224results about How to "Improve test" patented technology

A data processing system implementing a service-oriented architecture that efficiently provides for self-directed communications between service requesters and service providers. Service providers, operative to implement a predefined computing functions, are responsive to first service requests and operative to provide a first service responses. Service requesters executed remote from service providers are operative to provide second service requests and receive second service responses. A service invocation framework local to each service requester functions to convert between first and second service requests and first and second service responses and to establish direct invocation communications connection with a selected service provider for the exchange of first service requests responses. A service invocation manager provides configuration meta-data, upon dynamic request by a service invocation framework, to define the conversions and communications connection to be implemented by the service invocation framework with respect to a service provider.

Apparatus and methods for integrated circuit (IC) design, including the configuration and addition of extensions to the design. In one exemplary embodiment, a computer program rendered in an object-oriented language implementing the aforementioned methods for automatically adding user-customized extensions to digital processors is disclosed. The program comprises an extension tool which is adapted for varying levels of abstraction, and to significantly automate the creation and generation of various different extension types including for example ALUs, condition codes, and registers. A markup language (e.g., XML) database of abstracted extension components is utilized to permit ready addition and modification of extensions, as well as applicability of the extensions across different target architectures.

The present invention is directed to a separation device or container that can be used in the separation, isolation or pelleting of microorganisms from a test samples known to contain or suspected of containing said microorganisms. Subsequently, the separated, isolated or pelleted microorganism sample can undergo one or more interrogation steps to provide measurements useful for the characterization and/or identification of microorganism. In one aspect of the present invention, the interrogation steps can occur in situ in the separation device or container described herein.

A test system, apparatus and method for applying high current test stimuli to a semiconductor device in wafer or chip form includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, a plurality of current limiters electrically coupled to respective ones of the plurality of probes, and a current sensor electrically coupled to the plurality of probes. The current limiters are operative to limit current flow passing through a respective probe, and the current sensor is operative to provide a signal when detected current in any contact of the plurality of probes exceeds a threshold level.

A system and method for testing and calibrating integrated sensor devices that improves the manufacturing test throughput of the devices. The system includes a tester, a temperature controller, and at least one probe station including a thermal chuck. The chuck can be heated to specified temperatures to achieve variable heating of a wafer, PCB, or pallet disposed thereon. The temperature controller adjusts the temperature of the chuck to a first specified level. The tester performs at least one first measurement of the output offset of each integrated sensor embodied as a die on the wafer, or as a device on the PCB or pallet. Next, the temperature controller adjusts the temperature of the chuck to a second specified level, and the tester performs at least one second measurement of the output offset of each integrated sensor at the second temperature level. The offset temperature coefficient (OTC) of each sensor is calculated based upon the output offset measurements performed at the first and second temperature levels, and optimal settings for calibrating the respective sensors are determined based upon the calculated OTC values. After the temperature of the chuck is brought back down to the first specified level, the tester programs the output offset calibration settings into each sensor.

Pre-texturing composition for texturing silicon wafers having one or more surfactants. Methods of texturing silicon wafers having the step of wetting said wafer with a pre-texturing composition having one or more surfactants followed by a texturing step.

An eddy-current probe according to the present invention comprises: a substrate having a first surface facing to a subject to be tested and a second surface opposite to said first surface; an exciting coil formed on the second surface, having a pair of current lines in parallel with each other through which exciting currents flow in opposite directions to each other during testing, for generating an alternate magnetic field applied to the subject by the exciting currents; and at least one eddy-current sensor positioned on a central axis between the pair of current lines on the second surface of the substrate, for detecting a magnetic field generated newly from the subject by an eddy-current induced by the alternate magnetic field. The substrate has a non-planar form having at least one convex-surface portion on the first surface, and the at least one eddy-current sensor is formed on at least one concave-surface portion formed on the second surface, which is corresponding to the at least one convex-surface portion.

An analog preamplifier measurement system for a microphone array builds on conventional microphone arrays by providing an integral “self-calibration system.” This self-calibration system automatically injects an excitation pulse of a known magnitude and phase to all preamplifier inputs within the microphone array. The resulting analog waveform from each preamplifier output is then measured. A frequency analysis, such as, for example, a Fourier or Fast Fourier Transform (FFT), or other conventional frequency analysis, of each of the resulting waveforms is then performed. The results of this frequency analysis are then used to automatically compute frequency-domain compensation gains (e.g., magnitude and phase gains) for each preamplifier for matching or balancing the responses of all of the preamplifiers with each other.

