48 results about "Accelerated life testing" patented technology

The invention discloses a ship mechanical and electrical product accelerated life test stress profile generation method and device, a medium and a product, and relates to the field of ship reliability engineering and test.The method comprises the steps that working condition profile data and marine environment stress data of a target ship mechanical and electrical product under a typical navigation task are obtained, and a working condition-environment mapping model is established; according to the designed life target of the target ship mechanical and electrical product, the whole life cycle total damage to the target ship mechanical and electrical product is determined by using the working condition-environment mapping model and the failure physical damage model, an accelerated stress profile is generated by strengthening the stress level with damage equivalence as the principle, an accelerated factor is calculated, and an accelerated life test is performed; and failure data of the failure event is recorded, parameters of the failure physical damage model are calibrated, and the accelerated stress profile is iteratively optimized by using the calibrated failure physical damage model. Accurate and dynamic generation of the accelerated life test stress profile of the ship mechanical and electrical product is realized.

The invention relates to an active oxygen concentration control method and a brain-computer interface implant accelerated life test system. The accelerated life test system is used for testing the electrochemical performance of a brain-computer interface implant by using a test solution. The method comprises the following steps: detecting a current feedback current corresponding to a current test solution; obtaining the current active oxygen concentration according to the current feedback current and a preset active oxygen concentration and current relation function; generating a filling parameter according to a concentration difference value between the current active oxygen concentration and a preset active oxygen concentration; and adding a hydrogen peroxide solution into the current test solution according to the filling parameters, so that the current test solution reaches the preset active oxygen concentration. According to the method, the active oxygen environment generated by immune reaction in a living body can be simulated through the test solution, the active oxygen concentration in the test solution can be precisely regulated and controlled, and the accuracy of the test result of the brain-computer interface implant is improved.

The invention provides a hypoid gear accelerated life test method, device and equipment and a storage medium, and the method comprises the steps: calculating a basic acceleration factor based on the design life and accelerated life of a hypoid gear; calculating an included angle factor and a roughness correction factor based on meshing angle information and tooth surface roughness information of the hypoid gear; revising the basic acceleration factor based on the included angle factor and the roughness correction factor to obtain a corrected acceleration factor; and according to the corrected acceleration factor and the loading mode of the test bench, calculating an actual torque and an actual rotating speed applied by the accelerated life test, and carrying out the accelerated life test on the hyperboloid gear based on the actual torque and the actual rotating speed. According to the method, the effective accelerated life test can be completed under the condition that the gear is not damaged.

The application relates to a servo motor accelerated life test system and a servo motor accelerated life test method. The method comprises a test unit, a control unit and a unit to be tested. The test unit comprises a load torque assembly, a radial force assembly and a temperature assembly. The unit to be tested comprises at least one motor to be tested. The control unit comprises a controller and a driving motor. The load torque assembly and the radial force assembly are connected with the unit to be tested. The controller is connected with the load torque assembly and the driving motor respectively. The driving motor is connected with the radial force assembly. Multiple test stresses are provided for multiple groups of motors to be tested at the same time, and the accuracy and test efficiency of the life test on the motors to be tested are improved.

The present invention is an accelerated life test system for motor bearings under the action of multiple stresses. The present invention relates to the technical field of motor bearing life test. By applying electric brushes to both ends of the inner and outer rings of the bearing, the voltage stress exerted on the bearing during normal operation of the motor can be fully simulated. The number of levels, amplitude, frequency, and switching speed of the analog voltage generated by the bearing voltage simulation device can be adjusted, and a single test system can simulate the real bearing voltages borne by bearings in motors of various power ratings. The temperature of the bearing is regulated by a temperature control device, and a radial loading force is applied to the rotating shaft by a radial loading device. The data acquisition device processes the signals collected by the sensors and then transmits them to the host computer for real-time monitoring and data storage. The present invention can study the influence and action mechanism of bearing current on bearing life under multiple stresses, thereby making up for the deficiencies of the missing related test devices.

