The invention provides a method and
system for detecting interface state
spatial distribution of a centrosymmetric material, and the method comprises the steps: carrying out the light splitting of a preset
laser pulse, and forming reference light and incident light; constructing a
kinoform, and modulating the incident light according to the
kinoform; irradiating the interface of the sample by using the modulated incident light to obtain reflected light; collecting
light intensity after the reflected light and the reference light are coherent, and judging whether the
light intensity meets a convergence condition or not; under the condition that the
light intensity does not meet the convergence condition, performing iterative optimization on the
kinoform; under the condition that the light intensity meets a convergence condition, taking the current kinoform as a target kinoform; and determining interface
state space distribution information of the sample according to the target kinoform. According to the invention, the dynamic compensation of the
wavefront distortion of the incident light is realized based on the iteration of the kinoform, the method is not only used for improving the quality of coherent light signals, but also used as a quantitative basis for reflecting the
wavefront modulation amount of the sample interface, and the interface electronic
state space distribution information of the sample can be obtained through the inversion of the method.