235 results about "Optical path length" patented technology

A high-resolution display device is provided. The display device includes a plurality of light-emitting units emitting light of different colors. The light-emitting unit has a microcavity structure and intensifies light with a specific wavelength. In the light-emitting units emitting light of different colors, reflective layers with different thicknesses are formed, an insulating layer is formed to cover the reflective layers, and then a top surface of the insulating layer is subjected to planarization treatment, whereby an insulating layer with different thicknesses is formed. After that, light-emitting elements emitting white light are formed over the planarized top surface of the insulating layer to overlap with the respective reflective layers, whereby the light-emitting units that intensify different colors due to different optical path lengths are separately formed.

A computer-implemented method for calculating a digital twin of a spectacle lens is provided to use the digital twin for a manufacture of the spectacle lens. The digital twin has a predefined power distribution and contains a layer stack with a plurality of individual layers, each layer having a non-uniform layer thickness with a spatial variation and a uniform refractive index. The method includes determining the spatial variation of the layer thicknesses of the individual layers to achieve the predefined power distribution by a spatial control of optical path lengths.

The invention belongs to the technical field of laser pulse modulation, and particularly relates to an ultrafast laser multi-pulse sequence preparation device and method. According to the invention, ultrafast pulse laser is divided into a transmission light path and a reflection light path through a beam splitter, a spatial light modulator is utilized to perform programming control on a target pulse in the transmission light path, and amplitude and pulse width parameters can be controlled while multiple pulse strings are generated; and the light path of the reflection light path is controlled through the high-precision one-dimensional displacement table, so that the time delay of a reflection light path pulse relative to a transmission light path pulse is controlled. And after the reflected light path and the transmission path subjected to pulse shaping are combined again, a periodic pulse string sequence with controllable time delay, pulse number, pulse width parameter and pulse intensity is realized. The problem that high-precision multi-pulse dynamic programming cannot be achieved through a traditional adjusting mode is solved, and the problems that in the prior art, the number of excitation pulses and pulse width parameters cannot be controlled at the same time, and an ordered periodic pulse sequence cannot be generated are solved.

A method and instrument for determining optical density of a solution is disclosed. A flow cell 1 having at least three light paths (4a, 4b, 4c) is provided (100), wherein each light path has a respective predetermined path length, l. Absorbance readings are taken (400), A, of the solution at the at least three light paths (4a, 4b, 4c). For each pair of light paths, a slope, αc, is calculated (500) by dividing a difference in absorbance reading, ΔA, with a difference in path length, Δl. The calculated slopes, αc, are compared (600), and a) if the calculated slopes, αc, are the same, the slope is used for determining (700) optical density of the solution, or b) if the calculated slopes, αc, are not the same, the steepest slope of the calculated slopes is used for determining (701a) optical density of the solution, or the slope of the calculated slopes being in the range of an absorbance reading of 0.01 to 2 is used for determining (701b) optical density of the solution.

The invention relates to the technical field of ship emission monitoring, in particular to a ship emission telemetering method based on multiband spectrum inversion, which comprises the following steps of: acquiring O4 differential inclined column concentration along the horizontal direction by utilizing shore-based multiband telemetering, calculating effective light path lengths of different bands, dividing the NO2 horizontal column concentration subjected to synchronous inversion by the effective light path lengths, and calculating the ship emission telemetering result. The average concentration on the horizontal path is obtained, and NO2 concentrations of different horizontal layers are separated based on multiband inversion; the method comprises the following steps: constructing a ship plume model in which a ship navigation trajectory is coupled with a Gaussian plume model on the basis of ship AIS (Automatic Identification System) data in combination with wind direction and wind speed information, matching plume trajectories of different ships with passed concentration layers, and quantifying the concentration of NO2 discharged by a single ship in combination with plume width information calculated by the ship plume model. According to the method, the emission condition of the in-flight ship is evaluated based on a telemetering means, monitoring can be carried out under the condition that normal navigation of the ship is not interfered, and powerful technical means and data support are provided for ship emission supervision.

