This invention discloses a full-field metalens, a piezoelectric
fiber scanning device, and a two-
photon imaging
system, belonging to the technical field of two-
photon imaging systems. The metalens of this invention uses
gallium nitride (GaN) material and includes a substrate, a GaN thin film, and a periodically arranged
nanopillar unit structure. The unit period is 400–800 nm, the
nanopillar height is 300–800 nm, and the length and width are both 50–600 nm. Based on the generalized Snell's law,
image plane field curvature and off-axis
vignetting are introduced in
Zemax software to perform polynomial optimization of the phase distribution of the metalens, achieving full-field imaging. The piezoelectric
fiber scanning device passes an
optical fiber through a
piezoelectric tube and fixes it in place. A
voltage signal is applied to the electrodes of the
piezoelectric tube by a controller to drive the
optical fiber to perform two-dimensional scanning. This invention overcomes the limitations of traditional off-axis imaging through the optimized design of the metalens. Combined with the resonant scanning mechanism of the piezoelectric
fiber scanning device, it achieves a synergistic improvement in
large field of view and high-speed imaging, possessing the advantages of simplified structure, lightweight design, and high performance.