348results about "Spectrometer detectors" patented technology

A charge detection mass spectrometer includes an ion trap configured to store ions therein and to release stored ions therefrom, and an electrostatic linear ion trap (ELIT) array, in the form of at least two ELITs or ELIT regions each spaced apart from the ion trap, each ELIT or ELIT region including first and second ion mirrors and a charge detection cylinder positioned therebetween. The ion trap is controlled to release at least some of the stored ions to travel toward and into each of the ELITs or ELIT regions, and the first and second ion mirrors of each of the ELITs or ELIT regions is controlled in a manner which traps one or more ions traveling therein and causes the trapped ion(s) to oscillate back and forth between the first and second ion mirrors each time passing through and inducing a corresponding charge on the charge detection cylinder.

A power supply device applies a voltage to a quadrupole mass filter. The power supply device has a main substrate and a wave-detection substrate. The main substrate includes a detector. The wave-detection substrate includes a wave detector and an identifier. The wave detector detects an AC component of a voltage to be applied to the quadrupole mass filter as a wave-detection voltage. The identifier outputs identification information of the wave detector defined in correspondence with the configuration of a rectifying device of the wave detector. The detector detects identification information output by the identifier, and supplies the detected identification information to a corrector that corrects a deviation of voltage caused by a leakage current of the rectifying device.

The invention relates to the field of mass spectrum equipment, in particular to a low-noise and high-sensitivity mass spectrometer Faraday cup. The Faraday cup comprises a rectangular housing, one side of which is open; the suppression grid is arranged in the shell and is close to the opening; the collector is arranged in the shell and is adjacent to the suppression grid; a slit baffle is arranged at the opening of the shell; the collector is fixed through the insulating lining, insulated from the shell, and used for receiving the ion beam and generating current; the suppression grid electrode is fixed through an insulating lining and a metal positioning block, and negative bias voltage is applied to suppress escape of secondary electrons; the top cover is assembled on the shell to form a sealed whole; the collector connecting piece is arranged on the lower portion of the collector, one end of the Faraday cup outgoing line is welded to the collector connecting piece, and the other end of the Faraday cup outgoing line is led out of the shell. Noise is remarkably reduced, and the detection sensitivity of a mass spectrometer is improved.

The invention discloses a gas mass spectrometer ion source performance testing device, and belongs to the technical field of mass spectrometer testing, the ion source performance testing device comprises an ion source testing assembly, the ion source testing assembly is used for fixing and testing a to-be-tested ion source and converting ions into ion beams, and the ion source testing assembly is connected with an adjustable flight tube assembly. The adjustable flight tube assembly provides a flight channel for the ion beam, the adjustable flight tube assembly can stretch and retract relative to the ion source test assembly to adjust the flight distance of the ion beam, one end, far away from the ion source test assembly, of the adjustable flight tube assembly is connected with an adjustable observation assembly, and the adjustable observation assembly can slide relative to the ion source test assembly. Therefore, the observation position and the ion beam flight distance are adjusted. According to the invention, the installed to-be-detected ion source can be rapidly detected in a high-vacuum environment, the detection time is shortened from two days to half an hour aiming at complex operation of an existing ion source on an instrument, and the installation and detection efficiency of the ion source is greatly improved.

The invention provides an ion source detection system and method, and the system comprises a vacuum device which is used for providing a preset vacuum environment for an ion source; the n ion sources are connected with the vacuum device; each ion source is further provided with a first communication valve used for controlling and communicating with the vacuum environment. The ion source detection devices and the ion sources are arranged in a one-to-one correspondence manner, and the ion source detection devices are electrically connected with the corresponding ion sources; and each ion source detection device is used for providing working voltage for the ion source and collecting an ion intensity electric signal output when the ion source works. According to the invention, the vacuum device and the ion source detection device are arranged to provide an independent detection system for the ion source to be detected.

Methods and systems for identifying or classifying charge states of detected ions. An example method for classifying a charge state of detected ions may include generating a pulse for each ion in a plurality of ions detected by a detector, wherein each pulse has a pulse characteristic; generating a pulse-characteristic distribution of the generated pulses; and based on the pulse-characteristic distribution, generating an identification of the charge state of one or more ions in the plurality of ions.

Mass spectrometry includes: identifying sets of charge state distributions (CSDs) in deconvolved mass spectrometry data, where the CSDs of each set include at least one common mass spectrometry peak assigned a respective different charge state in each CSD of each set; distributing a respective weighting factor for each CSD in each group; calculating a fractional weighted average molecular weight of each compound CSD using a weighting factor in each group; finding out a single target CSD closest to the calculated average molecular weight in each group; for each common wave crest of each determined group, the sum of the intensities of the mass spectrum wave crests which are respectively and commonly distributed in the group is calculated, and the sum intensities are distributed to the single target CSDs of the group; all CSDs except the target CSD are removed; the sum intensity is used to calculate the abundance of each component compound.

