259results about "Spectrometer detectors" patented technology

A charge detection mass spectrometer includes an ion trap configured to store ions therein and to release stored ions therefrom, and an electrostatic linear ion trap (ELIT) array, in the form of at least two ELITs or ELIT regions each spaced apart from the ion trap, each ELIT or ELIT region including first and second ion mirrors and a charge detection cylinder positioned therebetween. The ion trap is controlled to release at least some of the stored ions to travel toward and into each of the ELITs or ELIT regions, and the first and second ion mirrors of each of the ELITs or ELIT regions is controlled in a manner which traps one or more ions traveling therein and causes the trapped ion(s) to oscillate back and forth between the first and second ion mirrors each time passing through and inducing a corresponding charge on the charge detection cylinder.

A power supply device applies a voltage to a quadrupole mass filter. The power supply device has a main substrate and a wave-detection substrate. The main substrate includes a detector. The wave-detection substrate includes a wave detector and an identifier. The wave detector detects an AC component of a voltage to be applied to the quadrupole mass filter as a wave-detection voltage. The identifier outputs identification information of the wave detector defined in correspondence with the configuration of a rectifying device of the wave detector. The detector detects identification information output by the identifier, and supplies the detected identification information to a corrector that corrects a deviation of voltage caused by a leakage current of the rectifying device.

The invention relates to the field of mass spectrum equipment, in particular to a low-noise and high-sensitivity mass spectrometer Faraday cup. The Faraday cup comprises a rectangular housing, one side of which is open; the suppression grid is arranged in the shell and is close to the opening; the collector is arranged in the shell and is adjacent to the suppression grid; a slit baffle is arranged at the opening of the shell; the collector is fixed through the insulating lining, insulated from the shell, and used for receiving the ion beam and generating current; the suppression grid electrode is fixed through an insulating lining and a metal positioning block, and negative bias voltage is applied to suppress escape of secondary electrons; the top cover is assembled on the shell to form a sealed whole; the collector connecting piece is arranged on the lower portion of the collector, one end of the Faraday cup outgoing line is welded to the collector connecting piece, and the other end of the Faraday cup outgoing line is led out of the shell. Noise is remarkably reduced, and the detection sensitivity of a mass spectrometer is improved.

The invention discloses a gas mass spectrometer ion source performance testing device, and belongs to the technical field of mass spectrometer testing, the ion source performance testing device comprises an ion source testing assembly, the ion source testing assembly is used for fixing and testing a to-be-tested ion source and converting ions into ion beams, and the ion source testing assembly is connected with an adjustable flight tube assembly. The adjustable flight tube assembly provides a flight channel for the ion beam, the adjustable flight tube assembly can stretch and retract relative to the ion source test assembly to adjust the flight distance of the ion beam, one end, far away from the ion source test assembly, of the adjustable flight tube assembly is connected with an adjustable observation assembly, and the adjustable observation assembly can slide relative to the ion source test assembly. Therefore, the observation position and the ion beam flight distance are adjusted. According to the invention, the installed to-be-detected ion source can be rapidly detected in a high-vacuum environment, the detection time is shortened from two days to half an hour aiming at complex operation of an existing ion source on an instrument, and the installation and detection efficiency of the ion source is greatly improved.

Methods and systems for identifying or classifying charge states of detected ions. An example method for classifying a charge state of detected ions may include generating a pulse for each ion in a plurality of ions detected by a detector, wherein each pulse has a pulse characteristic; generating a pulse-characteristic distribution of the generated pulses; and based on the pulse-characteristic distribution, generating an identification of the charge state of one or more ions in the plurality of ions.

Mass spectrometry includes: identifying sets of charge state distributions (CSDs) in deconvolved mass spectrometry data, where the CSDs of each set include at least one common mass spectrometry peak assigned a respective different charge state in each CSD of each set; distributing a respective weighting factor for each CSD in each group; calculating a fractional weighted average molecular weight of each compound CSD using a weighting factor in each group; finding out a single target CSD closest to the calculated average molecular weight in each group; for each common wave crest of each determined group, the sum of the intensities of the mass spectrum wave crests which are respectively and commonly distributed in the group is calculated, and the sum intensities are distributed to the single target CSDs of the group; all CSDs except the target CSD are removed; the sum intensity is used to calculate the abundance of each component compound.