The invention relates to the technical field of optical imaging, and discloses an AR optical projection machine and an optical display system, the projection machine comprises a projection lens group, a color combination prism assembly and a three-color display array; the projection lens group comprises a diaphragm STO, a first lens, a second lens, a third lens and a fourth lens. The color combination prism assembly comprises a plurality of prisms which are glued with one another, and a film coating structure which is used for reflecting red light and blue light and transmitting green light is arranged on each prism; the three-color display array comprises three display chips; wherein the FOV (field of view) of the AR optical projection machine is greater than or equal to 30 degrees and less than or equal to 40 degrees; the ratio of the total optical length TTL of the AR optical projection machine to the effective focal length f of the system meets the condition that TTL / f is larger than or equal to 5.0 and smaller than or equal to 7. The field angle of the system is limited within the range of 30-40 degrees, the ratio of the total optical length TTL to the effective focal length f is kept within 5.0-7.7, an imaging field meeting the AR application requirement can be obtained within the limited optical path length, meanwhile, the overall compactness of the optical system is considered, and the optical system can be more easily integrated into small-size near-to-eye display equipment.

The utility model discloses a thulium-doped fiber laser based on a composite cavity structure. The thulium-doped fiber laser comprises a pumping source, a thulium-doped gain active fiber, a high-reflectivity fiber grating HR, a first low-reflectivity fiber grating OC1 and a second low-reflectivity fiber grating OC2, the self-pulse effect is inhibited by adopting a composite resonant structure, so that stable 2-micron fiber laser output is obtained; the overall optical path length is short, and self-pulse suppression can be more effectively achieved under the condition that the overall optical path length is short.

A medical imaging system includes a first imaging element that receives NIR light and outputs a first image signal, a second imaging element that receives normal light and outputs a second image signal, a third imaging element that receives at least normal light and outputs a third image signal, and a signal processing unit that performs depth-of-field extension processing to generate an extended-depth-of-field image using at least two of the first image signal, the second image signal, and the third image signal. The optical path length from a mount surface to the first imaging element is set to be longer than the optical path length from the mount surface to the second imaging element, and to be shorter than the optical path length from the mount surface to the third imaging element. The present technology can be applied to, e.g., a medical imaging system capable of capturing an EDOF image.

The invention discloses an optical fiber connector end face defect detection method and system based on a mixed attention mechanism and dynamic enhancement, and belongs to the technical field of industrial visual inspection. According to the method, the zero optical path difference position of a white light interference curve is obtained through quadratic Gaussian function fitting, and the sensitivity to tiny defect textures is enhanced in cooperation with a multi-dimensional mixed attention mechanism, channel attention and space attention; dynamic adaptive data enhancement is provided, an enhancement strategy is adjusted in real time based on a model training state, and sample diversity is optimized; and a layered pruning and dynamic quantification scheme is designed for edge computing equipment, so that high-precision real-time detection is realized, and the method has certain reference significance in surface defect detection application in the field of precision manufacturing.

The invention provides an organoid drug sensitivity automatic detection method and system for multi-sample parallel processing, and the method comprises the steps: obtaining the optical path length data of each hole site of a cell culture perforated plate, and determining the initial focal plane position of each hole site; matching the deformed feature point coordinates with the initial three-dimensional structure data of the similar organs, and calculating the focal plane offset caused by the deformation of the similar organs through least square fitting; adjusting the focal length of the optical imaging system according to the corrected focal plane position by adopting a fast focusing algorithm, and re-collecting an organ-like image; using a layer-by-layer stacked three-dimensional reconstruction algorithm to perform registration splicing on the recollected image sequence to obtain complete three-dimensional structure data after the organ-like body is deformed; and according to the complete three-dimensional structure data, extracting the volume, surface area and cell distribution density characteristics of the organoid, and generating a morphological characteristic report of the drug sensitivity experiment.