In a mass spectrometer (10) for gas analysis, comprising: a mass spectrometer housing (12) evacuated by a vacuum pump; an ion source (16) for ionizing gas atoms or molecules entering the mass spectrometer enclosure (12) and accelerating ions in the mass spectrometer enclosure (12); an ion trap (22) made of an electrically conductive material for collecting ions generated by the ion source (16); an electrical measurement device (24) for measuring the potential or current of the ion trap (22) and connected to the ion trap (22) for inferring the ions collected by the ion trap (22) from the measured potential or current; a magnetic or electromagnetic deflection device configured to deflect or map ions having a specific mass-to-charge ratio to the ion trap (22); an electron barrier (30) made of an electrically conductive material is provided at the ion trap (22), the electron barrier having a lower potential than the ion trap (22) and being configured to generate a reverse electric field to return electrons released from the ion trap (22) onto the ion trap (22).

A system and method are provided for recovering charged particle measurement information in the operation of a charge detection mass spectrometer in which multiple ions are trapped and simultaneously measured. The recovered charged particle measurement information illustratively includes charged particle measurement information for at least some of the ions having oscillation frequencies that overlap with oscillation frequencies of others of the multiple trapped ions. One example charged particle recovery process operates on charged particle measurement information in which the overlapping oscillation frequencies are discernible from one another, and another operates on charged particle measurement information in which the overlapping oscillation frequencies are indiscernible from one another. The charge detection mass spectrometer may be operated using either or both of the charged particle recovery processes.

The invention discloses a current measuring circuit based on a quadrupole mass spectrometer, and the circuit comprises an input module which is used for receiving a current signal from the quadrupole mass spectrometer; the current detection module is used for carrying out current measurement on the current signal; wherein the current measurement module comprises a positive current measurement unit and a negative current measurement unit, the positive current measurement unit is used for measuring the positive current of the quadrupole mass spectrometer, and the negative current measurement unit is used for measuring the negative current of the quadrupole mass spectrometer; according to the current measurement circuit, small current linear amplification and large current logarithmic amplification are realized through the current measurement module, so that a high-range measurement effect is achieved, fA level-uA level current measurement can be realized, and meanwhile, automatic range switching is realized through circuit characteristics; and the cost is about one fiftieth of that of a reed switch range switching scheme.

An array of identical linear quadrupole ion traps, each trap comprising the following: at least four main electrodes (32, 33, 34, 35) extending in a Z-direction to form a quadrupolar field at least in the midline region aligned along the Z-axis, wherein the Z-axis is either straight or curved with a radius that is substantially larger than the distance between the said main electrodes (32, 33, 34, 35); an ion ejection slot (36) in at least one of the main electrodes (32, 33, 34, 35); wherein the slot (36) is oriented in the Z direction; a pair of electrostatic end plugs (37, 38) arranged at the Z-edges of the quadrupole ion trap; wherein the pair of end plugs (37, 38) are a segment of the main electrodes (32, 33, 34, 35) or ring electrodes; an RF generator that provides RF signals with opposite phases, to form a quadrupolar RF field at least in the midline region of the main electrodes (32, 33, 34, 35); a variable DC supply for supplying DC signals to at least two rods in order to form a quadrupolar DC field with a weaker dipolar DC field at least in the midline region of main electrodes (32, 33, 34, 35); a DC, RF or AC supply connected to the aforementioned pair of end plugs (37, 38) to provide axial Z-capture; a gas supply or pumping means for providing a gas pressure in the range of 1 to 100 mTorr [0.133 to 13.332 Pascal], wherein the variable DC supply has means for ramping up the said quadrupolar potential, whereby a sequential ion ejection via the slot (36) occurs in the inverse relationship to the ion m / z, wherein the array further comprises a wide-diameter RF channel (25) with a DC gradient for collecting, transferring and spatially confining ions behind the slots (36) of the quadrupole ion traps; wherein the dimension of said RF channel (25) is defined by the trap sizes of the quadrupole ion traps and the topology of the array and the gas pressure in the quadrupole ion traps, and wherein the individual quadrupole ion traps are oriented such that an ion emission surface is formed which is either planar or at least partially cylindrical or partially spherical for more efficient collection and transfer of ions in the wide diameter RF channel (25).

Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m / z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m / z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.

Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (6), a GaN layer (4) that is provided on the incident side to the sapphire substrate (6) and includes GaN, a quantum well structure (3) provided on the incident side to the GaN layer (4), and a conductive layer (2) provided on the incident side to the quantum well structure (3), wherein a plurality of emitting layers (21) including InGaN and a plurality of barrier layers (22) including GaN are alternatively stacked in the quantum well structure (3), and an oxygen-containing layer (23) including oxygen is provided between the quantum well structure (3) and the conductive layer (2).

