collecting module is used for holding the chips tested to be unqualified. A tray full of chips to be tested and sorted is automatically input to the right position by the tray separating and inputting device, then, the chips are transferred to the boats by a charging gripper platform device one by one; and the chips to be tested in the left material boat are precisely absorbed and moved to a testing position to be tested by a testing gripper combined module device, then, are placed back to the right material boat to be further conveyed to a sorting position, and finally, are sorted and placed in a corresponding finished product tray or inferior-quality product tray by a discharging and sorting gripper platform device according to the test result, and conveyed out of the machine in order after fully filled in the tray.

Description

technical field [0001] The invention relates to a new equipment for automatic testing and sorting of IC chips. Background technique [0002] After the IC chips complete the processing and manufacturing process, they need to be tested and classified one by one. The classified storage of chips is conducive to the rational use of chips. Initially, after people tested the chips, they were placed by manual classification, which was not only inefficient, but also prone to errors. At present, there are automatic test and sorting machines, but there are single types of test and sorting varieties and single types of classification and placement, that is, one machine can only test one or two types of chips, and can only be divided into qualified products and unqualified products for placement. This cannot meet the comprehensive requirements of today's chips with many varieties and specifications, detailed classification requirements, and full use of the value of each chip. Contents...

AI Technical Summary

Problems solved by technology

Initially, after people tested the chips, they were placed by manual classification, which was not only inefficient, but also prone to errors

At present, there are automatic test and sorting machines, but there are single types of test and sorting varieties and single types of classification and placement, that is, one machine can only test one or two types of chips, and can only be divided into qualified products and unqualified products for placement.

This cannot meet the comprehensive requirements of today's chip varieties and specifications, requiring detailed classification, and making full use of the value of each chip.

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