69 results about "Accelerated life testing" patented technology

Multilayer ceramic chip capacitors which satisfy COG requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as copper and copper alloys thereof may be used for internal and external electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a composite oxide formed by calcining rare earth titanates, barium titanate, together with other metal oxides such as MgO, CaO, ZnO, MnO2, ZrO2, SiO2, Ga2O3, Nd2O3, Nb2O5, and Y2O3.

Multilayer ceramic chip capacitors (MLCC's) which satisfy X7R TCC requirements and which are compatible with silver-palladium internal electrodes. The MLCC's exhibit desirable dielectric properties—high capacitance, low dissipation factor, high insulation resistance, stable TCC—and excellent performance on highly accelerated life testing, and good resistance to dielectric breakdown. The dielectric layers comprise a lead-free and cadmium-free barium titanate base material doped with other metal oxides such oxides of zinc, boron, bismuth, barium, titanium, praseodymium, cerium, tungsten, neodymium, tungsten, tin, niobium, copper, and / or manganese in various combinations. The dielectric ceramic materials herein can be fired at less than 1150° C. with an inner electrode having 70 wt % or more Ag and 30 wt % or less Pd to form an MLCC.

Systems and methods for providing biologically compatible pockets or envelopes that can contain chips and other circuit elements and can make electrical connection between those elements and living organisms. The assembled biologically compatible pockets and circuit components can have biomedical applications, such as bioimplantable devices such as retinal, cochlear and cortical prosthesis implants, muscular stimulators, and other uses. In various embodiments, the described technology explains how to make and use pocket systems for dealing with chips having connectors on one or two surfaces, and with other circuit components such as resistors, capacitors, inductors and transistors. Operation of chips encapsulated according to the described technology is demonstrated. Accelerated life testing suggests that the pocket systems described will survive for years at 37 degrees C.

An organic encapsulant composition applied to formed-on-foil ceramic capacitors and embedded inside printed wiring boards allows the capacitor to resist printed wiring board chemicals and pass 1000 hours of accelerated life testing conducted under high humidity, elevated temperature and applied DC bias.

The invention belongs to the technical field of numerical control machine tool and relates to a motorized spindle accelerated life testing time design method. The method includes the steps that firstly, product load data and fault information are collected; secondly, a load distribution model is established; thirdly, a program load spectrum is designed; fourthly, a product service life estimated formula is determined on the basis of the Miner fatigue accumulation damage theory, and an accelerated life testing accelerating factor model is built on the basis of the formula; fifthly, based on the fault information, a first fault time reliability mode is built through model hypothesis, parameter estimation and hypothesis testing; sixthly, testing time design is conducted on the basis of the first fault time, the first fault time corresponding to an acceptable reliability degree serves as a standard, and a relational model of motorized spindle testing time and the sample capacity is established; seventhly, an accelerating factor is considered for testing time design, and the creditability of the testing time design is verified. The relational model of the testing time and the sample capacity is considered, the accelerating factor model is established on the basis of the modification Miner theory, the modeling accuracy is improved, and the method better conforms to actual conditions.

The invention provides a grey support vector machine-based multi-stress accelerated life testing forecasting method, and belongs to the technical field of life forecasting. The method comprises eight steps, namely acquisition of multi-stress accelerated life testing data, determination of reliability with an empirical distribution function method, level ratio inspection of product failure time data, accumulated generating operation (AGO) of the product failure time data, construction of a support vector machine forecasting model, forecasting with the constructed support vector machine model, reduction of an AGO generating sequence forecasting value and life distribution fitting. The grey support vector machine-based multi-stress accelerated life testing forecasting method provided by the invention can be used for forecasting without knowing the information such as a specific accelerated model and product life distribution and the like, so that difficulty in establishing the accelerated model and introduction of system errors in forecasting are avoided, a complex multiplex likelihood equation set does not need to be solved, and the method has stronger engineering applicability and universality for different products or stress categories.

Multilayer ceramic chip capacitors which satisfy X8R requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as nickel and nickel alloys thereof may be used for internal and external electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a barium titanate base material doped with other metal oxides such as BaO, Y2O3, ZrO2, SiO2, MgO, MnO, MoO3, CaO, Lu2O3, Yb2O3, or WO3 in various combinations.