The invention discloses a two-photon N00N quantum state intelligent regulation and control device and method, and the device comprises an intelligent regulation and control module, and an entangled photon pair generation module, an HOM interferometer and a data collection module which are connected in sequence, and the entangled photon pair generation module transmits polarized orthogonal entangled photon pairs to two light paths in the HOM interferometer respectively; the data acquisition module is used for detecting and counting photons output by the two light paths respectively; the intelligent regulation and control module controls the first electric control time delay line on one light path and the electric control polarization controller on the corresponding light path so as to regulate the light path difference of the two light paths and the polarization state of photons output by the corresponding light path; every time control is completed, a second electric control time delay line on the other light path is controlled to carry out time delay scanning according to a set rule, and a coincidence counting rate and HOM visibility are obtained; and according to the coincidence counting rate and the HOM visibility, determining whether the two-photon N00N quantum state generated under the control is good or bad. According to the invention, intelligent regulation and control of the two-photon N00N quantum state quality can be realized.

Provided is a light scanning apparatus including a deflecting unit deflecting a light flux from a light source to scan a scanned surface in a main scanning direction, an imaging optical system including at least one optical element guiding light flux deflected by a deflecting surface of deflecting unit to scanned surface, and a reflecting element reflecting light flux. On an optical path of light flux from deflecting unit to scanned surface, reflecting element is arranged between deflecting unit and an optical element closest to deflecting unit among at least one optical element included in imaging optical system. An optical path length between an on-axis deflection point of deflecting surface and scanned surface on an optical axis of imaging optical system is equal to or less than a distance between outermost off-axis image heights on scanned surface.

Quantitative phase imaging (QPI) is a label-free computational imaging technique that provides optical path length information of objects. Here, a diffractive QPI network architecture is disclosed that can synthesize the quantitative phase image of an object by converting the input phase information of a scene or object(s) into intensity variations at the output plane. A diffractive QPI network is a specialized all-optical device designed to perform a quantitative phase-to-intensity transformation through passive diffractive / reflective surfaces that are spatially engineered using deep learning and image data. Forming a compact, all-optical network that axially extends only ˜200-300λ (λ=illumination wavelength), this framework replaces traditional QPI systems and related digital computational burdens with a set of passive substrate layers. All-optical diffractive QPI networks can potentially enable power-efficient, high frame-rate and compact phase imaging systems that might be useful for various applications, including, e.g., on-chip microscopy and sensing.

An optical displacement sensor comprises a reflective surface and one or more diffraction gratings which, together with the reflective surface, each define a respective interferometric arrangement. The reflective surface is moveable relative to the diffraction grating(s) or vice versa. Light from a light source propagates via the interferometric arrangement(s) to produce an interference pattern at a respective set of photo detectors. Each interference pattern depends on the separation between the reflective surface and the respective grating. A collimating optical arrangement at least partially collimates the light between the light source and the diffraction grating(s). For the or each interferometric arrangement, when the reflective surface or the diffraction grating is in a zero-displacement position, the optical path length L of the light propagating between the diffraction grating and the reflective surface satisfies the relationship:L=Tz⁢n2,to within 20% ofTz2, where n is an integer; where Tz is the Talbot length, defined by:Tz=λ1-1-λ2p2,where λ is the wavelength of the light, and where p is the grating period of the respective diffraction grating.

Provided is a pulse width expansion device for expanding the pulse width of a pulsed laser beam, the pulse width expansion device including a first optical pulse stretcher, a second optical pulse stretcher, a third optical pulse stretcher, and a fourth optical pulse stretcher disposed on the optical path of the pulsed laser beam, the first optical pulse stretcher, the second optical pulse stretcher, the third optical pulse stretcher, and the fourth optical pulse stretcher being disposed on the optical path of the pulsed laser beam. The optical path length of the delay optical path of the first optical pulse stretcher is L1, the optical path length of the delay optical path of the second optical pulse stretcher is L2, the optical path length of the delay optical path of the third optical pulse stretcher is L3, and the optical path length of the delay optical path of the fourth optical pulse stretcher is L4. When n is an integer of 2 or more, L2 is an integer multiple of 2 or more of L1, L3 satisfies (n-0. 75) * L1 < = L3 < = (n-0.25) * L1, and L4 satisfies (n-0.25) * L1 < = L4 < = (n + 0.25) * L1.