The application discloses a semiconductor EPI process bulb life test device and a test method, and belongs to the technical field of fault prediction and health management, and comprises the following steps: collecting the resistance values of filaments in each bulb under different states through a resistance measurement module, acquiring an actual temperature change curve of the filaments, determining a nonlinear inflection point, and analyzing the aging characteristics of the filaments before and after the nonlinear inflection point; performing accelerated life test, adopting a double-voltage input cycle method to periodically load voltage on the filaments, and recording the resistance value change curves of the filaments under different voltage stress levels; and performing multidimensional test in cooperation with an execution device to simulate an actual use environment. In the technical scheme implementation process of the application, the resistance values of filaments in each bulb under different states are collected through the resistance measurement module, the temperature change curves of the filaments are acquired, then the nonlinear inflection point is determined, and the life is analyzed before and after the inflection point by using different methods, so that the current life of the bulb can be accurately acquired.

The invention provides a packaging method of an enhanced gallium nitride power semiconductor device, which belongs to the technical field of chip manufacturing, and comprises the following steps of: firstly, simulating and optimizing an electrode distance and a dielectric layer parameter through three-dimensional electric field distribution, and then realizing efficient thermal connection between a chip and a heat dissipation substrate by using a silver sintering process; and a multi-layer field plate structure is designed to disperse a high electric field region. Then a high-dielectric-constant resin layer and low-ion-content epoxy molding compound are applied for insulation and packaging, and then a siloxane modified polyimide protection layer is coated. The reliability is verified through an electric field tolerance test, a highly accelerated life test and a thermal cycle test, a micro-nano channel structure is formed by using a focused ion beam technology to relieve a local high electric field area, and finally the performance and life of the device are evaluated based on an electric field distribution and reliability prediction model of a deep learning framework. The reliability problem of the gallium nitride power semiconductor device in a high-voltage working environment is solved.

The present application belongs to the technical field of photovoltaic module performance test, and relates to a photovoltaic module wind load spectrum simulation test system and method. The system comprises a closed fluid cavity provided with a fluid inlet and a fluid outlet; a fluid pressure control system comprising a pressure storage tank, a proportional valve, an on-off valve and a vacuum pump; the pressure storage tank is connected in sequence through the proportional valve, the on-off valve and the fluid inlet; the air inlet of the vacuum pump is connected with the fluid outlet; a spectrum analysis and control module comprising a data acquisition card and an iterative learning controller; the input end of the data acquisition card is connected with the output end of the pressure sensor, and the output end of the data acquisition card is connected with the input end of the iterative learning controller; and the output end of the iterative learning controller is connected with the proportional valve, the on-off valve and the vacuum pump respectively. The present application can reproduce any target wind pressure spectrum with high precision and fast convergence, and provides a high-fidelity and high-reliability dynamic loading means for wind fatigue resistance and accelerated life test of photovoltaic modules.

The present invention provides an accelerated life test method for satellite high-voltage electronic components. This method, based on the small sample size and long lifespan of satellite high-voltage electronic components, conducts comprehensive product performance analysis and research on accelerated life testing methods for satellite high-voltage electronic components in a ground-based simulated space environment. The method specifically involves determining the operating point and corresponding operating time of the satellite high-voltage electronic component in an application scenario, selecting a single constant stress accelerated test method, calculating the operating temperature, acceleration factor, and test time corresponding to each operating point of the satellite high-voltage electronic component, and conducting tests that sequentially perform an identification-level environmental test, a cyclic thermal vacuum aging test, a component performance test, a high-temperature accelerated life test, and a component performance test. The high-temperature accelerated life test sequentially performs tests at each operating point according to the corresponding operating temperature and test time, thereby completing the accelerated life test of the satellite high-voltage electronic component.

A simulation failure identification and physical acceleration fusion-based MEMS sensor accelerated life test method comprises the following steps: aiming at environmental stress information of an MEMS sensor in a predetermined task process, identifying a failure form and a weak part by using structure simulation, and carrying out simulation evaluation on candidate acceleration stress working conditions constructed around the weak part; according to a preset life, a reliability requirement and a test resource constraint, selecting a combination of a stress level, test time and a sample number from the candidate working conditions to form an accelerated life test design scheme of the MEMS sensor; according to the method, the test period can be shortened on the premise that the test representativeness and accuracy are guaranteed, the test cost is reduced, and the effectiveness and universality of the reliability test design of the MEMS sensor are improved.

The invention provides an application reliability evaluation method and system for an electric power micro sensor, and the method comprises the steps: applying a target combination environment factor to a sensor based on the environment data of a target application scene, and carrying out the dynamic testing of the sensor under the target combination environment factor, collecting preset performance index data of the sensor under the dynamic test based on a preset performance index, and generating performance degradation information of the sensor based on the preset performance index data by using a pre-constructed multi-scale performance degradation model, quantifying the contribution degree of each environmental factor in the target combination environmental factors to sensor degradation based on the performance degradation information, and generating a reliability evaluation result of the sensor based on the contribution degree and a multi-scale performance degradation model. Through a systematized evaluation method and experimental verification, the application reliability evaluation of the electric power micro sensor is realized, and the requirements of the traditional accelerated life test can also be met.

This invention discloses an on-board boost inductor monitoring and simulation testing system and its testing method, including an on-board power supply simulation module, an accelerated life testing module, an environmental test chamber, a fault early warning module, and a data analysis and diagnosis module. By constructing a power supply simulation model that matches the actual operating conditions of electric vehicles, and combining it with accelerated life testing coupled with multiple environmental factors, the actual stress state of the inductor is comprehensively simulated. Acoustic emission technology is used to achieve real-time monitoring and fault early warning of inductor performance degradation. Big data analysis and machine learning technologies are employed to construct an inductor fault diagnosis knowledge base and an intelligent reasoning system. The system and method provided by this invention can significantly improve the efficiency of inductor reliability testing, achieve early warning of inductor degradation, improve the accuracy and intelligence level of fault diagnosis, and provide a solid foundation for the safe operation of new energy electric vehicles, possessing broad application prospects and promotional value.

This invention relates to the field of reliability assessment technology for electric vehicle charging equipment, specifically disclosing a method for predicting the lifespan of charging connectors by integrating accelerated life testing and field data. The method includes: constructing a laboratory lifespan dataset and a field dataset; preprocessing the two types of data and converting the laboratory degradation time into equivalent field usage time using an acceleration factor model; pre-training a priori lifespan inference model using the preprocessed laboratory data, synthetic data, and the mapped equivalent field time; inputting historical data of the target device into the priori lifespan inference model and directly outputting the lifespan prediction result; and using the lifespan prediction result for operation and maintenance decisions. This invention uses laboratory accelerated life testing as the main data source, combines a small amount of field data, and can infer lifespan status without field training. It can model the lifespan degradation of key components of charging guns under complex operating conditions, predict remaining lifespan, and assess failure risk.

This invention belongs to the field of automotive electronics reliability testing technology, and relates to a method and apparatus for accelerated life testing of controllers based on multi-stress coupling. The method includes: selecting an on-board electronic controller sample and performing performance testing; determining the core failure mechanism and stress limit boundary; constructing a multi-stress coupling life conversion model; designing a cyclic accelerated test profile; setting the test condition parameters of the on-board electronic controller sample; conducting accelerated life testing based on the cyclic accelerated test profile; determining the failure state of the on-board electronic controller sample according to multi-level failure criteria; solving the life conversion model using the failure data corresponding to the failure state; inputting the target operating condition parameters into the solved life conversion model; and calculating the corresponding actual service life according to a preset reliability target. This invention addresses industry pain points such as low life prediction accuracy, incomplete failure identification, and high verification costs for complex on-board electronic systems like smart cockpits throughout their entire lifecycle.

The invention relates to an accelerated life test system and method for a brain-computer interface implant, and the system comprises an implant test module which comprises at least one implant test module, and the implant test module is used for accommodating the brain-computer interface implant and testing the electrochemical performance of the brain-computer interface implant by using a test solution; the circulating pipeline is connected with the implant testing module and used for providing a testing solution, and the testing solution has a preset active oxygen concentration; the liquid monitoring module is connected with the circulating pipeline, and the liquid monitoring module is configured to monitor an electrochemical signal of the test solution; and the central control module is respectively connected with the implant test module, the circulating pipeline and the liquid monitoring module, and the central control module is configured to control the concentration of active oxygen according to the electrochemical signal. According to the invention, the overall test efficiency and test accuracy of the brain-computer interface implant can be improved.

