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2495results about "Material analysis using radiation diffraction" patented technology

X-ray inspection system for detecting explosives and other contraband

InactiveUS7092485B2Rapidly and accurately discriminates among different substancesQuick checkUsing wave/particle radiation meansMaterial analysis by transmitting radiationX-rayExplosive material
A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item. The interrogation volume is illuminated with penetrating, polychromatic x-rays in a primary fan beam from a source such as a tungsten-anode x-ray tube. An energy-dependent absorption correction is determined from measurement of the attenuation of the fan beam at a plurality of different energies. Radiation coherently scattered by substances in the interrogation volume is detected by an energy-resolved x-ray detector operated at a plurality of scattering angles to form a plurality of scattering spectra. Each scattering spectrum is corrected for energy-dependent absorption and the corrected spectra are combined to produce a scattering pattern. The experimental scattering pattern is compared with reference patterns that uniquely characterize known contraband substances. The system and method can locate and identify a wide variety of contraband substances in an accurate, reliable manner. The system provides for automated screening, with the result that vagaries of human performance are virtually eliminated. False alarms and the need for hand inspection are reduced and detection efficacy is increased.
Owner:CONTROL SCREENING

Multi-parameter X-ray computed tomography

The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide range of applications, including medical imaging, security screening, and industrial non-destructive testing to name a few. Specifically provided as embodiments of the invention are systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone. Such systems can be configured to comprise at least two collimator-and-detector assemblies or configurations differing with respect to collimator height, collimator aperture, imaging geometry, or distance between an object subjected to the imaging and the collimator-and-detector assembly.
Owner:VIRGINIA TECH INTPROP INC

Method and apparatus for generating sequential beams of penetrating radiation

An apparatus and method for generating electronically steerable beams of sequential penetrating radiation. Charged particles from a source are formed into a beam and accelerated to a target. Electromagnetic radiation generated by the target is emitted with an angular distribution which is a function of the target thickness and the energy of the particles. A beam of particles is produced by allowing the radiation to exit from an apparatus through a collimator proximal to the target. The direction of the beam is determined by the point of radiation production and the corresponding array of transmission regions of the collimator.
Owner:SILICON VALLEY BANK

Method of electrowetting droplet operations for protein crystallization

InactiveUS7763471B2Easy to useFacilitates of propertySamplingBiological testingChemical physicsActuator
Methods of using protein crystallization droplet actuators are provided. Protein sample droplets and reagent droplets are dispensed, transported, and merged to yield an array of crystallization conditions by electrowetting droplet operations in a gap comprising oil filler fluid. The oil filler fluid is doped with a surfactant that enhances droplet operations using the protein sample.
Owner:ADVANCED LIQUID LOGIC +1

X-ray reflectometry with small-angle scattering measurement

Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.
Owner:BRUKER TECH LTD

X-ray imaging system and imaging method

The present invention provides an apparatus capable of X-ray imaging utilizing phase of X-rays. An X-ray imaging apparatus equipped with first and second diffraction gratings and an X-ray image detector are described. The first diffraction grating generates a Talbot effect and a second diffraction grating diffracts X-rays diffracted by the first diffraction grating. An image detector is provided to detect the X-rays diffracted by the second diffraction grating. In this manner, image contrasts caused by changes in phase of X-rays due to a subject arranged in front of the first diffraction grating or between the first diffraction grating and the second diffraction grating can be achieved.
Owner:MOMOSE ATSUSHI

X-Ray Inspection Trailer

An inspection system, and inspection methods, based upon an imaging enclosure characterized by an enclosing body. A source of penetrating radiation and a detector module are concealed entirely within the body of a conveyance such as a trailer. A characterizing value or an image is formed with respect to an inspected object that is disposed entirely outside the conveyance and the characterizing value or image is made available to a remotely disposed operator. Additional detectors may be disposed distally to the inspected object and may detect transmitted, or forward-scattered, penetrating radiation.
Owner:AMERICAN SCI & ENG INC

Protein Crystallization Droplet Actuator, System and Method

Protein crystallization droplet actuators, systems and methods are provided. According to one embodiment, a droplet actuator for providing an array of crystallization conditions is provided and includes: (a) two or more processing reservoirs; (b) two or more dispensing reservoirs collectively comprising two or more crystallization reagents; and (c) a port for introducing a sample for crystallization analysis. Systems including the droplet actuator, methods of providing an array of crystallization conditions, and methods of identifying crystallization conditions are also provided.
Owner:ADVANCED LIQUID LOGIC +1

X-ray diffraction-based scanning system

An x-ray diffraction-based scanning method and system are described. The method includes screening for a particular substance in a container at a transportation center using a flat panel detector having a photoconductor x-ray conversion layer to detect x-rays diffracted by a particular substance in the container. The diffracted x-rays may be characterized in different ways, for examples, by wavelength dispersive diffraction and energy dispersive diffraction.
Owner:VARIAN MEDICAL SYSTEMS

