Automated testing system and method for light emitting diode

A light-emitting diode and automated testing technology, which is applied in photometry, optical performance testing, optical radiation measurement, etc., can solve the problems that the accuracy and function cannot meet people's needs, and achieve increased testing, accurate classification, and high testing accuracy Effect
CN1696726APending Publication Date: 2005-11-16ζ¨ηΎŽθ‹±

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
ζ¨ηΎŽθ‹±
Publication Date
2005-11-16

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

An automatic test system of LED comprises operation control desk, PLC and system host including LED test device, data processing device and communication interface. The said LED test device is featured as using parameter test device of electrical property to test LED current and voltage, using brake current device to test diode brake current and using light spectrum device to test LED optical parameters.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the field of electrical and optical testing of light-emitting diodes, in particular to an automatic testing system and method for light-emitting diodes. Background technique

[0002] After the LED is packaged, its electrical or optical parameters must be tested to ensure its yield or applicability, and the testing method must use a dedicated LED testing instrument for detection. In recent years, there have been light-emitting diode testing instruments with a high degree of automation and reliable testing accuracy.

[0003] There are some types of light-emitting diode test systems currently on the market. Compared with the previous artificial spectroscopic, they have many advantages, such as fast speed, higher spectroscopic accuracy than manual, and higher accuracy of electrical parameters. However, there are also some defects, such as the forward voltage, because the applied current is instantaneous during the test, and the fo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More