The invention discloses a glass-based circuit board defect detection method and
system, and relates to the technical field of glass substrate defect detection.The method comprises the steps that an
optical coherence tomography system with the fixed scanning resolution of 320 * 320 is used for collecting a
tomographic image of a target area, three-dimensional reconstruction is conducted on the
tomographic image, and a three-dimensional body
data model is obtained; extracting a plurality of three-dimensional morphological characteristics such as defect depth, transverse distribution profile and defect internal
refractive index unevenness from the model; and inputting the features into a defect classifier constructed based on a three-dimensional
convolutional neural network for identification, and performing spatial position
verification in combination with a known design
layout to generate a final detection report. According to the method, the
standardization of the detection process is realized through the fixed scanning resolution, and the efficiency and the result consistency are improved; by quantifying the
refractive index non-uniformity in the defect, the
optical property variation type defect in the material is effectively identified, and the detection depth and accuracy are enhanced.