Non-parallel storage life test evaluation method based on accelerating factor feasible region selection

A storage life test, acceleration factor technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as product performance degradation and errors

Active Publication Date: 2015-06-03
BEIHANG UNIV
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Problems solved by technology

[0003] The current accelerated life test evaluation method is mainly aimed at new products, but in practical applications, the life evaluation of non-parallel storage products is carried out after storage for a certain period of time, and environmental factors such as temperature, humidity, and radiation during storage will cause The performance of the product is degraded, and storage is also equivalent to a period of testing for the product
Because the environmental stress in the storage process is relatively small compared with the test stress, the storage data is often ignored and only the accelerated life test data is considered. However, storage is a long-term process. If the storage information is ignored, the evaluation result will be different from the real value. There is a certain error between them, so the life evaluation of non-parallel storage products cannot be carried out simply by using existing methods, and the influence of environmental stress on products during storage must be considered

Method used

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  • Non-parallel storage life test evaluation method based on accelerating factor feasible region selection
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  • Non-parallel storage life test evaluation method based on accelerating factor feasible region selection

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Embodiment Construction

[0094] The present invention will be further described in detail below in conjunction with examples.

[0095] Preliminary work of the present invention:

[0096] The life of a stored gyro obeys the Weibull distribution, and a timed censored accelerated life test is performed to evaluate its life. The storage time is shown in Table 1.

[0097] The storage temperature is 20°C, and the test temperatures are 45°C, 57°C, 69°C, and 80°C, respectively.

[0098] The acceleration model is the Arrhenius model:

[0099] η = Aexp(E / kT) (10)

[0100] Where A is a positive constant, E is the activation energy, k=1.38×10 -23 J / K, is the Boltzmann constant.

[0101] Taking the logarithm on both sides, we can get

[0102] lnη=a+bx

[0103] where a=lnA, Therefore, the logarithm of the characteristic lifetime is a linear function of the inverse of temperature.

[0104] The test data are shown in Table 1.

[0105] Table 1 Test data

[0106]

[0107]

[0108] Note: d means day.

...

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Abstract

The invention discloses a non-parallel storage life test evaluation method based on accelerating factor feasible region selection. The method comprises the following steps: I, calculating an accelerating factor and comprehensive failure time; II, discussing an accelerating factor feasible region; III, performing parameter selection by using an optimal linear unbiased estimation method; IV, calculating the point estimation and interval estimation of logarithm reliable life. Specific to the phenomenon of missing of storage data in non-parallel storage product life estimation, storage data and test data are integrated, and calculation is performed by making full use of data on the basis that the service life follows Weibull distribution, so that the accuracy of life model parameter estimation is ensured, an algorithm has low requirement on the initial value of a parameter, the algorithm iteration is rapid and simple, and the operability is high.

Description

technical field [0001] The invention relates to a non-parallel storage life test evaluation method based on the selection of the feasible range of the acceleration factor, which aims at the Weibull distribution life model, based on the different storage data of the product and the data of the constant stress accelerated life test, and determines the feasible range of the acceleration factor Discuss and use the best linear unbiased estimation method to evaluate the life of the product. It is suitable for fields such as life extension test life evaluation. Background technique [0002] For expensive military equipment, after the storage period is reached, a life extension test is required to re-evaluate its storage life and prepare for the next work plan. Due to the limitation of the number of samples, the products subjected to the life extension test may experience different storage times before the test, and we call these products non-parallel storage products. In the face...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 马小兵王红雨赵宇常士华
Owner BEIHANG UNIV
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