A vacuum ring on a component testing system includes a metallic base material defining a vacuum-communicating passageway. A ceramic layer on the base material, preferably 20-100 micrometers thick and formed by a micro-arc oxidation process resulting in molecular adhesion, improves abrasion resistance and makes the vacuum ring more arc-over proof. A test plate for holding DUTs includes such a ceramic layer that provides better wear while enabling use of the base as a guard layer during testing. Another aspect of the invention concerns a vacuum ring having an eject hole pattern for discharging compressed gas toward DUTs in order to eject DUTs from a test plate. The eject hole pattern includes a plurality of closely spaced apart holes, each measuring less than the size that would be large enough to receive a DUT having the predetermined minimum cross sectional area.

A fixing device is provided on a casing of an industrial communication product, which includes a fixing plate, at least one elastic piece with an end, a pulling element, and an elastic element. The fixing plate is provided with at least two first connecting portions. The elastic piece is disposed corresponding to the first connecting portions. The pulling element is provided with two stoppers and at least two second connecting portions. The two second connecting portions are slidingly connected to the two first connecting portions. The pulling element is movable between a first position and a second position; wherein when at the first position, the end of the elastic piece abuts the second connecting portion; when at the second position, the end of the elastic piece is stopped by the second connecting portion, and thereby unlocking the industrial communication product, thus making the product accessible for repair and testing.

It is an object of the present invention to provide a multilayer wire which can accomplish both ball bonding property and wire workability simultaneously, and which enhances a loop stability, a pull strength, and a wedge bonding property. A semiconductor bonding wire comprises a core member mainly composed of equal to or greater than one kind of following elements: Cu, Au, and Ag, and an outer layer formed on the core member and mainly composed of Pd. A total hydrogen concentration contained in a whole wire is within a range from 0.0001 to 0.008 mass %.

The invention discloses a three-station DITO full-automatic testing machine and a testing process thereof. The testing machine comprises a feeding part, a testing part and a discharging part. The testing machine disclosed by the invention comprises the following technical steps: product feeding, product taking and product detection, product photographing correction, product function testing, product transferring and defective product screening, product position correcting and discharging, and material tray discharging. According to the testing machine, a plurality of products are loaded in a centralized manner by adopting the material tray, and the loading part and the discharging part are connected to the front end and the back end of the tested part; the material trays of the feeding part and the discharging part are of a circulating flow type structure, meanwhile, the circulating type taking and placing of the products and the material trays are realized, and the material flowing volume is greatly improved through a laminating and conveying mode; and the test part adopts multi-test-station design, the time periods of testing and product taking and placing are effectively utilized, so that uninterrupted lead-out of the test products is realized, and the screen testing efficiency is greatly improved; and single-piece detection, defective product scanning by two-dimensional codes and the like are integrated to realize real-time screening of defective products.

A Marsh funnel is equipped with a valve at the funnel outlet. The valve may be of the quick opening type selected from stem valves (internal of the funnel), ball valves, plug valves, flapper valves, butterfly valves, slide valves and the like.

Disclosed is a display apparatus. The display apparatus includes a first substrate having a plurality of pixels and a second substrate facing the first substrate. A concave-convex section is formed on at least one of the first and second substrates. The substrate having the concave-convex section is a flexible substrate. The substrate integrally formed with the concave-convex section is manufactured by applying a transfer method to an FRP substrate.

The invention provides a communication system between an FPGA (field programmable gate array) and a computer. The communication system comprises a DMA (directly memory access) engine, a PIO (programmed input/output) engine, a register block, a message controller, an interrupt controller and a PCIe IP (peripheral component interface-express intellectual property) core. Full-duplex and high-throughput DMA data transmission is realized by a sending module and a receiving module which are stand-alone in FPGA hardware, low-delay data transmission is realized by stand-alone processing of data flow and control flow in the sending module or the receiving module, and the FPGA and the computer are linked together by the DMA data transmission. By utilizing the technical scheme provided by the invention, the efficiency of the integration of an FPGA application and the computer can be increased, the research and development speed, the testing speed and the speed to market of the FPGA application are picked up, and the time and the human input consumed by the integration of the FPGA application and the computer are saved.

