The invention provides a transparent material parameter measuring method and a transparent material parameter measuring
system, which are used for solving the technical problems of large
signal interference, low
signal-to-
noise ratio and the like of the existing non-contact measuring method. The measuring method comprises the following steps: 1, preparing a sample to be measured; 2, respectively dividing a bullet-facing surface and a non-bullet-facing surface of the to-be-detected sample into
film coating areas, reserving a transparent area penetrating through the axial direction of the to-be-detected sample between the two
film coating areas, and then respectively
coating a layer of
metal reflective film in each
film coating area; 3, at least one PDV probe is arranged at the position, not affected by the side sparse
waves, in the
coating area of the non-bullet-facing face, at the position, not affected by the side sparse
waves, in the non-
coating area of the non-bullet-facing face and one end of the non-bullet-facing face of the transparent area respectively; and 4, impacting the to-be-tested sample from the bullet facing surface along the axial direction through the light-gas gun flat plate
impact experiment device, respectively acquiring particle speed signals at corresponding positions and speed signals of the flyer by each PDV probe, and further calculating to obtain the flatness and the
wave velocity of the to-be-tested sample.