The application relates to an accelerated life test system and method of a brain-computer interface implant, the accelerated life test system comprising: an implant test module group comprising at least one implant test module, the implant test module being used for accommodating the brain-computer interface implant and testing the electrochemical performance of the brain-computer interface implant by using a test solution; a circulating pipeline connected with the implant test module group, the circulating pipeline being used for providing the test solution, the test solution having a preset active oxygen concentration; a liquid monitoring module connected with the circulating pipeline, the liquid monitoring module being configured to monitor an electrochemical signal of the test solution; and a central control module connected with the implant test module group, the circulating pipeline and the liquid monitoring module respectively, the central control module being configured to control the active oxygen concentration according to the electrochemical signal. The application can improve the overall test efficiency and test accuracy of the brain-computer interface implant.

1. Name of the design product: high-accelerated life testing machine (large). 2. Use of the design product: the equipment for applying high temperature, high humidity, high pressure and other environmental conditions to electronic components, integrated circuits and other products to conduct reliability tests. 3. Design points of the design product: in shape. 4. Picture or photo that best indicates the design points: perspective view.

The invention discloses an accelerated life test method based on dynamic stress and a high-order interaction effect. The method comprises the following steps: firstly, acquiring CMAPSS multi-stress sensor data of NASA, and carrying out data preprocessing; secondly, on the basis of the generalized proportion advantage model, designing an acceleration test model, adding a dynamic stress function and a high-order stress interaction item into the model, and fitting parameters of the dynamic stress function by using preprocessed data to obtain a dynamic change rule of multiple stresses along with time; and finally, solving high-order stress interaction item parameters in the acceleration test model by adopting a maximum likelihood estimation method to obtain failure time distribution of the sensor under a multi-stress condition. Experiments prove that the method effectively solves the problems of dynamic stress change and multi-stress nonlinear interaction deficiency in an acceleration test, the sensor failure time prediction precision is improved, the prediction error of the method is lower than 10%, higher reliability and stability are shown under the multi-stress condition, and the method has good application prospects. The method can be widely applied to service life prediction and reliability optimization design of sensing equipment.

This invention relates to the field of ship and underwater vehicle sealing, specifically to an accelerated life testing and evaluation device for deep-sea submersible rudder shaft seals. The device includes a pressure system, a drive system, a monitoring system, and a control system. The pressure system provides the basic conditions required for testing, including pressure, temperature, load, and torque. The drive system is connected to the pressure system and provides the driving force required for testing. The monitoring system is connected to the pressure system and monitors the basic conditions required for testing. The control system is connected to both the pressure system and the drive system for integrated control of the testing and evaluation device. This invention comprehensively simulates the complex operating conditions of rudder shaft seals under high pressure, low temperature, particle and salinity conditions, variable speed, and additional loads and torque, enabling accelerated life testing and evaluation of deep-sea submersible rudder shaft seals under complex conditions.

The invention provides a lithium ion storage battery attenuation level and consistency rapid evaluation method, which is characterized by comprising the following steps: S1, determining a battery performance baseline and an initial state; s2, establishing a battery consistency evaluation model and a battery consistency evaluation system, wherein the consistency evaluation model is compiled according to the requirements in Q / RJ / Z232-2021 Statistical Process Control Application Guide for Space Products; s3, the batteries in batches are selected for an accelerated life test, and according to the initial state T1 and the accelerated aging state T2, the capacity retention rate eta 1, the energy retention rate eta 2 and the internal resistance expansion rate eta 3 are calculated; and S4, evaluating the battery consistency level by using the consistency evaluation model, wherein whether the production batch is abnormal or not is determined according to the point distribution on the control chart. According to the method, the defects of the to-be-characterized battery are subjected to consistency characterization after being exposed in a life test; the problems of long time consumption and low efficiency of the traditional life test are solved; and the battery production consistency is comprehensively and accurately evaluated.

