52results about How to "Accurate thickness measurement" patented technology

Method for measuring thicknesses of a film, a foil or a material layer with a measuring head which is spaced away from the film and with which a capacitive thickness measurement is performed, in which an optical distance measurement is performed with a distance measuring device and a distance determined by the optical distance measurement is used in determining the film thickness in the capacitive thickness measurement.

An optical translation technique for moving the interrogation spot at which a triangulation system measures the displacement of a target is disclosed. In normal operation of the laser triangulation sensor, an incident laser beam is projected from a sensor head onto a surface of a web that is facing the sensor head. Radiation is reflected from the surface and detected by the sensor. The distance from the sensor head to the web surface is calculated by triangulation. With optical translation, both the incident ray path and the captured ray path are translated with a plurality of high refractive index geometries such that the nominal functioning of the triangulation sensor remains undisturbed. The optimal position on the sheet wherein the interrogation spot will be located can be ascertained.

A method of using acoustic signals in the form of waves or pulses to non-destructively measure the thickness of a bonding layer sandwiched between and bonding together overlying and underlying materials different from the bonding layer especially when the thickness of the bonding layer is so small that the features (maxima, minima, time position) of the echo from the interface of the bonding layer and the overlying material is indistinguishable, i.e., not independently observable from the features (maxima, minima, time position) of the echo from the interface of the bonding layer and the underlying material.

Methods and apparatus for measuring a thickness of a coating on an moving object are provided. Light is directed toward the object at a predetermined location on the object such that a portion of the light interacts with the object. A I D and/or 2D maximum intensities for at least one wavelength channel is captured that is produced by the portion of the light interacting with the object. A measured average intensity of the wavelength channel and/or intensities and their arithmetic derivatives of multi wavelength channel geometries is converted into I D (averaged) and/or 2D thickness values. Based on these values an acceptability of the coating is evaluated and thickness calculated.

A method and system for correcting for temperature variation in ultrasonic testing systems is disclosed. In one embodiment, an offset is determined for correcting a time of flight measurement, wherein the offset is based on the pulse delays at first and second calibration temperatures. In another embodiment, a factor is determined for correcting a time of flight measurement, wherein the factor is based on clock signal errors at first and second calibration temperatures.

An apparatus (100) and a method for measuring the thickness (s) for a wall (35) of a transparent object (30); the wall (35) comprises a transparent material (35a) arranged between a proximal interface (31), set between an environment (33) and the transparent material (35a), and a distal interface (32), set between said transparent material (35a) and the environment (33). The apparatus (100) comprises a source (1) of a starting light radiation (2) and a means for focusing it (10), in order to obtain an entering light radiation (5) directed towards the wall (35) that hits the proximal interface (31) of the wall (35) of the object and is in part reflected, in order to generate a first reflected radiation (6). A part of the entering light radiation (5) that is transmitted (7), through the transparent material (35a), hitting upon the distal interface (32), is in turn reflected (8) and crosses in an opposite direction the transparent material (35a) through the proximal interface (31), in order to generate a second reflected radiation (9). A collected radiation (15) given by overlapping the first (6) and second (9) reflected radiations have a difference of intensity that is configured to obtain an interference, which allows determining the thickness (s) of the wall (35). In particular, the means for focusing comprises a lens means (10) that have two main meridians (10a, 10b) orthogonal to each other, such that the entering light radiation (5) is focused on a first virtual focus (F₁) in the first meridian plane (10a), and on a second virtual focus (F₂) in the second meridian plane (10b). This way, it is obtained that the collected radiation (15) is substantially independent from possible movements of the transparent object (30), and this allows a remarkable reliability and robustness of the measurement with respect to fluctuations and vibrations of the object (30).

The invention relates to a device for measuring thickness of a rubber-coated steel cord. The device comprises a dial gauge thickness measuring instrument consisting of a gauge frame, a counter weight, a measuring rod, a shifting fork, upper and lower measuring heads, a return spring, a gauge body, a pointer and a dial, wherein the gauge body is arranged on a supporting guide part of the gauge frame; the measuring rod passes through the gauge body and the supporting guide part; the top and bottom ends of the measuring rod are connected with the counter weight and the upper measuring head; the lower measuring head is arranged on a base of the gauge frame; two ends of the return spring in the gauge body are connected to the measuring rod and the gauge body; the shifting fork hinged on a hinge part of the gauge frame is connected to the measuring rod; and the measuring rod changes linear displacement into angular displacement of the pointer through a transmission piece so as to indicate the thickness value on the dial. The device is characterized by also comprising a measuring platform, wherein the base of the gauge frame is embedded in the platform; and an upper surface of the lower measuring head and an upper surface of the measuring platform are positioned on the same plane. The samples to be tested can be flatly put on the measuring platform and are accurately introduced between the upper and lower measuring heads, sample rubber cannot generate creep deformation, and the device is accurate in measurement and easy and convenient to operate.

A thickness monitoring device capable of performing thickness measurement of an object of measurement in real time even when using a relatively narrow band light source. This etching monitoring device (thickness monitoring device) includes a light source which produces measurement light having a predetermined wavelength bandwidth; an array detector which detects, for each wavelength, interference light of measurement light reflected from mask, whereof the thickness changes over time; and data processing unit which computes the thickness of the mask based on change over time of a plurality of single-wavelength components of the interference light detected by the array detector.

