14 results about "Nondestructive measurement" patented technology

This invention relates to the field of optical measurement technology, specifically to a device and method for detecting the beam-splitting surface parameters of waveguide sheets. The device includes an autocollimator and a measurement platform. The measurement platform is used to place and realize the translation and rotation of the waveguide sheet under test. The autocollimator is tilted above the measurement platform, with its center line coplanar with the rotation axis of the measurement platform, and its tilt angle relative to the rotation axis of the measurement platform is equal to the characteristic angle of the beam-splitting surface. The autocollimator is used to measure the angular parameters of each beam-splitting surface in the waveguide sheet under test during rotation or translation. In this invention, by placing the waveguide sheet under test on the measurement platform, the angular parameters of each beam-splitting surface of the waveguide sheet under test are measured using the autocollimator during the rotation or movement of the measurement platform. Therefore, this device can achieve non-destructive measurement of each beam-splitting surface of the waveguide sheet under test. This allows for the early rejection of defective products, improving production efficiency and reducing production costs.

The present application relates to the technical field of image data processing, and discloses a corn kernel and embryo volume high-throughput visual analysis method and system based on deep learning, which can obtain at least one folder according to a file input path set by a user, and each folder includes a gray scale sequence obtained by computer tomography (CT) slicing of corn kernel groups in a horizontal direction. Based on a parallel pipeline processing mode, a set batch size and a deep learning segmentation model, the gray scale sequence in the folder is preprocessed and image segmented to obtain kernel binary segmentation mask sequences and embryo binary segmentation mask sequences, and then the kernel quantity and the volume related data of the kernel and the embryo are determined, and the related images and data are visually output. The present application can complete the processing of the high-throughput data of the CT slice sequence of the corn kernel, and the nondestructive measurement and visual display of the volume related data of the kernel and the embryo, and effectively improve the measurement efficiency.

This invention provides a method for determining the dislocation density of diamond single crystals using cathodoluminescence spectroscopy, which can be applied to the field of semiconductor material characterization and defect detection. This method draws upon and develops upon colorimetric methods based on ultraviolet light intensity, utilizing the idea of ​​single measurement and quantitative analysis based on different peak ratios. It also incorporates a decoupled architecture of "destructive calibration + non-destructive measurement." First, at least five diamond single crystal calibration samples with gradient dislocation densities are selected. Cathodoluminescence spectra are acquired under low temperature and high vacuum conditions. The integrated intensity I of the A-band emission peak related to dislocations is extracted through multi-peak fitting. A and the integral intensity I of the free exciton emission peak FE Calculate the ratio R=I A / I FE Subsequently, the calibration sample was subjected to hydrogen-oxygen dry etching, and the surface dislocation density N was obtained by statistically analyzing the etching pits. The proportionality coefficient k was obtained by linear fitting with N as the ordinate and R as the abscissa. For the sample to be tested, the spectrum was collected under the same conditions and the ratio R was calculated. Substituting this value into the model N=k·R, the surface dislocation density can be quantitatively obtained.

The application belongs to the technical field of seedling quality grading, and discloses a quality grading method for Platycladus orientalis seedlings in situ based on electrical impedance spectroscopy, which comprises the following steps: a Platycladus orientalis seedling in-situ measurement device is built for non-destructive measurement of root EIS in situ; an EIS-100 system is used to measure EIS parameters; based on a GSFS-FCM algorithm, input data are clustered, and the optimal cluster number K and the optimal cluster center coordinate matrix are output; according to the optimal cluster number K and the optimal cluster center coordinate matrix, the final membership degree is calculated and the classification is divided through the FCM algorithm, the quality grade to which the Platycladus orientalis seedling belongs is output, and the whole process from electrical impedance measurement to quality grading is completed. The above-mentioned grading method is adopted, the GSFS-FCM algorithm can automatically determine the classification number, automatically find the cluster center, reduce the iteration number of the algorithm, has high accuracy, and breaks away from the traditional grading method which relies on morphological parameters of the aboveground part.

This invention belongs to the field of electronic testing equipment technology, specifically disclosing a power-connecting probe and a multimeter. The power-connecting probe includes: a probe body having a probe extending along a first direction; an adapter frame having a mounting hole extending along the first direction, the adapter frame being mounted on the probe body, and the probe passing through the adapter frame; and an adapter pin mounted within the adapter frame, one end of which is connected to the probe, and the other end extending out of the adapter frame, the cross-sectional diameter of the adapter pin being smaller than that of the probe. Compared to existing technologies, this application achieves efficient, accurate, and non-destructive measurement of small terminals through a matching structure of the probe, a detachable adapter frame, and a small-diameter adapter pin, combined with elastic clamping and buffer compensation design.