The invention provides a device and a method for testing a temperature fusion assembly of a refrigerator. The testing device comprises a testing container, a temperature-control device, a temperaturefuse assembly and a test controller, wherein liquid is filled in the testing container, the temperature-control device regulates and controls the temperature of the liquid in the testing container, the temperature fuse assembly is arranged in the testing container, the test controller is connected with the temperature-control device and the temperature fuse assembly and is provided with a defrosting load, the temperature-control device and the test controller control the liquid in the testing container at a constant-temperature state, and the test controller carries out switching-on and switching-off circulation control on the temperature fuse assembly. The invention restricts the temperature of the temperature fuse assembly by the methods of immersing the temperature fuse assembly into the liquid and controlling the temperature of a liquid medium and utilizes the test controller to carry out the switching-on and switching-off circulation control on the temperature fuse assembly, thussimulating the conditions of the temperature, the current, the switching-on time and the operation frequency of the temperature fuse assembly when in use and verifying the service life of the temperature fuse assembly by an accelerated life testing method.

The invention discloses a highly accelerated life testing system for electronic products. The highly accelerated life testing system for electronic products comprises a closed chamber, a plurality of electronic products to be tested, a vibration stress testing system, a thermal stress testing system and a plurality of vibration stress accelerometers. The vibration stress testing system comprises a vibrating table disposed in the closed chamber, a testing fixture with the electronic products to be tested is fixed on the vibrating table, and the vibration stress accelerometers are disposed on a printed circuit board inside each electronic product to be tested. The thermal stress testing system comprises a cold and heat source feed-discharge device communicated with the upper portion of the closed chamber, and a plurality of thermocouples are disposed on the printed circuit board inside each electronic product. The vibration stress accelerometers and the thermocouples are electrically connected with a test control computer. The invention further discloses a method using the highly accelerated life testing system for electronic products. The defects of the electronic products can be detected effectively, reliability is improved, and a basis of screening of type of stress and setting of magnitude of stress is provided for a later highly accelerated stress screen test.

The invention provides an accelerating service life test device for electronic electrical-energy meters. The test device is a laboratory which is formed by a plurality of test stands used for placing electronic electrical-energy meters, a fire extinguisher, a temperature and humidity sensor, a temperature and humidity controller, a smog sensor, an air circulation system device, a total control box and a control device. The accelerating service life test device adopts a method of using a high-temperature and high-humidity environment to realize accelerated service life testing to evaluate the reliability of the electrical energy meters so that test time can be reduced significantly and experiment cost is saved.

Multilayer ceramic chip capacitors which satisfy X7R and BX requirements and which are compatible with silver-palladium internal electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a lead-free and cadmium-free barium titanate base material doped with other metal oxides such oxides of zinc, boron, bismuth, cerium, tungsten, copper, manganese, neodymium, niobium, silver, barium, silicon and nickel in various combinations. The dielectric ceramic materials herein can be sintered together (fired) at less than 1000° C. with an inner electrode having more than 80 wt % Ag and less than 20 wt % Pd to form a multilayer ceramic capacitor (MLCC).

Multilayer ceramic chip capacitors which satisfy Y5V requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as nickel, copper, and alloys thereof may be used for internal and external electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise BaTiO3 doped with other metal oxides such as MgO, CaO, ZnO, MnO2, ZrO2, SiO2, Nd2O3, Nb2O5, and Y2O3.

Multilayer ceramic chip capacitors which satisfy COG requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as nickel and nickel alloys thereof may be used for internal and external electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a strontium zirconate matrix doped with other metal oxides such as TiO2, MgO, B2O3, CaO, Al2O3, SiO2, and SrO in various combinations.

The invention discloses a production method of nickel paste for an ultrahigh-capacitance MLCC (multilayer ceramic capacitor). The production method includes the steps of 1, dispersing nickel powder, dispersant and solvent with a sander; 2, dispersing barium titanate powder, dispersant and solvent with the sander; 3, mixing a product of the first step and a product of the second step, and performing mixing before adding adhesive; 4, performing conventional dispersion and filtration. The invention further provides nickel paste produced by the production method of the nickel paste for the ultrahigh-capacitance MLCC and an MLCC produced with the nickel paste for the ultrahigh-capacitance MLCC. The production method has the advantages that nickel powder and barium titanate powder can be dispersed more effectively, and the produced MLCC is good in voltage resistance and HALT (highly accelerated life testing) performance.