The invention relates to full-automatic glass laser melting marking equipment and a working method thereof. The full-automatic glass laser melting marking equipment is characterized in that a glass bearing platform is mounted on a rack, a laser generator device is arranged beside the rack for generating a laser beam, an X-axis moving beam assembly is located above the glass bearing platform and can move in the X-axis direction, a Y-axis moving mechanism is mounted on the X-axis moving beam assembly, an optical path setting mechanism is mounted at one end of the X-axis moving beam assembly andis used for receiving the laser beam generated by the laser generator device and sequentially refracting the laser beam onto a galvanometer and a field lens, an optical fiber edge finding probe, the galvanometer and the field lens are all mounted on the Y-axis moving mechanism, and the field lens can do lifting motion in the Z-axis direction. The marking equipment is perfect in system, simple andreasonable in structure, and capable of performing machining of identifications such as surface bar codes and two-dimensional codes on glass of different specifications, so that the unique identity which cannot be washed and eliminated is endowed to a glass product, and the traceability of machining the product in the subsequent working process of a production line connected with the marking equipment is greatly improved.

The invention discloses a laser height pole device capable of controlling the flatness of masonry. The laser height pole device capable of controlling the flatness of the masonry comprises a levelingbase, a vertical rod is fixedly connected to the leveling base, the vertical rod is perpendicular to the leveling base, and a cross rod is fixedly connected to the vertical rod. The cross rod and thevertical rod are perpendicular to each other; the vertical rod is movably connected with a sleeve, the sleeve is located above the cross rod, the sleeve is fixedly connected with a longitudinal measuring rod, the longitudinal measuring rod is perpendicular to the vertical rod, and a vertical rod limiting block is arranged at the top end of the vertical rod; the vertical rod, the cross rod and thelongitudinal measuring rod are all height poles, the vertical rod, the cross rod and the longitudinal measuring rod are all telescopic rods, and the leveling base is in bolted connection with a vertical rod inserting cylinder; and the vertical rod is fixedly connected with a leveling base plate through an inserting groove, the leveling base is in bolted connection with a counterweight, and the leveling base is in bolted connection with a horizontal air bubble meter. The laser height pole device capable of controlling the flatness of the masonry has the advantages of high precision, rich functions, simple operation, convenient carrying and use and the like. The laser height pole device capable of controlling the flatness of the masonry has the function of controlling the flatness of the masonry wall.

A time domain-optical coherence tomography (TD-OCT) technology is adopted to carry out high resolution imaging on a human cornea; the thickness of the human cornea can be accurately measured by usinga quick zoom lens; through the moving distance of a reference arm, the optical path difference between the front surface and the rear surface of a cornea can be calculated, thus the refractivity of the cornea can be calculated by ZEMAX optical simulation software; and the method is noncontact and is used to measure the thickness and refractivity of a cornea. The method can measure the thickness and refractivity of a cornea in a human body, the measurement is noncontact, high precision, and nondestructive; moreover, after a corneal surgery, the thickness and refractivity of corneas can be tracked, and at the same time, a preoperative detection device and method are provided for a refractive surgery.

The disclosure provides a substrate inspection apparatus. The substrate inspection apparatus according to the present disclosure may include: a light source configured to radiate laser light onto a coated film that is spread on a region of a substrate; a light detector configured to obtain optical interference data caused by an interference between reference light, that is generated by the laser light being reflected from a surface of the coated film, and measurement light, that is generated by the laser light penetrating the coated film and being scattered; and a processor configured to derive a thickness of the coated film corresponding to the region, based on the optical interference data.

The invention provides an area array sweep frequency measurement device and method, and belongs to the technical field of laser ranging. The device comprises a tunable laser, a collimator, a beam expander, a phase array, a lens array, a first lens, a beam splitter, a lens, a camera, an acquisition control unit, and a reflection element. The tunable laser is used for providing a laser beam; the phase array is used for carrying out phase modulation on the expanded parallel light; the lens array is used for focusing the light beams output by each phase array; the beam splitter is used for splitting the light beam output by the first lens into reflection light and transmission light; the reflection element is used for reflecting the transmission light to form reference light; during working, a measured object reflects reflection light to form signal light; the signal light and the reference light interfere to form an interference pattern; the camera is used for collecting the interference image; and the acquisition control unit is used for analyzing the surface topography of the measured object according to the interference image. Through superposition of a plurality of independent speckles, the effect of reducing the speckle contrast is achieved.

The invention provides an area array sweep frequency measurement device and method, and belongs to the technical field of laser ranging, and the device comprises a tunable laser, a first collimator, a first beam expander, a first beam splitter, a lens, a reflection element, a camera, and an acquisition control unit. The tunable laser is used for controlling the camera to acquire an interference image by sending a trigger signal and providing an original light beam; the first beam splitter is used for splitting the collimated and expanded light beam into a first light beam and a second light beam, and the first light beam irradiates a to-be-measured object and then is reflected; the reflection element is used for reflecting the second light beam to form reference light; and the camera is used for collecting an interference image formed by interference of the first reflected light and the reference light. According to the invention, a traditional point detection acquisition mode is replaced to acquire the surface topography, mechanical scanning errors introduced during point detection are avoided, and the measurement accuracy in a general field of view is improved.