Multifunction X-ray analysis system

Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a first, converging beam of X-rays toward a surface of the sample and to direct a second, collimated beam of the X-rays toward the surface of the sample. A motion assembly moves the radiation source between a first source position, in which the X-rays are directed toward the surface of the sample at a grazing angle, and a second source position, in which the X-rays are directed toward the surface in a vicinity of a Bragg angle of the sample. A detector assembly senses the X-rays scattered from the sample as a function of angle while the radiation source is in either of the first and second source configurations and in either of the first and second source positions. A signal processor receives and processes output signals from the detector assembly so as to determine a characteristic of the sample.
Owner:BRUKER TECH LTD

CD-GISAXS System and Method

CD-GISAXS achieves reduced measurement times by increasing throughput using longer wavelength radiation (˜12×, for example) such as x-rays in reflective geometry to increase both the collimation acceptance angle of the incident beams and the scattering signal strength, resulting in a substantial combined throughput gain. This wavelength selection and geometry can result in a dramatic reduction in measurement time. Furthermore, the capabilities of the CD-GISAXS can be extended to meet many of the metrology needs of future generations of semiconductor manufacturing and nanostructure characterization, for example.
Owner:CARL ZEISS X RAY MICROSCOPY

X-ray imaging system and imaging method

The object of the present invention is to provide an apparatus capable of X-ray imaging utilizing phase of X-rays with a simple construction. The X-ray imaging apparatus of the present invention is equipped with first and second diffraction gratings and an X-ray image detector. The first diffraction grating is constructed to generate the Talbot effect using X-rays irradiated at the first diffraction grating. The second diffraction grating is configured so as to diffract the X-rays diffracted by the first diffraction grating. The X-ray image detector is configured so as to detect the X-rays diffracted by the second diffraction grating. By diffracting X-rays diffracted by the first diffraction grating, the second diffraction grating is capable of forming image contrast caused by changes in phase of X-rays due to the subject arranged in front of the front surface of the first diffraction grating or between the first diffraction grating and the second diffraction grating. The X-ray image detector is capable of detecting X-rays creating image contrast.
Owner:MOMOSE ATSUSHI

X-ray inspection system for detecting explosives and other contraband

A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item. The interrogation volume is illuminated with penetrating, polychromatic x-rays in a primary fan beam from a source such as a tungsten-anode x-ray tube. An energy-dependent absorption correction is determined from measurement of the attenuation of the fan beam at a plurality of different energies. Radiation coherently scattered by substances in the interrogation volume is detected by an energy-resolved x-ray detector operated at a plurality of scattering angles to form a plurality of scattering spectra. Each scattering spectrum is corrected for energy-dependent absorption and the corrected spectra are combined to produce a scattering pattern. The experimental scattering pattern is compared with reference patterns that uniquely characterize known contraband substances. The system and method can locate and identify a wide variety of contraband substances in an accurate, reliable manner. The system provides for automated screening, with the result that vagaries of human performance are virtually eliminated. False alarms and the need for hand inspection are reduced and detection efficacy is increased.
Owner:CONTROL SCREENING

X-ray inspection with contemporaneous and proximal transmission and backscatter imaging

An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.
Owner:AMERICAN SCI & ENG INC

High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source

A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
Owner:CARL ZEISS X RAY MICROSCOPY

X-ray inspection system

PCT No. PCT / GB96 / 00195 Sec. 371 Date Oct. 20, 1997 Sec. 102(e) Date Oct. 20, 1997 PCT Filed Jan. 30, 1996 PCT Pub. No. WO96 / 24863 PCT Pub. Date Aug. 15, 1996An X-ray inspection system comprises an X-ray source (1) disposed to irradiate an object to be inspected (4) with a beam of X-rays in the form of a fan project from the source (1) through the object (4), detection means (6) capable of discriminating between the intensitities of X-rays coherently scattered through the object (4) at different angles to produce an output signal dependent on the intensity of the X-rays scattered through each of those angles and analyzing means (not shown) operably connected to the detention means (6) to process the output signal to determine the presence of X-rays coherently scattered through one or more pre-determined angles. Collimination means (23) is provided between the detection means (6) and the object (4) and is adapted to pass only X-rays coherently scattered at the different angles from a limited voxel (volume element) depth central at point P. Movement at the collimator (23) along the direction of the beam together with translation of the object by e.g. a conveyor (5) in the direction (22) allows the whole volume of the object, such as an item of baggage, to be scanned.
Owner:THE SEC OF STATE FOR DEFENCE IN HER BRITANNIC MAJESTYS GOVERNMENT OF THE UK OF GREAT BRITAIN & NORTHERN IRELAND