A non-destructive method for measuring the residual content of by-products in the insulation layer of high-voltage cables is disclosed. In this method, the high-voltage cable is placed in a degassing chamber. Under constant temperature, the high-voltage cable is cut, cleaned, and connected to test the current. The copper conductor of the high-voltage cable is connected to the high-voltage electrode. The outer shielding layer of the high-voltage cable is circumferentially stripped to form a spaced outer shielding layer, which is then connected to the shielding electrode and grounded. A copper strip on the outer shielding layer outside the spaced outer shielding layer is connected to the measuring electrode. The current in the high-voltage cable insulation layer is measured to obtain test results, including multiple sets of test currents, test times, test voltages, and test frequencies. Based on the test results, a three-exponential fitting is performed. Using the fitted continuous function and the corresponding test time and frequency, the polarization parameter values ​​in a fixed frequency band are obtained. These values ​​change as degassing progresses, and the polarization parameters at different stages are recorded. p and q are degassing factors. When p and q are less than 0.3, the by-product content is within the acceptable range.

The present disclosure relates to a method for measuring a sample based on an ellipsometer and an ellipsometric measuring device. The method for measuring a sample based on an ellipsometer comprises: collecting a first measurement Mueller spectrum corresponding to a reference light spot position, and obtaining a first Mueller matrix; moving a cylindrical body along a direction perpendicular to an incident plane by a first preset distance to form a measurement light spot, collecting a second measurement Mueller spectrum corresponding to the measurement light spot position, and obtaining a second Mueller matrix; determining a mathematical relationship between the second Mueller matrix and the first Mueller matrix; representing the second Mueller matrix as a first function of an incident light wavelength, a film thickness, and an included angle based on a Fresnel equation and the mathematical relationship; fitting the second measurement Mueller spectrum based on the first function using a nonlinear regression algorithm to obtain a measured value of the film thickness and the included angle; and calculating a radius of the cylindrical body based on the first preset distance and the measured value of the included angle. The method realizes rapid and non-destructive measurement of the radius of the cylindrical sample.

To improve the quality of surface parameter measurements, particularly the measurement of the thickness of coatings applied to a surface, by measuring their infrared radiation. [Solution] An apparatus for non-contact and non-destructive testing of a surface by measuring its infrared radiation in response to thermal excitation comprises one or more electromagnetic radiation sources (220), each adapted to emit excitation radiation directed toward the surface (17) to be tested. One or more detectors (120) equipped with a pixel array (121) are directed toward the surface (17) and record the response to the excitation radiation as a function of time. A control unit (60) receives values ​​from the pixels and determines the time at which the values ​​were measured, taking into account non-gate measurements in the pixel array (121). The control unit (60) also controls the pulsing of one or more radiation sources (220).

The present invention concerns an apparatus for non-destructively obtaining a vibrational response of a 3D solid piece to an impact, comprising: - a measurement stage; - a set of one or more robotic arms positioned on or near the measurement stage; - a set of one or more acoustic sensors, each sensor attached to one of the robotic arms and each sensor configured to capture an acoustic response of a 3D solid piece to an impact; - a set of one or more impactors, each impactor attached to one of the robotic arms, - a controller comprising a processor, configured for: * obtaining a set of impact positions and a set of sensor positions; * consecutively for each impact position: ° moving an impactor near the impact position by steering the robotic arm onto which the impactor is attached; ° moving a sensor to the sensor position corresponding to the impact position by steering the robotic arm onto which the sensor is attached; ° signalling the impactor to provide an impact at the impact position on the 3D solid object; ° receiving an acoustic response to the impact, said acoustic response captured by the sensor.

The application discloses a small sample-based concrete porosity gradient distribution measurement method based on nuclear magnetic resonance, realizes nondestructive measurement of the spatial gradient distribution of the porosity of a large aggregate concrete body, and solves the technical bottleneck that traditional nuclear magnetic resonance technology cannot obtain the continuous variation information of the porosity of the large aggregate concrete from the surface to the inside under the limitation of the size of the cavity of the equipment by establishing a mathematical mapping relationship between a small-size test block and the body porosity distribution. The method innovatively introduces statistical sampling theory and spatial weighted analysis into the field of concrete nondestructive testing, and realizes accurate reconstruction of the porosity gradient distribution of a large concrete body by using a small sample.