Built-in self-test (BIST) devices and methods are disclosed. A BIST section (100) according to one embodiment can include a built-in seed value memory (150) that stores multiple seed values. In a BIST operation, a seed value can be transferred from a built-in seed memory (150) to a test pattern generator (106) to generate multiple test patterns for scan chains (104-0 to 104-n). Successive seed values can be transferred to generate multiple test patterns sets at a clock speed and/or to achieve a desired test coverage.

An eddy-current probe according to the present invention comprises: a substrate having a first surface facing to a subject to be tested and a second surface opposite to said first surface; an exciting coil formed on the second surface, having a pair of current lines in parallel with each other through which exciting currents flow in opposite directions to each other during testing, for generating an alternate magnetic field applied to the subject by the exciting currents; and at least one eddy-current sensor positioned on a central axis between the pair of current lines on the second surface of the substrate, for detecting a magnetic field generated newly from the subject by an eddy-current induced by the alternate magnetic field. The substrate has a non-planar form having at least one convex-surface portion on the first surface, and the at least one eddy-current sensor is formed on at least one concave-surface portion formed on the second surface, which is corresponding to the at least one convex-surface portion.

An implantable medical device (IMD) with internal processor is configured for diagnostic emulation using an external processor coupled to the internal processor through a high speed serial link. The native external processor parallel data and address bus content can be converted to a serial communications stream, sent into the device, converted back to parallel address and data bus formats, and used to drive the device in place of the internal processor. The serial communication allows use of a small number of contact pads, conductors, or feed-throughs, depending on the device. Some devices allow serialized communication through the feed-through typically used for electrical stimulation. The devices can be used to enhance diagnostic testing with capabilities such as faster testing and more realistic testing. The IMD can be a wide variety of implantable devices such as neuro stimulators, pace makers, defibrillators, drug delivery pumps, diagnostic recorders, cochlear implants, and the like. The device can have a bus switch, which when activated, decouples the internal processor, and couples address and data buses containing information and commands provided by the external emulator through the serial communication channel.

Sheet resistance, junction leakage and contact conductivity of a semiconductor layer, associated with an ultra-shallow junction layer or metal film are measured by contacting the surface with a plurality of probes. The probes can be used, in conjunction with a four-point probe system, to determine sheet resistivity. Junction leakage through an ultra-shallow junction is determined by establishing a reverse bias across the junction set at a predetermined voltage value, measuring through a first probe a total junction current conduction value, measuring through second, third, and fourth probes a plurality of voltage values. The junction leakage value is then directly computed based on the sheet resistivity value, reverse bias potential, wafer radius, and the measured voltage values. Contact conductivity between a metal film and semiconductor layer can be similarly directly computed.

A testing device includes a pressure vessel, a mounting stand disposed in an internal space of the pressure vessel, on which a device to be tested is mounted, test electrodes, disposed in the internal space of the pressure vessel, that supply a test voltage to the device to be tested mounted on the mounting stand, and a pressurization unit that raises the pressure of the internal space of the pressure vessel. The test voltage is supplied from the test electrodes to the device to be tested mounted on the mounting stand, and testing of the device to be tested is carried out, in a condition that the pressure of the internal space of the pressure vessel is raised by the pressurization unit.

Leak rate testing is an engineering challenge where on the one hand, engineers must meet strict leak rate standards on a wide range of products and systems from semiconductor packages through medical product packaging to chemical storage vessels and liquid/gas handling systems. On the other hand, they have to make the leak testing process low cost and independent of operator whilst in many applications making the process automated and fast as this step may otherwise become a manufacturing bottleneck. Accordingly embodiments of the invention address manufacturing requirements by providing for high accuracy flow based leak testing of large volumes, providing adaptive techniques for use during testing, providing equivalent circuit modeling techniques allowing optimization and parameter extraction to be simulated prior to manufacturing commitment, and providing for the automatic tuning of setup parameters.

The present invention discloses a brake beam fatigue test stand, for simultaneously testing a fatigue strength of two brake beams, comprise: a base, and four upright columns vertical to the base and arranged on the base at intervals; a first tangential load actuator is mounted vertically between the first upright column and the second upright column, with simulated wheels being mounted on a front side and a rear side of a bottom of the actuator; a pressure load actuator is mounted vertically between the second upright column and the third upright column; a second tangential load actuator is mounted vertically between the third upright column and the fourth upright column, with simulated wheels being mounted on a front side and a rear side of a bottom of the actuator; the stiffness of the test stand in vertical and transverse directions is enhanced.