An ion guide or ion trap that comprises a plurality of electrodes (102) is disclosed. The ion guide or ion trap includes a detector (205) that can detect light or particles (114) emitted from the ion guide or ion trap due to electrical breakdown, and a control circuit (111) that can control the ion guide or ion trap in response to the detector (205) detecting light or particles (114) emitted from the ion guide or ion trap.

Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m / z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m / z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.

The present application discloses an ion trap radio frequency driving device, comprising: a sampling module, used to output a high-voltage signal of the ion trap radio frequency driving device, and to sample the high-voltage signal to obtain a sampling signal; a rectifying and filtering module, used to rectify and filter the sampling signal to obtain a DC voltage signal; a voltage source, used to provide a standard voltage reference signal; a proportional-integral controller, used to compare the DC voltage signal with the standard voltage reference signal to obtain a feedback signal; a radio frequency signal source, used to provide a local oscillator signal; a mixer, used to adjust the radio frequency output signal according to the local oscillator signal and the feedback signal to obtain a radio frequency stable signal; a power amplifier, used to amplify the radio frequency stable signal, and output a high-voltage signal through the sampling circuit, thereby ensuring a larger radio frequency voltage gain and a higher signal-to-noise ratio.

Embodiments provide for an ion mass spectrometer. An example ion mass spectrometer includes a laminated collimator, a laminated electrostatic analyzer (ESA) positioned downstream from the laminated collimator, a magnetic sensor analyzer positioned downstream from the laminated ESA, and a position sensitive cross-delay anode (XDL) assembly having a micro-channel plate (MCP) and a cross delay-line (XDL) anode.

A high mass ion detector for a mass spectrometer, a mass spectrometer, and a method for detecting high mass ions are provided.

A detection apparatus and method for detecting charged particles. The device relies on a detection assembly comprising microchannel plates. The useful surface of the microchannel plate device is maximized in time through the use of beam deflection means upstream of the detection front.

An instrument for analyzing ions includes at least one separation instrument configured to produce a flow of a sample solution in which molecules in the sample solution are separated as a function of at least one molecular characteristic, an ion source to generate ions from the sample solution flow, and an electrostatic linear ion trap (ELIT) to receive and trap ions exiting the at least one ion processing instrument. The ELIT is configured such that trapped ions oscillate back and forth through a charge detection cylinder between first and second ion mirrors at opposite ends of the cylinder with a duty cycle, corresponding to a ratio of time spent by the trapped ions traversing the charge detection cylinder and total time spent by the trapped ions traversing a combination of the first and second ion mirrors and the charge detection cylinder during one complete oscillation cycle, of approximately 50%.

A charge detection mass spectrometer may include an ion source to generate ions, a mass spectrometer to separate the generated ions as a function of ion mass-to-charge ratio to produce beam of separated ions, an electrostatic linear ion trap (ELIT) including a charge detection cylinder disposed between a pair of coaxially aligned ion mirrors, and means for controlling a trajectory of the beam of separated ions entering the ELIT to cause the ions subsequently trapped in the ELIT to oscillate therein with different planar ion oscillation trajectories angularly offset from one another about the longitudinal axis with each extending along and crossing the longitudinal axis in each of the ion mirrors or with different cylindrical ion oscillation trajectories radially offset from one another about the longitudinal axis to form nested cylindrical trajectories each extending along the longitudinal axis.

A charge detection mass spectrometer includes: an ion trap configured to receive and store ions therein and selectively release the stored ions therefrom; and an electrostatic linear ion trap (ELIT), the electrostatic linear ion trap (ELIT) being spaced apart from the ion trap, the ELIST comprising a first ion mirror and a second ion mirror and a charge detection cylinder positioned therebetween; and means for selectively controlling the ion trap to release at least some of the stored ions therefrom to travel toward and into the ELIST, and for controlling the first ion mirror and the second ion mirror in a manner that captures in the ELIST a single of the ions traveling therein, and causing the trapped ions to oscillate back and forth between the first ion mirror and the second ion mirror each time the trapped ions pass through the charge detection cylinder and a corresponding charge is induced thereon.

A charge detection mass spectrometer (CDMS) comprises an electrostatic sector field ion trap 40, an inductive image charge detector 400 and a fragmentation device. The electrostatic sector field ion t

The invention discloses a vacuum system for a mass spectrometer. The vacuum system includes a first vacuum region, a second vacuum region, a vacuum interlock connected to the first vacuum region by a first valve and to the second vacuum region by a second valve, a first pump connected to the first vacuum region and the second vacuum region, a second pump connected to the second vacuum region, a pressure sensor configured to determine a pressure within the second vacuum region, and a controller configured to adjust a position of the second valve in response to the pressure within the second vacuum region. The vacuum interlock device is configured to receive a sample. The first pump is configured to reduce pressure within the first vacuum region and discharge air to the second vacuum region. The second pump is configured to reduce pressure within the vacuum interlock. The controller is configured to prevent pressure fluctuations in the second vacuum region.