This invention relates to the field of semiconductor manufacturing inspection technology, and discloses a photomask photoresist thickness measurement device and method. The device includes a sample carrier component, a probe measurement component, a laser detection component, a drive control component, and a data processing module. The sample carrier component is equipped with an attitude adjustment component. The device obtains the surface tilt angle of the test piece by detecting probe displacement deformation through the laser detection component. The drive control component, in conjunction with the attitude adjustment component, synchronously adjusts the attitude of the sample carrier component and the height of the probe measurement component to ensure constant probe contact force, avoid scratching the photoresist layer, and prevent probe "flying over" and data loss. After the probe measurement component acquires the contour signal, it is filtered and compensated by the data processing module to filter out thick photoresist scattering interference, eliminate environmental measurement deviations, and improve signal accuracy. This achieves high-precision, non-destructive measurement of thick photoresist on photomasks, solving the problems of low accuracy and easy damage to the photoresist layer in traditional methods, and is suitable for relevant industry measurement needs.

The application discloses an experimental system for intrinsic flexible thickness sensor sensitive characteristic research, and belongs to the technical field of sensor performance test; the experimental system comprises a platform base, a platform displacement slider, a displacement slider supporting rod, a clamping plate connecting supporting rod, a coil fixing clamping plate and a metal sample fixing clamping plate; the system can be used to realize the thickness nondestructive detection sensitive characteristic research of the intrinsic flexible thickness sensor under the conditions of a plane and different bending states; the system can be used to conduct low-frequency transmission type nondestructive measurement experiments on metal samples with different thicknesses after the sensor is fixed on different coil fixing clamping plates, so that the intrinsic flexible sensor sensitive characteristics are obtained; the application can realize the characteristic research of the intrinsic flexible thickness sensor nondestructive detection experiment under multiple conditions, the system has simple structure and is convenient to operate, the setting of each component in the system can be flexibly adjusted according to the experimental requirements, the experimental analysis cost is low, and the system is suitable for the sensitive characteristic experiment and research analysis of the intrinsic flexible sensor.

The application belongs to the technical field of lunar soil measurement, and particularly relates to an analysis method for non-destructive measurement of stable metal isotope ratio in lunar soil, which comprises the following steps: step S1, placing a sample (2) to be measured into a reactor (1) to perform irradiation operation, wherein the sample (2) comprises a lunar soil sample and an earth sample, and the earth sample comprises standard substance and neutron fluence rate parameter monitoring material; step S2, after the irradiation operation is completed, cooling is performed, and then a HPGe detector (4) is combined with a digital multi-channel spectrometer (7) to perform radioisotope activity measurement on the activated lunar soil sample; step S3, after the radioisotope activity measurement is completed, the ratio of stable isotope A and stable isotope B in the lunar soil sample is calculated; and step S4, the difference between the isotope ratio of the lunar soil sample and the isotope ratio of the earth sample is calculated. The non-destructive isotope ratio measurement method provided by the application is complementary to the mass spectrometry method such as ICPMS, and more nuclear technology scientific data is provided for non-destructive analysis of lunar soil.

This invention relates to a non-destructive measurement method for the weight of Lanzhou lilies, comprising the following steps: S1 establishing a backbone network composed of a series of convolutional modules, C3k2 modules, and C2PSA modules at the ends; S2 establishing a small target-oriented dual-stream fusion pyramid; S3 establishing a multi-scale occlusion-focusing attention detection head; S4 establishing a YOLO-lily network architecture including a backbone network, a small target-oriented dual-stream fusion pyramid as the neck network, and a multi-scale occlusion-focusing attention detection head as the head network; S5 using the YOLO-lily network to perform instance segmentation on lily bulb images to obtain bulb mask images; S6 defining 22 bulb shape features based on the mask images and calculating the value of each feature; S7 using variance inflation factor evaluation to retain three key features: the volume of the circumscribed ellipsoid, the width of the circumscribed rectangle, and the length of the major axis of the circumscribed ellipse; S8 inputting the key features into a BPNN model to obtain the weight of the lily bulb. This invention achieves efficient and accurate estimation.