In a mass spectrometer (10) for gas analysis, comprising: a mass spectrometer housing (12) evacuated by a vacuum pump; an ion source (16) for ionizing gas atoms or molecules entering the mass spectrometer enclosure (12) and accelerating ions in the mass spectrometer enclosure (12); an ion trap (22) made of an electrically conductive material for collecting ions generated by the ion source (16); an electrical measurement device (24) for measuring the potential or current of the ion trap (22) and connected to the ion trap (22) for inferring the ions collected by the ion trap (22) from the measured potential or current; a magnetic or electromagnetic deflection device configured to deflect or map ions having a specific mass-to-charge ratio to the ion trap (22); an electron barrier (30) made of an electrically conductive material is provided at the ion trap (22), the electron barrier having a lower potential than the ion trap (22) and being configured to generate a reverse electric field to return electrons released from the ion trap (22) onto the ion trap (22).

The invention discloses a current measuring circuit based on a quadrupole mass spectrometer, and the circuit comprises an input module which is used for receiving a current signal from the quadrupole mass spectrometer; the current detection module is used for carrying out current measurement on the current signal; wherein the current measurement module comprises a positive current measurement unit and a negative current measurement unit, the positive current measurement unit is used for measuring the positive current of the quadrupole mass spectrometer, and the negative current measurement unit is used for measuring the negative current of the quadrupole mass spectrometer; according to the current measurement circuit, small current linear amplification and large current logarithmic amplification are realized through the current measurement module, so that a high-range measurement effect is achieved, fA level-uA level current measurement can be realized, and meanwhile, automatic range switching is realized through circuit characteristics; and the cost is about one fiftieth of that of a reed switch range switching scheme.

Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (6), a GaN layer (4) that is provided on the incident side to the sapphire substrate (6) and includes GaN, a quantum well structure (3) provided on the incident side to the GaN layer (4), and a conductive layer (2) provided on the incident side to the quantum well structure (3), wherein a plurality of emitting layers (21) including InGaN and a plurality of barrier layers (22) including GaN are alternatively stacked in the quantum well structure (3), and an oxygen-containing layer (23) including oxygen is provided between the quantum well structure (3) and the conductive layer (2).

An ion guide or ion trap that comprises a plurality of electrodes (102) is disclosed. The ion guide or ion trap includes a detector (205) that can detect light or particles (114) emitted from the ion guide or ion trap due to electrical breakdown, and a control circuit (111) that can control the ion guide or ion trap in response to the detector (205) detecting light or particles (114) emitted from the ion guide or ion trap.

Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m / z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m / z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.

Embodiments provide for an ion mass spectrometer. An example ion mass spectrometer includes a laminated collimator, a laminated electrostatic analyzer (ESA) positioned downstream from the laminated collimator, a magnetic sensor analyzer positioned downstream from the laminated ESA, and a position sensitive cross-delay anode (XDL) assembly having a micro-channel plate (MCP) and a cross delay-line (XDL) anode.

A high mass ion detector for a mass spectrometer, a mass spectrometer, and a method for detecting high mass ions are provided.

A detection apparatus and method for detecting charged particles. The device relies on a detection assembly comprising microchannel plates. The useful surface of the microchannel plate device is maximized in time through the use of beam deflection means upstream of the detection front.

A charge detection mass spectrometer (CDMS) comprises an electrostatic sector field ion trap 40, an inductive image charge detector 400 and a fragmentation device. The electrostatic sector field ion t

The invention relates to a multi-detector high-capacity ion trap quality analysis system which is arranged in a negative pressure sealed cavity containing buffer gas, the negative pressure sealed cavity is provided with an ion inlet, and the system comprises a first ion screening assembly communicated with the ion inlet, the first ion screening assembly is connected with one end of an ion dispersion assembly, and the other end of the ion dispersion assembly is connected with a second ion screening assembly; the other end of the ion dispersion assembly is connected with the second ion screening assembly, and the second ion screening assembly is provided with an ion output port. The ion trap mass analyzer is divided into the first ion screening assembly, the ion dispersion assembly and the second ion screening assembly, the overall capacity of the ion trap mass analyzer is improved, the ion detection efficiency and accuracy are improved through cooperation of multiple groups of detectors and the electrode stem slit, and the detection sensitivity, the analysis speed and the flux are further improved. When the ion dispersion assembly and the second ion screening assembly work, the first ion screening assembly can continuously drive ions to be analyzed to enter.