Measurement System Optimization For X-Ray Based Metrology

Methods and systems for optimizing measurement system parameter settings of an x-ray based metrology system are presented. X-ray based metrology systems employing an optimized set of measurement system parameters are used to measure structural, material, and process characteristics associated with different semiconductor fabrication processes with greater precision and accuracy. In one aspect, a set of values of one or more machine parameters that specify a measurement scenario is refined based at least in part on a sensitivity of measurement data to a previous set of values of the one or more machine parameters. The refinement of the values of the machine parameters is performed to maximize precision, maximize accuracy, minimize correlation between parameters of interest, or any combination thereof. Refinement of the machine parameter values that specify a measurement scenario can be used to optimize the measurement recipe to reduce measurement time and increase measurement precision and accuracy.
Owner:KLA TENCOR TECH CORP

Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light

A system configured for measurement of a specimen is provided. The system includes an optical subsystem configured to perform measurements of the specimen. The optical subsystem includes a light source that is configured to generate light having a relatively large number of separated spectral peaks with substantially no continuous background. In some embodiments, the light may include vacuum ultraviolet light, extreme ultraviolet light, and / or soft x-rays. A carrier medium is also provided that includes program instructions executable on a computer system to analyze data generated by a detector of an optical subsystem by partitioning the data into individual peaks spaced apart across a wavelength spectrum. Partitioning the data preferably corrects for spectrum shift, drift, stretching, shrinking, or a combination thereof at the detector. The individual peaks correspond to separated spectral peaks in light generated by a light source of the optical subsystem.
Owner:KLA TENCOR TECH CORP

Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation

An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
Owner:UNIV OF MARYLAND BALTIMORE COUNTY

CD-GISAXS system and method

CD-GISAXS achieves reduced measurement times by increasing throughput using longer wavelength radiation (˜12×, for example) such as x-rays in reflective geometry to increase both the collimation acceptance angle of the incident beams and the scattering signal strength, resulting in a substantial combined throughput gain. This wavelength selection and geometry can result in a dramatic reduction in measurement time. Furthermore, the capabilities of the CD-GISAXS can be extended to meet many of the metrology needs of future generations of semiconductor manufacturing and nanostructure characterization, for example.
Owner:CARL ZEISS X RAY MICROSCOPY

System and method for displaying material characteristic information

A system and method for displaying graphical information indicative of a plurality of material characteristics for a portion of a part under test. Energy is directed at the selected portion of the part under test. Resultant energy is detected from the selected portion of the part under test and data representative of each of a plurality of material characteristics for the portion of the part under test is obtained based, at least in part, upon the detected energy. A plurality of graphs is formed based upon the obtained data. Each of the graphs has information indicative of a separate one of the plurality of material characteristics. The plurality of graphs is displayed discrete from each other in a manner that facilitates substantially simultaneous visual comparisons between the information contained in each of the plurality of graphs.
Owner:PROTO MANUFACTURING LTD

Multiple energy x-ray source for security applications

An x-ray inspection system for identifying fissile material includes one or more sources of penetrating radiation that generate first, second, and third instantaneous spectra where the object is exposed to the second only if there is no penetration of the first and the object is exposed to the third only if there is no penetration of the second. Further, the sources of the second and the third spectra are pulsed. Consequently, ambient levels of radiation may be held below cabinet levels while identifying objects containing fissile material.
Owner:AMERICAN SCI & ENG INC

X-ray inspection using spatially and spectrally tailored beams

A system and method for inspecting an object, the system and method comprising a source for generating a penetrating radiation beam for irradiating the object, the beam having, for each instant of time, an instantaneous energy spectrum of intensity, a shaper for modulating the generated beam, thereby creating a shaped beam, the shaper comprising at least a first section and a second section, the first section attenuating the intensity of a portion of the generated beam by a first attenuation factor and the second section attenuating the intensity of another portion of the generated beam by a second attenuation factor, and at least one detector for detecting the shaped beam after the shaped beam interacts with the object. The source may scan a beam across an object while the source and at least one detector are moving on a platform capable of highway travel or on an inspection module movable with respect to the object.
Owner:SILICON VALLEY BANK

Methods and systems for rapid detection of concealed objects using fluorescence

This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and / or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.
Owner:RAPISCAN SYST INC (US)

Methods and Systems for Rapid Detection of Concealed Objects Using Fluorescence

This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and / or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.
Owner:RAPISCAN SYST INC (US)

X-ray method for the measurement, characterization, and analysis of periodic structures

Periodic spatial patterns of x-ray illumination are used to gather information about periodic objects. The structured illumination may be created using the interaction of a coherent or partially coherent x-ray source with a beam splitting grating to create a Talbot interference pattern with periodic structure. The object having periodic structures to be measured is then placed into the structured illumination, and the ensemble of signals from the multiple illumination spots is analyzed to determine various properties of the object and its structures. Applications to x-ray absorption / transmission, small angle x-ray scattering, x-ray fluorescence, x-ray reflectance, and x-ray diffraction are all possible using the method of the invention.
Owner:SIGRAY INC
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