The present invention provides an interference measurement method and apparatus that can appropriately measure the physical properties of a sample in a non-contact manner. [Solution] The interference measurement method using the interference measurement device 1 includes: a first step of obtaining a first interference waveform W1 for each optical path length difference in the first state by performing measurements while changing the optical path length difference between the first optical path P1 and the second optical path P2 in a first state in which no sample S is placed in the second optical path P2; a second step of converting the first interference waveform W1 into a first electric field amplitude waveform WE1; a third step of obtaining a second interference waveform W2 for each optical path length difference in the second state by performing measurements while changing the optical path length difference in a second state in which a sample S is placed in the second optical path P2; a fourth step of converting the second interference waveform W2 into a second electric field amplitude waveform WE2; and a fifth step of obtaining measured values ​​regarding the physical properties of the sample S based on the electric field amplitudes corresponding to the peaks of the first electric field amplitude waveform WE1 and the second electric field amplitude waveform WE2, respectively.

A laser device includes an oscillator outputting pulse laser light; an amplifier amplifying the pulse laser light; an optical pulse stretcher extending a pulse width of the pulse laser light; a beam divergence angle adjuster including an upstream lens arranged on an optical path of the pulse laser light, a downstream lens arranged downstream of the upstream lens, and an optical path length changing mechanism for changing an inter-lens optical path length between the upstream lens and the downstream lens; and a processor controlling the beam divergence angle adjuster and obtaining a repetition frequency or a duty of the pulse laser light, and to change, when the repetition frequency or the duty changes by a preset threshold or more, the inter-lens optical path length so that the beam divergence angle of the extended pulse laser light becomes small in accordance with the repetition frequency or the duty after the change.

An optical computing system includes: an intensity modulation device group including at least two intensity modulation devices, each of which includes modulation cells, wherein each of the modulation cells of each of the intensity modulation devices carries out intensity modulation with respect to carrier light in accordance with one of signals to generate a signal light beam, and each of the signals corresponds to each of the intensity modulation devices; and a light diffraction element including diffraction cells having respective thicknesses or refractive indices set independently of each other, wherein each of the diffraction cells receives the signal light beam from each of the modulation cells of each of the intensity modulation devices corresponding to each of the diffraction cells, and by causing signal light beams to have respective different optical path lengths to the light diffraction element, the signal light beams have respective different phases.

A telecentric interferometer, a method for determining characteristics of an input light field, and an interferometer assembly are disclosed. The telecentric interferometer includes a front side optic having an exit pupil, a first optical system having a first interferometer arm, a second optical system having a second interferometer arm, a detector, and a displacement unit located between the front side optic and the detector. The first optical system and the second optical system have a same object-side focal length, a same Gaussian image distance, and a same object-side main plane and a same object-side optical axis. The exit pupil of the front-side optic is the object-side focal length from the object-side main plane. The shifting unit shifts an image-side main plane of the first optical system and / or an image-side main plane of the second optical system such that the image-side main plane of the first optical system is different from the image-side main plane of the second optical system. And the optical path length of the first interferometer arm is equal to the optical path length of the second interferometer arm.

The invention provides a double-pulse laser engraving method and device, and relates to the technical field of laser engraving, the double-pulse laser engraving method and device are used for engraving a gravure forme.The engraving method comprises the steps that the wavelength of femtosecond pulse laser and the wavelength of picosecond pulse laser are determined; determining the pulse delay of the femtosecond pulse laser and the picosecond pulse laser; determining a to-be-engraved area of the gravure plate; adjusting the optical path length of the femtosecond pulse laser and / or the picosecond pulse laser according to the pulse delay; synthesizing the femtosecond pulse laser and the picosecond pulse laser into double-pulse laser by using a polarization beam splitting cube; and ablating the to-be-engraved area according to the double-pulse laser. The femtosecond pulse laser is short in wavelength and high in energy, so that a to-be-engraved area can be pre-ablated quickly, when ungasified plasma is formed in the pre-ablated area, the picosecond pulse laser is used for performing secondary ablation on the pre-ablated area, the machining quality of the gravure plate can be guaranteed, the area of a heat affected area can be controlled, and the etching precision of an etched pattern can be improved.