The invention relates to the technical field of metal bipolar plate detection, and discloses a metal bipolar plate high and low temperature rapid cycle accelerated life test technology. The method specifically comprises the following steps: (1) preparing a metal bipolar plate sample; (2) determining experimental working conditions of high-temperature and low-temperature circulation of the metal bipolar plate; (3) metal bipolar plate high and low temperature rapid cycle experiment; and (4) comparing and testing the accelerated life of the metal bipolar plate: comparing whether the accelerated life test results of the metal bipolar plate subjected to high and low temperature rapid circulation exist or not, and judging the high and low temperature resistance of the metal bipolar plate sample. According to the invention, a high-low temperature test box is used, an accelerated life test model is constructed, and various properties of the metal bipolar plate subjected to high-low temperature rapid circulation are compared, such as bonding strength, corrosion resistance, conductivity, electrochemical characteristics, internal stability, coating state morphology and thickness change of the metal bipolar plate with a flow channel, and the like. And the method is very important to the popularization and application evaluation work of the metal bipolar plate with the coating.

This invention discloses a method for intermediate testing in a high-temperature accelerated life test of smart meters. All smart meter samples are divided into M groups, with N meters in each group. Each group is equipped with a circuit switch. The N groups of smart meter samples are connected in series with the input power supply via the circuit switch, and then connected to a load, forming a series circuit structure. The input power supply, load, and all sockets and plugs are placed outside the high-temperature test chamber. This invention performs intermediate testing every 72 hours, allowing the failure time of the samples in the high-temperature accelerated life test to be controlled within 72 hours. The longest time the tested sample is removed from the high temperature during intermediate testing is controlled to approximately 10 minutes, and the temperature decay is controlled within 3°C, keeping the impact of temperature decay on measurement accuracy within an acceptable range. The method of removing the samples from the high-temperature test chamber only requires personnel to wear ordinary cotton gloves to prevent injury from the high temperature of the samples.

A method for reliability calculation of a Printed Circuit Board Assembly (PCBA) (904), the method comprises: configuring an algorithm to perform High Accelerating Life Testing (HALT) analysis of a plurality of components located on the PCBA (904) in a simulating environment, the HALT analysis comprises of steps: providing PCBA (904) layout information so as to draw virtual pattern of the plurality of components; determining sequence of a plurality of testing parameters; setting a targeted failure rate; monitoring performance and obtaining data for each of the plurality of testing parameters; analyzing data so as to predict failure rate of the PCBA (904), accurately.

The utility model provides a highly accelerated life experiment device, comprising: an experiment box, in which an experiment cavity is arranged; the humidity adjusting unit is communicated with the experiment cavity, and the humidity adjusting unit can controllably introduce gases with different humidities into the experiment cavity; and the pressure control unit is communicated with the experiment cavity, and the pressure control unit is used for automatically controlling the pressure in the experiment cavity. According to the highly accelerated life experiment device, through cooperative work of the humidity adjusting unit and the pressure control unit, it can be ensured that the pressure in the experiment cavity is kept constant in the humidity adjusting process, so that interference of pressure fluctuation on an experiment result is effectively avoided, and then the reliability and accuracy of the experiment result can be effectively improved.

This application belongs to the field of oil well logging tool technology, specifically a well logging tool reliability analysis method based on digital twins and dynamic stress boundaries. The method includes: constructing a digital twin model of the well logging tool; establishing a virtual-physical interactive connection; performing virtual accelerated testing using the digital twin model to acquire virtual test data; performing high-acceleration life testing on a physical prototype based on dynamic stress boundaries generated from historical operating data; simultaneously acquiring physical test data; comparing and verifying the physical test data with the virtual test data; adjusting the simulation process based on the comparison and verification results; regenerating virtual test data; fusing the virtual test data and physical test data; using graph neural networks for correlation analysis; identifying coupled failure modes; and constructing a predictive health management model. This forms a complete closed loop from virtual design verification to physical test calibration and then to on-site data feedback optimization, enabling reliability to continuously increase throughout the product's entire lifecycle.

