Test bed for testing comprehensive performance of LED modules

A comprehensive performance testing, LED module technology, used in testing optical performance, single semiconductor device testing, optical testing flaws/defects, etc., can solve the problem of uneven products, not suitable for real-time testing of industrial production lines, difficult to ensure accurate positioning of modules, etc. question

Inactive Publication Date: 2011-03-30
上海诚测电子科技发展有限公司
View PDF0 Cites 81 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at present, my country has not yet formed a formal standard for the testing of LED and related products, especially LED modules, and there is no unified standard requirement and testing method to regulate the entire industry. Unnecessary disorderly competition and technological confusion have seriously hindered the rapid development of the industry
However, the original Ministry of Information Industry stipulated only the test method for the characteristic parameters of semiconductor light-emitting devices. This test method is only suitable for the test of a single LED chip, and the required equipment is large in size and high in cost, so it is not suitable for a large number of real-time tests on industrial production lines.
In addition, since the LED module is a combined product integrating multiple LEDs, the current general-purpose conventional LED li

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test bed for testing comprehensive performance of LED modules
  • Test bed for testing comprehensive performance of LED modules
  • Test bed for testing comprehensive performance of LED modules

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The examples of the present invention are described in detail below in conjunction with the accompanying drawings: this example is implemented under the premise of the technical solution of the invention, and detailed implementation methods and specific operating procedures have been provided, but the protection scope of the present invention is not limited to the following implementation example.

[0031] Such as figure 1 , figure 2 and image 3 As shown, this embodiment includes: worktable surface 1, workbench foot bracket 2, adjustable anchor bolt 3, workbench beam frame 4, workbench beam frame top fixed connection frame 5, workbench beam frame bottom fixed connection frame 6 , Turntable rotary table 7, turntable main shaft 8, turntable main shaft bearing seat 9, turntable servo motor 10, servo motor main shaft 11, input flange pair 12, worm gear mechanism input shaft 13, worm gear mechanism 14, worm gear Mechanism output shaft 15, main shaft flange pair 16, gear...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a test bed for testing comprehensive performance of LED modules in the technical field of LED measurement. A double-station mode is provided with two sets of independent automatic loading and unloading machines, a PCB (printed circuit board) detector, an LED module electrical parameter detector, an LED module light intensity detector, an LED module spectrum parameter and chromaticity detector, an LED module defect repairer and a qualified product and unqualified product sorter; and the LED modules of two different specifications can be tested at the same time. Multi-variety online quick test and sorting can be efficiently matched by adopting a rotary sorting mode, combining a computer and a motion control card and controlling independent operation of each tester. The test bed can be adaptive to performance test of the LED modules of multiple specifications, is simple and convenient to operate, has high automation degree, can effectively and comprehensively reflect the comprehensive performance indexes of the tested LED modules, and has actual significance for improving quality control of the LED modules and research on industrialized key test technology of the LED module industry.

Description

technical field [0001] The invention relates to a mechanism in the technical field of LED measurement, specifically, a test bench for comprehensive performance testing of LED modules. Background technique [0002] As a new generation of lighting source, LED has the characteristics of low power consumption, small size, long life, etc., and has broad application prospects. In recent years, LED lighting technology has become one of the most promising high-tech fields in the world. my country's performance in the LED industry is extremely active, with continuous breakthroughs in technology and more and more applications. Especially through the implementation of the "National Semiconductor Lighting Project", China's LED industry has entered a new stage of accelerated development, providing a solid foundation for the development of the LED industry. Good opportunity. However, at present, my country has not yet formed a formal standard for the testing of LED and related products, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01M11/02G01N21/88G01R31/26G01R19/00G01R21/06G01J1/42G01J3/28G01J3/50B07C5/34B07C5/36
Inventor 姚晓栋薛波罗文君
Owner 上海诚测电子科技发展有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products