1894results about "Electrical/magnetic thickness measurements" patented technology

An electromagnetic imaging method for electromagnetically measuring physical parameters of a pipe CJ, CC by means of a plurality of measuring arrangement ZMA, MCMA, MonMa, ImMA comprising a plurality of transmitter coil ZTX, LFTX, DTX and a plurality of receiver coil ZRX1, ZR2, MRX, MC, PRX1, PRX2, PRX3, PRX4, PRX5, PRX6, PRX7, PRX8, PRX9, PRX10, PRX11, PRX12, PRX13, PRX14, PRX15, PRX16, PRX17, PRX18, the transmitter coils and receiver coils being associated so as to form the plurality of measuring arrangement, the plurality of measuring arrangement being adapted to be positioned into the pipe and displaced through the pipe, the physical parameters being measured for a plurality of position along the pipe, the method comprising the steps of:

• a) determining a first value of an average ratio of magnetic permeability to electrical conductivity and a first value of an average inner diameter of the pipe Z-MES,
• b) determining an average electromagnetic thickness of the pipe MC-MES,
• c) determining a second value of the average ratio of magnetic permeability to electrical conductivity and a second value of the average inner diameter of the pipe Mon-MES according to excitation frequencies which are substantially lower than the excitation frequencies used to determine the first values Z-MES,
• d) determining a first image EMTIM of the pipe electromagnetic thickness and the pipe defects Im-MES,
• e) discriminating the defects at an inside perimeter of the pipe from the defects at an outside perimeter of the pipe Dis-MES, and
• f) forming a corrected first image IOFIM of the pipe taking into account a position of the defects.

A sheet-thickness detector device has a sheet guide with a sheet-guide surface for guiding a sheet between a magnetic field sensor and a magnetic guide element. The magnetic field sensor, having an approach-guide plane disposed upstream in a sheet conveying direction for guiding the sheet to a detection surface, comes into direct contact with the sheet. By the structure mentioned above, the thickness of a sheet is detected so as to determine sheet double feeding and the like without producing sheet jamming.

A paper sheet thickness detection device which can reliably detect a foreign matter adhering to a paper sheet. A paper sheet thickness detection device (300) comprises a first sensor (301) and a second sensor (302) which detect a change of an electrostatic capacity when a paper sheet (304) such as a bill or a copier paper is inserted, and a thickness detection unit (303) which detects the thickness of the paper sheet (304) by using the signals obtained from the first sensor (301) and the second sensor (302).

In an apparatus for measuring thickness of a thin film, which is formed through a conductor, preventing the measurement from an error due to the curve or bend on a substrate surface or a moving surface of a stage, but without necessity of a large-scaled facility, an electric filed is applied between a probe 10 and a stage 8, so as to obtain an electrostatic capacitance of the substrate 3, an electrostatic capacitance of an insulating film, which is formed between the substrate 3, and an electrostatic capacitance defined starting from the substrate 3 to the thin film 4. The electrostatic capacitance between the substrate 3 and the thin film 4 is measured at plural numbers of places covering over the entire surface of the thin film 4. The probe 10 is so supported that the contact load “P” comes to be constant, by the probe 10 onto the thin film 4. A contact area of the probe 10 between the thin film 4 is calculated out through a predetermined equation, assuming the load “P” is constant. From respective electrostatic capacitances and the contact area measured, a distribution of thickness of the thin film 4 over the entire area thereof.

The apparatus employs the remote field eddy-current (RFEC) inspection technique to electromagnetically measure physical parameters of a metallic pipe. RFEC devices inserted into and displaced along a cylindrical pipes may be used to measure the ratio of pipe thickness to electromagnetic skin-depth and thus allow for the non-invasive detection of flaws or metal loss. Typically these RFEC thickness measurements exhibit a so-called double-indication of flaws, an undesired artifact due to a double-peaked geometrical sensitivity function of the device. The method describes a means by which this double indication artifact may be removed by an appropriate processing of RFEC measurements performed by an apparatus specifically designed for this purpose. The invention is particularly well designed for applications in the oilfield industry.

Coil is made to be disposed with gap opposed to the surface of wafer, and wafer stage is made to move in X and Y direction and R and θ direction. When supplying an alternating current to coil with the frequency swept by impedance analyzer, the magnetic field made to be induced in coil will operate on the conductive film of wafer. By changing a parameter (a frequency or an angle) influencing the skin effect of the conductive film and giving the parameter to coil, the state where a magnetic field is not made to penetrate relatively the film of wafer and the state where the magnetic field is made to penetrate relatively the film can be formed. From the variation of various values corresponding to the eddy current induced based on the change of state influenced by the skin effect of the conductive film, the film thickness of wafer can be measured with sufficient accuracy.

The invention relates to a capacitance ratio type icing thickness sensor and a detection method thereof. The sensor is characterized in that: a relative capacitance value detection loop is formed by a single chip microcomputer inside a sensor, a double-channel capacitance digital converter, detected media icing or air spreading between pole plates, a group of parallel pole plate detection capacitors which have an geometric structure the same with a reference parallel plate pole plate detection capacitor and are arranged according to fixed ruler scale spacing positions, as well as a double-channel programmable control scale gating circuit; under the control of the single chip microcomputer, the capacitance value obtained by each relative capacitance value detection loop is compared with the reference capacitance value obtained by a reference capacitance value detection loop which is formed by the single chip microcomputer inside the sensor, the double-channel capacitance digital converter and the reference parallel plate pole plate detection capacitor, and the measurement on the surface icing thickness of the sensor is realized by analyzing and judging a ratio result. Under the condition of ice rain or freezing, the sensor can continuously and automatically detect the icing thickness of suspended power transmission lines, pylons, buildings, equipment surfaces, branches, etc.