The present invention comprises novel methods of continuously monitoring the performance of an atmospheric pressure ionization (API) system. The methods of the invention allow for improved quality monitoring of the processes that leads to the formation of ions at atmospheric pressure. The methods of the invention further allow for continuously monitoring for the quality of the ion formation process in API without the addition of extraneous material (such as labelled compounds or control known compounds) to the system being monitored.

Embodiments described herein relate to evaluating similarities between spectral data sets. One system may include a memory storing a computer-executable component, which may include an identification component identifying a first set of spectral decomposition product data of a first compound, and a processor executing the computer-executable component, the first set corresponds to a first ion activation energy comprising a target ion activation energy missed from a previous spectral measurement of a first compound; wherein the identification component further identifies a second set of spectral decomposition product data of a second compound, the second set corresponding to a second ion activation energy; and a comparison component that performs a comparison of the first set of spectral decomposition product data at the target ion activation energy and the second set of spectral decomposition product data, thereby generating a target similarity value that defines a similarity between the first set of spectral decomposition product data at the target ion activation energy and the second set of spectral decomposition product data.

The present application relates to the field of mass spectrometers, and discloses a signal acquisition method, apparatus, mass spectrometer, and computer storage medium. The method includes: sampling an analog signal through an ADC acquisition card to obtain the signal intensity of the analog signal at each sampling point; comparing the signal intensity of each sampling point with a preset intensity threshold, and determining the type of each sampling point according to the comparison result; performing cumulative counting on each sampling point according to the type of each sampling point to obtain a cumulative result; wherein, the cumulative result is used to convert through the time corresponding to each sampling point and the count value, so as to obtain a mass spectrum. In the embodiment of the present application, by expanding the digital counting function on a single ADC acquisition card, there is no need to additionally increase a TDC acquisition card and other hardware circuit structures, which simplifies the structure of the mass spectrometer and improves the applicability of the mass spectrometer.

A method of checking calibration of a dual-mode secondary electron multiplier (SEM) detector of a mass spectrometer using non-analyte ions, the method comprising: recording, using a counting mode dete

A mass spectrometer includes an ion source configured to ionize a sample to produce ions; a mass analyzer configured to separate the ions based on their mass-to-charge ratio; a detector configured to detect ions; an ion optics component configured to direct ions along at least part of the path from the ion source to the mass analyzer to the detector; and a controller. The controller is configured to switch the source at a first time from a first polarity source voltage to a second polarity source voltage; and switch the detector or the ion optics component at a second time from a first voltage to a second voltage, the second time being offset from the first time, the first voltage being the first polarity detector voltage or the first polarity ion optics voltage and the second voltage being the second polarity detector voltage or the second polarity ion optics voltage.

A CDMS may include an ELIT having a charge detection cylinder (CD), a charge generator for generating a high frequency charge (HFC), a charge sensitive preamplifier (CP) having an input coupled to the CD and an output configured to produce a charge detection signal (CHD) in response to a charge induced on the CD, and a processor configured to (a) control the charge generator to induce an HFC on the CD, (b) control operation of the ELIT to cause a trapped ion to oscillate back and forth through the CD each time inducing a charge thereon, and (c) process CHD to (i) determine a gain factor as a function of the HFC induced on the CD, and (ii) modify a magnitude of the portion of CHD resulting from the charge induced on the CD by the trapped ion passing therethrough as a function of the gain factor.

A process for charge detection mass spectrometry includes: acquiring a time-varying signal representative of a current induced on a detector by oscillatory motion of ions within a trapping region; processing the time-varying signal to derive a frequency of the oscillating motion; generating resonant ion selective time overview (STORI) data representing a relationship of STORIreal value to time and a relationship of STORIimag value to time based on the amplitude of the time-varying signal and the derived frequency of the oscillatory motion; regenerating STORI data based on a change in the frequency of the oscillatory motion over time; and determining a state of charge of the ion based on the regenerated STORI data.

