Device and method for testing LED light source intensity space distribution characteristic

A technology of LED light source and spatial distribution, applied in the field of optical testing, can solve the problems of light distribution curve and spatial distribution of light intensity, etc., to achieve the effect of fast test speed, high precision and improved test speed

Inactive Publication Date: 2009-10-28
GUANGZHOU MECHANICAL & ELECTRICAL TECH RES INST
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Problems solved by technology

[0004] At present, the test of the spatial distribution characteristics of the light intensity of LED light sources is based on the test method of the light distribution curve of the traditional light source, but for LED light sources, there is a big difference between the light distribution curve and the spatial distribution of light intensity.

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  • Device and method for testing LED light source intensity space distribution characteristic
  • Device and method for testing LED light source intensity space distribution characteristic
  • Device and method for testing LED light source intensity space distribution characteristic

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Embodiment Construction

[0030] Below in conjunction with accompanying drawing, specify as follows:

[0031] Such as figure 1 and figure 2 As shown, the present invention proposes a test device for the spatial distribution characteristics of the light intensity of an LED light source.

[0032] The LED light source sample 7 to be tested is installed on the test sample holder 2 , and the photometric detection unit 3 is installed and fixed on the detector bracket 4 . The detector bracket 4 includes a bracket bottom plate 41 and a cover plate 42, which are combined and installed on the base 1, and can move up and down and be fixed. The test circuit 5 includes a photoelectric conversion circuit 51 and a signal acquisition circuit 52, and the number of photoelectric detection units 3 is the same as the number of photoelectric conversion circuits and signal acquisition circuits in the test circuit, and corresponds to each other one by one, and each photometric detector 31 is connected A photoelectric con...

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Abstract

The invention relates to a device and a method for testing the LED light source intensity space distribution characteristic. The device comprises a base, a testing sample seat, a light intensity detecting unit, a detector bracket, a testing circuit, a computer and testing software. A multi-path synchronous testing method of a plurality of light intensity detecting units is adopted to replace one light intensity detector to sequentially test a plurality of points so as to realize the quick testing of the LED light source intensity space distribution characteristic. Compared with a conventional light distribution curve measuring method adopting one light intensity detector, if N light intensity detectors are used, the testing speed can be improved by more than N times. The device has the advantages of high testing speed and precision, abundant information content and real time and visualization.

Description

technical field [0001] The invention relates to an optical test technology, in particular to a test device and a test method for the light intensity spatial distribution characteristic of a light-emitting diode (LED) light source, belonging to the technical field of optical test. technical background [0002] The spatial distribution of light intensity refers to the spatial distribution of the light emitted from the light source, reflecting the spatial distribution characteristics of the luminous intensity. The spatial distribution of light intensity is often also referred to as a light distribution curve. The most common way to measure the light distribution curve is to use a photometric detector. You can choose to keep the light source stationary and the photometric detector rotates and scan around it, or you can choose to keep the photometric detector stationary and the light source rotates around a fixed center point. The test point is generally It is set to more than 5...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42G01M11/02
Inventor 任豪李康业王巧彬胡敏
Owner GUANGZHOU MECHANICAL & ELECTRICAL TECH RES INST
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