The utility model discloses an optical cement transmittance testing device, and belongs to the technical field of optical instrument analysis. The optical cement transmittance testing device comprises a base, an adjusting piece, two bearing pieces and two light-transmitting pieces. The cuvette formed by the adjusting sheet and the two light-transmitting sheets is detachable, so that the adjusting sheet and the light-transmitting sheets can be repeatedly used, and the test cost is greatly saved. Besides, the length of the light path can be adjusted by using the adjusting sheets with different thicknesses, so that the test requirements of glue with different thicknesses can be met without purchasing cuvettes with different specifications, and the test function of the cuvette is effectively increased. Moreover, the specification of the cuvette is freely formulated, the light path width reaches 50mm, the test area is large, effective light beams can penetrate through the cuvette, and the accuracy of a detection result is further ensured. Furthermore, the cuvette is directly fixed on the base, and the processes of glue filling, solidification and testing are completed in one step, so that the trouble of repeatedly wiping the cuvette when the cuvette is taken is avoided.

Provided is a self-injection locking type laser device in which variations in environmental changes, optical path length, and resonator length are less likely to occur. The self-injection locking type laser device includes a first base plate, a second base plate, a temperature adjustment element disposed between the first base plate and the second base plate, a semiconductor laser light source disposed on the first base plate, a reference resonator disposed on the first base plate, located on an optical path of laser light emitted from the semiconductor laser light source, and including at least a first mirror and a second mirror for providing optical feedback to the semiconductor laser light source, a first cover covering the semiconductor laser light source and the reference resonator and in contact with the first base plate, and a second cover covering the first cover and in contact with the second base plate.

To provide a sensitivity measuring device and a sensitivity measuring method capable of measuring spectral sensitivity distribution of a light receiving element to be measured in a short time.SOLUTION: The sensitivity measurement device includes a light source, an optical system, a light collection mechanism, a position adjustment mechanism, a measurement unit, and an analysis unit. The optical system is configured to generate an interference wave by splitting light from a light source into two beams and causing the two beams to interfere with each other, and includes an optical path length difference changing mechanism configured to change an optical path length difference. The condensing mechanism condenses the interference wave at an irradiation position on the light receiving surface of the measured light receiving element. The position adjustment mechanism changes an irradiation position of the interference wave in a direction along the light receiving surface. The measurement unit controls the irradiation position and acquires a signal obtained by converting the interference wave from the light receiving element to be measured. The analysis unit calculates a component of the signal of each wavelength by Fourier transform of an interferogram obtained from the optical path length difference changed by the optical path length difference changing mechanism and the intensity of the signal measured by the measurement unit.SELECTED DRAWING: Figure 1

An interference measuring device 1A comprises a light source 10, an interference optical system 20A, a photomultiplier tube 30, an interference intensity measuring unit 40, a unit 50 for calculating the electric field amplitude, and an analysis unit 60. The light source 10 emits light in a band (a light band containing terahertz waves) to which the photomultiplier tube 30 is sensitive. The photomultiplier tube 30 is sensitive in a light band containing terahertz waves and outputs an electrical signal with a value corresponding to the intensity of the incident light.The unit 50 for calculating the electric field amplitude converts a value of intensity V of interference light, measured by the interference intensity measuring unit 40, into a value of electric field amplitude E, based on a relationship between a value of the electric field amplitude of light incident on the photomultiplier tube 30 and a value of the electrical signal output by the photomultiplier tube 30. It obtains the value of the electric field amplitude E of the interference light for each value of a time difference Δt, which corresponds to an optical path length difference Δd. Thus, an interference measuring device and an interference measurement method are realized that can perform Fourier spectroscopy by interference measurement using a terahertz wave quickly and accurately.

