Multi-stress accelerated life monitoring and testing system based on automatic photoelectric parameter acquisition

Abstract

The invention provides a multi-stress accelerated life monitoring and testing system based on automatic photoelectric parameter acquisition and relates to accelerated life testing and monitoring systems for semiconductor lighting products, belonging to the field of electric light source and lighting measurement technologies. The system comprises an accelerated aging device, an automatic illuminance acquisition device and a control device, wherein the accelerated aging device is used for supplying voltage stress and temperature stress to the accelerated aging of a sample and comprises a platform which is used for sample aging, the automatic illuminance acquisition device comprises an illuminance detector which is used for carrying out automatic and online acquisition on the illuminance of the sample, and the control device is used for controlling the aging time and regular automatic acquisition time of the sample. According to the system, a multi-stress accelerated aging system and automatic acquisition test are combined. The system has the advantages that the temperature and voltage stress accelerated aging for the sample is realized, photoelectric parameters are automatically acquired, and the change of the maintenance rate of the photoelectric parameters is monitored; a basis is supplied to the establishment of a life prediction model; and the uncertainty and cumbersome degree of manual measurement for single samples are avoided, and the time for normal life tests is shortened.

Description

technical field [0001] The present invention relates to an accelerated life testing and monitoring system for semiconductor lighting products (hereinafter referred to as SSL products), with the photoelectric parameter automatic collection, monitoring and testing system as the carrier, especially the photoelectric measurement of SSL lighting bulbs and lamps, which belongs to electric light source and lighting measurement technology field. Background technique [0002] SSL products currently on the market claim to have a long lifespan. The lifespan of SSL products stipulated by the US Energy Star standard needs to be at least 25,000 hours, and the long time of 25,000 hours cannot be verified by normal lighting aging. It is necessary to shorten the lighting aging time. For verification, that is, by applying stress, the aging is accelerated and the verification time is shortened. [0003] The basis for verifying its end of life is to measure its 70% lumen maintenance rate accor...

AI Technical Summary

Problems solved by technology

[0004] The patent application number is 201110435006.8, and the title of the invention is the system and method for photoelectric thermal aging comprehensive detection of light-emitting diodes. It discloses a method for automatically detecting the luminous intensity of light-emitting diodes, which accelerates aging by means of current and temperature stress on the device. Because it focuses on the research on devices, it is obviously different from the actual detection of the illuminance of SSL terminal light sources or lamps, etc., and cannot meet the research requirements on SSL terminal products.