Complete machine level product storage life acceleration test method

A storage life and accelerated test technology, which is applied to measuring devices, instruments, scientific instruments, etc., can solve the problems of inaccurate test results, high cost, and test pieces that cannot meet the test requirements, and achieve the effect of accurate life analysis results

Active Publication Date: 2018-07-27
CASIC DEFENSE TECH RES & TEST CENT
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Problems solved by technology

However, the application of the current accelerated test method is limited by the accelerated model and is only suitable for component or material level tests
In addition, due to the high cost and small sample size of the whole machine test piece, according to different types of conventional accelerated test methods, such as: constant stress accelerated test method, step / step back stress accelerated test method, the test piece cannot meet the actual test Require
Due to the fact that the object level of the current accelerated test is too low, more result approximations are required in the process of upward synthesis, which leads to a credibility crisis in the evaluation results of the equipment storage life, that is, large deviations, so the estimation of the equipment storage life Evaluation support is limited
[0004] Therefore, in the process of realizing the present application, the inventor found that there are at least the following problems in the prior art: the current accelerated test is difficult to apply to the complete machine product with complex structure, and the test results are inaccurate

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  • Complete machine level product storage life acceleration test method
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  • Complete machine level product storage life acceleration test method

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Embodiment Construction

[0058] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0059] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

[0060] In view of the fact that most of the current product acceleration tests can only be adapted to lower-level products and cannot meet the accelerated test of complete machine-level products, this application is based on the failure mechanism and failure mode of co...

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Abstract

The invention discloses a complete machine level product storage life acceleration test method. The method comprises steps as follows: sensitive environment factors related to the storage life are acquired according to cross-section analysis; the environment loading spectrum is analyzed and acquired with a corresponding data processing method and spectrum compiling theories; storage failure information related to a complete machine product storage failure mode and a failure mechanism is acquired, and storage life weak components of a complete machine product are determined according to the storage failure information; acceleration tests are performed on different weak parts, corresponding life distribution models, acceleration models and related parameters of the weak components are determined; a complete machine storage life model based on competing failure and an acceleration factor evaluation model of the complete machine storage life model are constructed according to analysis andcorresponding test results of the weak components; complete machine storage life acceleration verification tests are performed according to acceleration factors. By means of the complete machine levelproduct storage life acceleration test method, effective acceleration storage tests can be performed on the complete machine product, and the accurate life analysis result of the complete machine product is obtained.

Description

technical field [0001] The invention relates to the related technical field of product reliability test and evaluation, in particular to an accelerated test method for storage life of complete machine level products. Background technique [0002] For "long-term storage, one-time use" weapons and equipment, at present, field storage tests are mainly used to evaluate their storage life, but this evaluation method has prominent problems such as time-consuming, high cost, and weak prediction ability. In contrast, the accelerated storage test is time-consuming, less expensive, and has strong predictive ability, which provides an effective and feasible way for equipment storage life evaluation, and has high engineering application value. [0003] From the research status of accelerated test technology, it can be seen that the current theoretical and applied research of accelerated test is mainly aimed at products with a single failure mode and failure mechanism, and the models use...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/00
CPCG01N25/00
Inventor 张生鹏李宏民
Owner CASIC DEFENSE TECH RES & TEST CENT
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