52results about How to "Accurate thickness measurement" patented technology

An optical translation technique for moving the interrogation spot at which a triangulation system measures the displacement of a target is disclosed. In normal operation of the laser triangulation sensor, an incident laser beam is projected from a sensor head onto a surface of a web that is facing the sensor head. Radiation is reflected from the surface and detected by the sensor. The distance from the sensor head to the web surface is calculated by triangulation. With optical translation, both the incident ray path and the captured ray path are translated with a plurality of high refractive index geometries such that the nominal functioning of the triangulation sensor remains undisturbed. The optimal position on the sheet wherein the interrogation spot will be located can be ascertained.

A method and system for correcting for temperature variation in ultrasonic testing systems is disclosed. In one embodiment, an offset is determined for correcting a time of flight measurement, wherein the offset is based on the pulse delays at first and second calibration temperatures. In another embodiment, a factor is determined for correcting a time of flight measurement, wherein the factor is based on clock signal errors at first and second calibration temperatures.

The invention discloses a detection method for a melting effect between a cast copper cooling wall body for a blast furnace and a cast-in cooling water pipe for the blast furnace. The detection method comprises the steps that 1, a cast copper cooling wall of the cast-in cooling water pipe is split along the plane where the center line of the cast-in cooling water pipe is located, an ultrasonic straight crystal probe connected with an ultrasonic flaw detector is placed in the flat inner side of the cooling water pipe, and the interface melting condition of the cooling water pipe and the hot face side of the cooling wall body is detected; 2, test points I, II, III, IV,..., N-1 and N are selected on the flat face of the cooling water pipe, and detection on the interface melting condition of the cooling water pipe and the hot face side of the cooling wall body is performed by repeatedly utilizing the ultrasonic straight crystal probe; 3, the interface melting condition in the cast copper cooling wall is determined through a melting rate definition formula Z=Y / N*100%, wherein Y represents the interface metallurgy melting point number in ultrasonic detection, and N represents the total position point number of the selected test points. The detection method has the advantages of being high in feasibility, good in detection effect, simple in test method, low in cost and wide in application.

An apparatus (100) and a method for measuring the thickness (s) for a wall (35) of a transparent object (30); the wall (35) comprises a transparent material (35a) arranged between a proximal interface (31), set between an environment (33) and the transparent material (35a), and a distal interface (32), set between said transparent material (35a) and the environment (33). The apparatus (100) comprises a source (1) of a starting light radiation (2) and a means for focusing it (10), in order to obtain an entering light radiation (5) directed towards the wall (35) that hits the proximal interface (31) of the wall (35) of the object and is in part reflected, in order to generate a first reflected radiation (6). A part of the entering light radiation (5) that is transmitted (7), through the transparent material (35a), hitting upon the distal interface (32), is in turn reflected (8) and crosses in an opposite direction the transparent material (35a) through the proximal interface (31), in order to generate a second reflected radiation (9). A collected radiation (15) given by overlapping the first (6) and second (9) reflected radiations have a difference of intensity that is configured to obtain an interference, which allows determining the thickness (s) of the wall (35). In particular, the means for focusing comprises a lens means (10) that have two main meridians (10a, 10b) orthogonal to each other, such that the entering light radiation (5) is focused on a first virtual focus (F1) in the first meridian plane (10a), and on a second virtual focus (F2) in the second meridian plane (10b). This way, it is obtained that the collected radiation (15) is substantially independent from possible movements of the transparent object (30), and this allows a remarkable reliability and robustness of the measurement with respect to fluctuations and vibrations of the object (30).

The present disclosure proposes a substrate inspection device. The substrate inspection apparatus of the present disclosure may include: a light source that irradiates laser light toward a coating film coated on an area on a substrate; an optical sensor that obtains a reference generated by the laser light being reflected by the surface of the coating film light interference data caused by interference between light and measurement light scattered by the laser light through the coating film; and a processor that derives the coating corresponding to the one region based on the light interference data. The thickness of the film.

The substrate inspection apparatus of the present disclosure may include: a first light source that irradiates ultraviolet rays toward a coating film of a substrate mixed with a fluorescent dye; a first photosensor that captures fluorescence generated from the coating film irradiated from the ultraviolet rays and obtaining a two-dimensional image of the substrate; a processor that derives one of a plurality of regions of the substrate based on the two-dimensional image; a second light source that irradiates laser light toward the one region; and a second light a sensor that obtains light interference data occurring from the one area by means of the laser light; the processor can derive a thickness of the coating film with respect to the one area based on the light interference data.