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X-ray interferometric imaging system

a technology of interferometry and imaging system, which is applied in the direction of instruments, patient positioning for diagnostics, and application, can solve the problems of difficult unambiguous detection of tumors or anomalous tissue, difficult x-ray power, and simple absorption contrast imaging, and achieves high thermal conductivity, high x-ray brightness, and large x-ray power.

Inactive Publication Date: 2015-04-30
SIGRAY INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The invention uses a special x-ray target made of a high-Z material in close thermal contact or embedded within a substrate made of a low-Z material with high thermal conductivity, such as beryllium or diamond. This allows for higher electron density and power, resulting in greater x-ray brightness and power from each sub-source. This creates individual, well-separated spatially coherent x-ray sub-sources while minimizing the production of x-rays from the substrate that can lead to a reduction in image contrast.

Problems solved by technology

Although x-ray shadowgraphs have become a standard medical diagnostic tool, there are problems with simple absorption contrast imaging.
Notably, for tests such as mammograms, variations in biological tissue may result in only a subtle x-ray absorption image contrast, making unambiguous detection of tumors or anomalous tissue difficult.
However, for the prior art configurations described so far, x-ray power is a problem.
However, electron bombardment of the target also causes heating, and the x-ray power that can be achieved is limited by the maximum total electron power that can fall on the microspot without melting the x-ray generating material.
A limited electron power means a limited x-ray power, and the low x-ray flux achievable with typical x-ray targets may lead to unacceptable long exposure times when used, for example, for mammography or other diagnostic tests involving live patients or animals.
The total x-ray flux can be increased by distributing higher electron power over a larger area, but then the source becomes less coherent, degrading the image contrast.
Coherent x-rays of higher brightness and sufficient flux can be achieved by using a synchrotron or free-electron laser x-ray source, but these machines may occupy facilities that cover acres of land, and are impractical for use in clinical environments.
Unfortunately, the current art of Talbot-Lau GBIs have many constraints for most practical applications such as clinical imaging, including a requirement that both the source grating G0 and the analyzer grating G2 have fine pitches and apertures with large aspect ratios.
In this case, about 75% of the x-rays from the source are blocked due to area shadowing alone, and when gratings with large aspect ratios are used, greater losses occur due to angular shadowing.
As a result, both the G0 and G2 gratings must have small apertures and be of thickness sufficient to minimize unwanted x-ray transmission, which limits the efficient use of the x-rays from the source.
Furthermore, the loss from the analyzer grating G2 further results in a significantly higher dose (relative to the same system without a G2 grating) for the object under investigation to produce an image with good characteristics due to multiple exposures for phase-stepping and absorption of x-rays resulting in lower signal-to-noise.
When the object under investigation is a live animal or human, higher doses of ionizing radiation are undesirable and generally discouraged.
Smaller apertures can increase the possible image contrast and resolution by improving spatial coherence, but decreases the overall number of x-rays in the system, thus requiring longer exposure times. Moreover, with smaller apertures, these fine gratings become more difficult to manufacture.
Furthermore, building absorbing gratings such as G0 and G2 for these higher energy, shorter wavelength x-rays can present difficulties, as the thickness of the gratings must increase exponentially to maintain the same absorption factor for higher energy x-rays (the x-ray attenuation length is approximately proportional to Ekev3).
The preceding problems of Talbot-Lau GBIs using linear gratings, which can be used for collecting interference data in one dimension only, become more severe if one wishes to generate phase-contrast images in two orthogonal directions.
In addition to challenges associated with the imaging and registration processes, this approach may not be practical, especially when used with living subjects who may move or simply become impatient, and who will incur increased dosage (doubled) if the phase stepping must be performed in two directions.

Method used

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Embodiment Construction

1. Descriptions of Various Embodiments of the Invention

[0083]One embodiment of the invention disclosed herein is an x-ray phase-contrast imaging (XPCI) system as illustrated in FIG. 9. The system bears some similarity to the prior art Talbot-Lau interferometer, in that it comprises a beam splitting grating G1 210 of period p1 that establishes a Talbot interference pattern, and an x-ray detector 290 typically comprising an array of sensors to convert two-dimensional x-ray intensities into electronic signals. The beam splitting grating G1 210 may be a phase grating or a transmission grating, and may comprise 1-D periodic patterns (linear gratings), or may comprise more complex 2-D structures such as a grid that is periodic in two orthogonal directions. The system may also comprise an analyzer grating G2 220 of period p2 that may be placed in front of the detector to form additional interference fringes, such as Moiré fringes. The system may additionally comprise a means 225 to transla...

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Abstract

We disclose an x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, and a means to translate the second grating G2 relative to the detector.In some embodiments, the structures are microstructures with lateral dimensions measured on the order of microns, and with a thickness on the order of one half of the electron penetration depth within the substrate. In some embodiments, the structures are formed within a regular array.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This Patent Application claims the benefit of U.S. Provisional Patent Application Nos. 61 / 898,019, entitled “X-ray Phase Contrast imaging System” and filed on Oct. 31, 2013; 61 / 901,361, entitled “An X-ray Source Consisting of an Array of Fine Sub-Sources” and filed on Nov. 7, 2013; and 61 / 981,098 entitled “Two Dimensional Phase Contrast Imaging Apparatus” and filed Apr. 17, 2014, all of which are incorporated herein by reference in their entirety.FIELD OF THE INVENTION[0002]The embodiments of the invention disclosed herein relate to interferometric imaging systems using x-rays, and in particular, interferometric imaging systems comprising high-brightness sources of x-rays for generating phase-contrast images. The high brightness x-ray sources may use anodes or targets comprising periodic microstructures of x-ray generating materials embedded in a thermally conducting substrate of low atomic number material.BACKGROUND OF THE INVENTION[0003...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): A61B6/00
CPCA61B6/4291A61B6/508A61B6/4007A61B6/484G21K2207/005G01N23/041H01J35/12A61B6/035A61B6/032A61B6/4035A61B6/4233H01J35/112A61B6/0407A61B6/4208A61B6/40A61B6/42G01N23/046A61B6/04A61B6/0487A61B6/502
Inventor YUN, WENBINGLEWIS, SYLVIA JIA YUNKIRZ, JANOSLYON, ALAN FRANCIS
Owner SIGRAY INC
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