The invention provides a multi-stress accelerated life monitoring and testing system based on automatic photoelectric parameter acquisition and relates to accelerated life testing and monitoring systems for semiconductor lighting products, belonging to the field of electric light source and lighting measurement technologies. The system comprises an accelerated aging device, an automatic illuminance acquisition device and a control device, wherein the accelerated aging device is used for supplying voltage stress and temperature stress to the accelerated aging of a sample and comprises a platform which is used for sample aging, the automatic illuminance acquisition device comprises an illuminance detector which is used for carrying out automatic and online acquisition on the illuminance of the sample, and the control device is used for controlling the aging time and regular automatic acquisition time of the sample. According to the system, a multi-stress accelerated aging system and automatic acquisition test are combined. The system has the advantages that the temperature and voltage stress accelerated aging for the sample is realized, photoelectric parameters are automatically acquired, and the change of the maintenance rate of the photoelectric parameters is monitored; a basis is supplied to the establishment of a life prediction model; and the uncertainty and cumbersome degree of manual measurement for single samples are avoided, and the time for normal life tests is shortened.

An apparatus is provided for highly accelerated life testing (HALT) of multi-junction solar cells according to a method that utilizes a high vacuum chamber, as well as lenses and windows transparent to broad spectrum solar radiation from typically a single source to house packaged solar chips and temperature monitoring and control means during testing, thereby allowing substantially greater control of environmental variables such as temperature, atmospheric composition, and light spectrum than is currently available.

Multilayer ceramic chip capacitors which satisfy COG requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as nickel and nickel alloys may be used for internal and external electrodes are disclosed. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a strontium zirconate matrix doped with other metal oxides such as TiO2, MgO, B2O3, CaO, MnO, Nd2O3 and Nb2O5 in various combinations.

The invention discloses a method for analyzing the reliability of an explosive logic network based on evaluation of accelerated life. According to the method, accelerated stresses in temperature and humidity directions are selected and used; and an acceleration model is introduced into a conventional distribution function for transformation of the distribution function so as to each reliability parameter expression related to temperature-humidity. The method provided by the invention takes the influence of both temperature and humidity on the storage life of the explosive logic network into consideration; and compared with a conventional accelerated-life testing method which only takes temperature into consideration, the method reduces testing errors caused by consideration of the influence of a single environmental stress and better accords with the actual situation of complex storage environments in a battlefield.

This document provides systems and methods for testing of various kinds of valves. For example, this document provides systems and methods for accelerated life testing of prosthetic heart valves.

The invention belongs to the field of micro pumps and specifically discloses a micro pump accelerated life testing method. The method comprises the steps of grouping micro pumps, and selecting the voltage and the temperature of a working medium as accelerated stress to conduct continuous testing to obtain the pseudo-failure lifetime; conducting calculation to obtain the characteristic life of eachgroup of micro pumps and the activation energy and the index constant of the type of micro pumps; and selecting a solution reference group and obtaining the characteristic life of the type of micro pumps under the normal use conditions through the characteristic life of the solution reference group combined with the activation energy and the index constant. According to the micro pump acceleratedlife testing method, according to the characteristics that the failure of the micro pumps can be accelerated by voltage rising and temperature rising of the working medium of the micro pumps and thefailure mode of the micro pumps is fixed and single, the accelerated life of the micro pumps is tested with the voltage and the temperature of the working medium as the accelerated stress. The micro pump accelerated life testing method has the characteristics of high operability and easy testing regulation and control. Meanwhile, the test cycle can be shortened, and the test cost can be reduced.

Multilayer ceramic chip capacitors which satisfy COG requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as nickel and nickel alloys thereof may be used for internal and external electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a strontium ztrconate matrix doped with other metal oxides such as TiO2, MgO, B2O3, CaO, A12O3 SiO2, and SrO in various combinations. Figure 1 is a cross-sectional view of a multilayer ceramic chip capacitor (1) according to an embodiment of the invention External electrodes (4) of the capacitor (1) are disposed on side surfaces of the capacitor chip (1) and in electrical connection with internal electrode layers (3). The capacitor chip (1) has a plurality of alternately stacked dielectric layers (2).

Multilayer ceramic chip capacitors which satisfy COG requirements and which are compatible with reducing atmosphere sintering conditions so that non-noble metals such as nickel and nickel alloys thereof may be used for internal and external electrodes are made in accordance with the invention. The capacitors exhibit desirable dielectric properties (high capacitance, low dissipation factor, high insulation resistance), excellent performance on highly accelerated life testing, and very good resistance to dielectric breakdown. The dielectric layers comprise a strontium zirconate matrix doped with other metal oxides such as TiO2, MgO, B2O3, CaO, Al2O3, SiO2, and SrO in various combinations.