The invention relates to an easily adjustable
optical emission spectrometer (1), and a method (100) for establishing and operating such a
spectrometer (1), the
spectrometer (1) comprising a
plasma holder (2) for establishing a luminescent
plasma from a sample material, and an optical
system (3) for measuring the spectrum of light (L) emitted by the
plasma, the spectrum being characteristic of the sample material, wherein the optical
system (3) comprises at least one light entrance aperture (31), at least one
diffraction grating (32) for separating the light (L) coming from the plasma (A) and a method (100) for measuring the spectrum of the light (L). One or more detectors (33) of the
optical emission spectrometer (1), wherein the plasma support (2) and the optical
system (3) are directly and fixedly mounted on a plasma support
flange (2B) and an optical system
flange (3B) respectively, which are directly and fixedly connected to each other, and wherein the
optical emission spectrometer (1) further comprises an analysis unit (34), which is suitable for analyzing the measured spectrum and compensating for a drift of the spectrum relative to the
detector (33) that may be caused by heat transferred from the plasma support (2) to the optical system (3) taking into account
thermal expansion of the optical system (3).