On-line measuring system using optical fiber grating synthetic wave for interfering step height
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- BEIJING JIAOTONG UNIV
- Publication Date
- 2008-02-20
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
Technical field
[0001] The invention relates to a synthetic wave interference step height measurement system using a fiber grating, in particular to a step height measurement system suitable for online measurement, and belongs to the technical field of optical measurement. Background technique
[0002] [1] D.P. Hand, T.A. Carolan, J.S. Barton, and J.D.C. Jones, Optics Letters, 1993, Vol. 18, No. 16, pages 1361-1363. The working principle of the prior art document [1] is shown in Figure 1. The light emitted by the semiconductor laser passes through the Faraday isolator and the optical fiber 50:50 coupler before reaching the measuring head. The measuring head is a Fizeau interferometer, and part of the light is The fiber end surface is reflected as the reference light, and the other part of the light is focused by the self-focusing lens and projected on the measured surface, reflected by the measured surface and then returned to the system and interfered with the reference light. T...