LED optical parameter comprehensive testing device

A technology of comprehensive testing and optical parameters, applied in the field of optical testing, to achieve the effect of compact structure, accurate and reliable measurement results, and simple operation
CN102213615AActive Publication Date: 2011-10-12CHINA NORTH IND NO 205 RES INST

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
CHINA NORTH IND NO 205 RES INST
Publication Date
2011-10-12

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Abstract

The invention discloses an LED optical parameter comprehensive testing device, belonging to the technical field of optical parameter measurement. The LED optical parameter comprehensive testing device is technically characterized in that one end of a horizontal base provided with a one-dimensional mobile platform is fixedly provided with an arc-shaped clamp provided with a fiber-optic probe and astandard luminosity probe, the other end of the horizontal base is fixedly provided with an arc-shaped light collector consisting of an arc fiber-optic array and a linear array CCD (Charge Coupled Device), and a rotary clamping table for holding an LED to be tested is arranged on the one-dimensional mobile platform; light information acquired by the fiber-optic probe is converted into a spectrum band by a spectrograph and then is sent into a computer, outputs of the standard luminosity probe and the linear array CCD are sent to the computer through the data acquisition unit, the computer performs corresponding processing and operation on measurement data through measurement software to finally obtain the luminescence characteristics of the LED to be tested. According to the invention, theproblem on comprehensively measuring the LED on a single measurement instrument is solved; and the LED optical parameter comprehensive testing device has the characteristics of simplicity for operation, compact structure, fastness for measurement, easiness for realization and the like.
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Description

technical field

[0001] The invention belongs to the field of optical testing, and mainly relates to an optical parameter testing device of a light-emitting device, in particular to a comprehensive testing device capable of testing parameters such as luminous intensity, light intensity distribution, spectral distribution and chromaticity of a light-emitting diode. Background technique

[0002] Light-emitting diode (LED) is a semiconductor diode that can emit light. When the minority carriers injected into the PN junction recombine with the majority carriers, it will emit light. It is a light-emitting device that directly converts electrical energy into light and radiation energy. . Compared with traditional light sources such as incandescent lamps, LED has a series of characteristics such as low power consumption, long life, small size, light weight, low working voltage, short luminous response time, and pure light color. It has been widely used in indicator lights, display s...

Claims

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