LED optical parameter comprehensive testing device

A technology of comprehensive testing and optical parameters, applied in the field of optical testing, to achieve the effect of compact structure, accurate and reliable measurement results, and simple operation

Active Publication Date: 2011-10-12
CHINA NORTH IND NO 205 RES INST
View PDF3 Cites 73 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a comprehensive test device for LED optical parameters in view of the deficiency that the existing LED optical parameter measurement device can only test a single LED optical parameter. Distribution, total luminous flux, spectrum and chromaticity parameters for quick testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • LED optical parameter comprehensive testing device
  • LED optical parameter comprehensive testing device
  • LED optical parameter comprehensive testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be further described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0019] according to figure 1 As shown, the preferred embodiment of the LED optical parameter comprehensive testing device includes a light source clamping and adjusting mechanism, an arc receiving component, an acquisition and control component and a computer 17 . The light source clamping and adjusting mechanism includes a horizontal base 1, a one-dimensional moving platform 2, and a rotating clamping table 5 including a clamping and adjusting mechanism 5-2 and an electronically controlled rotating table 5-1. The one-dimensional mobile platform 2 is installed on the horizontal base 1, the rotating clamping table 5 is installed on the one-dimensional mobile platform 2, and the measured LED 6 is fixed on the center of the electric control rotating table 5-1 through the clamping adjustment mechanism 5-2.

[0020] The one-dimensional m...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an LED optical parameter comprehensive testing device, belonging to the technical field of optical parameter measurement. The LED optical parameter comprehensive testing device is technically characterized in that one end of a horizontal base provided with a one-dimensional mobile platform is fixedly provided with an arc-shaped clamp provided with a fiber-optic probe and astandard luminosity probe, the other end of the horizontal base is fixedly provided with an arc-shaped light collector consisting of an arc fiber-optic array and a linear array CCD (Charge Coupled Device), and a rotary clamping table for holding an LED to be tested is arranged on the one-dimensional mobile platform; light information acquired by the fiber-optic probe is converted into a spectrum band by a spectrograph and then is sent into a computer, outputs of the standard luminosity probe and the linear array CCD are sent to the computer through the data acquisition unit, the computer performs corresponding processing and operation on measurement data through measurement software to finally obtain the luminescence characteristics of the LED to be tested. According to the invention, theproblem on comprehensively measuring the LED on a single measurement instrument is solved; and the LED optical parameter comprehensive testing device has the characteristics of simplicity for operation, compact structure, fastness for measurement, easiness for realization and the like.

Description

technical field [0001] The invention belongs to the field of optical testing, and mainly relates to an optical parameter testing device of a light-emitting device, in particular to a comprehensive testing device capable of testing parameters such as luminous intensity, light intensity distribution, spectral distribution and chromaticity of a light-emitting diode. Background technique [0002] Light-emitting diode (LED) is a semiconductor diode that can emit light. When the minority carriers injected into the PN junction recombine with the majority carriers, it will emit light. It is a light-emitting device that directly converts electrical energy into light and radiation energy. . Compared with traditional light sources such as incandescent lamps, LED has a series of characteristics such as low power consumption, long life, small size, light weight, low working voltage, short luminous response time, and pure light color. It has been widely used in indicator lights, display s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42G01J3/28G01J3/46G01M11/02
Inventor 陈超占春连杨鸿儒卢飞李正琪吕春力杨峰李燕
Owner CHINA NORTH IND NO 205 RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap