Highly accelerated life testing system for electronic products and method using same

Abstract

The invention discloses a highly accelerated life testing system for electronic products. The highly accelerated life testing system for electronic products comprises a closed chamber, a plurality of electronic products to be tested, a vibration stress testing system, a thermal stress testing system and a plurality of vibration stress accelerometers. The vibration stress testing system comprises a vibrating table disposed in the closed chamber, a testing fixture with the electronic products to be tested is fixed on the vibrating table, and the vibration stress accelerometers are disposed on a printed circuit board inside each electronic product to be tested. The thermal stress testing system comprises a cold and heat source feed-discharge device communicated with the upper portion of the closed chamber, and a plurality of thermocouples are disposed on the printed circuit board inside each electronic product. The vibration stress accelerometers and the thermocouples are electrically connected with a test control computer. The invention further discloses a method using the highly accelerated life testing system for electronic products. The defects of the electronic products can be detected effectively, reliability is improved, and a basis of screening of type of stress and setting of magnitude of stress is provided for a later highly accelerated stress screen test.

Description

technical field [0001] The present invention relates to the reliability design of electronic product, particularly relate to a kind of HALT (Highly Accelerated Life Test, highly accelerated life test) system and method thereof for electronic product, be applicable to the PCBA (Print Circuit Board Assembly, printing circuit board assembly of electronic product) Circuit board) Reliability design of thermal stress and vibration stress in the early design stage. Background technique [0002] It is very necessary to carry out reliability design in the sample design stage of electronic products. Reliability testing usually uses HALT (Highly Accelerated Life Test, Highly Accelerated Life Test), which can find out the defects of the product in the early design, and then improve the design to improve the reliability index, thereby reducing the chance of product failure in the hands of customers. probability. [0003] The so-called Highly Accelerated Life Test (HALT) is a process fo...

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a highly accelerated life test system and its method

Images