The invention relates to a multi-detector high-capacity ion trap quality analysis system which is arranged in a negative pressure sealed cavity containing buffer gas, the negative pressure sealed cavity is provided with an ion inlet, and the system comprises a first ion screening assembly communicated with the ion inlet, the first ion screening assembly is connected with one end of an ion dispersion assembly, and the other end of the ion dispersion assembly is connected with a second ion screening assembly; the other end of the ion dispersion assembly is connected with the second ion screening assembly, and the second ion screening assembly is provided with an ion output port. The ion trap mass analyzer is divided into the first ion screening assembly, the ion dispersion assembly and the second ion screening assembly, the overall capacity of the ion trap mass analyzer is improved, the ion detection efficiency and accuracy are improved through cooperation of multiple groups of detectors and the electrode stem slit, and the detection sensitivity, the analysis speed and the flux are further improved. When the ion dispersion assembly and the second ion screening assembly work, the first ion screening assembly can continuously drive ions to be analyzed to enter.

To further enhance high-speed responsiveness.SOLUTION: A light emitting body 10 converts incident electrons into light. The light emitting body 10 includes a multi-quantum-well structure 14C that emits light upon incidence of electrons. A well layer 141 of the multi-quantum-well structure 14C is 0.2 nm or more and less than 1.5 nm thick. The concentration of additives added to a barrier layer 142 and the well layer 141 constituting the multi-quantum-well structure 14C is greater than 4×1018 cm-3 and equal to or less than 1×1020 cm-3.SELECTED DRAWING: Figure 1

The present invention comprises novel methods of continuously monitoring the performance of an atmospheric pressure ionization (API) system. The methods of the invention allow for improved quality monitoring of the processes that leads to the formation of ions at atmospheric pressure. The methods of the invention further allow for continuously monitoring for the quality of the ion formation process in API without the addition of extraneous material (such as labelled compounds or control known compounds) to the system being monitored.

The present invention provides an ion transmission efficiency measurement device, method, storage medium and program product, which relate to the field of mass spectrometry technology. The device comprises a controller and at least one group of ion deflection receiving components; wherein the ion deflection receiving components comprise an electric field deflection module and an ion receiving module, the electric field deflection module and the ion receiving module are arranged on the side of the transmission path of the continuously output ion flow and are located between two adjacent modules in the mass spectrometer; the controller is connected with the electric field deflection module and the ion receiving module, and the controller is used to output an electric field deflection voltage to the electric field deflection module and the ion receiving module to change the electric field direction between the electric field deflection module and the ion receiving module, and guide the ion flow to be transmitted toward the ion receiving module. When the electric field direction points to the ion receiving module, the controller collects the current received by the ion receiving module, and the loss of the ion flow in the transmission process can be determined, thereby determining the ion transmission efficiency.

Embodiments described herein relate to evaluating similarities between spectral data sets. One system may include a memory storing a computer-executable component, which may include an identification component identifying a first set of spectral decomposition product data of a first compound, and a processor executing the computer-executable component, the first set corresponds to a first ion activation energy comprising a target ion activation energy missed from a previous spectral measurement of a first compound; wherein the identification component further identifies a second set of spectral decomposition product data of a second compound, the second set corresponding to a second ion activation energy; and a comparison component that performs a comparison of the first set of spectral decomposition product data at the target ion activation energy and the second set of spectral decomposition product data, thereby generating a target similarity value that defines a similarity between the first set of spectral decomposition product data at the target ion activation energy and the second set of spectral decomposition product data.

The present application relates to the field of mass spectrometers, and discloses a signal acquisition method, apparatus, mass spectrometer, and computer storage medium. The method includes: sampling an analog signal through an ADC acquisition card to obtain the signal intensity of the analog signal at each sampling point; comparing the signal intensity of each sampling point with a preset intensity threshold, and determining the type of each sampling point according to the comparison result; performing cumulative counting on each sampling point according to the type of each sampling point to obtain a cumulative result; wherein, the cumulative result is used to convert through the time corresponding to each sampling point and the count value, so as to obtain a mass spectrum. In the embodiment of the present application, by expanding the digital counting function on a single ADC acquisition card, there is no need to additionally increase a TDC acquisition card and other hardware circuit structures, which simplifies the structure of the mass spectrometer and improves the applicability of the mass spectrometer.