The dual-mode optical lens comprises a positive lens, a negative lens, a first turning mirror, a second turning mirror, a third turning mirror, a fourth turning mirror, an optical sensor and a machine shell, a linear sliding table is fixedly installed in the machine shell, and a moving part of the linear sliding table is in transmission connection with an installation frame; a second light hole is formed in one side of the top end of the mounting frame, a first light hole is formed in the bottom end of the other side of the mounting frame, the positive lens, the negative lens and the second light hole are located on the same horizontal line, and the first light hole and the light sensor are located on the same horizontal line; through the combination of the negative lens and the positive lens, a long focal length is realized under a relatively short optical path length, a more compact distance is realized through the two small-incidence-angle plane turning mirrors, and the two plane reflecting mirrors are combined and inserted into an optical path between the positive lens and the negative lens, so that light rays do not pass through the negative lens, and the optical path is more compact. And a relative small focal length light path corresponding to the positive lens directly reaches the sensor.

Detecting stress / strain in optical fibres using coherent optical time domain reflectometry (COTDR) where the apparatus operates in two modes and determines changes in optical path length. A first mode

To provide an optical element, a laser module, a retina projection device, and a near-eye wearable device with which it is possible to convert a visible light polarization mode from a TM0 mode into a TE0 mode while suppressing decrease in conversion efficiency.SOLUTION: An optical element comprises a mode converter for converting the polarization mode of visible light. The mode converter includes: a conversion unit 51 for converting the polarization mode of the visible light from a TM0 mode into a TE1 mode; and a branch unit 52 for branching the visible mode of the TE1 mode into branched light LA of a TE0 mode and branched light LB of a TE0 mode and adjusting the phase difference obtained by subtracting the phase of the branched light LA on entering a multiplexing unit 53 from the phase of the branched light LB on entering the multiplexing unit 53. The branch unit 52 includes a branch waveguide 52A through which the branched light LA propagates and a branch waveguide 52B through which the branched light LB propagates. The optical path length of the branched light LA in the branch waveguide 52A and the optical path length of the branched light LB in the branch waveguide 52B are different from each other.SELECTED DRAWING: Figure 6

This method is for observing the same measurement place of the same biological sample by means of an X-ray microscope and an optical microscope by using a wax block in which a biological sample is embedded and the minimum value of the optical path length of the X-ray is 2 mm or less and the maximum value thereof is more than 2 mm. The method comprises: a step for imaging the biological sample by means of an X-ray microscope using an X-ray having an energy of 4-12 keV; a step for identifying, in reference to an arbitrarily defined position of the biological sample in an image captured by the X-ray microscope, positional information of an observation target region for imaging the biological sample by means of an optical microscope; and a step for obtaining a section of the biological sample including the observation target region on the basis of the identified positional information, and imaging the section by means of the optical microscope.

The invention relates to an optical path length adjusting device of a micro spectrophotometer for measuring the optical property of light passing through a sample. The optical path length adjusting device of a spectrophotometer according to the present invention comprises: a housing; a cover arm mounted so as to be rotatable about a hinge shaft provided on one side of an upper portion of the housing; a cover arm retainer on which the free end of the cover arm rests in the closed state; a lower base irradiated with light transmitted from a lamp installed inside the housing through an optical fiber; the upper base is supported by the cover arm and is positioned above the lower base; a lower base moving device configured to vertically move the lower base relative to the upper base; the spectrograph is configured to receive the light which is irradiated on the lower base and passes through the light path through the optical fiber and analyze and display the measurement characteristics of the sample, and the opposite surfaces of the lower base and the upper base are in a non-parallel state. The light path length adjusting device of the micro spectrophotometer is simple in structure, so that high-precision absorbance measurement can be carried out in an ultra-high concentration range without precise control.

A biological sample analysis system (100) according to an embodiment includes a detection optical system (121), a focal point of which is set at a predetermined position in a container (C), an imaging unit (122), a light receiving surface of which is located at an image forming position of an image of light transmitted through the detection optical system (121), and an optical path length adjustment element (13) disposed on an optical path between the detection optical system (121) and the imaging unit (122) and in a part within an angle of view of the imaging unit (121).