To provide a leak detector and an ion source for a leak detector that improve the insulation durability between electrodes without changing the size and weight of the ion source. A leak detector that guides a gas from an object to be inspected to an analysis tube that is evacuated, ionizes the gas using an ion source provided in the analysis tube, and detects the ionized gas to thereby perform a leak inspection on the object to be inspected, wherein the ion source includes a filament that emits hot electrons that ionize the gas, an electrode that is electrically connected to the filament, a base member through which the electrode passes and that separates an internal space in which the filament is disposed from the outside, a first insulation member that is provided in a through-hole for the electrode formed in the base member and that insulates the electrode from the base member, and a second insulation member that is provided around the electrode and that extends toward the internal space side more than a surface of the base member that faces the internal space.

The present invention improves the performance of a power module. In particular, the generation of discharge is prevented within the power module, and the power module is miniaturized. As a means for this, a plurality of substrates are arranged within the power module so as to overlap when viewed from above. In this case, a low-voltage circuit (3) and a high-voltage circuit are formed on a first substrate (2) while maintaining a distance (L) between each other for preventing creeping discharge, and a low-voltage circuit (5) is formed on a second substrate (4). In addition, the distance between the components constituting the high-voltage AC circuit (8) formed in the high-voltage circuit and the components constituting the low-voltage circuit (5) is at least three times the shortest distance (D) between the components constituting the high-voltage DC circuit (7) formed in the high-voltage circuit and the components constituting the low-voltage circuit (5) at which no space discharge occurs.

A system and method for detecting high-energy particles, the system comprising a detector unit and an AC coupler, the detector unit having a differentially biased detector having a first terminal for coupling to a positive bias voltage and a second terminal for coupling to a negative bias voltage, and the AC coupler having capacitively coupled input and output positive and negative terminals. The capacitive coupling is embedded in a transmission line structure, with the input positive terminal coupled to the first terminal of the detector and the input negative terminal coupled to the second terminal of the detector. Some advantages include reducing or eliminating resonance between the storage capacitor inductance and the detector capacitor, ringing due to common-mode excitation from the coaxial cable and the AC coupler circuitry, and undershoot and ringing due to reflections of low-frequency components blocked by the remotely mounted AC coupler.

An ion detector 400 for a mass and / or ion mobility spectrometer, comprising: a dynode 402 arranged such that primary ions 412 to be detected by the ion detector impact upon the dynode and generate fir

A method of operating an instrument which comprises a first and second ion stores, comprising determining whether a target accumulation time for the second ion store is greater than a threshold accumulation time. When the target accumulation time is less than the threshold accumulation time, ions are accumulated within the second ion store using an accumulation time that is based on the target accumulation time. When the target accumulation time is greater than the threshold accumulation time, ions are accumulated within the first ion store using a first accumulation time, the ions accumulated in the first ion store are passed to the second ion store, and further ions are accumulated within the second ion store using a second accumulation time.

A method of reducing electrical measurement noise in a detection apparatus (e.g., an ion mobility spectrometer or a mass spectrometer) configured to detect the arrival of ions at a collector electrode 118. The detection apparatus comprises an air mover 122 (e.g., a fan, pump or blower) to provide a flow of air in the apparatus. The method comprises: operating the air mover at an operating level to provide the flow of air; reducing operation of the air mover for a quiet period; and operating the detection apparatus to allow ions to travel to be detected by the collector electrode during the quiet period. The collector electrode may be subject to variations in capacitance due to mechanical vibration. The air mover may be a source of mechanical vibration. Mechanical vibration of the collector electrode may be reduced during the quiet period. A detection apparatus is also claimed.

The performance of a power supply module is to be improved. The occurrence of discharge in the power supply module is to be prevented, and the size of the power supply module is to be reduced. In a power supply module, substrates are provided being stacked in a planar view. A low voltage circuit and a high voltage circuit are formed on a first substrate such that a distance is kept for preventing surface discharge, and a low voltage circuit is formed on a second substrate. A distance between a component of a high voltage alternating current circuit on the high voltage circuit and a component of the low voltage circuit is three times a shortest distance, at which space discharge does not occurs, between a component that constitutes a high voltage direct current circuit on the high voltage circuit and a component that constitutes the low voltage circuit.