X-ray interferometric imaging system

a technology of interferometry and imaging system, which is applied in the direction of instruments, patient positioning for diagnostics, and application, can solve the problems of difficult unambiguous detection of tumors or anomalous tissue, difficult x-ray power, and simple absorption contrast imaging, and achieves high thermal conductivity, high x-ray brightness, and large x-ray power.
US20150117599A1Inactive Publication Date: 2015-04-30SIGRAY INC
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Applications(United States)
Current Assignee / Owner
SIGRAY INC
Publication Date
2015-04-30
Estimated Expiration
Not applicable · inactive patent

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Abstract

We disclose an x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, and a means to translate the second grating G2 relative to the detector.In some embodiments, the structures are microstructures with lateral dimensions measured on the order of microns, and with a thickness on the order of one half of the electron penetration depth within the substrate. In some embodiments, the structures are formed within a regular array.
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Description

CROSS-REFERENCE TO RELATED APPLICATIONS

[0001] This Patent Application claims the benefit of U.S. Provisional Patent Application Nos. 61 / 898,019, entitled “X-ray Phase Contrast imaging System” and filed on Oct. 31, 2013; 61 / 901,361, entitled “An X-ray Source Consisting of an Array of Fine Sub-Sources” and filed on Nov. 7, 2013; and 61 / 981,098 entitled “Two Dimensional Phase Contrast Imaging Apparatus” and filed Apr. 17, 2014, all of which are incorporated herein by reference in their entirety.FIELD OF THE INVENTION

[0002] The embodiments of the invention disclosed herein relate to interferometric imaging systems using x-rays, and in particular, interferometric imaging systems comprising high-brightness sources of x-rays for generating phase-contrast images. The high brightness x-ray sources may use anodes or targets comprising periodic microstructures of x-ray generating materials embedded in a thermally conducting substrate of low atomic number material.BACKGROUND OF THE INVENTION[0003...

Claims

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