An apparatus for, and methods of use for, measuring film thickness on an underlying body are provided. The apparatus may include at least one Impedance Resonance (IR) sensor, which may include at least one sensing head. The at least one sensing head may include an inductor having at least one excitation coil and at least one sensing coil. The excitation coil may propagate energy to the sensing coil so that the sensing coil may generate a probing electromagnetic field. The apparatus may also include at least one power supply, at least one RF sweep generator electrically connected to the excitation coil; at least one data acquisition block electrically connected to the sensing coil; at least one calculation block; and at least one communication block. Methods of monitoring conductive, semiconductive or non-conductive film thickness, and various tools for Chemical Mechanical Polishing/Planarization (CMP), etching, deposition and stand-alone metrology are also provided.

A method and apparatus for measuring differential voltages in an electrolyte of an electrochemical plating cell. Current densities are calculated from the measured differential voltages and correlated to thickness values of plated materials. A real time thickness profile may be generated from the thickness values.

The invention relates to an automatic test device of the flatness and thickness of a metal sheet, which comprises a machine frame, a feeding mechanism, a test platform and a discharging mechanism. The machine frame and the test platform are connected through a Y-directional track. The test platform comprises a test frame, guide rails, a test cross beam, a cantilever fixing frame, a cantilever, an upper test probe, a lower test probe, a Y-directional ball screw mechanism and a measuring circuit. The automatic test device has the following beneficial effects that: the test is accurate; the test efficiency and the test precision are improved because the probes always cover the effective test range of a saw blade; mechanical and electrical integration technology is fully used, the structure is simple, the operation and maintenance are convenient, and the application in the field of the test of the flatness and thickness of other metals can be realized with a little improvement, and the promotion and use are easy; and an eddy induction principle is used to realize the test of the flatness and the thickness of the metal sheet, the interference of water and other non-metal impurities on the saw blade is eliminated effectively, precise positioning of the saw blade is not required in test, the price is low, and the operation is simple.

The present invention relates to a corrosion examination and non-destructive examination method for a metal pipeline. The instant electromagnetic technology (TEM) is used to examine the average thickness of the wall of the pipeline under the condition that no dig is performed, no corrosion-prevention layer is damaged and the normal running of the pipeline is not influenced. The method is characterized in that when other conditions are the same, the metal pipeline with different wall thicknesses can have obvious time divisibility on a normalized pulse instant-changing responding curved line. The wall thickness of the measured section of the pipe can be obtained by the indication of the known wall thickness and the method of inversing modeling. The present invention also relates to a corrosion examination and non-destructive examination systematic device for the metal pipeline. A virtual instrument is designed and produced with the TEM examination method for the wall thickness of the metal pipeline; a data collector adopts the instant-changing electromagnetic instrument; the control of the instruments, the data processing and the results expression are realized by the software of the computer, so that the expansion property of the instrument is strengthened, and the renewing speed is accelerated, and the complicate data processing analysis can be performed instantly. The device can be widely used for examining the corrosion of the anti-corrosion heat-preservation pipeline in the industries such as the petroleum industry, the petrochemical industry, the fuel gas industry, the electric power industry, the water supply industry, and the like.

The invention provides a conductive film thickness measurement system based on an eddy current sensor and a corresponding measurement method. The thickness measurement is realized by using the relation between the slope of an LOC line formed by the corresponding points of the impedance of an eddy current sensor detection coil in a resistance-inductance plane in different detection distances and the thickness of a measured conductive film. The conductive film thickness measurement system comprises an eddy current sensor probe with the detection coil, an impedance measurement circuit, a micro actuator for realizing the vertical movement of the probe, and a controller which controls the measurement process and thickness result output. The method is simple and efficient, the thickness of a conductive film can be accurately measured without contact, the measurement result is nearly not affected by a detection distance, a thickness measurement range is in a range from tens of nanometers to several millimeters, and the method can be widely applied to the semiconductor metal film detection, a metal film online measurement system in an industrial production line and the quality monitoring or detection of various film coating processes.

Method for measuring thicknesses of a film, a foil or a material layer with a measuring head which is spaced away from the film and with which a capacitive thickness measurement is performed, in which an optical distance measurement is performed with a distance measuring device and a distance determined by the optical distance measurement is used in determining the film thickness in the capacitive thickness measurement.

This invention relates to capacitor thickness sensor and its test method in the field of automatic testing technique, which is characterized by the following: forming testing circuit by the capacitor measurement circuit and single machine control circuit and the sensor inside scale code switch circuit through one set of metal capacitor test pole slice and metal capacitor testing pole slice space; generating scale code switch control signals along certain order by the senor inside single machine control to connect metal capacitor test pole slices adjacent two metal capacitor test pole slices to test the capacitor value and to determine the ice layer thickness sensor.