The utility model relates to the technical field of highly accelerated life test systems, and discloses a wide-frequency-domain vibration test device for simulating seismic rock stratum impact dynamics. According to the device, a hammer core (21) in a pneumatic hammer (4) collides with the front wall of a sleeve (20) under the pushing of compressed air to generate earthquake-like impact vibration, and vibration energy is conducted to a table top (1) through a square block seat (3) and a net-shaped layer (2); by adjusting the number, the installation direction and the angle of the pneumatic hammers, the table top is excited to generate three-axis six-degree-of-freedom wide-frequency-domain random vibration, and the device is suitable for high-frequency and wide-frequency-domain vibration testing. The device controls the pressure of compressed air through the electric proportional valve (10), collects and feeds back vibration data in real time through the vibration acceleration sensor (11), forms a closed-loop control system, realizes accurate regulation and control of vibration energy, and meets the requirements of high-acceleration service life testing of various products.

The application provides a packaging method of an enhanced gallium nitride power semiconductor device, and belongs to the technical field of chip manufacturing. The application firstly optimizes the electrode spacing and dielectric layer parameters through three-dimensional electric field distribution simulation, then realizes efficient thermal connection of the chip and the heat dissipation substrate by using a silver sintering process, and designs a multilayer field plate structure to disperse the high electric field area. Then, a high dielectric constant resin layer and a low ion content epoxy molding compound are applied for insulation and packaging, and a siloxane modified polyimide protective layer is coated. The reliability is verified through electric field resistance tests, high acceleration life tests and thermal cycle tests, the micro-nano channel structure is formed by using a focused ion beam technology to relieve the local high electric field area, and finally, the performance and life of the device are evaluated based on an electric field distribution and reliability prediction model of a deep learning framework, so that the reliability problem of the gallium nitride power semiconductor device in a high voltage working environment is solved.

The invention relates to the technical field of compressor testing, in particular to air conditioner compressor accelerated life testing equipment which comprises a testing table, a testing bin and two airflow pipes installed on the testing bin, the two airflow pipes are connected with an air inlet and an air outlet of a compressor respectively, and a plurality of marking plates are arranged on the testing table. The plurality of marking plates are arranged at intervals from low to high along the vertical direction, and marking paper tapes are movably mounted on the marking plates. When the accelerated life test equipment for the air conditioner compressor is used, the pressure difference between an air inlet and an air outlet of the compressor is used as direct driving force; the mark block is triggered to automatically generate the abnormal mark on the mark paper tape of the preset height layer, real-time and autonomous recording of pressure abnormity in dynamic start-stop circulation is achieved, the pressure difference serves as a core physical parameter of the working state of the compressor, abnormal changes are directly converted into mechanical actions of the mark block, delay and distortion of a signal conversion link are eliminated, and the reliability of the compressor is improved. And the instantaneity and authenticity of abnormal event recording are ensured.

This invention relates to a method for enhancing the lifespan of coated titanium electrodes using a polymer-modified coating solution. Compared to electrodes prepared with conventional coating solutions without polymer modification, the electrode coating prepared with the polymer-modified solution exhibits a 20-50% reduction in crack size, a 0.8-2.4-fold increase in accelerated life testing lifespan, and a 1-2.5-fold increase in lifespan during frequent reverse electrolysis of tap water. The polymer-modified coating solution method is applicable to coated titanium electrodes with various active coatings, including but not limited to RuO2-TiO2 coatings, RuO2-TiO2-IrO2 coatings, RuO2-TiO2-SnO2 coatings, and IrO2-Ta2O5 coatings. Furthermore, the polymer-modified coating solution method is compatible with existing industrial electrode manufacturing processes, namely the surface coating thermal decomposition process, and is easily scaled up for production.

The present disclosure relates to a product testing method and apparatus integrating accelerated life test and accelerated degradation test, computer device, storage medium and computer program product. The method includes, performing failure mode analysis on components of a product to be evaluated, classifying the components into sudden failure components and degradation failure components, performing accelerated life tests on the sudden failure components to determine a first cumulative failure probability function of each of the sudden failure components, performing accelerated degradation tests on the degradation failure components to determine a second cumulative failure probability function of each of the degradation failure components, and determining a reliability of the product to be evaluated based on the first cumulative failure probability function and the second cumulative failure probability function.